Products & Services
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Supplier: Mad City Labs, Inc.
Description: The Nano-Gauge™ is an ultra high precision, single axis, displacement measuring instrument capable of resolving dimensions down to 1.5 nanometers (0.06 microinches) over a full scale range of 25mm (1 inch). Combining ease-of-use and small physical size, the Nano-Gauge™ can be quickly
- Mounting / Loading Options: Machine Mounted
- Range: 5.91E-8 to 1 inch
- Resolution: 5.91E-8 to 1.97E-7 inch
- Technology: Mechanical
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Supplier: Epsilon Technology Corp.
Description: Epsilon’s very high resolution calibrator features 0.8 microinches (20 nanometers) resolution and has 2 inches (50 mm) of measuring range. The 3590VHR is provided with a netbook PC and software to display the calibrator readings. The 3590VHR calibrator meets the accuracy and
- Application Software Included: Yes
- Calibrator Style: Fixed
- Display Type: Digital Readouts
- Interface Options: Other Computer Interface
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Supplier: Anton Paar
Description: The NHT3 is designed to provide low loads with depth measurements in the nanometer scale for the measurement of hardness, elastic modulus, creep, etc. The system can be used to characterize organic, inorganic, hard and soft materials. With the unique top surface referencing technique
- Mounting: Handheld or Portable
- Test Load: 0.0510 kg
- Vertical Capacity: 0.0200 cm
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Supplier: Anton Paar
Description: The UNHT, ultra-high resolution nanoindenter, is used to examine the mechanical properties of a material at the nanoscale. The UNHT virtually eliminates the effect of thermal drift and compliance due to its unique patented active surface referencing system. Therefore, it is perfectly suited
- Force / Load Capacity: 0.0225 lbs
- Mechanical Test: Specialty / Other
- Stroke / Travel: 0.0039 inch
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Supplier: MTI Instruments Inc.
Description: Accumeasure System 9000 is a high-resolution, capacitance-based instrument that provides the perfect solution to many previously unattainable measurement applications. Rapid response time and extremely low noise levels make it ideal for critical measurements of targets such as: • X
- Gap Sensor / Feeler Gauge Types: Gap Monitor / Instrument
- Measuring Technology: Capacitance
- Non-contact: Yes
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Supplier: RainWise, Inc.
Description: wavelength interval of 400 to 1100 nanometers. The sensor is calibrated for 1.0 volt output with solar intensity of 2000 watts per meter square. The cosine correction extends to 70 degrees from zenith. The overall accuracy of the sensor is +/- 5 %. Output of the sensor is a voltage equal to 0
- Device Classification: Sensor Only
- Leveling fixture: Yes
- Measures Solar Radiation: Yes
- Mounting Options: Base Mounted
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Supplier: Marposs Corp
Description: every kind of surface reflectivity as transparent or opaque, shiny or diffusing. BENEFITS • Dedicated to industrial environment, independent from Ambiant Light • High Axial resolution : Nanometer scale • High Lateral resolution : Micrometric
- Technology: Optical, Non-contact
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Supplier: Marposs Corp
Description: . BENEFITS • Dedicated to industrial environment, independent from Ambiant Light • Maximum Slope Angle • Adapted to be used in the maximum of diverse applications • High Axial resolution : Nanometer scale • High Lateral resolution
- Technology: Optical, Non-contact
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Supplier: Marposs Corp
Description: , independent from Ambiant Light High Axial resolution : From Nanometer to Micrometer scale High Photometric Efficiency High signal to noise ratio Works on all types of samples Steep slope compatibility thanks to High Numerical Aperture Coaxial : no Shadow Effect « Speckle » free TECH
- Technology: Optical, Non-contact
- Type: Micrometer, Thickness Gage
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Supplier: MTI Instruments Inc.
Description: processing and the freedom from having to purchase additional acquisition hardware. Features True Direct Digital Capacitive Displacement Sensor Up to 0.01% FSR Linearity Sub-nanometer Resolution Built-in Quadrature Input 20k
- Gap Sensor / Feeler Gauge Types: Gap Monitor / Instrument
- Measuring Range: 0.0 to 0.0410 ft
- Measuring Technology: Capacitance
- Non-contact: Yes
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: 3-in-1 form, contour and surface measurement in one setting For large, precision parts for the wind, power and bearing industries Precision rotary table on air bearings with 80 nanometer rotation accuracy Form tester, contour measuring instrument and
- Display & Special Features: Computer Interface / Networkable, SPC / Software Capability
- Industrial Applications: Other
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Specialty / Custom
- Mounting / Loading: Floor / Free Standing
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Supplier: Trilion Quality Systems
Description: to measure the smallest 3D displacements and plane strain with resolutions of approximately 10 nanometers or 1 micrometer per meter. The ESPI system includes a high quality digital CCD camera with computer-controlled shutter time, one or multiple laser sources, a computer controlled
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Supplier: MTI Instruments Inc.
Description: Accumeasure System 9000 is a high-resolution, capacitance-based instrument that provides the perfect solution to many previously unattainable measurement applications. Rapid response time and extremely low noise levels make it ideal for critical measurements of targets such as: • X
- Measurement Range: 0.0 to 0.4921 inch
- Output: Voltage
- Technology: Capacitive Linear Position Sensor
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Supplier: MTI Instruments Inc.
Description: -positioning, thermal correction, focusing and closed loop control applications. It provides exceptional value and offers sub-nanometer resolution, extreme stability, exceptional repeatability, and fast response time, making it ideal for micro-positioning, thermal correction, focusing
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Supplier: Mahr Inc.
Description: The precision optical measuring instrument MarSurf WM 100 with sub-nanometer resolution and measuring accuracy. A 3D white light interferometer measuring system. Features Maximum precision with sub-nanometer resolution and measuring accuracy Suitable
- Industrial Applications: Electronics, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
- Mounting / Loading: Benchtop
- Surface Metrology: 2D / Line Profile, 3D / Areal Topography
- Technology: Non-contact - Optical / Laser
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Supplier: Lion Precision
Description: from 0.4 mils to half an inch. Resolutions as low as one nanometer are available with a typical resolution of 0.003% of range at full 15 kHz bandwidth. Zero adjustments and visual range indicators ease setup.Vacuum compatible systems are available. Our expertise will help you
- Body: Cylindrical, Rectangular
- Linearity: 0.1500 to 0.5000 ±% Full Scale
- Measurement Range: 4.00E-4 to 0.5000 inch
- Operating Temperature: 40 to 120 F
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Supplier: Lion Precision
Description: The CPL190 is a precision noncontact displacement measuring instrument using capacitive technology. This linear position and displacement sensor has a large selection of rectangular and cylindrical probes providing ranges from 0.4 mils to half an inch. High resolutions as low as one
- Body: Cylindrical, Rectangular
- Linearity: 0.1500 to 0.5000 ±% Full Scale
- Measurement Range: 4.00E-4 to 0.5000 inch
- Operating Temperature: 40 to 120 F
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Supplier: Mahr Inc.
Description: Product features The precision, computer-controlled optical measuring instrument MarSurf CWM 100 with sub-nanometer resolution. A combined 3D measuring system comprising a confocal microscope and white light interferometer Features Advantages
- Industrial Applications: Electronics, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
- Mounting / Loading: Benchtop
- Surface Metrology: 3D / Areal Topography
- Technology: Non-contact - Optical / Laser
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Supplier: Micromeritics
Description: available in other laser particle sizing systems. The level of detail, accuracy, and resolution enables the extraction of all available information from the static light scattering pattern. Both organic and inorganic particles can be analyzed and measured over a wide range of 40
- Modality: Classroom (On Campus / Trainer's Facility)
- Technology / Subject: Testing / Test Methods
- Type: Course, Product Training
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Supplier: Lion Precision
Description: The CPL490 is the most precise capacitive displacement sensor in the world. Linear noncontact position sensors with the highest resolution possible. With a bandwidth up to 50 kHz and resolutions less than one nanometer (7 ppm), this instrument is for the most demanding
- Body: Cylindrical, Rectangular
- Linearity: 0.2000 ±% Full Scale
- Measurement Range: 4.00E-4 to 0.0040 inch
- Operating Temperature: 60 to 100 F
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Supplier: NETZSCH-Gerätebau GmbH
Description: and allows measurement of even the smallest of length changes, into the nanometer range (digital resolution of 0.125 nm). Vacuum-tight thermostatic measuring system The entire TMA 402 Hyperion® measuring system is thermally stabilized via water-cooling. This
- Display & Special Features: Computer Interface / Networkable, Laboratory / Batch
- Test Media / Material: Polymers (Plastics, Elastomers)
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Supplier: TSI Incorporated
Description: submicrometer and low nanometer size range. With the addition of the Nano Enhancer Model 3757 and Differentia l Mobility Analyzer Model 3086, you can now measure the size and number concentration with high resolution and speed, and monitor reaction kinetics and new
- Measurement Type: Size
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Featured Products Top
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With the interferoMETER IMS5400-DS, absolute distance measurements with nanometer resolution can be carried out in industrial applications. The sensors generate a small light spot over the entire (read more)
Browse Interferometers Datasheets for Micro-Epsilon Group -
Nanometer Measurement The Nano-Gauge™ is an ultra high precision, single axis, displacement measuring instrument (read more)
Browse Dimensional Gages and Instruments Datasheets for Mad City Labs, Inc. -
Want to see a nanometer? Check out the video of Kaman's SMT-9700 (read more)
Browse Eddy Current Proximity Sensors Datasheets for Kaman Precision Measuring Systems -
microscopy methods have already achieved resolutions at the scale of 10s of nanometers, producing images of cellular and macromolecular structures with resolutions approaching those attained by electron microscopy. SR microscopy methods are compatible with whole cells, or even live cells, as well (read more)
Browse Microscopes Datasheets for Mad City Labs, Inc. -
Flexible, high-resolution position/displacement systems for OEM applications > 1, 2 and 3 channel configurations > Nanometer to sub-nanometer resolution > Easy, cost-effective performance customization > CE and RoHS compliant > Small package size > Thirteen standard sensor options (read more)
Browse Eddy Current Linear Encoders Datasheets for Kaman Precision Measuring Systems -
Differential resolution to a nanometer > Two precisely matched sensors per channel give resolution to a nanometer. > Superior thermal and long-term stability of 5x10-6 inches/month or better. > Small package size: 2 x 2.12 x 0.75 inches thick. > Cryogenic sensors available. > High sensitivity: up to 10 V/mil (394 mV/µm). > Low power consumption: less than 2W @ ±15 Vdc typical. (read more)
Browse Inductive Proximity Sensors Datasheets for Kaman Precision Measuring Systems -
included 2 additional ADC connections for instrument versatility Low noise, atomic step resolution Automated software control Auto PCC control High resolution Auto Q calculation & resonant frequency detection Integrated Z axis PI loop (read more)
Browse Piezoelectric Drivers and Piezoelectric Amplifiers Datasheets for Mad City Labs, Inc. -
automatic parasitic capacitance compensation (PCC) control. Features: Low cost Software, sensor amplifier, and probe boards included 2 additional ADC connections for instrument versatility Low noise, atomic step resolution Automated (read more)
Browse Piezoelectric Drivers and Piezoelectric Amplifiers Datasheets for Mad City Labs, Inc. -
manufacturer of flexure based piezo nanopositioning systems capable of sub-nanometer positioning resolution since 1998. Our piezo nanopositioning product line covers the entire spectrum of piezo nanopositioning capabilities while maintaining a leadership role in multi-axis stages for high speed (read more)
Browse Microscopes Datasheets for Mad City Labs, Inc. -
twitter Mad City Labs, Inc Mad City Labs, Inc has been a leading manufacturer of flexure based piezo nanopositioning systems capable of sub-nanometer positioning resolution since 1998. Our piezo (read more)
Browse Linear Slides and Linear Stages Datasheets for Mad City Labs, Inc.
Conduct Research Top
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Interferometer Feedback for Piezo Linear Motor Provides Highly Accurate Motion with Sub-Nanometer Resolution
Piezo motors can provide motion in extremely small increments, smaller than one nanometer. This is due to solid state effects in the piezo material, where small changes in the electric field affect the shape of the piezo elementary cells with virtually unlimited resolution.
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Piezo Flexure Nanopositioning Stages: Frequently Asked Questions
A piezo nanopositioning stage is defined as a positioning device capable of nanometer or sub-nanometer resolution.
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Nanometer Accuracy
Mad City Labs closed loop nanopositioning systems are capable of providing picometer level positioning. Position noise, the lower limit on controllable motion, can be thought of as the true positioning resolution of a nanopositioning system. Position noise is the sum of all unwanted
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Different Methods of Full-Field X-Ray Diffraction Imaging with a Single Universal Instrument
Compact 6-Axis parallel precision manipulator with nanometer resolution helps the goal of designing a single universal instrument for the use in different full-field X-ray diffraction imaging methods.
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Why Super-Resolution Microscopy Benefits from Piezo Technology
machines within cells. We discuss how nanometer precision measuring and positioning technology has been a major enabler for rapid advances in this field, and the importance of nanopositioning for Super-Resolution microscopy applications.
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Magnetic Levitation for Precision Multi-Axis Positioning
In this concept, magnetic levitation is used as multi-axis precision positioning concept based on non-contact propulsion and guiding principles. High performance motion control algorithms, low noise amplifiers and sub-nanometer resolution sensor technologies are used to achieve high precision
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Multi-Peak White Light Interferometers for Industrial Measurement Tasks and Nanometer Accuracy
high-resolution distance and thickness measurements are required.
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Nanometer Precise Hybrid Actuator in Positioning Mechanism with Long Travel Range
Nanotechnology requires extreme high resolution and accuracy and at the same time long travel range. Improvement in accuracy can be achieved with mechatronic design principals and integration of piezo technology in the system design. The design rules for extreme high accurate multi axis systems
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Nanovision: a new paradigm for enabling fast optical inspection of nanoscale structures
Although nanometer resolution instruments exist today in the form of Scanning Near-Field Microscopes (such as AFM, STM, SEM, and NOSM) they fall short ofmeeting this critical need in two ways: by being either too slow or too intrusive.
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Mechanical behavior of A265 single fibers
Transverse compressive loading and displacement are measured directly by a low profile load cell with a capacity of 22.24 N (5 lbf) and a capacitive displacement sensor with sub- nanometer resolution (Physik Instrument D510.100), respectively.
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Spectroscopy
The Grammont 2172 is a nanometer resolution spectroscopy instrument , based on a disruptive technology called Quantitative Cathodoluminescence, that tightly integrates a scanning electron microscope and a light microscope into one tool.
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http://dspace.mit.edu/bitstream/handle/1721.1/3911/IMST014.pdf?sequence=2
This seemingly small eccentricity could be in fact significant when the actuator is used in precision instruments with nanometer resolution .
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http://dspace.mit.edu/bitstream/handle/1721.1/17008/54450066-MIT.pdf?sequence=2
Direct measurement of the membrane strain deformation when actuated by the thin-film PZT microactuators require an instrument with nanometer resolution .
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Investigation of Gas Shales at Nanoscale Using Scan Electron Microscopy, Transmission Electron Microscopy and Atomic Force Microscopy
Use of Instruments of Nanometer Resolution .
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Laser diode technologies for in-process metrology
Using independent dIodes, wavelength tuning and multimode operation together, it should be possible to build an Instrument wIth nanometer resolution and no ambiguity interval.
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Characterization of drop-on-demand printed conductive silver tracks
This is a well known drawback in Scanning Probe Microscopy, and numerous attemps have been made to develop instruments with nanometer resolution in 3D and lateral working areas in the range of mm².