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Supplier: SAE International
Description: product quality judgments. Some years ago, a "Hearing Model" was developed explaining and describing many psychoacoustic effects [ 1 ], [ 2 ], and allowing for roughness calculation in accordance with subjective listening tests [ 3 ]. Existing roughness models work well for
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Supplier: Accuris
Description: Surface roughness - Guidance for attainable roughness values R[a] for various machining operations
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Supplier: Accuris
Description: Roughness Comparison Specimens Part 3: Cast Surfaces
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Standards and Technical Documents - Standard Practice for Quantifying Roughness of Pavements -- R 43Supplier: Accuris
Description: Standard Practice for Quantifying Roughness of Pavements
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Supplier: Accuris
Description: Roughness Comparison Specimens - Part III: Cast surfaces
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Supplier: Mahr Inc.
Description: "sMAHRtSurf" - Simple, smart and mobile Compact roughness measuring instrument for mobile use Simple and intuitive to use: As easy to use as a smart phone Large, illuminated 4.3" TFT touch display Adjustable display Start button also
- Display & Special Features: Video / Graphic Display
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Mounting / Loading: Handheld / Portable
- Standards Compliance: ISO / EN, DIN
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Supplier: Mahr Inc.
Description: and 30 profiles 16 languages (including 3 Asian languages) Integrated thermal graphics printer with high print quality Print the R-profile via the thermal graphics printer Printed log either by pressing a button or automatically Data transfer of results and
- Display & Special Features: Digital Readout
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Mounting / Loading: Handheld / Portable
- Operating Temperature: 23 to 104 F
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Supplier: Mahr Inc.
Description: Product features Bright, illuminated color display Automatic selection of filter and traversing length conforming to standards Integrated thermal graphics printer of high print quality Print the r-profile via the thermal graphics printer
- Display & Special Features: Digital Readout
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Mounting / Loading: Handheld / Portable
- Operating Temperature: 23 to 104 F
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Supplier: Mahr Inc.
Description: Mahr stands for innovative roughness evaluation software. Features Over 80 surface parameters for R-, P- and W-profiles according to current ISO/JIS or MOTIF standards (ISO 12085) Bandpass filter Ls in accordance with current standard; Ls can also be switched off or varied as
- Display & Special Features: Computer Interface / Networkable
- Industrial Applications: Aerospace / Defense, Automotive, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Mounting / Loading: Benchtop
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Supplier: SAE International
Description: This SAE Recommended Practice describes a method for measuring Roughness Average (R a ) and Peak Count (PC) of the surface of cold-rolled steel sheet.
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Supplier: SAE International
Description: , the development model is tested with new stimuli not used in the development of the model; also for these new stimuli a good agreement of R\u2082 = 88% could be achieved. After the discussion of the roughness prediction model, parameter variations for an automotive internal
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Description: ISO 8791-3:2005 specifies a method for the determination of the roughness of paper and board using the Sheffield apparatus. The method is applicable to papers and boards which have Sheffield roughness values between 10 and about 3 000 ml per min. It is not suitable for
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Supplier: American Welding Society (AWS)
Description: This document is an aid to assist users, inspectors, and producers in communicating among one another their needs with regard to the oxygen-cut surface.
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Supplier: CSA Group
Description: ISO 8791-3:2017 specifies a method for the determination of the roughness of paper and board using the Sheffield apparatus. ISO 8791-3:2017 is applicable to papers and boards which have Sheffield roughness values between 10 ml/min and about 3 000 ml/min. It is not
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Supplier: ASTM International
Description: variations. 1.3 This test method describes the computation required for one particular type of roughness index, the vehicle simulation used in the International Roughness Index (IRI). Additionally, the profile obtained with this test method can be processed to obtain other
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Supplier: ASTM International
Description: variations. 1.3 This test method describes the computation required for one particular type of roughness index, the vehicle simulation used in the International Roughness Index (IRI). Additionally, the profile obtained with this test method can be processed to obtain other
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Supplier: ASTM International
Description: . 1.3 This test method describes the computation required for one particular type of roughness index, the vehicle simulation used in the International Roughness Index (IRI). Additionally, the profile obtained with this test method can be processed to obtain other
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Supplier: ASTM International
Description: parameters (Ra, Rt, and RzISO) 1.3 This standard specifies two different standardized procedures for measuring the surface roughness of PM parts. 1.3.1 Method 1 uses a conical stylus and a Gaussian filter. 1.3.2 Method 2 uses a
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Supplier: SAE International
Description: This SAE Recommended Practice describes a method for measuring Roughness Average (R a ) and Peak Count (PC) and other variables of the surface of metallic coated and uncoated steel sheet/strip.
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Supplier: CSA Group
Description: ISO 8791-2:2013 specifies a method for the determination of the roughness of paper and board using the Bendtsen apparatus. ISO 8791-2:2013 is applicable to paper and board which have Bendtsen roughness values between about 5 ml/min and 3 000 ml/min when measured with
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Description: ISO 8503-2:2012 describes a visual and tactile method for assessing the grade of the profile which is produced by one of the abrasive blast-cleaning procedures described in ISO 8504-2. The method uses ISO surface profile comparators for assessing, on site, the roughness of surfaces
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Description: ISO 8503-3:2012 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503-1. It is also applicable to the determination of the surface profile, within the range of 20 µm to 200 µm, of
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Supplier: Zygo Corporation
Description: The ZeGage™ optical profiler is the ideal non-contact tool for quantitative measurements of 3D form and roughness on precision machined surfaces. The industrial design provides fast, accurate metrology in a compact, cost-effective package that can be located directly on the factory
- Mounting Options: Benchtop
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Supplier: Zygo Corporation
Description: select a profiler based on the type of surface you want to measure. The Nexview™ NX2 profiler measures topography of virtually any surface from a super polished optical surface with sub-Angstrom surface roughness, to steep machined angles up to 85 degrees. It does all this in 3D,
- Control: PC
- Mounting Options: Free Standing
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Supplier: Zygo Corporation
Description: The NewView™ 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped, and stepped. All measurements are nondestructive, fast
- Control: Manual, PC
- Mounting Options: Benchtop
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Supplier: LMI Technologies
Description: MikroCAD delivers sub-micron accuracy and repeatability on a variety of challenging scan surfaces such as shiny, reflective and steep edges, in contrast to confocal solutions that are unable to handle steeply angled geometries. With MikroCAD 3D Surface Metrology you can: Measure
- Features: Reverse Engineering
- Mounting Options: Benchtop
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Supplier: Park Systems, Inc.
Description: Park Systems has revolutionized the AFM with the introduction of the XE-3DM, the fully automated AFM system designed for overhang and trench profiles, sidewall roughness and imaging, and critical angle measurements. The unique design of the XE-3DM, made possible by the
- Applications: Semiconductor Wafers
- Form Factor: Monitor / Instrument
- Measurement Capability: Critical Dimension / Trench Geometry, Defects / ADC, Roughness / Waviness
- Mounting / Loading: Floor Mounted / Stand-alone
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Supplier: Precipart
Description: micro 3D printing technology and micro laser sintering solutions. Materials Metals: Stainless steel 316L, Molybdenum, Tungsten, Titanium Ceramics: Alumina, Zirconia Micro Laser Sintering – MLS Accuracy ± 5 µm up to 10 mm
- Capabilities: Other
- Regional Preference: North America, United States Only, Northeast US Only, Canada Only, Europe Only, South Asia Only
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Supplier: AENOR
Description: ROUGHNESS COMPARISON SPECIMENS. PART 3: CAST SURFACES.
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Supplier: MicroSense, LLC
Description: Automated Wafer Thickness Measurement System Cassette to cassette or manual loading. Exclusive sensing technology with dual White light chromatic coding probes (10nm resolution) Wafer 4” to 12” (100 to 300mm) Thickness range: 50um to 3mm
- Applications: Semiconductor Wafers
- Form Factor: Monitor / Instrument
- Maximum Wafer / Part Size: 100 to 300 mm
- Measurement Capability: Roughness / Waviness, Thickness - Wafer / Disc (TTV)
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: 3-in-1 form, contour and surface measurement in one setting For large, precision parts for the wind, power and bearing industries Precision rotary table on air bearings with 80 nanometer rotation accuracy Form tester, contour measuring instrument and
- Display & Special Features: Computer Interface / Networkable, SPC / Software Capability
- Industrial Applications: Other
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Specialty / Custom
- Mounting / Loading: Floor / Free Standing
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Supplier: Bruker Corporation
Description: Bruker's Dektak® stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and
- Display & Special Features: Computer Interface / Networkable
- Industrial Applications: Electronics, Semiconductor Manufacturing, Other
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
- Mounting / Loading: Benchtop, Floor / Free Standing
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Supplier: Bruker Corporation
Description: , WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically
- Applications: Semiconductor Wafers, Other
- Measurement Capability: Defects / ADC, Roughness / Waviness
- Technology: Profilometer / AFM, X-ray Diffractometer
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Supplier: Phenom-World BV
Description: image interpretation. Some examples are Fibermetric - automated measurements and classification of fiber and filter samples, 3D Roughness Reconstruction, and Automated Image Mapping - an automated way of collecting high-resolution overview images. A large variety of sample holders is
- Applications: Semiconductor Wafers, CVD / PVD Films, Packaged ICs / Ceramic Substrates
- Area Mapping: Yes
- FIB / Ion Mill: Yes
- Form Factor: Monitor / Instrument
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Supplier: Polytec, Inc.
Description: -Doppler Vibrometry, Stroboscopic Video Microscopy and White Light Interferometry, the MSA-500 is designed with an all-in-one combination of technologies that clarifies real microstructural response and topography. Incorporated in the MEMS design and test cycle, the MSA-500 provides precise
- Applications: Other
- Form Factor: Sensor / Sensing Element
- Measurement Capability: Roughness / Waviness, Shape / Flatness, Other
- Mounting / Loading: Manual Loading
![Surface roughness - Guidance for attainable roughness values R[a] for various machining operations -- NPR 3638](https://partimages.globalspec.com/47/4497/8399497_medium.png "Surface roughness - Guidance for attainable roughness values R[a] for various machining operations -- NPR 3638")
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that includes all 3 components. But, in reality, this is somewhat misleading. To get a really good look at surface roughness, first form has to be removed and then the waviness. How Do You Measure Just the Roughness? Non-contact, 3D (read more)
Browse Surface Profilometers Datasheets for Zygo Corporation -
you want to measure. The Nexview NX2 profiler measures topography of virtually any surface from a super polished optical surface with sub-Angstrom surface roughness, to steep machined angles up to 85 degrees. It does all this in 3D, without contact, and provides the best qualities of (read more)
Browse Dimensional and Profile Scanners Datasheets for Zygo Corporation -
±5% ?Min±0.03mm? Warp?C? mm ≤0.3% ≤0.3% ≤0.3% ≤0.3% Surface Roughness μm 0.2-0.6 0.2-0.5 0.2-0.75 0 (read more)
Browse Ceramic Sheets and Boards Datasheets for Xiamen Innovacera Advanced Materials Co., Ltd. -
. Correlates to 2D and 3D standards, and complies with ISO 25178 surface roughness parameters. High-resolution 1 million pixel image sensor provides fast areal measurements in seconds, for excellent surface detail and visualization. Integrated autofocus and focus aid simplify (read more)
Browse Surface Metrology Equipment Datasheets for Zygo Corporation -
3D Optical Surface Profiler The NewView™ 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped (read more)
Browse Dimensional and Profile Scanners Datasheets for Zygo Corporation -
?N? Appearance – – grey Surface roughness Ra μm 0.2~0.75 Density – g/cm 3 ≥3.2 (read more)
Browse Thermal and Refractory Ceramics Datasheets for Xiamen Innovacera Advanced Materials Co., Ltd. -
purging. 3.maximizes flow capacity. Diaphragm *Hastelloy C-22 or cobalt-based superalloys (UNS R30003) material for strength and corrosion resistance. *Optimal design for long cycle life. Seat *Fully contained PCTFE seat design provides (read more)
Browse Diaphragm Valves Datasheets for Shenzhen Jewellok Technology Co., Ltd. -
Ra 5 μin, and the flow channel can be completely cleaned. 1.minimizes entrapment areas. 2.facilitates purging. 3.maximizes flow capacity. Diaphragm *Hastelloy C-22 or cobalt-based superalloys (UNS R30003) material for strength and corrosion resistance (read more)
Browse Diaphragm Valves Datasheets for Shenzhen Jewellok Technology Co., Ltd. -
. 3.maximizes ?ow capacity. Diaphragm *Hastelloy C-22 or cobalt-based superalloys (UNS R30003) material for strength and corrosion resistance. *Optimal design for long cycle life. Seat *Fully contained PCTFE seat design provides: 1 (read more)
Browse Diaphragm Valves Datasheets for Shenzhen Jewellok Technology Co., Ltd. -
channel can be completely cleaned. 1.minimizes entrapment areas. 2.facilitates purging. 3.maximizes flow capacity. Diaphragm *Hastelloy C-22 or cobalt-based superalloys (UNS R30003) material for strength and corrosion resistance. *Optimal design for long (read more)
Browse Diaphragm Valves Datasheets for Shenzhen Jewellok Technology Co., Ltd.
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ZCP2002HT001
The three nitrocarburized stainless steels, austenitic, duplex ferritic-austenitic and the super-ferritic, had their (RA, RZ, Rmax, RT and e R3Z ) surface roughness determined.
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Calculation of Unsteady Hydrodynamic Lubrication and Surface Contact at the Piston-Ring / Cylinder-Liner Interface
A higher roughness (high R3z value) with symmetrical amplitude distribution gives rise simultaneously to a higher lubricating film thickness, hnom, (depending on the compliance of the roughnesses).
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Effect of Initial Cylinder Liner Honing Surface Roughness on Aircraft Piston Engine Performances
Average third highest peak to third lowest valley height within one five sample length: the roughness profile ( R3z , lm .
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Understanding Surface Texture Parameters
Among the largest set of parameters, roughness parameters include Swedish height (H), areal flatness deviation (ISO flatness), total peak-to-valley profile height (Pt ISO), base roughness depth ( R3z ), base roughness profile depth (R3z ISO), arithmetical mean deviation (Ra), Kurtosis (Rku),maximum …
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Quantitative surface roughness measurements using multivariate data analysis in speckle interferometry
Finally, the regression models created for four exemplary roughness parameters Rq, R3z , Rp, and Mr1 are discussed and the accuracy in the prediction .
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Textbook of Aging Skin
In contrast to the cream, twice daily treatment for 2 months with the placebo formulation (identical cream without PSP) did not result in significantly changed roughness parameters Rzmax, R3z , R3zmax, and RzISO; whereas only Ra and Rz significantly .
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Preliminary study in the evaluation of anti‐aging cosmetic treatment using two complementary methods for assessing skin surface
Both of them utilize roughness parameters such R2/ R3z , R3/Rmax, R5/Ra or RKU,while Primos gener- ates additional parameters like -S (mean spacing of local peaks of the profile), Wt (waviness height) and PC (peak count/density) allowing varied presentation of the acquired …
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AMST’05 Advanced Manufacturing Systems and Technology
^^^ To the aim to make inquiries about the maximum and minimum value on the roughness profile, the parameter R3Z is liked better than Ra because it protects from possible local imperfections of the material or exceptional data.
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Analysis of Oil Emission Mechanisms by Simulation and Mass Spectrometry
DEFINITIONS/ABBREVIATIONS amu atomic mass units FVV Forschungsvereinigung Verbrennungskraftmotoren Mr1 Peak material component Mr2 Valley material component PFI Port fuel injection ppm parts per million R3z Average peak to valley profile roughness Ra Average deviation of the roughness profile from the mean line …
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A comparison of surface roughness of pipes as measured by two profilometers and atomic force microscopy
… distance coordinate along the measurement axis y = distance coordinate perpendicular to the measure- ment axis Ra = arithmetic average roughness Rmax = maximum individual peak-to-valley height Rq = root-mean-square roughness RZD = mean peak-to-valley height R3Z = arithmetic average of third …