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Supplier: Epsilon Technology Corp.
Description: Epsilon’s very high resolution calibrator features 0.8 microinches (20 nanometers) resolution and has 2 inches (50 mm) of measuring range. The 3590VHR is provided with a netbook PC and software to display the calibrator readings. The 3590VHR calibrator meets the accuracy and
- Software: Application Software Included
- User Interface: Digital Front Panel
- Display: Digital Readouts
- Physical Properties: Displacement / Position
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Supplier: Anton Paar
Description: The NHT3 is designed to provide low loads with depth measurements in the nanometer scale for the measurement of hardness, elastic modulus, creep, etc. The system can be used to characterize organic, inorganic, hard and soft materials. With the unique top surface referencing technique, an
- Force / Load Capacity: 0.1124 lbs
- Stroke / Travel: 0.00787402 inch
- Features: Specialty / Other
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Supplier: Mad City Labs, Inc.
Description: The Nano-Gauge™ is an ultra high precision, single axis, displacement measuring instrument capable of resolving dimensions down to 1.5 nanometers (0.06 microinches) over a full scale range of 25mm (1 inch). Combining ease-of-use and small physical size, the Nano-Gauge™ can be quickly
- Range: 0.00000005905515 to 1 inch
- Resolution: 0.00000005905515 to 0.0000001968505 inch
- Range / Travel: 0.00000005905515 to 1 inch
- Graduation / Resolution: 0.00000005905515 to 0.0000001968505 inch
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: savings: parts are automatically measured in one setting New, highly precise air bearings for extremely reliable results Contour measurements with large deflection range of ±26 mm at resolution of 1.24 nanometers Roughness measurements with large deflection range of ±2 mm at
- Display & Special Features: Computer Interface / Networkable, SPC / Software Capability
- Technology: Contact / Stylus Based
- Mounting / Loading Options: Floor / Free Standing
- Features: Other, Specialty / Custom
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Supplier: Mahr Inc.
Description: The precision optical measuring instrument MarSurf WM 100 with sub-nanometer resolution and measuring accuracy. A 3D white light interferometer measuring system. Features Maximum precision with sub-nanometer resolution and measuring accuracy Suitable for all
- Vertical (Z) Range: 7.87402 inch
- Measurement Capability: 2D / Line Profile, 3D / Areal Topography
- Mounting / Loading Options: Benchtop
- Applications: Electronics, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
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Supplier: MTI Instruments Inc.
Description: Accumeasure System 9000 is a high-resolution, capacitance-based instrument that provides the perfect solution to many previously unattainable measurement applications. Rapid response time and extremely low noise levels make it ideal for critical measurements of targets such as: • X-Y
- Measuring Technology: Capacitance, Non-contact
- Gap Sensor / Feeler Gauge Type: Gap Monitor / Instrument
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Supplier: Lion Precision
Description: The CPL190 is a precision noncontact displacement measuring instrument using capacitive technology. This linear position and displacement sensor has a large selection of rectangular and cylindrical probes providing ranges from 0.4 mils to half an inch. High resolutions as low as one
- Measurement Range: 0.0004 to 0.5 inch
- Linearity: 0.15 to 0.5 ±% Full Scale
- Operating Temperature: 40 to 120 F
- Features: AC Powered
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Supplier: Lion Precision
Description: 0.4 mils to half an inch. Resolutions as low as one nanometer are available with a typical resolution of 0.003% of range at full 15 kHz bandwidth. Zero adjustments and visual range indicators ease setup.Vacuum compatible systems are available. Our expertise will help you make
- Measurement Range: 0.0004 to 0.5 inch
- Linearity: 0.15 to 0.5 ±% Full Scale
- Operating Temperature: 40 to 120 F
- Features: AC Powered
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Supplier: Mahr Inc.
Description: Product features The precision, computer-controlled optical measuring instrument MarSurf CWM 100 with sub-nanometer resolution. A combined 3D measuring system comprising a confocal microscope and white light interferometer Features Advantages Special microscope technology
- Vertical (Z) Range: 3.93701 inch
- Measurement Capability: 3D / Areal Topography
- Mounting / Loading Options: Benchtop
- Applications: Electronics, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
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Supplier: MTI Instruments Inc.
Description: thermal correction, focusing and closed loop control applications. It provides exceptional value and offers sub-nanometer resolution, extreme stability, exceptional repeatability, and fast response time, making it ideal for micro-positioning, thermal correction, focusing and closed
- Sensor Technology: Capacitive Linear Position Sensor
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Supplier: MTI Instruments Inc.
Description: Accumeasure System 9000 is a high-resolution, capacitance-based instrument that provides the perfect solution to many previously unattainable measurement applications. Rapid response time and extremely low noise levels make it ideal for critical measurements of targets such as: • X-Y
- Measurement Range: 0 to 0.49212625 inch
- Sensor Technology: Capacitive Linear Position Sensor
- Features: DC Powered
- Output: Voltage
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Supplier: RainWise, Inc.
Description: square meter for sunlight intensities of up to 2000 watts per square meter. The standard resolution of the sensor is 10 watts per square meter. Using a 10 bit digitizer, the sensor is capable of providing minimum resolution of 2 watts per square meter. The Pyranometer is available with
- Operating Temperature: -85 to 176 F
- Measured Wavelength: 400 to 1,200 nm
- Accuracy: 3 (+/- %)
- Spectral Sensitivity: 0.5 (µV(or A)/Wm-2)
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Supplier: Lion Precision
Description: The CPL490 is the most precise capacitive displacement sensor in the world. Linear noncontact position sensors with the highest resolution possible. With a bandwidth up to 50 kHz and resolutions less than one nanometer (7 ppm), this instrument is for the most demanding
- Measurement Range: 0.0004 to 0.004 inch
- Linearity: 0.2 ±% Full Scale
- Operating Temperature: 60 to 100 F
- Features: AC Powered
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Supplier: Micromeritics
Description: in other laser particle sizing systems. The level of detail, accuracy, and resolution enables the extraction of all available information from the static light scattering pattern. Both organic and inorganic particles can be analyzed and measured over a wide range of 40 nanometers to
- Delivery: Classroom (On Campus / Trainer's Facility)
- Type: Course, Product Training
- Technology / Subject Expertise: Testing / Test Methods
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Supplier: MTI Instruments Inc.
Description: from having to purchase additional acquisition hardware. Features True Direct Digital Capacitive Displacement Sensor Up to 0.01% FSR Linearity Sub-nanometer Resolution Built-in Quadrature Input 20kS/sec. on all channels No need for Analog-to-Digital Converter 100% digital linearization
- Measuring Range: 0 to 0.041010520833333335 ft
- Measuring Technology: Capacitance, Non-contact
- Gap Sensor / Feeler Gauge Type: Gap Monitor / Instrument
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Supplier: Marposs Corp
Description: CCS series, LightMaster or IRIX™. BENEFITS Exceptional working distance up to more than half a meter Ideal for implementing a specific optical path while respecting mechanical constraints Dedicated to industrial environment, independent from ambient light High axial resolution: From
- Gaging Technology: Non-contact, Optical
- Attribute Measurement Capability: Thickness Gage
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Supplier: Matexcel
Description: AFM Probe Functionalization Atomic force microscopy (AFM) is a surface characterization instrument which utilizes a tip to “feel” the surface. AFM has great potential as a tool for materials science studies in that it not only is a tool to image the topography of solid surfaces at high
- Forms Tested / Certified: Components / Parts, Products, Samples or Materials
- Capabilities: Consulting / Training, Failure Analysis / Troubleshooting, Test Development
- Applications / Industry: Health Care / Medical, Materials
- Features: Specialty / Other
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Supplier: NETZSCH-Gerätebau GmbH
Description: nanometer range (digital resolution of 0.125 nm). Vacuum-tight thermostatic measuring system The entire TMA 402 Hyperion® measuring system is thermally stabilized via water-cooling. This ensures that the measurement will not be influenced by heat from the furnace or by temperature
- Temperature Range: -150 to 1,550 C
- Remote Interface: Computer Interface
- Features: Cooling Available, Temperature Control
- User Interface: Digital Front Panel
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Supplier: TSI Incorporated
Description: Take your measurements to the limit of detection with the 2nd generation of 1nm particle sizing. For more than 30 years, TSI's Scanning Mobility Particle Sizer™ (SMPS™) spectrometers have been widely used as the standard for measuring aerosol size distributions in the submicrometer and low
- Measurement Type: Size
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point is projected onto the surface, which enables a stable signal on the receiver element. Therefore, the sensor is able to measure to nanometer resolution. In addition, the extremely small laser spot size allows the sensor to detect very small objects. In addition to its high precision sensor (read more)
Browse Optical Triangulation Position Sensors Datasheets for Micro-Epsilon Group -
-term stability, and travel to 1500µm Nanometer adjustment precision, wear-free operation, and clean-room compatibility is critical in applications such as super-resolution microscopy, micro-assembly, beam delivery, photonics, and optical metrology, often requiring continuous 24/7 operation. To (read more)
Browse Multi-axis Positioning Systems Datasheets for PI (Physik Instrumente) L.P. -
Piezo Phase Shifter with Tip-Tilt Correction features Sub-Nanometer Resolution Large-aperture, low profile, high stiffness – ideal for optics and interferometry PI, a global leader in piezo nanopositioning and precision motion control equipment (read more)
Browse Piezoelectric Actuators Datasheets for PI (Physik Instrumente) L.P. -
-Position Stability This hexapod is engineered to achieve superior precision and stability. Its actuators provide a resolution of 1.4 nanometers, and the platform delivers in-position stability of 3 nanometers. Automating 6-Axis High Precision Motion Tasks (read more)
Browse Robots Datasheets for PI (Physik Instrumente) L.P. -
Z3TM allows OEMs’ migration from expensive and obsolete piezoelectric solutions, eliminating their hysteresis problems while supporting nanometer level resolution, accuracy and repeatability, at even higher dynamics. With (read more)
Browse Multi-axis Positioning Systems Datasheets for ETEL S.A. -
nanometer position resolution and advanced dual-phase piezo inertia motors, BIX stages deliver smooth, backlash-free performance with excellent repeatability, and a minimum incremental motion of just 0.01 microns per step. Unlike conventional stick-slip motor stages, the BIX series utilizes two (read more)
Browse Linear Slides and Linear Stages Datasheets for PI (Physik Instrumente) L.P. -
problems while supporting nanometer level resolution, accuracy and repeatability, at even higher dynamics. With embedded support to proper sample alignment, the module then allows further control of wafers planarity, with respect to equipment heads, by means of its additional “tip” and (read more)
Browse Multi-axis Positioning Systems Datasheets for ETEL S.A. -
engineered for sub-micron and nanometer-level motion control – new from PI PI (Physik Instrumente), a global leader in precision motion control and nano-positioning technologies, offers its Nanopositioning (read more)
Browse Linear Actuators Datasheets for PI (Physik Instrumente) L.P. -
θZ for full 6-DOF adjustment User-selectable pivot point—in software for intuitive multi-axis alignment Nanometer level resolution and repeatability for reduced insertion loss Parallel-kinematic flexure design for uniform stiffness and zero friction (read more)
Browse Microscope Stages Datasheets for PI (Physik Instrumente) L.P. -
applications requiring minimum incremental motion down to 20 nanometers, drive forces up to 22 lbs, and multi-axis configuration options. The L-511 high precision linear stage provides resolution and repeatability to 0.1µm. With linear travel up to 155 mm (6 (read more)
Browse Linear Slides and Linear Stages Datasheets for PI (Physik Instrumente) L.P.
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Interferometer Feedback for Piezo Linear Motor Provides Highly Accurate Motion with Sub-Nanometer Resolution
Piezo motors can provide motion in extremely small increments, smaller than one nanometer. This is due to solid state effects in the piezo material, where small changes in the electric field affect the shape of the piezo elementary cells with virtually unlimited resolution.
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Piezo Flexure Nanopositioning Stages: Frequently Asked Questions
A piezo nanopositioning stage is defined as a positioning device capable of nanometer or sub-nanometer resolution.
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Nanometer Accuracy
Mad City Labs closed loop nanopositioning systems are capable of providing picometer level positioning. Position noise, the lower limit on controllable motion, can be thought of as the true positioning resolution of a nanopositioning system. Position noise is the sum of all unwanted
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Different Methods of Full-Field X-Ray Diffraction Imaging with a Single Universal Instrument
Compact 6-Axis parallel precision manipulator with nanometer resolution helps the goal of designing a single universal instrument for the use in different full-field X-ray diffraction imaging methods.
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Why Super-Resolution Microscopy Benefits from Piezo Technology
machines within cells. We discuss how nanometer precision measuring and positioning technology has been a major enabler for rapid advances in this field, and the importance of nanopositioning for Super-Resolution microscopy applications.
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Magnetic Levitation for Precision Multi-Axis Positioning
In this concept, magnetic levitation is used as multi-axis precision positioning concept based on non-contact propulsion and guiding principles. High performance motion control algorithms, low noise amplifiers and sub-nanometer resolution sensor technologies are used to achieve high precision
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Multi-Peak White Light Interferometers for Industrial Measurement Tasks and Nanometer Accuracy
high-resolution distance and thickness measurements are required.
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Nanometer Precise Hybrid Actuator in Positioning Mechanism with Long Travel Range
Nanotechnology requires extreme high resolution and accuracy and at the same time long travel range. Improvement in accuracy can be achieved with mechatronic design principals and integration of piezo technology in the system design. The design rules for extreme high accurate multi axis systems
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Nanovision: a new paradigm for enabling fast optical inspection of nanoscale structures
Although nanometer resolution instruments exist today in the form of Scanning Near-Field Microscopes (such as AFM, STM, SEM, and NOSM) they fall short ofmeeting this critical need in two ways: by being either too slow or too intrusive.
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Mechanical behavior of A265 single fibers
Transverse compressive loading and displacement are measured directly by a low profile load cell with a capacity of 22.24 N (5 lbf) and a capacitive displacement sensor with sub- nanometer resolution (Physik Instrument D510.100), respectively.
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Spectroscopy
The Grammont 2172 is a nanometer resolution spectroscopy instrument , based on a disruptive technology called Quantitative Cathodoluminescence, that tightly integrates a scanning electron microscope and a light microscope into one tool.
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http://dspace.mit.edu/bitstream/handle/1721.1/3911/IMST014.pdf?sequence=2
This seemingly small eccentricity could be in fact significant when the actuator is used in precision instruments with nanometer resolution .
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http://dspace.mit.edu/bitstream/handle/1721.1/17008/54450066-MIT.pdf?sequence=2
Direct measurement of the membrane strain deformation when actuated by the thin-film PZT microactuators require an instrument with nanometer resolution .
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Investigation of Gas Shales at Nanoscale Using Scan Electron Microscopy, Transmission Electron Microscopy and Atomic Force Microscopy
Use of Instruments of Nanometer Resolution .
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Laser diode technologies for in-process metrology
Using independent dIodes, wavelength tuning and multimode operation together, it should be possible to build an Instrument wIth nanometer resolution and no ambiguity interval.
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Characterization of drop-on-demand printed conductive silver tracks
This is a well known drawback in Scanning Probe Microscopy, and numerous attemps have been made to develop instruments with nanometer resolution in 3D and lateral working areas in the range of mm².