Products & Services
See also: Categories | Featured Products | Technical Articles | More Information-
Supplier: Accuris
Description: PLATINUM AGGLOMERATION BY X-RAY DIFFRACTION
-
Supplier: Rigaku Corporation
Description: 2012 heralds the newest additions to the MiniFlex series of benchtop X-ray diffraction (XRD) analyzers. The new 5th generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials.
- Angular Range: -3 to 145 degrees
- Features: Benchtop
- Diffracted Beam Optics: Collimators and Slits, K-Beta Absorption Filter, Monochromating Crystal
- Positioning System: Goniometer
-
Supplier: Accuris
Description: Residual Stress Measurement by X-Ray Diffraction
-
-
Supplier: Accuris
Description: Standard Guide for Forensic Analysis of Geological Materials by Powder X-Ray Diffraction
-
Supplier: Accuris
Description: RESIDUAL STRESS MEASUREMENT BY X-RAY DIFFRACTION, 2003 EDITION
-
Supplier: Rigaku Corporation
Description: Our most popular protein crystallography system, the HighFlux HomeLab is a complete home X-ray diffraction system that enables data collection on a wide range of protein crystal samples. As all of Rigaku’s protein crystallography systems, the HKL3000-R software suite provides
- Features: Benchtop, Other
- Positioning System: Goniometer
- Detector: Imaging Plate/Foil
- Diffracted Beam Optics: Monochromating Crystal
-
Supplier: ASTM International
Description: This method is for determining the extent of platinum agglomeration in reforming catalysts, i.e., the fraction of the platinum in the sample that has agglomerated into crystallites larger than 3.5 nm, using X-ray diffraction. These materials generally contain between 0.2 to 0.4
-
Supplier: SAE International
Description: Several residual stress (RS) measurement standards that employ x-ray diffraction (XRD) techniques are available for users in Europe, North America, Japan and other countries. Such standards are similar in principle however the detailed requirements for each
-
Supplier: ASTM International
Description: 1.1 This test method covers a procedure for experimentally determining the x-ray elastic constants (XEC) for the evaluation of residual and applied stresses by x-ray diffraction techniques. The XEC relate macroscopic stress to the strain measured in a particular
-
Supplier: ASTM International
Description: 1.1 This guide covers techniques and procedures for the use of powder X-ray diffraction (XRD) in the forensic analysis of geological materials (to include soils, rocks, sediments, and materials derived from them such as concrete), to enable non-consumptive identification of
-
Standards and Technical Documents - Residual Stress Measurement by X-Ray Diffraction -- J784A_197108Supplier: SAE International
Description: Technical Standard
-
Supplier: ASTM International
Description: 1.1 These practices provide for X-ray diffraction analysis of powdered crystalline compounds in water-formed deposits. Two are given as follows: Sections Practice A---Camera 12 to 21 Practice B---Diffractometer 22 to 30
-
Supplier: SAE International
Description: perform. The resultant RS present in production springs as a result of the various fabrication and processing operations applied can be predicted and modeled, however, RS measurements must be performed in order to quantify the RS state with precision. X-ray diffraction (XRD)
-
Description: ISO 20203:2005 describes a test method for the determination of the mean crystallite height of a representative, pulverized sample of calcined petroleum coke by interpretation of an X-ray diffraction pattern produced through conventional X-ray scanning techniques.
-
Supplier: CSA Group
Description: ISO 20203:2005 describes a test method for the determination of the mean crystallite height of a representative, pulverized sample of calcined petroleum coke by interpretation of an X-ray diffraction pattern produced through conventional X-ray scanning techniques.
-
Supplier: CSA Group
Description: products that incorporate such natural minerals. This method is intended only for application to building material samples that contain deliberately added commercial grade asbestos including tremolite asbestos. ISO 22262-3:2016 is intended for use by analysts who are familiar with
-
Supplier: CSA Group
Description: ISO 19950:2015 sets out an X-ray diffraction method for the determination of the alpha alumina content of smelter grade alumina. The method is applicable to smelter grade alumina containing alpha phase at levels up to 50 %. The percentage by mass of alpha alumina is determined
-
Description: and x-y-axis. In the z-axis the order parameter is derived from the full width at half maximum (FWHM) of peak (002) in the XRD spectrum. In the x-y-axis, it is derived from the FWHM of peak (100) corresponding to diffraction patterns obtained by SAED (selected area electron
-
Supplier: Rigaku Corporation
Description: Our most powerful protein crystallography system, the Ultimate HomeLab is a complete home X-ray diffraction system that enables data collection on a wide range of protein crystal samples and dramatically reduces your need to utilize a synchrotron source. As all of Rigaku’s
- Features: Benchtop, Other
- Positioning System: Goniometer
- Detector: Imaging Plate/Foil
- Diffracted Beam Optics: Monochromating Crystal
-
Supplier: Rigaku Corporation
Description: Rigaku's unique ZSX 400 sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer was specifically designed to handle very large and/or heavy samples. Accepting samples up to 400 mm diameter, 50 mm thick and 30 kg weight, this system is ideal for analyzing sputtering
- Remote Interface: Computer Interface
- Optical System: Crystal
- Sample Type: Liquids, Solids
- ICP Measurement Mode: Sequential
-
Supplier: AENOR
Description: Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
-
Supplier: AENOR
Description: Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
-
Supplier: AENOR
Description: Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
-
Supplier: Lambda Technologies
Description: railway, defense and other industries since 1977. Lambda offers a broad array of x-ray diffraction and fluorescence testing capabilities for materials applications, primarily in the areas of qualitative and quantitative phase analysis, and texture determination. Lambda provides
- Standards (Test / Certify To): ASTM, OEM Specific
- Industry: Aerospace / Aviation, Automotive, Nuclear / Utility, Piping / Pressure Vessel
- Materials: Ceramics / Glass, Composites, Metals, Thin Films / Plating, Welds / Joints
- Test Methods: Diffraction (X-ray, Electron, etc.), Mechanical Testing, Microscopy / Metallography, Nondestructive Testing, Scanning Electron Microscopy, X-ray Fluorescence (XRF), X-ray Radiography
-
Supplier: American Welding Society (AWS)
Description: Six welding fumes, representing a variety of welding rods and wires, were analyzed for particle size and chemistry by X-ray diffraction, energy dispersive X-ray analysis, scanning transmission electron microscope, and automated electron beam analysis. Four carbon
-
Supplier: SAE International
Description: purpose of this study and X-ray diffraction techniques were used to measure both residual stress and retained austenite. The findings from this research are then applied to a manufacturing application involving the surface hardening of a thin shelled, plain carbon steel
-
Supplier: Element Materials Technology
Description: accredited materials testing, product testing, failure analysis and consulting. Element chemists continually train in the most advanced techniques to provide a wide range of chemical analyses; laboratories are equipped with state-of-the-art instrumentation, including: Sequential X-ray
- Standards (Test / Certify To): ASME, ASTM, AWS, EPA, MIL-SPEC, OEM Specific, RoHS
- Test Methods: Acoustic Microscopy (SAM), Atomic Absorption Spectroscopy (AA), Auger Spectroscopy (AES), Chemical Extraction, Chromatography (GC, HPLC, etc.), Combustion Analysis, Diffraction (X-ray, Electron, etc.), Inductively Coupled Plasma (ICP / LA-ICP), Infrared Spectroscopy (FTIR, etc.), Mass Spectroscopy
- Materials: Adhesives / Sealants, Air, Ceramics / Glass, Chemicals, Coatings, Composites, Concrete / Mortar, Gases, Heavy Metals (Lead, Chromium, etc.), Inorganics, Metals, Nanomaterials, Paper, Petroleum Fluids (Oil, Fuel, Distillates), Plastic / Rubber, Polymers / Organics, Powders, Sediment, Soil, Textiles,
- Industry: Aerospace / Aviation, Automotive, Chemical / Material Processing, Food / Beverage, Health Care / Medical, Legal / Forensics, Marine, Military, Nuclear / Utility, Packaging, Pharmaceutical / Biotech, Piping / Pressure Vessel, Semiconductors / Electronics, Structural / Construction
-
Supplier: Remcom (USA)
Description: requirements of a full physics method may exceed available computational resources. Applications XGtd’s capabilities extend well beyond standard ray tracing codes, incorporating techniques including Geometric Optics (GO), the Uniform Theory of Diffraction (UTD), Physical Optics
-
Supplier: Acuren
Description: automotive plastic components, amongst others. In-house machine shops provide quick and accurate specimen preparation for all laboratory tests. Technical libraries contain an extensive collection of materials standards, both current and historical, for evaluating test results. Ready access to
- Standards (Test / Certify To): ASME, ASTM, AWS
- Test Methods: Acoustic Microscopy (SAM), Diffraction (X-ray, Electron, etc.), Mechanical Testing, Nondestructive Testing, Property Testing, Scanning Electron Microscopy, Thermal Analysis, UV / Vis Spectroscopy, Wet Chemical Analysis, X-ray Fluorescence (XRF), X-ray Radiography
- Industry: Aerospace / Aviation, Automotive, Chemical / Material Processing, Marine, Military, Nuclear / Utility, Piping / Pressure Vessel, Structural / Construction
- Features: Canada Only, Midwest US Only, North America, Northeast US Only, Northwest US Only, Southern US Only, Southwest US Only, United States Only
-
Supplier: Matexcel
Description: The characterization of materials is an important step in understanding the structure-property relationship. It is also crucial for process/quality control and product development, once the materials properties (physical, chemical, mechanical, etc.) are determined, this information can be used to
- Standards (Test / Certify To): ASTM
- Materials: Adhesives / Sealants, Chemicals, Coatings, Composites, Fuel Cell / Battery Materials, Gases, Inorganics, Metals, Nanomaterials, Plastic / Rubber, Polymers / Organics, Powders, Toxins / Restrictive Substances
- Capabilities: Assays / Quantitative, Chemical Testing Services, Failure Analysis, Quality / Purity (Contamination - Alloys, Polymers, etc.), Standards Testing / Certification
- Test Methods: Atomic Absorption Spectroscopy (AA), Chromatography (GC, HPLC, etc.), Diffraction (X-ray, Electron, etc.), Mass Spectroscopy (RGA, etc.), Mechanical Testing, Microscopy / Metallography, Nondestructive Testing, Particle Size / Sieve Analysis, Property Testing, Thermal Analysis, UV / Vis Spectroscopy,
-
Optical Lenses - Microscope Objective Lens, Long Working Distance, 50x, 0.55 NA, 4 mm FL -- MLWD-50XSupplier: Newport MKS
Description: diffraction-limited spot, providing concentrated optical power and excellent resolution. M26-RMS Thread Adapter The thread on the long working distance objectives are M26, so the adapter is required to step down to standard RMS threads. Please make sure to purchase one for use with any
- Lens Features: Microoptic
- Features: Other
-
Supplier: Newport MKS
Description: diffraction-limited spot, providing concentrated optical power and excellent resolution. M26-RMS Thread Adapter The thread on the long working distance objectives are M26, so the adapter is required to step down to standard RMS threads. Please make sure to purchase one for use with any
- Lens Features: Microoptic
- Features: Other
-
Supplier: SPIE - Education
Description: multiple diffraction effects and their interferences, but also systematic and random fabrication errors, multi-order propagation and other effects which cannot be modeled accurately through ray tracing. 3) Following the design (1) and modeling tasks (2), the optical engineer usually
- Type: Course
- Technology / Subject Expertise: Instruments / Sensors, Photonics / Optics
- Delivery: On-site / In Plant
-
Supplier: Aurora Instruments
Description: Segmented Flow Analysis Flow Injection Analysis TOC analysis Gel Permeation Chromatography Ion Chromatography Laser Diffraction Particle Size Analysis X-ray Fluorescence analysis Viscosity analysis Fourier Transform Infrared Spectroscopy Liquid handling applications (such as:
-
Supplier: Cambridge Polymer Group, Inc.
Description: cleanliness studies, failure analysis, sterilization procedures, oxygen content, Vitamin E characterization Mechanical Analysis Dynamic mechanical analysis (DMA), tensile testing, compression testing, creep testing For a partial list of ASTM standards performed by Cambridge Polymer Group,
- Standards (Test / Certify To): ASTM, NIST, OEM Specific
- Materials: Adhesives / Sealants, Chemicals, Coatings, Composites, Cosmetics (Creams, Sunblocks, etc.), Inorganics, Nanomaterials, Paper, Petroleum Fluids (Oil, Fuel, Distillates), Plastic / Rubber, Polymers / Organics, Powders, Textiles, Thin Films / Plating, Wafers / Surfaces, Water
- Industry: Aerospace / Aviation, Automotive, Chemical / Material Processing, Food / Beverage, Health Care / Medical, Legal / Forensics, Marine, Military, Packaging, Pharmaceutical / Biotech, Semiconductors / Electronics, Structural / Construction
- Capabilities: Assays / Quantitative, Cleanliness Monitoring / Testing, Deformulation / Reverse Engineering, Environmental Exposure Testing, Materials Testing Services, Quality / Purity (Contamination), Report Preparation, Standards Testing / Certification, Umpire Testing
Find Suppliers by Category Top
Featured Products Top
-
Wireless InSite is a suite of RF propagation models, providing 3D ray-tracing, fast ray-based methods, and empirical models for the analysis of site-specific radio wave propagation and wireless communication systems. Through its combined modeling, simulation, and (read more)
Browse Communications Software Datasheets for Remcom (USA) -
fast, accurate results ideal for in-line quality control. Manufacturers of three-dimensional sensing technology can apply the NIR Intensity Lens solution for angular measurement of NIR LEDs, lasers, and diffractive optical elements (DOE). The lens mounts directly to a Radiant Vision Systems (read more)
Browse Automated Test Equipment Datasheets for Radiant Vision Systems
Conduct Research Top
-
One-step Synthesis of ZnO Nanosheets: A Blue-White Fluorophore
Zinc oxide is synthesised at low temperature (80 C) in nanosheet geometry using a substrate-free, single-step, wet-chemical method and is found to act as a blue-white fluorophore. Investigation by atomic force microscopy, electron microscopy, and X-ray diffraction confirms zinc oxide material
More Information Top
-
Homoleptische Silber(I)‐Acetylen‐Komplexe
The standard roentgen diffraction experiments because of an incomplete development of the thermally conditional charge density deformation as well as bindungsbildenden effects to it, bond lengths to represent too briefly, tend the specifically covalent in the case bonds.
-
http://www-pub.iaea.org/MTCD/publications/PDF/te_1654_web.pdf
… the composition range of x = 0.75 to 0.9 is extrapolated, it intercepts the ordinate axis at the value 0.5404 nm for x = 1 (GdO1.5), which is very close to the X ray diffraction standard value of 1.0813 …
-
New Materials, Applications and Processes
Furthermore, a comparison between the X-ray diffraction pattern of the sample and the standard X ray diffraction pattern demonstrated that the intensity of (110) orientation was increased, which indicated that the Fe-Si layer had Fe3Si structure with (110) preferred orientation.
-
Al-N (Aluminum-Nitrogen)
McMurdie, H.F., Morris, M.C., Evans, E.H., Paretzkin, B., de Groot, J.H., Hubbard, C.R., Carmel, S.J.: Standard X Ray Diffraction Powder Patterns, Section 12--Data for 57 Substances, Nat.
-
Effect of the nature of the acido ligand in the precursor on the properties of nanosized palladium-based hydrogenation catalysts modified with elemental phosph...
… 889, 1.862, 1.845, 1.784, 1.731, 1.569, 1.543, 1.456, 1.409, 1.346, 1.331, 1.290, and 1.281 Å are in good agree ment with the standard X ray diffraction data for the palladium …
-
Structural transitions in liquid cesium
The data produced via standard X ray diffraction were pub lished in [3].
-
Dynamic equilibria of phases in the processes of the mechanosynthesis of an alloy with composition Fe72.6 C24.5 O1.1 N1.8
The standard X ray diffraction patterns of the amorphous phase for the quantitative phase analysis of MS alloys were sim ulated by smoothing the diffraction profiles from the amorphous/nanocrystalline samples of cementite with a high fraction of the amorphous phase obtained by …
-
Binuclear heterometallic {M-Ln} pivalate complexes (M = Co, Ni, Cu; Ln = Sm, Gd): synthesis, structure, and thermolysis
The X ray powder diffraction analysis of the thermolysis products was carried out with a FR 552 monochromator cham ber (CuKα1 radiation) using germanium as the internal standard ( X ray diffraction patterns were processed with an IZA 2 com parator with an …
-
Influence of the nature of organic ligands on the character of thermal decomposition products of CoII and NiII pivalate complexes with amino derivatives of p...
The X ray powder diffraction analysis of the thermolysis prod ucts was carried out with a FR 552 monochromator chamber (CuKα1 radiation) with the use of germanium as the internal standard ( X ray diffraction patterns were processed with an IZA 2 comparator …
-
Carboxylate clusters with the M4 O4 cubane-like core: pivalate cocrystal containing CoII and NiII
decomposition products was carried out with a FR 552 mono chromator chamber (Cu Kα1 radiation) using germanium as the internal standard ( X ray diffraction patterns were processed on an IZA 2 comparator with an accuracy of ±0.01 mm) and on a …
Indicates content that may require registration and/or purchase.