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Supplier: Quantachrome Instruments
Description: The AutoFlow BET+™ is a fully automated state-of-the-art dynamic flow system designed to enable an extremely rapid evaluation of the surface areas of solid samples. Single-point or multi-point determination of surface areas using different standard methods (such as
- Display & Special Features: Computer Interface / Networkable, Digital Readout, Laboratory / Batch, SPC Software / Capability
- Property Analyzed: Surface Area - Total
- Test Media / Material: Wood / Wood Product
- Total Surface Area Range: 0.0100 m²
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Surface Area and Pore Size Analyzers - Accelerated Surface Area and Porosimetry System -- ASAP® 2420Supplier: Micromeritics
Description: Micromeritics ASAP® 2420 Accelerated Surface Area and Porosimetry System uses the gas sorption technique to generate high-quality data for applications that require high performance/high sample throughput. Standard features include six independently operated analysis
- Display & Special Features: Computer Interface / Networkable, Laboratory / Batch
- Property Analyzed: Pore Volume / Porosimetry, Surface Area - Specific
- Test Media / Material: Adhesives / Coatings, Ceramics / Glass, Chemicals, Food / Drugs, Geological (Rock, Strata, etc.), Metals, Powders / Granular Materials, Other
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Supplier: Micromeritics
Description: The Flowsorb III 2305 / 2310 provides single-point and multipoint BET surface area measurements with speed, accuracy, and reliability. Samples having surface areas from 0.01 m2/g to over 1,000 m2/g are easily accommodated. The FlowSorb III measures
- Display & Special Features: Digital Readout, Laboratory / Batch
- Property Analyzed: Surface Area - Specific, Surface Area - Total
- Specific Surface Area Range: Over 0.0100
- Test Media / Material: Porous Materials (Filters, Foam, etc.), Powders / Granular Materials
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Surface Area and Pore Size Analyzers - Accelerated Surface Area and Porosimetry System -- ASAP® 2020Supplier: Micromeritics
Description: High Performance in a Compact Footprint Accurate and precise surface area and porosimetry measurements are essential to the determination of the effectiveness and quality of a wide variety of materials. The Micromeritics ASAP 2020 integrates multiple gas sorption techniques into a
- Display & Special Features: Computer Interface / Networkable, Laboratory / Batch
- Property Analyzed: Pore Volume / Porosimetry, Surface Area - Specific
- Test Media / Material: Adhesives / Coatings, Ceramics / Glass, Chemicals, Food / Drugs, Metals, Powders / Granular Materials, Other
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Supplier: Micromeritics
Description: volumetric systems. Accelerates delivery of the analysis gas because sample uptake controls the rate at which the gas is delivered to the sample. This results in a surface area analyzer that is as fast as the physics of adsorption allows The use of a servo valve to
- Display & Special Features: Computer Interface / Networkable, Digital Readout, Laboratory / Batch, SPC Software / Capability
- Property Analyzed: Surface Area - Specific, Surface Area - Total
- Test Media / Material: Adhesives / Coatings, Ceramics / Glass, Chemicals, Food / Drugs, Fuel, Porous Materials (Filters, Foam, etc.), Powders / Granular Materials, Other
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Supplier: Quantachrome Instruments
Description: pressures for true micropore analysis. This is also the model for very low surface area and thin film analyses using krypton gas. A typical physisorption analysis starts with degassing of the sample. The desired protocol of heating rates, hold times and automatic testing
- Display & Special Features: Computer Interface / Networkable, Laboratory / Batch, SPC Software / Capability
- Property Analyzed: Pore Volume / Porosimetry, Surface Area - Total
- Test Media / Material: Powders / Granular Materials
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Supplier: Quantachrome Instruments
Description: NOVAtouch™ Series High Speed Surface Area and Pore Size Analyzer Introducing the Next Generation of NOVA Analyzers Now with Advanced Touchscreen and Higher Throughput Capabilities The NOVAtouch™ provides the next generation of NOVA analyzer
- Display & Special Features: Computer Interface / Networkable, Graphic / Video Display, Laboratory / Batch
- Property Analyzed: Pore Distribution, Pore Volume / Porosimetry, Surface Area - Total
- Test Media / Material: Ceramics / Glass, Food / Drugs, Metals, Porous Materials (Filters, Foam, etc.), Powders / Granular Materials, Soil
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Supplier: Tekscan, Inc.
Description: K-Scan System Provides a better understanding of how the contact surfaces of articulating bones are functioning and loading for objective joint analysis. What is the K-Scan™? The K-Scan Joint Analysis System utilizes paper-thin sensors to provide accurate data for
- Application: Medical / Biomedical
- Application Software Included: Yes
- Auxiliary Outputs: Other
- Connection to Host: USB
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Supplier: AMETEK Surface Vision
Description: Using AMETEK Surface Vision’s patented camera synchronization technology, SmartAdvisor® Process Inspection simplifies the viewing and analysis of upsets, and their root cause, across continuous production processes. Combining multiple synchronized cameras with
- Applications / Capabilities: Flaw Detection, Web Inspection
- Image Source: Area Scan Camera
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Supplier: AMETEK Surface Vision
Description: An industry-leading video monitoring system, SmartAdvisor® Process Monitoring finds defects and upsets across the process, from root cause to failure. Single-screen analysis from several cameras reduces the troubleshooting time, which means the causes of process
- Applications / Capabilities: Flaw Detection, Web Inspection
- Image Source: Area Scan Camera
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Supplier: Radiant Vision Systems
Description: The Area Color Inspection System (ACIS?) is an integrated solution for efficient inspection of characters and color on surfaces such as metal or plastic. Users can quickly measure markings such as pattern, text, symbols, and color with near-spectrometer accuracy at production
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Supplier: AMETEK Surface Vision
Description: Using high-speed cameras, perfectly synchronized, SmartAdvisor® Surface Monitoring simplifies the monitoring and analysis of surface images. By unifying the images from multiple cameras, the system delivers a comprehensive monitoring and inspection solution across
- Applications / Capabilities: Flaw Detection, Web Inspection
- Image Source: Area Scan Camera
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Supplier: Haida International Equipment Co., Ltd.
Description: Automatic sampling gas chromatograph is used for quantitative and qualitative analysis to determine the physical and chemical constants such as the distribution coefficient, activity coefficient, molecular weight and surface area of the sample in the fixed phase. An instrument
- Applications: Other
- Detection Method: Thermal Conductivity Detector, Flame Ionization Detector, Electron Capture Detector, Flame Photometric Detector, Nitrogen Phosphorous Detector
- Flow Control: Yes
- Instrument Type: Fixtured or Permanent
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Supplier: AMETEK Surface Vision
Description: SmartAdvisor’s synchronized system along with the flexibility and proven quality of SmartView’s industry-leading surface inspection solution. SmartView’s advanced classification can be configured to trigger an event capture across multiple SmartAdvisor data points on the production
- Applications / Capabilities: Edge Detection, Flaw Detection, Web Inspection
- Image Source: Area Scan Camera, Line Scan Camera
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Description: New data acquisition techniques are emerging and are providing fast and efficient means for multidimensional spatial data collection. Airborne LIDAR surveys, SAR satellites, stereo-photogrammetr y and mobile mapping systems are increasingly used for the digital reconstruction of the
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Supplier: Nikon Metrology
Description: . A wide field of view enables easy confirmation of measurement areas and provides unparalleled operation. Its broader XYZ measurement range, with a longer working distance than ever before, provides ultimate versatility for measurement of both large and tall mechanical parts and uneven
- Applications / Capabilities: Electronics or Semiconductor Inspection, Flaw Detection, Materials Analysis, Production & Quality Control
- Image Source: Optical Microscope
- System Type: Turnkey / Complete System
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Supplier: Nikon Metrology
Description: software and incorporates a new 10x optical zoom system and Laser Auto Focus option. Applications Surface analysis, Surface examination, Manual examination, Plastic manufacturing, Metal manufacturing Implants/ Protheses, Mobile phones, shavers & watches
- Applications / Capabilities: Electronics or Semiconductor Inspection
- Image Source: Confocal Laser
- System Type: Turnkey / Complete System
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Supplier: LMI Technologies
Description: surface structure of shiny, hard, soft and deformable objects. (MikroCAD is ideal for characterizing manufactured materials made from metals, paper, rubber, etc.)Measure evenness/flatness on large areasMeasure wearImprove fiber-level manufacturing processesAnalyze edges of tools such
- Applications / Capabilities: Edge Detection, Gauging, Scanning & Dimensioning, Materials Analysis
- Image Source: Area Scan Camera, High Speed / Brightness
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Supplier: SAE International
Description: A modified membrane-aerated biofilm reactor (mMABR) was constructed by incorporating two distinct biofilm immobilization media: gas-permeable hollow fiber membranes and high surface area inert bio-media. In order to evaluate the mMABR for space flight applications, a synthetic ersatz
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Supplier: ASTM International
Description: 1.1 This test method covers the use of image analysis to determine the level of dirt in pulp, paper, and paperboard in terms of Equivalent Black Area (EBA) of dirt specks within the physical area range of 0.02 to 3.0 mm2 reported in parts per million as well as the number of
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Supplier: SAE International
Description: holography algorithm. Multiple array positions can be measured to cover the needed mesh area, and area-integration of contributions is then performed on the surface mesh. Measurement or alignment of surface mesh geometry and measurement of array positions is performed
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Description: pools, empirical analysis of the attack surface of Blockchain, and more Written for researchers and experts in computer science and engineering, Blockchain for Distributed Systems Security contains the most recent information and academic research to provide an understanding of
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Supplier: Zygo Corporation
Description: Mx™ for 3D Optical Profilers ZYGO's Mx™ software powers complete system control & data analysis, including interactive 3D maps, quantitative topography data, intuitive navigation, & built-in SPC with statistics, control charting, and pass/fail limits. World
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Supplier: Cygnus Instruments Limited
Description: the member, even when approached from an angle. The system also has a contact sensor which will not allow a test to be taken unless the probe is correctly aligned. The system returns a simple DRY / FLOODED result to the reporting software with results logged at the surface. •
- Leak Test Method: Ultrasonic Leak Detector
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Description: convert the ion-sputtering time scale to sputtered depth in a depth profile by assuming a constant sputtering velocity. This method has not been designed for, or tested using, a scanning probe microscope system. It is not applicable to the case where the sputtered area is less than 0,4
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Image Analysis Software - INSPECT.assembly Automated Visual Inspection Station -- INSPECT.assemblySupplier: Radiant Vision Systems
Description: dynamic range of the ProMetric camera sensor enables the system to detect hairline variations on part surfaces caused by reflections of light (like shadows that indicate a drill hole, or spectral reflections that indicate a metal component). Install Directly onto Production Lines The
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Description: , sample preparation, specific surface area and porosity characterization and measurement methods including sedimentation, classification, acoustic methods, laser diffraction, dynamic light scattering, single particle light interaction methods, differential electrical mobility
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Supplier: AMETEK Sensors, Test & Calibration
Description: Overview The system is capable of storing up to 600 test results from a choice of 10 programmable test set-ups. For enhanced performance, the TAPlus can be used with Lloyd Instruments NEXYGENPlus data analysis software . The software contains an extensive library of
- Display & Special Features: Digital Readout, Laboratory / Batch
- Property Analyzed: Texture Analysis
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Supplier: Fischer Technology, Inc.
Description: : Measurements on extremely small sample areas Analysis of ion-implanted surfaces Testing of nano layers with sensors Matrix effects in alloys Measurement of biological materials Determination of the plastic and elastic properties on cross
- Hardness Testers: Vickers and Knoop, Other
- Mounting: Fixtured or Permanent
- Test Load: 5.10E-7 to 0.0510 kg
- Test Method: Micro
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Supplier: Plasma Etch, Inc.
Description: Benefits to you are better adhesion or marking, cleaner parts with less labor and reduced chemical expense by eliminating unwelcome and often expensive chemical waste associated with cleaning and priming. The large all aluminum chamber accommodates a generously sized active processing
- Applications & Materials Processed: Research / Surface Analysis, Other
- Automated Loading: Yes
- Coating System Type: Factory / Free Standing
- Gas Control Unit: Yes
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Supplier: Tekscan, Inc.
Description: high resolution. 250K sensing elements over a 508 mm x 508 mm (20 in. x 20 in.) area allows the system to measure footprints across a diverse tire portfolio (car to truck tires). The ruggedized housing is designed to handle harsh environments, allowing the system to collect
- Application: Vehicular
- Auxiliary Outputs: Other
- Connection to Host: USB
- Form Factor: Stand Alone / Benchtop
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Supplier: CSA Group
Description: convert the ion-sputtering time scale to sputtered depth in a depth profile by assuming a constant sputtering velocity. This method has not been designed for, or tested using, a scanning probe microscope system. It is not applicable to the case where the sputtered area is less than 0,4
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Supplier: KRÜSS Scientific
Description: cleanliness and wettability and measuring differences between coated/uncoated or treated/untreated areas Wetting analysis at controlled temperature and/or humidity Measuring surface tension of hot liquids, e.g. hotmelts
- Display & Special Features: Computer Interface / Networkable, Laboratory / Batch
- Property Analyzed: Surface Energy / Tension, Wettability / Contact Angle
- Test Media / Material: Adhesives / Coatings, Ceramics / Glass, Metals, Polymers (Plastics, Elastomers), Pulp / Paper, Wood / Wood Product
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Supplier: SAE International
Description: The basis for the analysis of friction in brake systems is the brake pad's tribological interface. An investigation of this interface reveals friction intensive surface structures, so-called 'patches'. Their development is determined by an equilibrium of flow, which depends on
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Supplier: Tekscan, Inc.
Description: high resolution. 250K sensing elements over a 508 mm x 508 mm (20 in. x 20 in.) area allows the system to measure footprints across a diverse tire portfolio (car to truck tires). The ruggedized housing is designed to handle harsh environments, allowing the system to collect
- Electrical Output: Other
- Electronic/Digital Image: Yes
- Flexible: Yes
- Imager/Sensor Type: Active Pressure Sensor Arrays
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Supplier: SAE International
Description: dynamic load distribution among wheel stations. Furthermore, parametric analysis shows that natural frequencies of truck with HIS system depend on piston surface areas and installation schematics of actuators. Tire dynamic load coefficients can be favorable changed by
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Supplier: Miles Scientific (Analtech)
Description: These transilluminators are high performance units specially designed for fluorescence analysis, including TLC plates and electrophoresis gels. They are also well suited for DNA related research. The available transilluminators are compatible with Analtech's documentation & densitometry
- Illuminator Output: 90 watts
- Illuminator Type: Area / Backlight
- Light Source: Lamp
- Wavelength: 365 nm
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Supplier: Miles Scientific (Analtech)
Description: These transilluminators are high performance units specially designed for fluorescence analysis, including TLC plates and electrophoresis gels. They are also well suited for DNA related research. The available transilluminators are compatible with Analtech's documentation & densitometry
- Illuminator Output: 6 watts
- Illuminator Type: Area / Backlight
- Light Source: Lamp
- Wavelength: 366 nm
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Supplier: Miles Scientific (Analtech)
Description: These transilluminators are high performance units specially designed for fluorescence analysis, including TLC plates and electrophoresis gels. They are also well suited for DNA related research. The available transilluminators are compatible with Analtech's documentation & densitometry
- Illuminator Output: 15 watts
- Illuminator Type: Area / Backlight
- Light Source: Lamp
- Wavelength: 254 nm
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Supplier: Miles Scientific (Analtech)
Description: These transilluminators are high performance units specially designed for fluorescence analysis, including TLC plates and electrophoresis gels. They are also well suited for DNA related research. The available transilluminators are compatible with Analtech's documentation & densitometry
- Illuminator Output: 6 watts
- Illuminator Type: Area / Backlight
- Light Source: Lamp
- Wavelength: 254 nm
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Supplier: CSA Group
Description: , sample preparation, specific surface area and porosity characterization and measurement methods including sedimentation, classification, acoustic methods, laser diffraction, dynamic light scattering, single particle light interaction methods, differential electrical mobility
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Supplier: Fritsch GmbH - Milling and Sizing
Description: For gentle cleaning of analysis sieves, micro-precision sieves and other sensitive parts without damaging them. Also for dispersing of suspensions for particle size analysis. Fill volume: 28 litres Areas of application For especially gentle and damage-free cleaning of even
- Application / Operation: General Cleaning / Surface Prep, Container / Bottle Cleaning
- Automation: None - Manual
- Internal Depth / Height: 13 inch
- Internal Length: 23 inch
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Description: identifying the product structuring of engineering parts and structural parts contained within a space; data identifying the product structuring of compartments in an area of the ship; data required for the definition of design requirements placed on a space by systems within the ship
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Supplier: Zygo Corporation
Description: parameters, including 2D and 3D profiling of surface texture, form, step-height and more. Selectable magnification and field-of-view with numerous imaging and system options. Included Mx software provides comprehensive tools for surface data visualization, analysis and
- Application: Measuring / Toolmaker
- Computer Interface: Yes
- Digital Display: Yes
- Grade: Benchtop
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Supplier: Quantachrome Instruments
Description: architecture (e.g., pore size , pore size distribution, pore volume, and pore interconnectivity) are particularly important because they control transport phenomena and diffusional rates and govern selectivity in catalyzed reactions. The most popular method to obtain surface area, pore
- Industry: Materials / Chemicals
- Modality: Internet / Online
- Technology / Subject: Chemical Engineering, Chemistry / Chemical Analysis
- Type: Seminar / Webinar
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Supplier: Fritsch GmbH - Milling and Sizing
Description: For gentle cleaning of test sieves, micro-precision sieves and other sensitive parts without damaging them. Also for dispersing of suspensions for particle size analysis. Fill volume: 5.6 litres Areas of application For especially gentle and damage-free cleaning of even
- Application / Operation: General Cleaning / Surface Prep, Container / Bottle Cleaning
- Automation: None - Manual
- Internal Depth / Height: 10 inch
- Internal Length: 10 inch
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Supplier: Rigaku Corporation
Description: TXRF analysis can gauge contamination in all fab processes, including cleaning, litho, etch, ashing, films, etc. The TXRF-V310 can measure elements from Na through U with a single-target, 3-beam X-ray system and a solid-state detector system. The TXRF-V310 includes Rigaku's
- Applications: Semiconductor Wafers
- Area Mapping: Yes
- Form Factor: Monitor / Instrument
- Maximum Wafer / Part Size: 150 to 300 mm
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Supplier: TSI Incorporated
Description: powerful global image capture, analysis, and display package available. Providing complete hardware support and turnkey system operation, INSIGHT 4G software couples ease-of-use with unsurpassed performance. Advanced analysis and display options allow a rapid transition from raw
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Supplier: LI-COR Biosciences
Description: up to 16 long-term chambers. LI-COR's research in this area has resulted in better comprehension of soil CO2 flux measurement problems and system design requirements. Production of CO2 in the soil is primarily a function of respiration of roots and organisms in the soil
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Supplier: CSA Group
Description: identifying the product structuring of engineering parts and structural parts contained within a space; data identifying the product structuring of compartments in an area of the ship; data required for the definition of design requirements placed on a space by systems within the ship
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Supplier: ASTM International
Description: secondary definitions requires the knowledge of the basic definitions. 1.3 Based on the terms of this developed system of tread pattern definitions or descriptions, a set of treadwear descriptions is presented that encompasses both regular wear and irregular wear features. 1
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Supplier: HORIBA Instruments, Inc.
Description: This emission analysis type end-point monitor is intended for end-point detection or plasma condition control in the plasma-based semiconductor thin-film process. The newly-developed Rapture Intensity algorithm allows accurate end-point detection by capturing faint signal changes. The ability
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Supplier: ASTM International
Description: profile data taken at uniform intervals along straight lines across the surface under test, although reference is made to the more general case of two-dimensional measurements made over a rectangular array of data points. 1.3 The data analysis procedures described in this practice are
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Supplier: HORIBA Instruments, Inc.
Description: developed according to customers’ needs. Features The RU-1000 plasma emission controller achieves excellent spatial distribution of deposition on substrates with large surface areas. Reactive sputtering is performed for film deposition on films and glass substrates used
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Supplier: Harper International Corporation
Description: surface area measurement DTA and TGA thermal diffusivity thermal and elemental As a result of their experience in the testing and feasibility stage, many customers work with Harper to conduct in-depth studies to determine equipment requirements and help
- Capabilities: Materials Engineering, Mechanical Engineering, Systems Engineering, Other
- Industry Served: Other Market Served
- Location: North America, United States Only, Northeast US Only
- R & D: Machine Design, Materials Research, Modeling, Process Design, Systems Design, Other R&D
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Supplier: Terra Universal, Inc.
Description: allows convenient viewing of process area Includes piping, fittings, and solenoid valve for easy vacuum pump connection and control (order pump and vacuum controller separately below) Internal 18"W (457 mm) shelf supports load up to 75 lbs. (34 kg.) Optional powder-coated steel stand with 6"
- Chamber / Component Type: Baseplate, Box / Degassing Chamber, Base / Service Well, Custom / Specialty Chamber, Glovebox / Weld Chamber, Feedthrough Collar, Load Lock Chamber, Surface Analysis / Universal
- Chamber Material: Aluminum, Stainless Steel, Steel, Other
- Cooling: Yes
- Flange / Fitting Types: Elastomeric (O-ring / Gasket), Threaded / NPT, Weld / Braze Stub, ISO-BF (Bolted), ISO-CF (Metal Seal), ISO-KF / ISO-NW (Small Clamped, <2"), ISO-MF (Multi-fastener / Universal), ANSI ASA, Conflat®
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Supplier: AASHTO Publications
Description: Construction Hydraulic Design of Highway Culverts The Legal Aspects of Highway Drainage Hydraulic Analysis and Design of Open Channels Hydraulic Analysis for the Location and Design of Bridges Hydraulic Aspects in Restoration and Upgrading of Highways Storm Drain Systems
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Supplier: InspectorTools
Description: analysis for follow-up reporting and documentation. Features Backlit display for poorly lit areas Last ten temperature readings displayed on bar graph for easy reference Enhanced optics (distance to spot ratio up to 60:1) allow measurements of smaller objects from
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Supplier: NACE International
Description: weight of the deposit per boiler tube surface area. Currently, DWD values are commonly expressed in g/ft units. Procedures for test specimen processing, dimensional analysis. Historical Document 1999
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Savant Automation, Inc. sells, engineers, installs, and services Automation Equipment and System Integrators. In addition to supplying state of the art AGV systems, Savant provides AGV system requirements analysis, concepting, budgeting and simulation services. Savant Automation offers (read more)
Browse Automation Equipment and System Integrators Datasheets for Savant Automation, Inc. -
therefore essential to identify potential fault sources at an early stage and plan maintenance activities proactively to avoid disruptions and maximize crane availability. Intelligent monitoring systems, such as the iba system for data acquisition and analysis, support maintenance teams, who are often (read more)
Browse Data Acquisition Systems and Instruments Datasheets for iba America LLC -
3D Optical Surface Profiler The NewView™ 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped (read more)
Browse Dimensional and Profile Scanners Datasheets for Zygo Corporation -
the accuracy and precision of the feedback information provided by the encoder. We have designed three types of code wheels: straight, angular, and curved. The curved code wheel is optimal due to its increased and uniform copper surface area on each strip, which enhances the inductive (read more)
Browse Rotary Encoders Datasheets for Portescap -
. The system ensures highly detailed measurements and strengthens verification at the feature level. It enables more dependable control of GD&T-critical characteristics, including functional surfaces, precision-machined features, and assembly-defining geometries. This makes (read more)
Browse 3D Scanners Datasheets for SCANOLOGY -
system options. Included Mx software provides comprehensive tools for surface data visualization, analysis and reporting. Area-based measurement is insensitive to part lay. Productivity and Value Cost-effective price-to-performance ratio compares (read more)
Browse Surface Metrology Equipment Datasheets for Zygo Corporation -
Instrument Control & Data Analysis Software for ZYGO 3D Optical Surface Profilers ZYGO's Mx™ software powers complete system control & data analysis, including interactive 3D maps, quantitative topography data, intuitive navigation, & built-in SPC with (read more)
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The Verifire XL system includes ZYGO's patented QPSI™ acquisition technology which enables reliable high-precision measurements in the presence of vibration. QPSI enables true on-axis surface form metrology, without (read more)
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complete system control & data analysis, including rich interactive 3D maps, quantitative topography information, intuitive measurement navigation, and built in SPC with statistics, control charting, and pass/fail limits. Interactive 3D plots - zoom, pan, rotate (read more)
Browse Dimensional and Profile Scanners Datasheets for Zygo Corporation -
-engineered to match the exact dimensions and mounting points of the A100 GPU for maximum heat transfer Enhanced Surface Area: Advanced fin structures increase surface (read more)
Browse CPU Coolers Datasheets for ToneCooling Technology Co., Ltd
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Shedding New Light on Photocatalyst Performance Part 1: Surface Area and Pore Size Analysis
of this two-part Note. Part 1 focuses on how selected physical properties of photocatalysts (surface area and pore structure) affect their performance. Part 2 extends the discussion to include chemical properties (chemisorption capacity and reactivity) of photocatalysts.
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SMD Resistor Thermal Analysis
in temperature due to conduction through each thermal impedance between the film and the ultimate "perfect heatsink." This relationship is shown in the block diagram titled "Figure 1." A typical example of this relationship applied to a surface mount resistor is shown in "Figure 2." A detailed analysis
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Designing Atmospheric-Pressure Plasma Sources for Surface Engineering of Nanomaterials
target cells for analysis. Additionally,. the complex sample handling required by these techniques. may compromise gene expression, contaminate samples,. reduce cell populations, as well as add to experimental time. and cost [5]. Since DEP response, the resultant motion of a particle. due to its
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Combining Size and Shape Analysis
(proportional to. the ratio of the particle's area to the particle's. perimeter squared), particle orientation, and. fiber curl, as shown in figure 1. These parameters are particularly useful for. quantifying a particle's shape anisotropy and. describing the particle's surface area. regularity.
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Types Of Gas Chromatograph
Gas chromatograph is a commonly used chromatographic product. In addition to quantitative and qualitative analysis, it can also determine the physical and chemical constants such as the partition coefficient, activity coefficient, molecular weight, and specific surface area of the sample
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Packaging Simulation Answers the Need for Speed
By Adrian Possumato, Global Manager - Pharmaceutical Market, Multisorb Technologies Figure 1 shows the adsorption isotherms for a drug product (light blue line), a molecular sieve desiccant (red line) and a silica gel desiccant (dark blue line). The analysis would also have to calculate the surface
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Characterizing Coarse Particles with Dual EDS Detectors (.pdf)
Performing EDS analysis on a specimen with coarse particles on the surface can be difficult because of shadowing effects as shown in the schematic in figure 1. However, this effect can be mitigated in two different ways. One is to collect a set of maps from an area, rotate the sample 180
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A Spectroscopy Guide for PAT
, crushability, surface area, porosity, morphology and particle size distribution of excipients and APIs. Standard physical testing, while accurate, is slow and labor-intensive. Means are needed to make rapid, multivariate measurements on solid materials. This suggests spectroscopy. This article
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Anomalously Low Surface Area and Density in the Silica—Alumina Gel System
For standard sam- ples, surface areas were within 5% for these two different surface area analysis systems .
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Technical Analysis of Projects Being Funded by the DOE Hydrogen Program
It will house the infrared spectrometer, gas chromatograph and BET surface area analysis system .
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Estrogen receptors in the islets of Langerhans of baboons
… group; within each of these samples, 8 nuclear and 8 extranuclear areas were randomly selected for analysis of the numbers of photographic grains per lam2 of cell area by utilizing a Zeiss MOP-3 analysis system for surface area and grain counts.
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Modification of Epoxy Resin with Carbon Nanotubes Formed under Conditions of Mechanical Activation from Plant Raw Material
A study of specific surface was performed in a Sorbtometer-M (KATAKON, Novosibirsk, Russia) analyzer and by means of an automated system for analyzing surface area ASAP 2020 (USA), and the value of specific surface was estab- lished by nitrogen absorption.
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Dopant Segregation Analysis on Sb:SnO 2 Nanocrystals
In fact, the enthalpy term is dominated by the overall surface energy,[27] which can be evaluated by the ab initio calculated energies for the differ- ent crystallographic planes and their respective surface areas for the analyzed systems .
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Reaction Rates for the Partial Dehydration of Glucose to Organic Acids in Solid‐Acid, Molecular‐Sieving Catalyst Powders
-BET surements (using Ar as the gas probe) were performed on each catalyst using a Micromeritics ASAP-2000 surface area and porosimetry analysis system .7 Each catalyst powder was sieved to the range of 20È100 km, and then the particle size distribution …
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In Situ Remediation of {sup 137}Cs Contaminated Wetlands Using Naturally Occurring Minerals
We estimated surface area using the BET method (Carter et al. 1986) with a Micromoretics 2000 Accelerated Surface Area and Porosimetry Analysis System .
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Removal of xenobiotics from effluent discharge by adsorption on zeolite and expanded clay: an alternative to activated carbon?
The surface area and porosity measure- ments (pore volume and size) were obtained from Micromeritics ASAP 2010 (Accelerated Surface Area and Porosimetry System ) analyses based on gas (Nitrogen) ad- sorption theory.
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