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Supplier: Accuris
Description: Use of Pb-Free Ball Grid Array Component Soldered Using SnPb Solder
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Supplier: SAE International
Description: This document contains information and guidance on the use of Pb-free ball grid arrays (BGAs) in an aerospace, defense, and high performance (ADHP) product, or other products which demand a high reliability.
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Supplier: IPC International, Inc.
Description: Explains the advantages and challenges of ball grid arrays, including component descriptions and terminology. Provides an overview of removal / replacement procedures for ball grid arrays, using hot air and conductive heating equipment. Covers site
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Supplier: Accuris
Description: Process management for avionics \x96 Aerospace and defence electronic systems containing lead-free solder Part 4: Ball grid array (BGA) re-balling
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Supplier: Accuris
Description: Process management for avionics \x96 Aerospace and defence electronic systems containing lead-free solder \x96 Part 4: Ball grid array (BGA) re-balling
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Supplier: CSA Group
Description: IEC TS 62647-4:2018(E) defines the requirements for replacing solder balls on ball grid array (BGA) component packages in the context of an electronic components management plan (ECMP) for aerospace, defence and high reliability products. The intent of this document is to
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Description: IEC TS 62647-4:2018(E) defines the requirements for replacing solder balls on ball grid array (BGA) component packages in the context of an electronic components management plan (ECMP) for aerospace, defence and high reliability products. The intent of this document is to
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Supplier: Indium Corporation
Description: Features Suitable for Pin-Grid Array and standard Ball Grid Array applications Airless Packaging Excellent solderability to all common surface metallizations No-clean residue Can be used for printing, dipping, and pin transfer deposition Offers high yields in BGA
- Features: Other
- Fluxes & Cleaners: Soldering Flux / Rosin
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Supplier: Henkel Corporation - Industrial
Description: control. LOCTITE ECCOBOND FP4802 is suitable for bare chip protection of a variety of advanced packages, such as Ball Grid Arrays (BGA’s), Chip Scale Packages (CSP’s), Plastic Ball Grid Arrays (PBGA’s), and full arrays on Low Temperature cofired
- Coeff. of Thermal Expansion (CTE): 11.11111111111111 µin/in-F
- Viscosity: 80,000 cP
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Supplier: Boyd
Description: Aavid provides the broadest product line of heat sinks and thermal solutions for cooling integrated circuits such as Field Programmable Grid Arrays (FPGAs) and the surface mount packaging used for integrated circuits like Ball Grid Arrays (BGAs). Choose from a
- Device: Active Heat Sink
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Supplier: Cal Quality Electronics, Inc.
Description: BGA (Ball Grid Array) X-Ray Inspection Micro BGA X-Ray Inspection 0201 Chip Placement Fine Pitch Selective Soldering Through Hole Assembly Cal Quality maintains a highly skilled work force for the assembly of Through Hole or mixed technology boards, including both wave
- Testing Services: Agency Compliance Testing, Analytical Laboratory Testing, Automated Optical Inspection, Environmental Testing, Functional Testing, In-circuit Testing, X-Ray Testing
- Production Capabilities: Cabling, High Volume, Mid Volume, Prototype / Low Volume, Quick Turn
- Material Acquisition: Customer Supplied, Vendor Supplied
- Manufacturing: Flexible Printed Circuit Board Assembly, Microelectronic, Chip On Board, Microelectronic, Flip Chip, Optoelectronic Assembly, Printed Circuit Board Assembly, Rigid-Flexible Printed Circuit Board Assembly, Surface Mount Assembly, System Assembly, Through Hole Assembly
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Supplier: Samsung Electro-Mechanics
Description: : High Density Interconnect 2) BGA : Ball Grid Array 3) FCBGA : Flip Chip BGA Quality Has durability against repetitive flexing Folder Type: 100,000 times Slider Type: 200,000 times Ideal assembly process with high reliability Able to perform continuous production. Folder Type:
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performance - achieving IPC Class III voiding on ball grid arrays (BGAs) and less than 10% average voiding on bottom-terminated components, enhancing thermal and electrical integrity in demanding assembly environments. Thermal and Environmental Protection for Demanding (read more)
Browse Solder Datasheets for MacDermid Alpha Electronics Solutions -
to process a single wafer or are looking for a source to provide recurring production services, Micross AIT has a wide array of WLP technologies. WLCSP ball place, electroplated C4, and Cu pillar bumping with bump diameters as small as 25 microns Bump-on-pad and (read more)
Browse IC Interfaces Datasheets for Micross Components, Inc. -
ball grid array (BGA) package of the AD4854 includes all critical power supply and reference bypass capacitors, minimizing the full solution footprint and component count, as well as reducing sensitivity to the application printed circuit board (PCB) layout. The AD4854 operates over an extended (read more)
Browse Analog-to-Digital Converter (ADC) Chips Datasheets for DigiKey
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Unique Application of Solder Ball Technology on QFP Pads Improves Processing Reliability
challenges associated with QFP packages such as non-coplanar leads "lifting" after reflow, opened the door for newer, high density packages, such as Ball Grid Array (BGA), that are ultimately more cost effective and process friendly.
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Structural Dynamics of Electronic and Photonic Systems
Wong, T. E., Palmieri, F. W., and Kachatorian, L. A., “Experimentally Validated Vibration Fatigue Life Prediction Model for Ball Grid Array Solder Joint,” in G. J. Kowalski et al (Eds.), Packaging of Electronic and Photonic Devices , EEP-Vol.
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Finite element analysis and simulation of adhesive bonding, soldering and brazing—an addendum: a bibliography (1996–2002)
Austin, 1996) pp 129–35 Jung W et al 1996 Nonlinear analysis of full-matrix and perimeter plastic ball grid array solder joints 1996 ASME Int.
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Lead-free Solders: Materials Reliability for Electronics
(2004) Quantitative metallography of b-Sn dendrites in Sn-3.8Ag-0.7Cu ball grid array solder balls via electron backscatter diffraction and polarized light microscopy.
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Reliability of RoHS-Compliant 2D and 3D IC Interconnects > Notes on Failure Criteria
Lau, J. H., “Nonlinear Analysis of Full-Matrix and Perimeter Plastic Ball Grid Array Solder Joints,” ASME Transactions, Journal of Electronic Packaging, September 1997, pp. 163–170.
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2010 Index IEEE Transactions on Device and Materials Reliability Vol. 10
Ball Grid Array Solder Joint Relia- bility Under System-Level Compressive Load; TDMR Sept. 2010 324-337 Christian, B., see Varkey, B., TDMR Sept. 2010 353-359 Chuvilin, A., see Maier, D., TDMR Dec. 2010 427-436 Claeys, C., see Griffoni, A …
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Soldering: Understanding the Basics
Khan, Ball Grid Array Soldering , Assembly, Jan 25, 2008, p 4–9, http://www.assemblymag.com/articles/print/85323-ball-grid-array- soldering, accessed June 27, 2013 .
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Reliability behavior of lead-free solder joints in electronic components
Shin [131] predicted the thermal fatigue life of a lBGA (Micro Ball Grid Array ) solder joints based on Engelmaier fatigue life equation.
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Effect of chip dimension and substrate thickness on the solder joint reliability of plastic ball grid array packages - HKUST Institutional Repository
• Design for plastic ball grid array solder joint reliability .
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