Film Thickness Measurement

Products & Services

See also: Categories | Featured Products | Technical Articles | More Information

Find Suppliers by Category Top


Conduct Research Top

  • Dual Technology Film Thickness Measurement
    Capacitive sensing technology can measure thickness of nonconductive films such as paper or plastic. The process can be effective and straightforward for large changes in thickness; however, resolving thickness to microns requires controlling or compensating for error sources which are often
  • Hypersen Chromatic Confocal Sensor for Film Thickness Measurement
    The thickness of industrially produced films is an important parameter. With the advancement of science and technology and the application of precision instruments, there are many methods for measuring film thickness, which can be divided into two categories: direct measurement and indirect
  • Thickness Measurement of Strip and Coatings in the Battery Industry
    In the battery industry, inline inspection of production deviations during the process contributes significantly to efficiency, resource conservation and quality assurance. A decisive measurement parameter here is the thickness measurement of strip material and coated films. Distance sensors, laser
  • Measuring the Thickness of Wet Layers in Battery Production
    In the production of battery cells, films are coated continuously or intermittently. The film thickness and the coating thickness represent a process-critical measurement parameter. Precise thicknessGAUGE measuring systems from Micro-Epsilon monitor these values with high accuracy during ongoing
  • Glass, Film, and Other Nonconductive Material Measurement with Capacitive Sensors
    Capacitive sensors are most often used to measure the change in position of a conductive target. But capacitive sensors can be effective in measuring presence, density, thickness, and location of non-conductors as well. The trick is controlling all the other variables that will affect
  • A New Dielectric Analyzer for Rapid Measurement of Microwave Substrates up to 6 GHz
    This paper from Compass Technology Group presents a new measurement method based on the parallel plate capacitor concept, which determines complex permittivity of dielectric sheets and films with thicknesses up to about 3 mm. Unlike the conventional devices, this new method uses a greatly
  • The Influence of the Expansion Process on Pore Size
    capabilities and product range will be presented along with test and measurement data encompassing two types of resins materials. A capillary flow test method will be used to determine how the pore size is affected when the short way of the opening (SWO) and film thickness is decreased by a constant
  • Recent Advances in Pulsed Thermography
    . Since only the coefficients of the equations are stored, significant data compression also occurs in TSR, facilitating rapid inspection of large structures. Applications include thickness measurement of thermal barrier coatings or turbine blade walls, corrosion detection and measurement of material

More Information Top

Lock Indicates content that may require registration and/or purchase. Powered by IHS Goldfire