The IMS5400-TH white light interferometer is used for highly accurate thickness measurements from a relatively large distance. A decisive advantage here is the distance-independent measurement, where a nanometer-accurate thickness value is achieved even with moving objects. The large thickness measuring range allows the measurement of thin layers, flat glass and films. Since the white light interferometer works with an SLED in the near infrared range, thickness measurement of anti-reflective coated glass is also possible.

With the multi-peak controller variant, several signal peaks can be evaluated simultaneously. This allows multi-layer thickness measurement of transparent objects and laminated glass. The controller outputs the thickness values with the highest stability regardless of their position. Robust sensors and a controller in a metal housing make the system ideally suitable for integration into production lines.