Specialty / Other Interferometers
from Zygo Corporation
The new ZYGO DynaFiz ® dynamic laser interferometer is a highly optimized optical instrument designed specifically for performing accurate metrology of optics in the presence of air turbulence and extreme vibrations. The high light efficiency of the DynaFiz ® interferometer's optical system,... [See More]
- Measurement Capability: Specialty / Other; Designed Specifically for Performing Accurate Metrology of Optics in the Presence of Air Turbulence and Extreme Vibrations
- Repeatability: RMS Simple Repeatability < 0.06 nm; RMS Wavefront Repeatability < 0.35 nm
- Zoom: 1 to 50
- Optical Configuration: Fizeau
from Micro-Epsilon Group
The IMS5400-DS absolute interferometer opens up new perspectives in industrial distance measurements. The controller has an intelligent evaluation feature and enables absolute measurements with nanometer resolution at a relatively large offset distance. Compared to other absolute measuring optical... [See More]
- Measurement Capability: Displacement / Position; Specialty / Other; Distance
- Optical Configuration: NIR-SLED interferometer
- Resolution: 1.00
- User Interface: Analog Control; Digital
from Micro-Epsilon Group
The IMS5600-DS absolute interferometer is used for distance measurements with maximum precision. The controller offers a special calibration with intelligent evaluation and enables absolute measurements with subnanometer resolution. The interferometer is used for measurement tasks with the highest... [See More]
- Measurement Capability: Displacement / Position; Specialty / Other; Distance
- Optical Configuration: NIR-SLED interferometer
- Resolution: 0.03
- User Interface: Analog Control; Digital
from Micro-Epsilon Group
The IMS5420-TH absolute interferometer opens up new perspectives in the industrial thickness measurement of monocrystalline silicon wafers and silicon carbide wafers and comparable materials that are transparent for a wavelength range of 1,100 nm. Due to its broadband superluminescent diode, the... [See More]
- Measurement Capability: Thickness; Specialty / Other; Wafer thickness
- Optical Configuration: NIR-SLED interferometer
- Resolution: 1.00
- User Interface: Analog Control; Digital
from Micro-Epsilon Group
The IMS5420IP67-TH absolute interferometer is designed for industrial wafer thickness measurement in challenging environmental conditions such as wafer lapping. The IP67 controller with stainless steel housing provides stable signal quality for inline measurements of silicon wafers and air gaps. [See More]
- Measurement Capability: Thickness; Specialty / Other; Wafer thickness
- Optical Configuration: NIR-SLED interferometer
- Resolution: 1.00
- User Interface: Digital
from Micro-Epsilon Group
The IMP DS0.5/90/VAC is a right-angle distance sensor for absolute interferometer measurements with a 1.5 mm distance measuring range, a 10 µm light spot and a start of measuring range of 0.5 mm. The cable and sensor are designed for UHV operation. [See More]
- Measurement Capability: Displacement / Position; Specialty / Other; Distance
- Operating Temperature: 41 to 158
- Optical Configuration: NIR-SLED interferometer
from Micro-Epsilon Group
The IMP DS1/VAC is a miniature distance sensor for absolute interferometer measurements with a 1 mm distance measuring range, a 10 µm light spot and an integrated vacuum optical fiber. It is designed for UHV cable and sensor operation in restricted installation spaces. [See More]
- Measurement Capability: Displacement / Position; Specialty / Other; Distance
- Operating Temperature: 41 to 158
- Optical Configuration: NIR-SLED interferometer
from Mahr Inc.
Product features. Full Featured 40 mm Fizeau Interferometer for Flat or Spherical Surfaces. The MarSurf FI 1040 Z is a full-featured interferometer that can provide non-contact measurement of flat or spherical surfaces and transmitted wavefront of optical components and assemblies. The MarSurf FI... [See More]
- Measurement Capability: Spherical Elements; Specialty / Other; Flat and Spherical Surfaces
- Applications: Transmission and Surface Testing of Small Optics; Measurements on Optics, Machined Parts, Ceramics, Semiconductors, and Wafers
- Zoom: 3
- Optical Configuration: Fizeau
from Qioptiq
Many physical occurrences can be described in terms of waves. The emission of radio waves and the emission of light waves from light sources are all examples of this phenomena. If we overlap these waves, we can observe the phenomena known as interference. It is sometimes much easier to view the... [See More]
- Measurement Capability: Displacement / Position; Flatness; Specialty / Other; Angles, Velocity, Geometrical Forms, and More
from Mahr Inc.
Product features. High Accuracy Measurement Capability with Unsurpassed Flexibility and Versatility. The MarSurf FI 1100 Z interferometer provides non-contact measurement of flat or spherical surfaces along with transmitted wavefront measurements of optical components and assemblies. Measurements... [See More]
- Measurement Capability: Specialty / Other; Flat and Spherical Surfaces
- Applications: Measurement of Flat, Concave or Convex Surfaces; Prism, Corner Cube, Wedge Angle and Homogeneity Measurements; Measurement of Machined, Ceramic
- Zoom: 1 to 6
- Orientation: Horizontal