Digital Inspection Microscopes

Description: The USB microscope is designed to display simple magnifications on a computer screen. The USB microscope is connected to a screen. This allows a large presentation for several people. In addition, the USB microscope can illuminate the test objects by means of eight built-in LEDs

• Computer Interface: Yes
• Digital Display: Yes
• Grade: Other
• Image Analysis Processing Software: Yes

Description: Features Live depth composition eliminates the need for manual focus adjustment High-resolution HDR function with increased resolution limits Easy Mode for quick access to advanced functions Integrates observation, image capture, and measurement capabilities for improved workflow Application

• Application: Semiconductor Inspection
• Computer Interface: Yes
• Digital Display: Yes
• Grade: Benchtop

Description: PCE-MM 200UV is a UV USB microscope, or UV USB inspection camera, that magnifies objects up to 200 times. This UV microscope uses 8 UV LEDs with a wavelength of 365 nm for illumination. The microscope captures photos and videos as well as displays magnified objects in

• Computer Interface: Yes
• Fine Focus: Yes
• Grade: Other
• Image Analysis Processing Software: Yes

Description: Nikon Eclipse L300N/L300ND FPD / Wafer Inspection microscopes incorporate Nikon’s renowned CFI60 infinity optics, offering the world’s highest level of optical performance. The enhanced epi-fluorescence function, which enables 365nm UV excitation, is optimal for the inspection

• Application: Semiconductor Inspection
• Computer Interface: Yes
• Fine Focus: Yes
• Grade: Benchtop

Description: Better Images and Results DSX1000 digital microscopes enable faster failure analysis with guaranteed accuracy and repeatability. Large selection of lenses that are easy to change Switch between 6 different observation methods by pushing a button Fast macro

• Application: Measuring / Toolmaker, Metallurgical, Semiconductor Inspection, Other
• Computer Interface: Yes
• Digital Display: Yes
• Eyepiece Style: Binocular, Other

Description: Combined with Nikon's superior CFI60 LU/L optical system and an extraordinary new illumination system, this microscope provides images with greater contrast, high resolving power and darkfield images three times brighter than before. Used independently, or in combination with wafer loaders,

• Application: Semiconductor Inspection
• Computer Interface: Yes
• Fine Focus: Yes
• Grade: Benchtop

Description: The ShuttlePix P-400R Digital Microscope from Nikon Metrology is a portable digital microscope that has a sleek, compact design well suited for onsite use. This new concept in digital microscopy allows for much simpler remote inspection of large samples that

• Application: Metallurgical
• Digital Display: Yes
• Grade: Benchtop
• Microscope Type: Other

Description: The Olympus MX51 industrial inspection microscope is cost-effective and optimized for the inspection requirements of a variety of electronic components, wafers and large samples.

• Application: Semiconductor Inspection
• Computer Interface: Yes
• Grade: Benchtop
• Image Analysis Processing Software: Yes

Description: As an entirely new advanced imaging tool for bioscience research and industrial inspection fields, the NeoScope benchtop SEM extends your vision by combining the familiarity of a digital camera with the high resolution and depth of field of a powerful SEM. Born from the combined

• Application: Biological / Life Science
• Grade: Benchtop
• Microscope Type: Scanning Electron Microscope (SEM)
• Total Magnification: 10 to 60000 X

Description: , locked-on parts and non-skid rubber feet to withstand multiple usage The fundamental inspection microscope with built-in digital camera extends to 14-1/4'' (360 mm) to accommodate larger objects such as rocks, insects, and flowers with total magnification up to 40x. Unlike

• Digital Display: Yes
• Eyepiece Style: Monocular
• Total Magnification: 40 X

Description: The MX61A is a specially designed semiconductor microscope that allows operators to work in an ergonomically correct position and benefit from smoother operation throughout extended inspection periods, maximizing productivity and integration.

• Application: Semiconductor Inspection
• Computer Interface: Yes
• Grade: Benchtop
• Image Analysis Processing Software: Yes

Description: microscope inspection. Topside and backside macro inspections are also available for all wafer sizes Thin Wafer Inspection To meet the demands of thin wafer manufacturers, the new arm design of the AL120-LMB-90 model can handle a full cassette of 90 µm wafers

• Application: Semiconductor Inspection
• Grade: Benchtop
• Mechanical Stage: Yes
• Microscope Type: Compound

Description: CIQTEK Scanning NV Microscope Diamond III/IV is a scanning NV magnetometer based on the diamond nitrogen-vacancy center (NV center) and AFM scanning magnetic imaging technology. The sample's magnetic properties are obtained quantitatively and non-destructively by quantum control and readout

• Application: Biological / Life Science, Semiconductor Inspection
• Computer Interface: Yes
• Grade: Research
• Image Analysis Processing Software: Yes

Description: CIQTEK Quantum Diamond Microscope (QDM) is a wide-field magnetic resonance based on the principle of spin magnetic resonance in the diamond nitrogen-vacancy center (NV center). The spin quantum state of the NV center luminescence defects is susceptible to the surrounding microwave and static

• Application: Biological / Life Science, Semiconductor Inspection
• Computer Interface: Yes
• Grade: Research
• Image Analysis Processing Software: Yes

Description: High-speed scanning electron microscope for cross-scale imaging of large-volume specimensCIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration, dynamic optical axis

• Application: Metallurgical, Semiconductor Inspection
• Computer Interface: Yes
• Grade: Research
• Image Analysis Processing Software: Yes

Description: CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope. It has excellent imaging quality capabilities in both high and low vacuum modes. It also has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the

• Application: Metallurgical, Semiconductor Inspection
• Computer Interface: Yes
• Grade: Benchtop, Research
• Image Analysis Processing Software: Yes

Description: industry standards. Bruker™s 3D optical microscope systems feature the industry™s top service and support, and have a proven track record of robust performance, with thousands of installations in settings ranging from research labs to manufacturing shop floors and semiconductor fabs. With

• Application: Biological / Life Science, Metallurgical, Semiconductor Inspection
• Computer Interface: Yes
• Microscope Type: Other

Description: The LSCM has the advantages of a confocal laser scanning microscope with the size and price of an IR camera. The combination of high contrast imaging, infrared capabilities, extremely small size and low cost enables many new applications.

• Application: Biological / Life Science, Semiconductor Inspection
• Computer Interface: Yes
• Grade: Other
• Microscope Type: Laser / Confocal, Other

Description: New from LECO, the DSX Series of opto-digital microscopes combines advanced optics and the latest digital technology in one user-friendly system. Instead of looking through eyepieces, everything is controlled by touch screen, which takes the operator through the process from

• Application: Metallurgical
• Digital Display: Yes
• Grade: Benchtop
• Image Analysis Processing Software: Yes

Description: Polytec's MSV-050 and MSV-100 Microscope Adapters are the bridge that connects Laser-Doppler Vibrometry (LDV) to the micro world. Designed to couple a fiber-optic vibrometer head to a microscope, the adapters permit precise single-point and differential vibration analysis on MEMS and

• Application: Measuring / Toolmaker, Semiconductor Inspection, Other
• Computer Interface: Yes
• Grade: Benchtop, Research
• Image Analysis Processing Software: Yes

Description: precise inspection and measurement. LECO and Olympus—a perfect match for all your microscopy needs. Features Advanced ergonomic design for enhanced operator performance Wide range of mount adapters accommodates various image devices and digital photomicrography

• Application: Metallurgical
• Eyepiece Style: Binocular
• Grade: Benchtop
• Image Analysis Processing Software: Yes

Description: The MSV-400 Microscope Scanning Vibrometer is the successor to the award-winning MSV-300 for full-field vibration analysis of very small objects such as MEMS optical switches. Based on the laser Doppler principle, a HeNe laser maps the vibrational response of the structure with a lateral

• Application: Measuring / Toolmaker, Semiconductor Inspection, Other
• Computer Interface: Yes
• Grade: Benchtop, Research
• Image Analysis Processing Software: Yes

Description: A dramatically new concept in simple, inexpensive, and accessible fluorescence microscopy. The Etaluma LumaScope provides provides fluorescence and brightfield capability in a small, portable, and easy to use microscope. Small enough to fit into a cabinet or workstation, the Lumascope is

Description: Designed to move easily from the lab to the factory floor, this portable microscope is ideal for your quality control inspections, forensics, print quality, research, field use, or anywhere you need magnification. Built-in illumination is adjustable four your lighting needs. View you

• Microscope Type: Other

Description: be fixed to the microscope body by locking screws. Fully corrected trinocular tube lens provides clean, crisp images for capture by camera or video. Mount nearly any analog or digital camera to the trinocular models via a T2 adapter (supplied by the camera manufacturer) for

• Eyepiece Style: Trinocular
• Microscope Type: Other

Description: polarizer • Long working distance metallurgical plan objectives provide a bright, true image • Imbedded intelligent IR system powers off the microscope when not in use and powers it on when an operator returns to work • Adjustable interpupillary distance and 360

• Eyepiece Style: Trinocular
• Microscope Type: Other

Description: WDI's AOI Microscope is designed for fast scanning and defect review applications of a variety of specimen including bare glass, TFT array and colour filter. It provides exceptional image quality, and is limited only by the selection of the microscope objective lens. The

• Application: Biological / Life Science, Measuring / Toolmaker, Metallurgical, Other
• Computer Interface: Yes
• Grade: Other

Description: ), investigating of material defects on metal surfaces, and more, making the PCE-VM 21 inspection microscope a vital addition to your plant, shop, production line or quality control laboratory.

• Horizontal Resolution: 600 lines
• Imaging Technology / Camera Type: CCD
• Monochrome / Color: Color
• Vertical Resolution: 800 lines

Description: microscope. The robot is equipped with four high quality high performance Sony XCD-710CR digital color cameras. Sony Desktop Robot’s winning combination of superior performance and compact size combined with Sony Firewire cameras and Scorpion Vision Software is redefining the meaning

• Image Source: Line Scan Camera

Description: RS Pro WiFi microscope base and arm designed for use with our complete line of digital microscopes. This stand utilises an adjustable sliding horizontal arm with up to 250 mm reach and 360° rotational capability making it ideal for inspection applications. Accessory Type

Description: RS Pro microscope hard case is an essential accessory for digital microscopes. Durable with custom cushion interior to protect the RS Pro HD 1080p Inspection System from dust and scratches. Accessory Type = Hard Case

Description: The Gen-Eye Micro-Scope2® compact handheld inspection tool features a new Command Module that includes a USB port to record on a flash drive. You can watch the action on a big 7” LCD color monitor for crisp, clear pictures and record videos or photos on the

• Features: Integral Video Capability
• Operating Temperature: 14 to 122 F
• Tube or Sheath Diameter: 10.79 to 25.4 mm
• Type: Flexible

Description: The PCE-VM 21 consists of an optical microscope, CCD camera and monitor with LCD display. Due to the 75-fold magnification, it is possible to view very small parts very clearly. The PCE-VM 21 microscope is ideal for investigating solder joints on printed circuit boards, material

• Applications: Electronics Manufacturing, Industrial Inspection
• Illuminated: Yes
• Magnification: 10 to 75 X
• Type / Mounting: Video / Digital

Description: RS Pro KP1 external keypad is an optional digital microscopes accessory which is designed for use with the RS Pro HD 1080p inspection systems. Offers a wide range of extra features such as memory save/recall with 3 memory presets available. It is also used to access and control

Description: The AM7023 from Dino-Lite is a digital eyepiece fitted with a 5 megapixel sensor. The 23-mm inner eyepiece slots into traditional microscopes or similar devices. Adding digital power and capabilities to a regular microscope, the ability to capture and record is offered.