Product Announcements:
Industrial and Engineering Software

This short video clip demonstrates how Wireless InSite models engineered EM surface (EES) and compares coverage improvement with diffuser and grating EES placements on a glass window or a wall. Read more...

This tutorial demonstrates XFdtd's workflow for evaluating a diplex matched antenna and analyzing two different matching network states simultaneously. Read more...

In this video tutorial, an antenna's intrinsic impedance is simulated for two conditions--in free space and against a head. A three-port switch with two possible states is also included. Read more...

In this tutorial, we demonstrate the ease of adjusting, or tuning, multiple operating modes so that capacitance values match various frequency bands. Using XF’s schematic editor with tuning slider bars, the correct values can be found in moments. Read more...

This presentation covers XFdtd's capabilities for matching networks, including the schematic editor and frequency domain circuit solver. Read more...

ABB launches digital asset performance management platform for instrumentation Read more...

Teledyne DALSA is pleased to announce its latest Sapera™ Vision Software Edition is available. This release includes enhanced versions of its AI training graphical tool Astrocyte™ 1.50, and its image processing and AI libraries Sapera Processing 9.50. Read more...

New Geeplus Test Rig Makes Data Capture Easier Than Ever Read more...

TT-NIRI software combines efficient image-based measurements with application-specific tests to evaluate the accuracy of 850 or 940 nm NIR LEDs, lasers, and structured light patterns used for:

• Facial and gesture recognition
• Eye tracking and iris detection
• Other non-visible 3D sensing applications

The VIP™ (Vision Inspection Pack) license supplements the standard photometric analysis capabilities of Radiant Vision Systems TrueTest™ Automated Visual Inspection Software with registration functionality for unique illuminated regions (backlit icons and shapes) to enable defect detection and accurate photometric measurement. Read more...