Chapter 8: Atomic Force Microscopy and Microthermal Analysis

8.1 Atomic Force Microscopy

Scanning probe microscopy initially provided three-dimensional visualisation of surfaces down to the atomic scale using scanning tunnelling and atomic force microscopy (AFM). Today, a range of imaging modes and spectroscopic techniques can be used to determine additional information on physical, chemical, and thermal properties of polymeric materials. Examples of the uses of lateral force microscopy, to determine surface friction and force modulation to elucidate surface stiffness, have been presented. Pulsed force mode now enables both of these properties to be displayed simultaneously. Intermittent contact (tapping force) atomic force microscopy (AFM) combined with phase imaging provides fast imaging of soft polymers, combined with simultaneous materials contrast based on surface viscoelastic properties. Hence, the spatial distribution of multi-component polymers can be determined.

The past decade has witnessed an explosion of techniques used to pattern polymers on the nano- and sub-micrometre scale. This has been driven by the extensive versatility of polymers for diverse applications such as molecular electronics, data storage, and all forms of sensors. Lyuksyutov and co-workers [1] demonstrate a novel lithography technique electrostatic nanolithography using AFM that generates features by mass transport of polymers within an initially uniform, planar film, without chemical crosslinking, substantial polymer degradation or ablation.