The innovative IMS5200-TH white light interferometer from Micro-Epsilon opens up new perspectives in the nanometer-precise inline inline measurement of thin films.

 With a measurement rate of up to 24 kHz, the IMS5200-TH controller is ideally suited for dynamic industrial applications. Transparent materials with a coating thickness of 1 µm to 100 µm are detected by the high-precision IMP TH-26 sensor. The factory calibration of the sensor and controller enables nanometer-precise air gap and coating thickness measurements. The robust sensor design allows use both in industrial environments and in vacuum environments. The compact design and the large working range allow the sensor to be easily integrated into confined production lines. The multi-peak version enables coating thickness measurements of up to five thin layers.