Analog Control Interferometers
from Micro-Epsilon Group
The IMS5400-DS absolute interferometer opens up new perspectives in industrial distance measurements. The controller has an intelligent evaluation feature and enables absolute measurements with nanometer resolution at a relatively large offset distance. Compared to other absolute measuring optical... [See More]
- User Interface: Analog Control; Digital
- Measurement Capability: Displacement / Position; Specialty / Other; Distance
- Resolution: 1.00
- Optical Configuration: NIR-SLED interferometer
from Micro-Epsilon Group
The IMS5600-DS absolute interferometer is used for distance measurements with maximum precision. The controller offers a special calibration with intelligent evaluation and enables absolute measurements with subnanometer resolution. The interferometer is used for measurement tasks with the highest... [See More]
- User Interface: Analog Control; Digital
- Measurement Capability: Displacement / Position; Specialty / Other; Distance
- Resolution: 0.03
- Optical Configuration: NIR-SLED interferometer
from Micro-Epsilon Group
The IMS5420-TH absolute interferometer opens up new perspectives in the industrial thickness measurement of monocrystalline silicon wafers and silicon carbide wafers and comparable materials that are transparent for a wavelength range of 1,100 nm. Due to its broadband superluminescent diode, the... [See More]
- User Interface: Analog Control; Digital
- Measurement Capability: Thickness; Specialty / Other; Wafer thickness
- Resolution: 1.00
- Optical Configuration: NIR-SLED interferometer
from Micro-Epsilon Group
The innovative IMS5200-TH white light interferometer from Micro-Epsilon opens up new perspectives for fast and reliable thickness measurements of thin layers from 1 µm to 100 µm. The interferometers are used for high-precision thickness measurement of transparent single layers and multilayer... [See More]
- User Interface: Analog Control; Digital
- Measurement Capability: Thickness; Specialty / Other; Thin layer thickness
- Resolution: 1.00
- Optical Configuration: White LED interferometer
from Polytec, Inc.
Polytec Laser Doppler Vibrometers are precision tools for non-contact vibration measurement. Designed to be quick, easy to operate and free from cross-talk or feedback problems, these instruments determine a structure's velocity and displacement from the Doppler shift of back-scattered laser light. [See More]
- User Interface: Analog Control
- Measurement Capability: Displacement / Position
- Aperture Size: 3.2 to 16
- Applications: Measurement on Fine Bonding Wires