Products & Services
See also: Categories | Featured Products | Technical Articles | More Information-
Supplier: Accuris
Description: Test Methods for Electroheating Installations with Electron Guns
-
Supplier: Accuris
Description: Test methods for electroheating installations with electron guns
-
Description: Applies to electroheating installations with one or more electron guns as heating source. Covers test methods to determine the essential parameters and contains technical data and characteristics.
-
-
Supplier: CSA Group
Description: IEC 60703:2008 lays down the test methods to determine the essential parameters, technical data and characteristics of electroheating installations comprising one or more electron guns. The significant changes with respect to the previous edition are as follows: the latest edition of
-
Supplier: Accuris
Description: Safety in Electroheat Installations Part 7: Particular Requirements for Installations with Electron Guns
-
Supplier: Accuris
Description: Safety in electroheat installations Part 7: Particular requirements for installations with electron guns
-
Supplier: CSA Group
Description: Deals with safety of electroheat installations with electron guns and applies to all electroheat applications with electron guns. May also be used for non-thermal applications with electron guns and equipment employing glow discharge systems. Applies also to
-
Description: Deals with safety of electroheat installations with electron guns and applies to all electroheat applications with electron guns. May also be used for non-thermal applications with electron guns and equipment employing glow discharge systems. Applies also to
-
Description: Deals with the safety of electroheating installations with electron guns and is to be read in conjunction with IEC 60519-1. Applies also to the high-voltage source supplied to electron guns and may also be used for equipment employing glow discharge heating systems, where
-
Supplier: Leister USA
Description: Powerful Compact Robust Construction site tried and tested
-
Supplier: CIQTEK Co., Ltd
Description: High-speed scanning electron microscope for cross-scale imaging of large-volume specimensCIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration,
- Total Magnification: 66 to 1,000,000 X
- Resolution: 1.2999999999999998 to 3.3 nm
- Accelerating Voltage: 0.1 to 30 kilovolts
- Remote Interface: Computer Interface, Image Analysis Processing Software
-
Supplier: Hitachi High Technologies America, Inc.
Description: The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness and stability, affording high-resolution imaging and high-quality elemental analysis.
- Application: Biological / Life Science, Medical / Forensic
- Microscope Type: Scanning Electron Microscope (SEM)
-
Supplier: CIQTEK Co., Ltd
Description: CIQTEK SEM4000Pro is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers
- Total Magnification: 1 to 1,000,000 X
- Resolution: 0.8999999999999999 to 2.5 nm
- Accelerating Voltage: 0.2 to 30 kilovolts
- Grade: Benchtop, Research
-
Supplier: Electron Beam Engineering, Inc.
Description: The "BEAMER" line is a completely new design of electron beam welders taking advantage of all the latest developments in the fields of electronic control systems, high voltage power supplies, vacuum technology and electron gun design. It is available in four different cubed
-
Supplier: JEOL USA, Inc.
Description: "NEOARM" / JEM-ARM200F comes with JEOL’s unique cold field emission gun (Cold FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low
- Accelerating Voltage: 30 to 200 kilovolts
- Microscope Type: Transmission Electron Microscope (TEM)
-
Supplier: Leister USA
Description: Powerful Compact Robust Construction site tried and tested
- Output Power Capability: DC Output
- Equipment Type: Gun / Iron / Torch
- Process Capability: Plastic Welder, Welding Equipment
-
Supplier: HiTek Power Ltd.
Description: High reliability Computer controlled Supports tungsten & LaB6 filaments Fibre optic communications link Applications: Scanning electron microscopes Electron beam Lithography Focussed ion beam lithography Semiconductor inspection/repair Transmission microscopy Ion beam etching
- Type: High Voltage Power Supply
-
Supplier: Hitachi High Technologies America, Inc.
Description: The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. With the option for a probe-forming aberration corrector,
- Application: Biological / Life Science, Medical / Forensic
-
Supplier: CSA Group
Description: ISO 24236:2005 specifies a method for evaluating the constancy and repeatability of the intensity scale of Auger electron spectrometers, for general analytical purposes, using an electron gun with a beam energy of 2 keV or greater. It is only applicable to instruments that
-
Description: ISO 24236:2005 specifies a method for evaluating the constancy and repeatability of the intensity scale of Auger electron spectrometers, for general analytical purposes, using an electron gun with a beam energy of 2 keV or greater. It is only applicable to instruments that
-
Supplier: JEOL USA, Inc.
Description: Features Electron Probe Microanalyzer (EPMA) has been utilized as a tool for research development and quality assurance in a variety of industrial fields such as steel, automobile, electric component, battery material and its application are expanding more and more. In addition, in academic
-
Supplier: Hiden Analytical
Description: Static and Dynamic SIMSAuger Electron SpectroscopyIon Beam SputteringSurface Science StudiesRastering / Depth Profiling
-
Description: cleaning and with an electron gun capable of operating at 4 keV or higher beam energy.
-
Supplier: CSA Group
Description: cleaning and with an electron gun capable of operating at 4 keV or higher beam energy.
-
Description: at relative resolutions poorer than 0,2 % in the constant delta E/E mode or 1,5 eV in the constant delta E mode, those requiring tolerance limits of plus or minus 0,05 eV or less, nor those with an electron gun that cannot be operated in the energy range 5 keV to 10 keV. It does not
-
Supplier: ASTM International
Description: to the analyzer entrance. Some of the methods described here require an auxiliary electron gun mounted to produce an electron beam of variable energy on the specimen (“electron-gun method”). Other experiments require a sample with a sharp edge, such as a wafer
-
Supplier: Hiden Analytical
Description: Low power, high brightness, surface ionisation source coupled to a compact ion column, providing high performance in a small package.
-
Supplier: AENOR
Description: Safety in electroheat installations -- Part 7: Particular requirements for installations with electron guns
-
Supplier: AENOR
Description: TEST METHODS FOR ELECTROHEATING INSTALLATIONS WITH ELECTRON GUNS. (Endorsed by AENOR in April of 1996.)
-
Supplier: AENOR
Description: Test methods for electroheating installations with electron guns (Endorsed by AENOR in April of 2009.)
-
Supplier: Integrated Engineering Software
Description: for over 20 years. Applications include: Charged Particle Trajectories Ion mobility spectroscopy Ion traps Ion mass spectrometers Time of flight Deflector plates Microchannel plates Multipaction Photomultiplier tubes Charged Particle Beams Electron guns Ion guns Ion implanters
-
Supplier: IMI Life Science
Description: Precision high voltage modules delivering exceptionally low levels of noise and drift, designed for easy integration into systems requiring multiple high voltages. Applications include mass spectrometry and electron gun operations. Exceptionally low levels of low frequency (LF) noise
- DC Input Voltage: 24 volts
- DC Output Voltage: 15,000 volts
- DC Output Current: 0.00025 to 0.005 amps
- Number of Outputs: 1 #
-
Description: ISO 23830:2008 specifies a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general analytical purposes. It is only applicable to instruments that incorporate an electron gun for charge
Find Suppliers by Category Top
Featured Products Top
-
-performance electron gun, achieving the expected resolution is not always possible. One possible cause is slight instability in the electron beam. But did you know that electron microscopes can experience a phenomenon similar to (read more)
Browse Power Supplies Datasheets for Daitron Co., Ltd. -
your Electron Beam Guns or Magnetron Sputtering applications. We also offer standard coaxial feedthroughs that support the needed signal information for your Crystal Sensor Holders and Crystal Sensing Devices to ensure your coating thicknesses are being deposited correctly. We understand your (read more)
Browse Feedthroughs Datasheets for MPF Products, INC. -
Die/Laser Cut Preforms Gun Applicators View all packaging options (read more)
Browse Epoxy Adhesives Datasheets for Master Bond, Inc. -
Die/Laser Cut Preforms Gun Applicators View all packaging options (read more)
Browse Specialty Adhesives, Sealants, and Compounds Datasheets for Master Bond, Inc.
Conduct Research Top
-
Database For Trace Analysis (.pdf)
Coupled with an Energy Dispersive x-ray System (EDS), the Scanning Electron Microscope (SEM) is often used to analyze trace evidence. Automated identification of gun shot residue is an excellent example of this. The traditional approach has been to mount the unknown in some fashion, insert
More Information Top
Indicates content that may require registration and/or purchase.
-
Intense Electron and Ion Beams
Electron Guns . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
-
Thin-Skin Deployable Mirrors for Remote Sensing Systems
A thin-skin piezoelectric bimorph mirror will bend in response to an applied electric field and can therefore be deformed into desirable shapes using a scanning electron gun .
-
Electron Beams and Microwave Vacuum Electronics
Single-Component Flows 3.5.3 Meltzer Flow 3.5.4 Laminar Noncongruent Beams 4 Electron Guns 4.1 Introduction 4.2 Pierce’s Synthesis Method for Gun Design 4.3 Internal Problems of Synthesis.
-
Proceedings of the XIX international Linac conference
Electron Gun Simulation Using MAGIC .
-
Investigation of multi-charged heavy ion production in an electron beam ion source
This test model utilized an electron gun placed .
-
Deployable large aperture optics system for remote sensing applications.
This report summarizes research into effects of electron gun control on piezoelectric polyvinylidene fluoride (PVDF) structures.
-
Electron Lenses for Super-Colliders
… acting on high-energy protons, do not present any material close to the beam, thus, avoiding material damage and impedance increase; (b) In a typical e-lens configuration, electrons are produced at the cathode of an electron gun and right after interaction …
-
Experimental Innovations in Surface Science
Electron Gun Design and Behavior . . . . . . . . . . . . . . . . . . .
-
Development of an Ultrafast Low-Energy Electron Diffraction Setup
4 Numerical Analysis of a Tip-Based Ultrafast Electron Gun . . . . . .
-
Vacuum Electronics
Gridded electron guns and introduction of the impregnated cathodes in the 1970s.