The device is designed for non-contact scanning and measuring the inner diameter of pipes. Measured parameters: inner diameter, ovality, roundness.
ID measurement range, mm 18...30
ID measurement error, mm ±0.05
Discreteness of indication, mm 0.01
Space resolution, points/turnover 700
Measurement depth from the pipe end, mm 155...307
Operation of... Read more...
More Product Announcements from RIFTEK EUROPE Sp. z.o.o.
Mini Probes - Ideal for Measurements in Confined Spaces
The Mini Probe is a compact, low profile transducer that is ideal for measurement in confined spaces, such as bores. The transducer is based on a parallel spring structure that ensures excellent repeatability over a long working life, even when rotated in bores that have key slots or lubrication ports.
A Tungsten... Read more...
Solartron's MicroFlex - Our Smallest Specialist Transducer Yet
MicroFlex, a Micro Single Leaf Flexure, which has Solartron quality ruggedness and accuracy in a tiny package; Just 5.5 mm high.
Key features:
- Measures just 16.5 long x 5 wide x 5.5mm High
- 0.4mm measurement range
- 17-7PH Steel Body for Maximum Performance<.../li>
In today’s highly competitive manufacturing environment, efficiency and precision are key. The ML3G is a non-contact tool measurement system that ensures reliable tool control directly on the machine, reducing manual errors and boosting productivity. Read more...
More Product Announcements from Marposs Corp
Micro-Epsilon's IMS5400-TH white light interferometer measures thickness with nanometer accuracy from a large distance. Distance-independent
Laser probes RF609-Wi-Fi Series
Laser sensor is designed for non-contact measurement of geometric parameters of holes (diameter, ovality, roundness).
Diameter of the laser sensor body, mm 8.5; 15
Range of controlled diameters, mm 9.2 ... 19; 16 ... 48
Laser sensor linearity, % ±0.05 of the range
Depth of controlled holes, mm on request
Th... Read more...
More Product Announcements from RIFTEK EUROPE Sp. z.o.o.
Micro-Epsilon's surfaceCONTROL 3500 inspects geometry, shape and surface on diffusely reflecting materials such as metal, plastic and ceramics. Z-repeatability below 0.4 µm helps detect very small deviations in planarity and height. Read more...
More Product Announcements from Micro-Epsilon Group
Micro-Epsilon's IMS5420 white light interferometer measures monocrystalline silicon wafers without contact. One sensor handles undoped, doped and highly doped wafers and achieves signal stability of less than 1 nm. Read more...
More Product Announcements from Micro-Epsilon Group
Micro-Epsilon's IMS5200-TH white light interferometer measures transparent films inline from 1 µm to 100 µm. Measuring rates up to 24 kHz support fast, nanometer-precise layer control in production processes. Read more...
More Product Announcements from Micro-Epsilon Group
Micro-Epsilon reflectCONTROL uses deflectometry to measure the shape of shiny and reflective objects. A striped pattern is reflected by the target surface into the sensor cameras, enabling precise inspection of glossy surfaces. Read more...
More Product Announcements from Micro-Epsilon Group