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Supplier: Accuris
Description: Characterization of pavement texture by use of surface profiles Part 6: Verification of the performance of laser profilometers used for pavement texture measurements
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Supplier: Accuris
Description: Characterization of pavement texture by use of surface profiles \x97 Part 6: Verification of the performance of laser profilometers used for pavement texture measurements
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Supplier: Accuris
Description: Characterization of pavement texture by use of surface profiles \x96 Part 6: Verification of the performance of laser profilometers used for pavement texture measurements
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Supplier: KEYENCE
Description: Blue Laser Optical System The use of a blue laser enables ultra-stable and highly accurate measurements. Able to measure on black surfaces or inclines with low reflectance as well as highly reflective metallic surfaces. A very accurate profile is captured even when the target has a
- Machine Type: 2-D Scanning / Profiling
- Control: PC
- Application: Profile Measurement
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Supplier: Micro-Epsilon Group
Description: The scanCONTROL 30x2 laser profile scanners provide calibrated profile data with up to 7.9 million points per second. Thanks to their high accuracy, high profile frequency and versatility, these powerful scanners are particularly suitable for demanding measurement tasks. They measure and
- Vertical (Z) Range: 3.05118275 to 3.64173425 inch
- Operating Temperature: 32 to 113 F
- Profile Vertical Range: 3.05118275 to 3.64173425 inch
- Measurement Capability: 2D / Line Profile, 3D / Areal Topography, Defects / ADC, Flatness, Step Height, Thickness, Warp / Bow
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Supplier: MTI Instruments Inc.
Description: The latest 1D laser displacement sensor from MTI provides excellent speed and accuracy for even the most difficult applications and provides data output and power through a single USB cable. The Microtrak™ 4 is the ultimate 2d laser measurement sensor for measuring height, thickness,
- Vertical (Z) Range: 3.93701 inch
- Vertical (Z) Resolution: 0.0000750787807 inch
- Operating Temperature: 32 to 104 F
- Profile Vertical Range: 3.93701 inch
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Supplier: MTI Instruments Inc.
Description: the ideal laser power needed for different types of surfaces Programmable Cut-time feature – The bridging function ignores hole and cut-outs on objects for in process gap control and measurement No controller Needed – Built-in 5-color position indicator determines nominal laser gap
- Vertical (Z) Range: 0.9842525 inch
- Vertical (Z) Resolution: 0.00000150000081 inch
- Operating Temperature: 32 to 104 F
- Profile Vertical Range: 0.9842525 inch
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Supplier: Micro-Epsilon Group
Description: The scanCONTROL 8x00 sensors use innovative Green Laser Technology (520 nm), which operates near the range where the sensor achieves its highest quantum efficiency. This ensures extremely stable measurement signals with minimal noise, even on shiny metals, printed circuit boards, or organic
- Vertical (Z) Range: 4.330711 to 8.0708705 inch
- Operating Temperature: 32 to 113 F
- Profile Vertical Range: 4.330711 to 8.0708705 inch
- Measurement Capability: 2D / Line Profile, 3D / Areal Topography, Defects / ADC, Flatness, Step Height, Thickness, Warp / Bow
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Supplier: KEYENCE
Description: Features Non-contact 3D metrology system performs nanometer level profile, roughness and thickness measurements on nearly any material. This software module complies with ISO 25178 and allows users to complete measurements of several surface parameters. Up to 28,800x magnification 0.5 nanometer
- Features: Surface Profilometry
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Supplier: Micro-Epsilon Group
Description: scanCONTROL 29x0 laser scanners are designed for industrial measurement tasks where compact design and high accuracy are required. Thanks to their high resolution, versatility and excellent price-performance ratio, the scanners are particularly suitable for static and dynamic applications,
- Vertical (Z) Range: 7.480319 to 11.417329 inch
- Operating Temperature: 32 to 113 F
- Profile Vertical Range: 7.480319 to 11.417329 inch
- Measurement Capability: 2D / Line Profile, 3D / Areal Topography, Defects / ADC, Flatness, Step Height, Thickness, Warp / Bow
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Supplier: Micro-Epsilon Group
Description: scanCONTROL 25x0 laser scanners are designed for industrial measurement tasks. Thanks to their high signal stability, versatility and excellent price-performance ratio, the scanners are particularly suitable for measurement tasks involving large quantities. They measure and evaluate, for
- Vertical (Z) Range: 2.10630035 to 3.09055285 inch
- Operating Temperature: 32 to 113 F
- Profile Vertical Range: 2.10630035 to 3.09055285 inch
- Measurement Capability: 2D / Line Profile, 3D / Areal Topography, Defects / ADC, Flatness, Step Height, Thickness, Warp / Bow
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Supplier: SAE International
Description: Holes are scanned in process using a laser profilometer. Coordinates for points along the countersink edge are processed with a unique filtering algorithm providing a highly repeatable estimate for major and minor diameter.
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Supplier: RIFTEK EUROPE Sp. z.o.o.
Description: The laser profilometer is employed for measuring geometrical parameters of the rail wheel flange (thickness, slope, height), rim/tire thickness and for taking full profile of the wheel roll surface. The device is supplied with database and software package for wheel sets wear data
- Range: 0.787402 to 55.11814 inch
- Gage / Instrument Type: Height Gage, Optical - Laser, Special Function / Form Gages
- Measurement Scale / Units: Metric
- Gaging Technology: Optical
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Supplier: Mahr Inc.
Description: isometric or numeric graph with plate grade All features as standard differential level system Electronic levels are much easier to use with an autocollimator or a laser based calibration system Performance is comparable and results are obtained without time consuming sight path alignments,
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Supplier: RIFTEK EUROPE Sp. z.o.o.
Description: Portable laser rail profilometer (PRP) is designed for non contact registration of cross-section of the railhead acting face. The main functions of PRP are: Obtaining the information on the cross-section profile of the working railhead surface Full profile scanning and analyze of the
- Application: Dimensional Measurement, Profile Measurement
- Probe / Head: Laser Triangulation
- Control: PC
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Supplier: Renishaw
Description: Multi-sensor 5-axis measurement system The REVO system uses synchronised motion and 5-axis measurement technology to minimise the dynamic effects of CMM motion at ultra high measurement speeds. This is achieved by letting the REVO-2 head do the fast demanding motion while the CMM moves in a linear
- Technology: Non-contact - Optical / Laser
- Applications: Precision Machining / Grinding
- Features: Surface Profilometry
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Supplier: Mahr Inc.
Description: Product features The precision, computer-controlled optical measuring instrument MarSurf CWM 100 with sub-nanometer resolution. A combined 3D measuring system comprising a confocal microscope and white light interferometer Features Advantages Special microscope technology dedicated to the
- Vertical (Z) Range: 3.93701 inch
- Measurement Capability: 3D / Areal Topography
- Mounting / Loading Options: Benchtop
- Applications: Electronics, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
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Supplier: North Star Imaging, Inc.
Description: The X25 is quite possibly the most conveniently sized system on the market. The system offers all of the same creature features as the larger systems while still maintaining the ability to fit through a standard interior door. The X25 is well suited for small to medium sized objects. SYSTEM
- Part Diameter / Width: 6 inch
- Measurement Capability: 2D / Line Profile, 3D / Areal Topography
- Applications: Aerospace / Defense, Automotive, Coatings (Thin Films, Plating, etc.), Electronics, Mechanical Parts (Bearings, Shafting), Medical, Precision Machining / Grinding, Wear / Tribology
- Mounting / Loading Options: Floor / Free Standing
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Supplier: SAE International
Description: automated solutions. Electroimpact is delivering a solution that integrates multiple technologies to combat inspection challenges. The approach integrates laser projectors, cameras, and laser profilometers in a comprehensive user interface that greatly reduces the burden on
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Supplier: LMI Technologies
Description: MikroCAD delivers sub-micron accuracy and repeatability on a variety of challenging scan surfaces such as shiny, reflective and steep edges, in contrast to confocal solutions that are unable to handle steeply angled geometries. With MikroCAD 3D Surface Metrology you can: Measure roughness and
- Traverse Length: 0.03149608 to 1.181103 inch
- Measuring Path / Scan Length: 0.03149608 to 1.181103 inch
- Measurement Capability: 3D / Areal Topography
- Mounting / Loading Options: Benchtop
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Supplier: Marposs Corp
Description: DESCRIPTION Optocloud S is an advanced optical measurement system that combines multiple laser profilometers, a high-precision rotary axis and an optimized optical architecture to perform complete 360° inspection of parts without repositioning. In a single measuring cycle, the system
- Applications: Gauging, Scanning & Dimensioning
- Features: Other Image Source
- System Type: Turnkey / Complete System
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Supplier: Suzhou Jiujon Optics Co., Ltd
Description: interferometers, and other advanced metrology tools. 2.Laser systems: Cylindrical lenses are used in laser systems to focus and shape laser beams. They can be used to collimate or converge the laser beam in one direction while leaving the other direction unaffected. This
- Surface Quality: 40-20 Scratch / Dig
- Lens Type: Cylindrical Lens
- Features: Other
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The laser profilometer is employed for measuring geometrical parameters of the rail wheel flange (thickness, slope, height), rim/tire thickness and for taking full profile of the wheel roll surface. The device is supplied with database and software package for wheel sets wear data storage and processing. (read more)
Browse Height Gages Datasheets for RIFTEK EUROPE Sp. z.o.o. -
Portable laser rail profilometer (PRP) is designed for non contact registration of cross-section of the railhead acting face. The main functions of PRP are (read more)
Browse Depth Gages Datasheets for RIFTEK EUROPE Sp. z.o.o. -
Optocloud S is an advanced optical measurement system that integrates multiple laser profilometers, a high-precision rotary axis, and an optimized optical architecture to perform complete 360° inspection of parts without repositioning (read more)
Browse 3D Scanners Datasheets for Marposs Corp -
enhances the overall look of the final product. Surface finish is typically measured using a profilometer, which records the texture of the surface in terms of roughness and waviness. The results are often expressed in micrometers (µm) or microinches, indicating the peak (read more)
Browse Metal Tubes Datasheets for Eagle Stainless Tube & Fabrication, Inc. -
endeavor. At Avantier, we design optical solutions systems and manufacture high-performance optics, elevating the standards of metrology equipment used in research, industry, aerospace, and defense. Our comprehensive range of metrology systems includes: 1. Optical Profilometers (read more)
Browse Processing Services Datasheets for Avantier Inc. -
equipment for a wide variety of applications. We work at the forefront of research and developments, and produce metrology systems for research, industry, aerospace, and defense. Examples include: Optical profilometers, which can be used to measure surface topographies at high resolution (read more)
Browse Optical Design Services Datasheets for Avantier Inc.
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https://helda.helsinki.fi/bitstream/handle/10138/19122/therough.pdf?sequence=1
AFM roughness data represents the roughness of only a small part of the surface and therefore needs other methods like laser profilometer are needed to provide a larger scale description of the surface.
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A prototype of digital photogrammetric algorithm for estimating roughness of rock surface
The RMS roughness and Z2s parameters estimated using the DCS 420 non-metric digital camera ranges from 0.001 mm to 0.067 mm and from 0.007 to 0.073, when compared to the laser profilometer values.
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Laser-formed bumps on glass for precision alignment of planar optical components
Bump heights may be rapidly measured in situ using a scanning laser profilometer (e.g., Keyence LT-9010).
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Durability of Building Materials and Components
The loss is referred to the vertical section of the specimen and quantified through a computer code starting from successive readings of the surface decay along defined profiles using a laser profilometer device.
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Effect of carbamide peroxide and hydrogen peroxide on enamel surface: an in vitro study
Therefore, the aim of this study was to investigate (1) the effect of low versus relatively high concentrations of bleaching agents on micromorphology and on microhard- ness of the enamel surface using the laser profilometer , scanning electron microscope, and Knoop hardness tester …
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Tribology of Ceramics and Composites: Materials Science Perspective
On the basis of laser profilometer measurement of wear volume, the specific wear rate is calculated.
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Asperity Height and Aperture of an Artificial Tensile Fracture of Metric Size
… about 1 m in length was created by indenting wedges in a block of granite, and the heights of the two fracture surfaces were measured using a large, non-contact surface profile measurement system with a laser profilometer to determine the aperture …
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Underestimation of roughness in rough rock joints
… type 3D scanner, which is most recently adopted device [14] for surface roughness measurement of rock joints, is better than conventional devices such as a mechanical profilometer [3], a shadow profilometer [30], a stylus profilometer [8], and a laser profilometer [7, 31].
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Monitoring tablet surface roughness during the film coating process
The purpose of this study was to evaluate the change of surface roughness and the development of the film during the film coating process using laser profilometer roughness measurements, SEM imaging, and energy dispersive X-ray (EDX) analysis.
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High Accuracy Form Measurement Of Specularly Reflecting Surfaces By Laser Autocollimation
A single -axis laser profilometer based on this principle was initially developed .