Glossary

AES: Auger electron spectroscopy; a surface analysis technique that probes the chemistry of a surface by measuring the energy of electrons emitted from that surface when it is irradiated with electrons of energy in the range 2 50 keV
AFM: atomic-force microscopy, a surface-analysis technique that measures the position of atoms on the surface using a ceramic or semiconductor tip at the end of a cantilever. As the tip moves over a surface, it contacts the surface continuously or periodically and the cantilever bends as the tip is repelled or attracted to the surface
acceptor: an atom or defect that provides a "hole", e.g. Zn on Ga site in GaAs
activation energy: the energy of a potential barrier that must be crossed for a reaction to proceed
airbridge: a metal interconnect that spans between two contacts through the air rather than crossing over a dielectric
alkane: hydrocarbons with a formula C _nH _2n+2. Examples are methane and ethane
alloy: to heat in order to promote a solid-state reaction such as that needed to form many kinds of ohmic contacts
analogue: referring to a circuit or application using an architecture with continuously variable voltages and currents
antisite defect: a type of defect where an atom of one element of a compound is located on a lattice site normally occupied by an atom of a different element of the compound
AR coating: anti-reflection coating, a thin layer of material that changes the reflectivity of a surface; minimum reflection occurs...

< Previous Excerpt

Fabrication of GaAs Devices

TABLE OF CONTENTS

Glossary

A-B

Fabrication of GaAs Devices

TABLE OF CONTENTS

Glossary

A-B

Contact Preferences

This is embarrasing...

Customize Your GlobalSpec Experience

Select Your Free Newsletters

Industry Newsletters

Select Your Free Product Alerts

This is embarrasing...