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Supplier: RS Components, Ltd.
Description: LEAPER-2 is a portable, small and light Linear IC Tester that provides auto detection function. Easy-operating, particularly designed for the linear IC. Small, portable, light and power-saving, usable with batteries. Average test time: 0.8 second. Equipped with empty-load test,
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Supplier: RS Components, Ltd.
Description: A handheld, battery powered linear IC tester (200 x100 x 55mm) designed to test a variety of analogue devices including comparators, op amps, opto-isolators, regulators. Testing by direct entry of device number. On screen IC function and pin data. Intermittent and temperature
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Supplier: RS Components, Ltd.
Description: and overload protection. Dimensions: 175 mm x 84 mm x 31mm Resistance Measurement Resolution = 0.1Ohms Capacitance Measurement Resolution = 0.1pF Tester Type = Component, IC Display Type = LCD Battery Life = 200 h Battery Type = Alkaline Power Source = Battery Dimensions = 84 x 31 x
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Supplier: ProductionLine Testers, Inc.
Description: The IC200 is an automatic, multi-channel, parametric test system for DC analysis of integrated circuits. Base tester comes with a 4-channel VI-Source board, and is expandable to 128 channels. This tester is the ideal replacement for the common rack-and-stack systems that run
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Supplier: RS Components, Ltd.
Description: The ABI ChipMaster Compact Professional is a hand held out-of-circuit IC tester. The ChipMaster is designed for testing digital ICs with up to 40 pins through a ZIF socket. The ChipMaster includes a search facility for unknown ICs, loop modes for intermittent failure detection,
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Supplier: ProductionLine Testers, Inc.
Description: The IC100-S packs a variety of fast and powerful instruments into a small box at a small price. This rugged little tester is fully capable of high volume production testing. It includes everything needed to test most low-to-medium complexity analog, digital, and mixed-signal IC
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Supplier: ODG (Origin Data Global)
Description: Battery Management 1-Cell Li-ion Battery Protection IC
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Supplier: ProductionLine Testers, Inc.
Description: The IR3000 Model 3 is the latest, fully integrated automatic test system customized to electrically and optically test IrDA transceiver modules. The system has been specifically built and programmed to test 115.2 KHz and 4 Mbps IR transceivers. Tests include standard IC tests, direct LED
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Supplier: VAST STOCK CO., LIMITED
Description: Video IC Development Tools IMX224 MIPI Module w/ USB 3.0 EVA Kit
- Category: Development Suite / Kit
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Supplier: ODG (Origin Data Global)
Description: Battery Management 2-Cell Li-ion Battery Protection IC
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Supplier: ProductionLine Testers, Inc.
Description: The IC100-A is a special-purpose tester that is configured from the basic IC100-S. Most modern Ambient Light Sensors include an I2C port to read and write the internal registers. Some additionally include an infrared transceiver for proximity sensing. The IC100-A is built
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Supplier: ODG (Origin Data Global)
Description: Battery Management 2 to 5 Serial Cell Li-ion Battery Protection IC for Secondary Protection
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Supplier: ODG (Origin Data Global)
Description: Battery Management 3-Cell to 5-Cell Li-ion Battery Protection IC
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Supplier: Haida International Equipment Co., Ltd.
Description: 1. Application Electronic Universal Tensile Tester is used to test tension, compression, shearing force, adhesion, peeling force, tear strength,etc. of specimen, semi-product and finished product in the field of rubber, plastic, metal, nylon, fabric, paper, aviation, packing
- Application Software: Yes
- Display / Interface: Computer Interface
- Force / Load Capacity: 1102 to 4410 lbs
- Mechanical Test: Tensile, Universal
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Supplier: ValueTronics International, Inc.
Description: may break down and result in current flow leakage. HiPot testers keep engineers safe from current leakages by detecting gaps and defects in the electronic device. Dielectric Testers, Insulation Testers, and Megohmmeters are similar to HiPot testers. Popular manufacturers
- Types of Measurements: Insulation Resistance, Current Leakage Tester, Ground Bond Testers
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Supplier: Utmel Electronic Limited
Description: IC BATT PROTECTION
- Operating Temperature: -40 to 85 C
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Supplier: Utmel Electronic Limited
Description: IC BATT PROTECTION
- Operating Temperature: -40 to 85 C
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Supplier: Utmel Electronic Limited
Description: IC LITHIUM BATT PROTECT 20TSSOP
- Operating Temperature: -40 to 85 C
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Supplier: Utmel Electronic Limited
Description: IC BATTERY MONITOR HP 8-TSSOP
- Current Test Range: 0.0050 amps
- Operating Temperature: -20 to 70 C
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Supplier: Visual Sound, Inc.
Description: RDL, Radio Design Labs Compact padded nylon instrument case for carrying one or two RDL® portable testers, power supplies and associated test leads. The PT-IC1 is a compact padded nylon instrument case for carrying one or two RDL® portable testers, power supplies
- Type: Bag / Sack
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Supplier: Seaward Group USA
Description: The Sentinel hipot / flash tester provides simple affordable AC or DC Hipot/flash/dielectr ic withstand testing, ideal for the manufacturing or conformance lab test environment. Manual or automatic test sequences can be created with multiple test steps. This is a highly versatile
- AC Current: Up to 0.0400 amps
- AC Voltage: 100 to 5000 volts
- DC Current: Up to 0.0100 amps
- DC Voltage: 100 to 6000 volts
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Supplier: Seaward Group USA
Description: The A203K/TL hipot/flash/dielectr ic withstand tester is a cost effective simple to use, rugged test system suited to manufacturing or laboratory environments. It can deliver a test voltage of 0 to 15 kV a.c. from an internal 500VA transformer source, and has displays that show both
- AC Current: Up to 0.0050 amps
- AC Voltage: 0.0 to 15000 volts
- Display: Analog Meter
- Features: Buzzer or Annunciator, Warning Indicator Light
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Supplier: Seaward Group USA
Description: The A203H/TL hipot/flash/dielectr ic withstand tester is a cost effective simple to use, rugged test system suited to manufacturing or laboratory environments. It can deliver a test voltage of 0 to 10 kV a.c. from an internal 250VA transformer source, and has displays that show both
- AC Current: Up to 0.0050 amps
- AC Voltage: 0.0 to 10000 volts
- Display: Analog Meter
- Features: Buzzer or Annunciator, Warning Indicator Light
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Description: ENHANCED BIT ERROR RATE TESTER
- Device Type / Applications: Sensor Interface
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Supplier: VAST STOCK CO., LIMITED
Description: Battery Management Bat IC for Cell & IC
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Supplier: VAST STOCK CO., LIMITED
Description: Battery Management Composite IC
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Supplier: VAST STOCK CO., LIMITED
Description: Battery Management COMPOSITE IC
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Supplier: DigiKey
Description: IC
- Form Factor: Test Module / Sub-system
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Supplier: Lingto Electronic Limited
Description: IC
- Form Factor: Other
- Test Capability: Other
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Supplier: Rochester Electronics
Description: BQ2023 Single-Wire Advanced Battery Monitor IC for Cellular and PDA Applications
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Supplier: Infineon Technologies AG
Description: This multi-channel IC for battery monitoring and balancing is engineered to monitor up to 18 channels in Lithium-ion battery packs utilized in diverse automotive, industrial, and consumer applications. The module performs four primary roles: measuring cell voltage, assessing temperature
- Operating Temperature: 150 C
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Supplier: Quarktwin Technology Ltd.
Description: Telecom IC Bit Error Rate Tester (BERT) 32-TQFP (7x7)
- IC Package Type: QFP, TQFP, Other
- RoHS Compliant: Yes
- Supply Voltage: 3.6V, Other
- TJ: 0.0 to 70 C
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Supplier: DigiKey
Description: Telecom IC Bit Error Rate Tester (BERT) 32-TQFP (7x7)
- IC Package Type: TQFP, Other
- Pin Count: 32 #
- TJ: 0.0 to 70 C
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Supplier: Radwell International
Description: CIRCUIT BOARD, HANDLER / IC TESTER. FREE 2 YEAR RADWELL WARRANTY
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Supplier: Win Source Electronics
Description: Manufacturer: Maxim Integrated Win Source Part Number: 869528-DS2172T/T&R Operating Temperature Range: 0°C ~ 70°C Features: Telecom IC Bit Error Rate Tester (BERT) 32-TQFP (7x7) Package: Bulk Package: 32-TQFP Mounting: Surface Mount Part Status: Obsolete
- IC Package Type: QFP, TQFP, Other
- TJ: 0.0 to 70 C
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PCBA functional tester can also be called a Test fixture or test jig, and it is a highly efficient but simple principle. It uses metal probes to connect the pad or test point on the PCB. When the PCB is powered on, the tester can get the PCB voltage, current (read more)
Browse Printed Circuit Substrate Materials (PCB / PWB) Datasheets for FX PCB Co., Ltd. -
graphical software interface that requires no programming skills, making it ideal for both Designers and Test Engineers (TE). The DMT from Cosmic is a compact, mixed signal and digital automatic test equipment (ATE) designed for efficient IC validation. Thanks to its ultra high hardware (read more)
Browse Automated Test Equipment Datasheets for Cosmic Equipment SpA
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EETimes.com | Electronics Industry News for EEs & Engineering Managers
Heard on the Beat (May 3) Heard on the Beat (May 3) Semiconductor Alert! (April 28-May 3) Commentary & analysis of week's chip news, April 28-May 3 ATE startup Inovys leaks details about new low-cost IC tester for SoC devices PLEASANTON, Calif. -- More details are surfacing about the first
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Application: Switching Performance PCB's Used In IC's - Reed Relay
Chip makers use new performance boards for every new chip they develop. Since most integrated. circuit/chip makers generally have large factories devoted to the testing of their chips. Hundreds of testers are typically used on a 24 hour/7 days a week basis. Each tester may be well over $1,000,000
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EETimes.com | Electronics Industry News for EEs & Engineering Managers
IC forecasts see slowdown in '05, '06 Magma, PDF Solutions implement flow to improve IC yield : Prices to climb, parts are scarce Xilinx' FPGA lead times are easing, says analyst ASML to enter LCD stepper biz PMC-Sierra bumps up revenue forecast for Q2 WJ expands wireless infrastructure line
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EETimes.com | Electronics Industry News for EEs & Engineering Managers
into SOC business, says Taiwanese executive IMS to provide tools for Advantest logic testers Samsung orders RDRAM testers from Schlumberger Motorola tips its RF IC strategy, revealing GaAs FET and SiGe amp Zygo metrology tool increases precision of wafer planarity measurement Intel invests
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EETimes.com | Electronics Industry News for EEs & Engineering Managers
Atmel rolls out single-chip DAB processor for digital radios HEILBRONN, Germany--Atmel Corp. today announced a single-chip baseband processor for Digital Audio Broadcasting (DAB) radios. The European unit of Atmel here said the new IC U2739M processor is the industry's first one-chip decoder
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EETimes.com | Electronics Industry News for EEs & Engineering Managers
, Nov. 5-9 Eagle rolls out low-cost tester for mixed-signal ICs MUNDELEIN, Ill. -- In a move to lower the cost of test, Eagle Test Systems Inc. here recently rolled out a new tester for use in analog and mixed-signal chip applications. The new ETS-6000 from Eagle is said to test 64 mixed-signal
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EETimes.com | Electronics Industry News for EEs & Engineering Managers
is building a new line of "structural testers " for Intel. The Santa Clara, Calif.-based chip giant is reportedly using these testers for next-generation chip products, possibly even microprocessors, according to sources. What happen to the upturn? SAN JOSE -- What happened to the anticipated recovery
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EETimes.com | Electronics Industry News for EEs & Engineering Managers
Agilent announces new memory tester PALO ALTO, Calif.-- Agilent Technologies Inc. here has expanded its line of automatic test equipment, rolling out a system for use in testing high-speed non-volatile memory devices. Featuring a tester-per-site architecture, the V4400 NVM Test System from Agilent
More Information Top
Indicates content that may require registration and/or purchase.
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Digital Logic Testing and Simulation 2nd Edition
When debugging first silicon, the IC tester can apply stimuli and monitor response in order to determine whether or not the device responds correctly.
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Digital IC Tester
Digital IC Testers .
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Digital IC
MME-DIT 2040 - Digital IC Tester .
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The Boundary-Scan Handbook
Figure 4-1: The analog testing subsystem of an IC tester is used to switch load and test resources to measure analog parametric properties of an IC.
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Optical Delay Tester
We place an electro-optic crystal at the back of the IC tester 's test board and irradiate the crystal with laser pulses.
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http://thescipub.com/pdf/10.3844/ajassp.2005.824.827
Design of a Low Cost IC Tester .
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Practical Aspects of Embedded System Design using Microcontrollers
We have developed many interesting case studies such as a night lamp controller, automation of a nylon rubber stamp making machine, digital IC tester , etc.
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Gizopoulos / Advances in ElectronicTesting
These may be different than the corresponding definition for an IC tester .