Sensor Review: Gas Discharges and Thermal Imaging, Volume 23, Number 1, 2003

References

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Arshak, K., Korostynska, O. and Harris, J. (2002), ?-radiation dosimetry using screen printed Nickel oxide thick films , MIEL 2002 Conference Proceedings.

Arshak, A., Zleetni, S.M., Arshak, K. and Harris, J. (2002), ?-radiation dosimeter using the optical and electrical properties of Al/S/CuPc/Al thin films , MIEL 2002 Conference Proceedings .

Atanassova, E., Paskaleva, A., Konakova, R., Spassov, D. and Mitin, V.F. (2001), Influence of ?-radiation on thin Ta 2O 5-Si structures , Microelectronics Journal, Vol. 32, pp. 553-62.

Champarnaud, J.C., Blanchandin, S., Thomas, P., Mirgorodsky, A., Merle-M jean, T. and Frit, B. (2000), Crystal structure, Raman spectrum and lattice dynamics of a new metastable form of tellurium dioxide: ?-TeO 2 , Journal of Physics and Chemistry of Solids, Vol. 61, pp. 1499-507.

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Hikita, K., Miyayama, M. and Yanagida,...

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