Semiconductor Inspection Microscopes

Description: The Olympus MX51 industrial inspection microscope is cost-effective and optimized for the inspection requirements of a variety of electronic components, wafers and large samples.

• Total Magnification: 1.25 to 150 X
• Resolution: 100,000 nm
• Grade: Benchtop
• Eyepiece Style: Binocular

Description: Nikon Eclipse L300N/L300ND FPD / Wafer Inspection microscopes incorporate Nikon’s renowned CFI60 infinity optics, offering the world’s highest level of optical performance. The enhanced epi-fluorescence function, which enables 365nm UV excitation, is optimal for the inspection

• Total Magnification: 1 to 150 X
• Grade: Benchtop
• Remote Interface: Computer Interface, Image Analysis Processing Software
• Features: Digital Display, Fine Focus, Mechanical Stage

Description: series performs exceptionally precise optical inspection of wafers, photo masks, reticles and other substrates. 3 Models to Choose From L200: Offers 200mm wafer and mask inspection capabilities for reflected light illumination defect identification with various observation methods such

• Total Magnification: 1 to 150 X
• Grade: Benchtop
• Remote Interface: Computer Interface, Image Analysis Processing Software
• Features: Digital Display, Fine Focus, Mechanical Stage

Description: Harmonized system of quality assessment for electronic components: Basic specification: Scanning electron microscope inspection of semiconductor dice

Description: integration simple with application specific software. Precision Functionality Enhanced Macro Inspection Macro Inspection - 360 Degree Rotation (Simulation) Macro inspection features a 360-degree self-rotating function for a complete macro inspection of the wafer's top

• Grade: Benchtop
• Eyepiece Style: Binocular
• Microscope Type: Compound
• Features: Digital Display, Mechanical Stage

Description: The BXFM-A is a space saving computer controlled microscope module incorporating a motorized Z focus and reflected light vertical illuminator. The BXFM-A offers a high performance optical sensor capability for sophisticated inspection system.

• Total Magnification: 5 to 150 X
• Resolution: 10 nm
• Grade: Benchtop
• Eyepiece Style: Binocular, Trinocular

Description: respectively. Extra objectives can be purchased as optional extras to allow for a magnification range from 6X to 80X. The microscope is an excellent value for its purchase price. It is ruggedly constructed and can be used in a shop environment. The microscope body is rotatable in its

• Total Magnification: 6 to 80 X
• Field of View: 2.793998491240815 to 25.653986146847483 mm
• Working Distance: 31.495982992169186 to 229.99687580168708 mm
• Grade: Benchtop

Description: CIQTEK Scanning NV Microscope Diamond III/IV is a scanning NV magnetometer based on the diamond nitrogen-vacancy center (NV center) and AFM scanning magnetic imaging technology. The sample's magnetic properties are obtained quantitatively and non-destructively by quantum control and readout

• Application: Biological / Life Science, Semiconductor Inspection
• Remote Interface: Computer Interface, Image Analysis Processing Software
• Features: Digital Display, Mechanical Stage, Other
• Grade: Research

Description: microscope with an increased Depth of Field produces revealing three dimensional views with the FX-4 Stereo Microscope. Ideal for inspection, research, assembly, electronic components manufacturing, missile parts, burring, printed circuits inspection, wire

• Total Magnification: 10 to 80 X
• Field of View: 3.809997942601111 to 17.779990398805186 mm
• Working Distance: 38.09997942601111 to 169.92590824000956 mm
• Grade: Benchtop, Research

Description: 3D optical microscope systems feature the industry™s top service and support, and have a proven track record of robust performance, with thousands of installations in settings ranging from research labs to manufacturing shop floors and semiconductor fabs. With specialized instruments

• Application: Biological / Life Science, Metallurgical, Semiconductor Inspection
• Remote Interface: Computer Interface
• Features: Digital Display, Other

Description: A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging. Max.

• Total Magnification: 1 to 150 X
• Grade: Benchtop
• Remote Interface: Computer Interface, Image Analysis Processing Software
• Features: Digital Display, Fine Focus, Mechanical Stage

Description: CIQTEK Quantum Diamond Microscope (QDM) is a wide-field magnetic resonance based on the principle of spin magnetic resonance in the diamond nitrogen-vacancy center (NV center). The spin quantum state of the NV center luminescence defects is susceptible to the surrounding microwave and static

• Application: Biological / Life Science, Semiconductor Inspection
• Remote Interface: Computer Interface, Image Analysis Processing Software
• Features: Digital Display, Mechanical Stage, Other
• Grade: Research

Description: Affordable Brightfield Imaging for Materials Science Brightfield Imaging Out of the Box Combining quality brightfield images with affordability, the LC35 digital microscope camera is an excellent value for materials science imaging. Complementing our microscopes, the LC35 camera is

• Grade: Benchtop
• Remote Interface: Computer Interface
• Features: Digital Display, Other
• Application: Semiconductor Inspection

Description: The AZ100 Multizoom represents a new concept in zoom microscopes. It covers an extremely wide range of magnifications, from 5x to 400x, effectively combining the advantages provided by stereo zoom microscopes and compound microscopes. Thanks to a smooth zooming mechanism and a

• Total Magnification: 5 to 500 X
• Grade: Benchtop
• Application: Metallurgical, Semiconductor Inspection
• Features: Other

Description: The LSCM has the advantages of a confocal laser scanning microscope with the size and price of an IR camera. The combination of high contrast imaging, infrared capabilities, extremely small size and low cost enables many new applications.

• Application: Biological / Life Science, Semiconductor Inspection
• Remote Interface: Computer Interface
• Features: Digital Display, Other
• Microscope Type: Laser / Confocal

Description: Zaber’s MSR series of motorized, upright microscopes are designed to lower the barriers to automated microscopy. Combining Zaber precision motion control and world-class optics, MSR microscopes deliver unparalleled performance and value. The modular design allows easy swapping of key

• Grade: Benchtop, Research, Student
• Application: Biological / Life Science, Medical / Forensic, Semiconductor Inspection
• Microscope Type: Fluorescent / UV
• Features: Other

Description: Examples Semiconductor and Electronics Industries Automotive and Metal Industries Chemical and Raw Materials Industries Technology 18 megapixels × 3CMOS camera REMAX V high-performance graphics engine Increased stage speed and vibration resistance TRIPLE'R lens recognition function

• Grade: Benchtop
• Remote Interface: Computer Interface
• Features: Digital Display, Mechanical Stage
• Application: Semiconductor Inspection

Description: Polytec's MSV-050 and MSV-100 Microscope Adapters are the bridge that connects Laser-Doppler Vibrometry (LDV) to the micro world. Designed to couple a fiber-optic vibrometer head to a microscope, the adapters permit precise single-point and differential vibration analysis on MEMS and

• Total Magnification: 1 to 100 X
• Grade: Benchtop, Research
• Eyepiece Style: Binocular
• Remote Interface: Computer Interface, Image Analysis Processing Software

Description: This Extra Wide Field Stereo Microscope features unusually long Focal Lengths and great Depths of Field in the Lower Magnifications. The accompanying larger fields of view offer greater versatility than most Stereo Microscopes available for Medical or Industrial Applications. Ideal for

• Total Magnification: 5 to 40 X
• Field of View: 7.010396214386045 to 66.92896385835951 mm
• Working Distance: 85.08995405142481 to 511.1747239656491 mm
• Grade: Benchtop

Description: High-speed scanning electron microscope for cross-scale imaging of large-volume specimensCIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration, dynamic optical

• Total Magnification: 66 to 1,000,000 X
• Resolution: 1.2999999999999998 to 3.3 nm
• Accelerating Voltage: 0.1 to 30 kilovolts
• Remote Interface: Computer Interface, Image Analysis Processing Software

Description: The MSV-400 Microscope Scanning Vibrometer is the successor to the award-winning MSV-300 for full-field vibration analysis of very small objects such as MEMS optical switches. Based on the laser Doppler principle, a HeNe laser maps the vibrational response of the structure with a lateral

• Resolution: 1,000 nm
• Lateral Resolution: 1,000 nm
• Grade: Benchtop, Research
• Remote Interface: Computer Interface, Image Analysis Processing Software

Description: CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope. It has excellent imaging quality capabilities in both high and low vacuum modes. It also has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the

• Total Magnification: 1 to 1,000,000 X
• Resolution: 3 to 8 nm
• Accelerating Voltage: 0.2 to 30 kilovolts
• Grade: Benchtop, Research

Description: esigned for streamlined operation and compact integration onto a multitude of probing stations, the A-Zoomµ Micro offers a high-value solution for circuit board, semiconductor and flat-panel display probing without sacrificing features, function or performance. 7:1 parfocal Optical zoom 2X

• Total Magnification: 10 to 40 X
• Field of View: 0.060000000000000005 to 10.1 mm
• Working Distance: 13 to 34.00000000000001 mm
• Grade: Benchtop

Description: The Phenom Pure desktop SEM (scanning electron microscope) is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom Pure is equipped with the basic fundamentals for meeting imaging needs. The Phenom Pure

• Image Source: Electron Microscope
• Applications: Electronics or Semiconductor Inspection, Flaw Detection, Materials Analysis
• Modules Included: Imaging & Analysis Software
• System Type: Modular / PC-Based

Description: SemiProbe IRIS inspection systems inspect, locate and identify defects created during wafer manufacturing, probing, bumping, dicing or general handling, providing microelectronic device manufacturers with accurate, timely quality assurance and process information. The IRIS inspection

• Image Source: Electron Microscope
• Applications: Electronics or Semiconductor Inspection
• Modules Included: Imaging & Analysis Software
• Features: Other Image Source

Description: The A-Zoom2 10x single-objective zoom optical brightfield microscope delivers continuous 10:1 variable power magnification for microelectronics inspection, R&D imaging, testing and analysis. Originally designed for electronic probing applications, A-Zoom2 features superior optics to

• Total Magnification: 28 to 7,000 X
• Field of View: 0.034 to 9 mm
• Working Distance: 34.00000000000001 to 13 mm
• Grade: Benchtop

Description: This is the only commercially available microscope guaranteeing transmission of more then 80% for all four YAG laser harmonics: 266, 355, 532, and 1064nm - without compromising the review channel fidelity. The MIC4 microscope is instrumental in laser repair of TFT arrays over the

• Applications: Alignment / Guidance, Biotechnology or Medical, Electronics or Semiconductor Inspection, Flaw Detection, Gauging, Scanning & Dimensioning, Non-contact Profilometry, Production & Quality Control
• Modules Included: Cameras or Imagers, Imaging Illuminators
• Image Source: Confocal Laser, Line Scan Camera, Optical Microscope, Thermal or Infrared
• System Type: Modular / PC-Based

Description: The PI 640i microscope lenses offer resolutions down to 28 μm, ideal for electronic board inspection and small component analysis. They allow hands-free operation for simultaneous testing and radiometric measurement, with an adjustable distance from 80 to 100 mm. The optris PI 640i

• Applications: Electronics or Semiconductor Inspection
• Image Source: Thermal or Infrared

Description: Failure analysis from both sides is possible with one unit The iPHEMOS-MPX is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.

• Application: Semiconductor Inspection

Description: The microscope optics for the optris Xi 400 infrared camera allow reliable temperature measurement on tiny objects from 240 µm. Combined with a suitable stand, this setup enables professional measurement of printed circuit boards and components in the electronics industry. The measuring

• Applications: Electronics or Semiconductor Inspection
• Image Source: Thermal or Infrared

Description: WDI's AOI Microscope is designed for fast scanning and defect review applications of a variety of specimen including bare glass, TFT array and colour filter. It provides exceptional image quality, and is limited only by the selection of the microscope objective lens. The

• Applications: Alignment / Guidance, Biotechnology or Medical, Electronics or Semiconductor Inspection, Flaw Detection, Gauging, Scanning & Dimensioning, Non-contact Profilometry, Production & Quality Control
• Modules Included: Cameras or Imagers, Imaging Illuminators
• Image Source: Confocal Laser, Line Scan Camera, Optical Microscope
• System Type: Modular / PC-Based

Description: Precision High-Resolution VGA Infrared Microscope Camera with 2X Magnification

• Applications: Electronics or Semiconductor Inspection
• Image Source: Thermal or Infrared

Description: The Nanotronics Imaging nSpec® is an inspection device designed for high resolution microscopy and detection of wafer defects. With particular application in silicon carbide and Galium Nitride epi wafers, the nSpec® offers fast quantification and qualification of defects with detailed

• Stage Type: Camera Positioner, X-Y Stage
• Modules Included: Cameras or Imagers, Imaging & Analysis Software
• Features: Clean Room Compatible
• Applications: Electronics or Semiconductor Inspection

Description: 1.1 This practice covers conditions for nondestructive visual inspection of the surface finish of spooled aluminum and gold wire used for making internal semiconductor device connections and hybrid microelectronic connections. 1.2 This practice specifies the recommended lighting,

Description: piezoelectric objective lens positioning system 100 µm range of motion compact design high resonant frequency easy to mount on microscopes optional: integrated capacitive sensor applications: surface scanning and analysis semiconductor analysis equipment scanning interferometry &

• Minimum Step Size (Resolution): 0.0002 µm
• Stage Type: Z-Axis Stage