Nanotechnology and Nanoelectronics: Materials, Devices, Measurement Techniques

Nanotechnology and Nanoelectronics Materials, Devices, Measurement Techniques

W. R. Fahrner

With 218 Figures

Prof. Dr. W. R. Fahrner
University of Hagen
Chair of Electronic Devices
58084 Hagen
Germany

Library of Congress Control Number: 2004109048

978-354032-819-3

ISBN 3-540-22452-1 Springer Berlin Heidelberg New York

This work is subject to copyright. All rights are reserved, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilm or in other ways, and storage in data banks. Duplication of this publication or parts thereof is permitted only under the provisions of the German Copyright Law of September 9, 1965, in its current version, and permission for use must always be obtained from Springer. Violations are liable to prosecution act under German Copyright Law.

Springer is a part of Springer Science + Business Media GmbH

http://www.springeronline.com

2005 Springer-Verlag Berlin Heidelberg

The use of general descriptive names, registered names, trademarks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use.

Typesetting: Digital data supplied by editor
Cover-Design: medionet AG, Berlin
62/3020 Rw 5 4 3 2 10

Contributors

Prof. Dr. rer. nat. Wolfgang R. Fahrner (Editor)
University of Hagen
Haldenerstr. 182, 58084 Hagen, Germany

Prof. Dr.-Ing. Ulrich Hilleringmann
University of Paderborn
Warburger Str. 100, 33098 Paderborn, Germany

Dr.-Ing. John T. Horstmann
University of Dortmund
Emil-Figge-Str. 68, 44227 Dortmund, Germany

Dr. rer. nat. habil. Reinhart Job

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