Overview

The earliest paper identified on this technique was published in 1996, in which energy dispersive analysis using X-rays (EDAX) was used for elemental analysis in order to map the non-crystalline regions in semicrystalline polyethylene terephthalate (PET) [1].

Applications of scanning electron microscopy (SEM) to polymer characterisation and microstructure include studies on the zwitterions-type polymer, poly(3-diethyl methylmethacryloyl ethyl) ammonium persulfonate grafted on to a silica surface by treatment of poly(2-dimethyl amino) ethyl methacrylate [2], polyaniline coated glass fibre fillers with different polyaniline contents [3], and also studies on ultra high molecular weight blends [4] and high-density polyethylene (HDPE)-gamma ferric oxide composite films [5].

Stuart and Mauritz [6] used environmental SEM-EDAX, and also AFM and transmission electron microscopy, to study the formation of organic-inorganic nanocomposites within Surlyn (polyethylene- co-methacrylate cation forms) random copolymers. SEM-EDAX has also been used to study thin films of Prussian blue and N-substituted polypyrrols [7] and epoxy resins [8].

Duan and Mukherjee [9] characterised Si-CNO nanowires [9] functionalised polyureasilazane followed by heat treatment. SEM, together with ¹³C-nuclear magnetic resonance energy dispersive x-ray analysis and x-ray diffraction between them, enabled the mechanism of the reaction to be determined.

SEM and EDAX have been used in the examination of the structural detail of polymer surfaces. Thus, Dilsiz and co-workers [10] used SEM and EDAX to examine silver coatings of spindle- and filament-type particles for conductive adhesive properties. The same technique was used by Lambert and co-workers [11] to examine the silicate structure deep in PET comonomer/silicate...