Semiconductor Inspection Digital and Video Microscopes
from CIQTEK Co., Ltd
CIQTEK SEM4000Pro is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers advantages in EDS, EBSD,... [See More]
- Application: Metallurgical; Semiconductor
- Microscope Type: Scanning Electron Microscope
- Grade: Benchtop; Research
- Magnification: 1 to 1000000
from Evident Scientific
Affordable Brightfield Imaging for Materials Science. Brightfield Imaging Out of the Box. Combining quality brightfield images with affordability, the LC35 digital microscope camera is an excellent value for materials science imaging. Complementing our microscopes, the LC35 camera is easily... [See More]
- Application: Semiconductor
- Optical Technique: Brightfield
- Grade: Benchtop
- Remote Interface: Computer Interface
from CIQTEK Co., Ltd
CIQTEK SEM5000 is a field emission scanning electron microscope with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (SuperTunnel), low aberration, and... [See More]
- Application: Metallurgical; Semiconductor
- Microscope Type: Scanning Electron Microscope
- Grade: Benchtop; Research
- Magnification: 1 to 2500000
from Evident Scientific
Better Images and Results. DSX1000 digital microscopes enable faster failure analysis with guaranteed accuracy and repeatability. Large selection of lenses that are easy to change. Switch between 6 different observation methods by pushing a button. Fast macro to micro viewing. Accurate measurements... [See More]
- Application: Measuring / Toolmaker / Inspection; Metallurgical; Semiconductor; Wiring Boards, Fractured Infrastructure Metal, Automotive Part Inspection Applications
- Microscope Type: Polarizing; Telecentric Optical System
- Grade: Benchtop
- Optical Technique: Brightfield, Darkfield, MIX [BF + DF], Differential Interference Contrast, Polarized Light
from CIQTEK Co., Ltd
CIQTEK DB500 is a Field Emission Scanning Electron Microscope with a Focused Ion Beam column for nano analysis and specimen preparation, which is applied with “SuperTunnel ” technology, low aberration, and magnetic-free objective lens design, with low-voltage and high-resolution ability... [See More]
- Application: Metallurgical; Semiconductor
- Microscope Type: Scanning Electron Microscope
- Grade: Benchtop; Research
- Resolution: 1.2 to 3
from Evident Scientific
The BXFM-A is a space saving computer controlled microscope module incorporating a motorized Z focus and reflected light vertical illuminator. The BXFM-A offers a high performance optical sensor capability for sophisticated inspection system. [See More]
- Application: Semiconductor
- Microscope Type: Compound; Fluorescent
- Grade: Benchtop
- Optical Technique: BF/DF/DIC/KPO*/FL and Reflected
from CIQTEK Co., Ltd
CIQTEK Quantum Diamond Microscope (QDM) is a wide-field magnetic resonance based on the principle of spin magnetic resonance in the diamond nitrogen-vacancy center (NV center). The spin quantum state of the NV center luminescence defects is susceptible to the surrounding microwave and static... [See More]
- Application: Biological / Life Sciences; Semiconductor; Quantitative Nondestructive Microscopic Magnetic Imaging
- Microscope Type: Quantitative Nondestructive Microscopic Magnetic Imaging
- Grade: Research
- Features: Mechanical Stage
from Evident Scientific
The MX61A is a specially designed semiconductor microscope that allows operators to work in an ergonomically correct position and benefit from smoother operation throughout extended inspection periods, maximizing productivity and integration. [See More]
- Application: Semiconductor
- Microscope Type: Compound; Fluorescent
- Grade: Benchtop
- Optical Technique: BF/DF/DIC/KPO*/FL Reflected/Transmitted
from WDI Wise Device Inc.
The LSCM has the advantages of a confocal laser scanning microscope with the size and price of an IR camera. The combination of high contrast imaging, infrared capabilities, extremely small size and low cost enables many new applications. [See More]
- Application: Biological / Life Sciences; Semiconductor
- Microscope Type: Laser / Confocal; Digital, Video, Optical, and Light
- Grade: Industrial
- Remote Interface: Computer Interface; Special requirements such as modem, RF transmitter, etc.
from KEYENCE
3D Measurement of a Large Area in 4 Seconds. The VR is able to measure across 30 mm in just 4 seconds, with a maximum measurement range of 100 mm x 200 mm. Instead of use a physical probe, the VR utilizes structured lighting to obtain the entire 3D shape of an object. By using telecentric lenses... [See More]
- Application: Semiconductor
- Microscope Type: LED Ring Light, White LED
- Grade: Benchtop
- Magnification: 12 to 50
from Polytec, Inc.
The MSA-500 Micro System Analyzer is the premier measurement technology for the analysis and visualization of structural vibrations and surface topography in micro structures such as MEMS (Micro-Electro-Mechanical Systems) devices. By fully integrating a microscope with Scanning Laser-Doppler... [See More]
- Application: Measuring / Toolmaker / Inspection; Semiconductor; Micro System Analyzer
- Microscope Type: Laser / Confocal; Laser-Doppler Vibrometry, Stroboscopy
- Grade: Benchtop; Research
- User Interface: Digital
from Park Systems, Inc.
Park Systems has revolutionized the AFM with the introduction of the XE-3DM, the fully automated AFM system designed for overhang and trench profiles, sidewall roughness and imaging, and critical angle measurements. The unique design of the XE-3DM, made possible by the XE-series ’ decoupled XY... [See More]
- Application: Semiconductor
- Microscope Type: Scanning Probe / Atomic Force
- Grade: Benchtop
- Resolution: 1.5
from Nikon Metrology
Combined with Nikon's superior CFI60 LU/L optical system and an extraordinary new illumination system, this microscope provides images with greater contrast, high resolving power and darkfield images three times brighter than before. Used independently, or in combination with wafer loaders, the L200... [See More]
- Application: Semiconductor
- Magnification: 1 to 150
- Grade: Benchtop
- Objective Lenses: 4
from KEYENCE
Features. Live depth composition eliminates the need for manual focus adjustment. High-resolution HDR function with increased resolution limits. Easy Mode for quick access to advanced functions. Integrates observation, image capture, and measurement capabilities for improved workflow. Application... [See More]
- Application: Semiconductor
- Features: Mechanical Stage
- Grade: Benchtop
- User Interface: Analog
from Polytec, Inc.
Polytec's MSV-050 and MSV-100 Microscope Adapters are the bridge that connects Laser-Doppler Vibrometry (LDV) to the micro world. Designed to couple a fiber-optic vibrometer head to a microscope, the adapters permit precise single-point and differential vibration analysis on MEMS and other... [See More]
- Application: Measuring / Toolmaker / Inspection; Semiconductor; Microscope Adapter
- Microscope Type: Laser / Confocal; Laser Doppler Vibrometry
- Grade: Benchtop; Research
- Magnification: 1 to 100
from Park Systems, Inc.
XE-HDM is an automatic defect review AFM which revolutionizes the way defects in HDD substrates and media are searched, scanned, and analyzed. The new XE-HDM significantly increases throughput for the defect review process; test runs with real defects demonstrate over 500 - 800% gain in throughput... [See More]
- Application: Semiconductor
- Microscope Type: Scanning Probe / Atomic Force
- Grade: Benchtop
- Resolution: 1.5
from Nikon Metrology
Nikon Eclipse L300N/L300ND FPD / Wafer Inspection microscopes incorporate Nikon ’s renowned CFI60 infinity optics, offering the world ’s highest level of optical performance. The enhanced epi-fluorescence function, which enables 365nm UV excitation, is optimal for the inspection of... [See More]
- Application: Semiconductor
- Magnification: 1 to 150
- Grade: Benchtop
- Objective Lenses: 4
from Polytec, Inc.
The MSV-400 Microscope Scanning Vibrometer is the successor to the award-winning MSV-300 for full-field vibration analysis of very small objects such as MEMS optical switches. Based on the laser Doppler principle, a HeNe laser maps the vibrational response of the structure with a lateral resolution... [See More]
- Application: Measuring / Toolmaker / Inspection; Semiconductor; Microscope Scanning Vibrometer
- Microscope Type: Scanning Probe / Atomic Force
- Grade: Benchtop; Research
- Resolution: 1000
from Park Systems, Inc.
Atomic Force Microscopy (AFM) is emerging as an essential tool in many industries. With its ability to accurately measure critical dimensions in the micrometer to nanometer regime, the AFM is becoming an essential tool choice in applications involving surface roughness, trench width, depth, sidewall... [See More]
- Application: Semiconductor
- Microscope Type: Scanning Probe / Atomic Force
- Grade: Benchtop
- Field of View: 0.1000
from Nikon Metrology
A manual microscope with episcopic/diascopic illumination, which meets the various needs of observation, inspection, research, and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before mean superior optical performance and efficient digital... [See More]
- Application: Metallurgical; Semiconductor; Observation, Inspection, Research
- Magnification: 1 to 150
- Grade: Benchtop
- Objective Lenses: 4
from Park Systems, Inc.
Hard Disk Drive (HDD) manufacturers can now reliably depend on Park Systems ’ XE-PTR, a fully automated industrial in-line AFM for automatic Pole Tip Recession measurements on rowbar-level sliders. As most HDD manufacturers are turning to PMR (Perpendicular Magnetic Recording), sub-nano scale... [See More]
- Application: Semiconductor
- Microscope Type: Scanning Probe / Atomic Force
- Grade: Benchtop
- Resolution: 1.5
from Nikon Metrology
A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging. Max. sample size:... [See More]
- Application: Semiconductor
- Magnification: 1 to 150
- Grade: Benchtop
- Objective Lenses: 4