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  • Failure Analysis of Die Bond Adhesion Failures Caused by Silicone Contamination
    surfaces. The wafer mounting film is analyzed by Fourier Transform Infrared Spectroscopy. A process related failure in conductive die attach systems is described and corrective actions are presented. This analytical approach can be extended to other epoxy attach materials systems.
  • Electronic Device Repair Die Cuts
    An electronic device repair company was using a double-sided acrylic film tape to attach a face onto an Apple Watch. The customer wanted the rolls of tape slit to 2mm and 8mm widths. The converter they were previously working with could not consistently slit to such narrow widths and the rolls were

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