Accelerating the test environment, or increasing the stresses, can yield a shorter burn-in test duration. If the test results can be extrapolated to the use stress levels, they yield estimates of the lives and reliabilities under use stresses. Such testing provides a saving in time and expense, since for many components and products, life under use conditions is so long that burning-in under those conditions is not time-wise and economically feasible.
If temperature is the only accelerating variable in burn-in, the Arrhenius and Eyring Accelerated Test Models may be used. If voltage is the only accelerating variable in burn-in, the Inverse Power Law Accelerated Test Model may be used. If both temperature and voltage are combined and accelerated in burn-in the Combination, Generalized Eyring and Bazovsky models may be used. In this Chapter only the Arrhenius, the Inverse Power Law and the Combination models are discussed. For more acceleration models, the readers are referred to [1] where various models for accelerated life tests and reliability determinations are presented, including the Arrhenius, Eyring, Inverse-Power law, Combination, Generalized Eyring, Bazovsky, Temperature-Humidity, Weibull Stress-Life, Log-log Stress-Life, Overload-Stress Reliability, Percent-Life, Deterioration Monitoring, Step-Stress, Distribution-Free Tolerance Limits, Non-parametric and Optimum Acceleration Models.
A widely used formula for modeling an electronic component's strength degradation with respect to increasing temperature, has for many years been the Arrhenius model. It estimates the characteristic life...
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