-
Supplier: Nikon Metrology
Description: Nikon Eclipse L300N/L300ND FPD / Wafer Inspection microscopes incorporate Nikon’s renowned CFI60 infinity optics, offering the world’s highest level of optical performance. The enhanced epi-fluorescence function, which enables 365nm UV excitation, is optimal for the inspection
- Application: Semiconductor Inspection
- Computer Interface: Yes
- Digital Display: Yes
- Eyepiece Style: Trinocular
-
Supplier: Evident Scientific
Description: The Olympus MX51 industrial inspection microscope is cost-effective and optimized for the inspection requirements of a variety of electronic components, wafers and large samples.
- Application: Semiconductor Inspection
- Computer Interface: Yes
- Digital Display: Yes
- Eyepiece Style: Binocular
-
Supplier: Nikon Metrology
Description: Combined with Nikon's superior CFI60 LU/L optical system and an extraordinary new illumination system, this microscope provides images with greater contrast, high resolving power and darkfield images three times brighter than before. Used independently, or in combination with wafer loaders,
- Application: Semiconductor Inspection
- Computer Interface: Yes
- Digital Display: Yes
- Eyepiece Style: Trinocular
-
-
Supplier: Evident Scientific
Description: The MX61A is a specially designed semiconductor microscope that allows operators to work in an ergonomically correct position and benefit from smoother operation throughout extended inspection periods, maximizing productivity and integration.
- Application: Semiconductor Inspection
- Computer Interface: Yes
- Digital Display: Yes
- Eyepiece Style: Binocular
-
Supplier: Titan Tool Supply, Inc.
Description: The RX - 2 Stereo Microscope is an EXTRA WIDE FIELD STEREO MICROSCOPE WITH UNUSUALLY LONG FOCAL LENGTHS AND GREAT DEPTH OF FIELD. The image is crisp and sharp with unexcelled natural light gathering capabilities. The eight way adjustable pillar stand allows for many combinations of
- Application: Measuring / Toolmaker, Metallurgical, Semiconductor Inspection
- Eyepiece Style: Binocular
- Grade: Benchtop, Research
- Microscope Type: Stereomicroscope
-
Supplier: Titan Tool Supply, Inc.
Description: THE ALL NEW ERGONOMIC RX-3 STEREO MICROSCOPE The eight way adjustable pillar stand allows for many combinations of vertical and horizontal or even angular adjustments that combine both planes. Full rotation of 360° is possible on all adjustments with no limitations
- Application: Measuring / Toolmaker, Metallurgical, Semiconductor Inspection
- Eyepiece Style: Binocular
- Grade: Benchtop, Research
- Microscope Type: Stereomicroscope
-
Supplier: Titan Tool Supply, Inc.
Description: The FX - 6 is an inexpensive Industrial Microscope for broad industrial applications. It can be easily mounted to the universal pillar stand (#UPS-TSZM) or on machines for in process viewing. It is supplied with one pair each of 10X and 20X eyepieces for standard magnifications of 20X and
- Application: Gemological, Measuring / Toolmaker, Metallurgical, Semiconductor Inspection
- Eyepiece Style: Binocular
- Grade: Benchtop
- Microscope Type: Stereomicroscope
-
Supplier: Bruker Corporation
Description: industry standards. Bruker™s 3D optical microscope systems feature the industry™s top service and support, and have a proven track record of robust performance, with thousands of installations in settings ranging from research labs to manufacturing shop floors and semiconductor fabs.
- Application: Biological / Life Science, Metallurgical, Semiconductor Inspection
- Computer Interface: Yes
- Digital Display: Yes
- Microscope Type: Other
-
Supplier: Evident Scientific
Description: The AL120 wafer handler series transfers both silicon and compound semiconductor wafers from the cassette to the microscope stage with enhanced capabilities and flexibility, while maintaining an ergonomic design. Accommodates Multiple Wafer Sizes The ability to accommodate
- Application: Semiconductor Inspection
- Digital Display: Yes
- Eyepiece Style: Binocular
- Grade: Benchtop
-
Supplier: CIQTEK Co., Ltd
Description: High-speed scanning electron microscope for cross-scale imaging of large-volume specimensCIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration, dynamic optical axis
- Application: Metallurgical, Semiconductor Inspection
- Computer Interface: Yes
- Digital Display: Yes
- Grade: Research
-
Supplier: CIQTEK Co., Ltd
Description: CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope. It has excellent imaging quality capabilities in both high and low vacuum modes. It also has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the
- Application: Metallurgical, Semiconductor Inspection
- Computer Interface: Yes
- Digital Display: Yes
- Grade: Benchtop, Research
-
Supplier: CIQTEK Co., Ltd
Description: CIQTEK Scanning NV Microscope Diamond III/IV is a scanning NV magnetometer based on the diamond nitrogen-vacancy center (NV center) and AFM scanning magnetic imaging technology. The sample's magnetic properties are obtained quantitatively and non-destructively by quantum control and readout
- Application: Biological / Life Science, Semiconductor Inspection
- Computer Interface: Yes
- Digital Display: Yes
- Grade: Research
-
Supplier: KEYENCE
Description: capabilities for improved workflow Application Examples Semiconductor and Electronics Industries Automotive and Metal Industries Chemical and Raw Materials Industries Technology 18 megapixels × 3CMOS camera REMAX V high-performance graphics engine Increased stage speed and vibration
- Application: Semiconductor Inspection
- Computer Interface: Yes
- Digital Display: Yes
- Grade: Benchtop
-
Supplier: CIQTEK Co., Ltd
Description: CIQTEK Quantum Diamond Microscope (QDM) is a wide-field magnetic resonance based on the principle of spin magnetic resonance in the diamond nitrogen-vacancy center (NV center). The spin quantum state of the NV center luminescence defects is susceptible to the surrounding microwave and static
- Application: Biological / Life Science, Semiconductor Inspection
- Computer Interface: Yes
- Digital Display: Yes
- Grade: Research
-
Supplier: Evident Scientific
Description: The BXFM-A is a space saving computer controlled microscope module incorporating a motorized Z focus and reflected light vertical illuminator. The BXFM-A offers a high performance optical sensor capability for sophisticated inspection system.
- Application: Semiconductor Inspection
- Computer Interface: Yes
- Digital Display: Yes
- Eyepiece Style: Monocular, Binocular, Trinocular
-
Supplier: Nikon Metrology
Description: The AZ100 Multizoom represents a new concept in zoom microscopes. It covers an extremely wide range of magnifications, from 5x to 400x, effectively combining the advantages provided by stereo zoom microscopes and compound microscopes. Thanks to a smooth zooming mechanism and a
- Application: Metallurgical, Semiconductor Inspection, Other
- Grade: Benchtop
- Total Magnification: 5 to 500 X
-
Supplier: Nikon Metrology
Description: A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging. Max
- Application: Semiconductor Inspection
- Computer Interface: Yes
- Digital Display: Yes
- Eyepiece Style: Trinocular
-
Supplier: WDI Wise Device Inc.
Description: The LSCM has the advantages of a confocal laser scanning microscope with the size and price of an IR camera. The combination of high contrast imaging, infrared capabilities, extremely small size and low cost enables many new applications.
- Application: Biological / Life Science, Semiconductor Inspection
- Computer Interface: Yes
- Digital Display: Yes
- Eyepiece Style: Other
-
Supplier: Zaber Technologies, Inc.
Description: Zaber’s MSR series of motorized, upright microscopes are designed to lower the barriers to automated microscopy. Combining Zaber precision motion control and world-class optics, MSR microscopes deliver unparalleled performance and value. The modular design allows easy swapping of
- Application: Biological / Life Science, Medical / Forensic, Semiconductor Inspection, Other
- Grade: Student, Benchtop, Research
- Microscope Type: Fluorescent / UV
-
Supplier: Titan Tool Supply, Inc.
Description: TSTVA12-TSZM Video Adapter with built in cross hair reticle for alignment or measuring when calibrated. The improved Stereo effect of this microscope with an increased Depth of Field produces revealing three dimensional views with the FX-4 Stereo Microscope. Ideal for inspection
- Application: Measuring / Toolmaker, Metallurgical, Semiconductor Inspection
- Eyepiece Style: Binocular
- Grade: Benchtop, Research
- Microscope Type: Stereomicroscope
-
Supplier: Polytec, Inc.
Description: Polytec's MSV-050 and MSV-100 Microscope Adapters are the bridge that connects Laser-Doppler Vibrometry (LDV) to the micro world. Designed to couple a fiber-optic vibrometer head to a microscope, the adapters permit precise single-point and differential vibration analysis on MEMS and
- Application: Measuring / Toolmaker, Semiconductor Inspection, Other
- Computer Interface: Yes
- Digital Display: Yes
- Eyepiece Style: Binocular
-
Supplier: Polytec, Inc.
Description: The MSV-400 Microscope Scanning Vibrometer is the successor to the award-winning MSV-300 for full-field vibration analysis of very small objects such as MEMS optical switches. Based on the laser Doppler principle, a HeNe laser maps the vibrational response of the structure with a lateral
- Application: Measuring / Toolmaker, Semiconductor Inspection, Other
- Computer Interface: Yes
- Digital Display: Yes
- Grade: Benchtop, Research
-
Supplier: Qioptiq
Description: esigned for streamlined operation and compact integration onto a multitude of probing stations, the A-Zoomµ Micro offers a high-value solution for circuit board, semiconductor and flat-panel display probing without sacrificing features, function or performance
- Application: Semiconductor Inspection
- Computer Interface: Yes
- Eyepiece Style: Binocular
- Fine Focus: Yes
-
Supplier: Qioptiq
Description: The A-Zoom2 10x single-objective zoom optical brightfield microscope delivers continuous 10:1 variable power magnification for microelectronics inspection, R&D imaging, testing and analysis. Originally designed for electronic probing applications, A-Zoom2 features superior optics to
- Application: Semiconductor Inspection
- Eyepiece Style: Binocular
- Grade: Benchtop
- Microscope Type: Compound, Laser / Confocal
-
Supplier: Qioptiq
Description: The A-Zoom2 40x single-objective zoom optical brightfield microscope delivers continuous 40:1 variable power magnification for microelectronics inspection, R&D imaging, testing and analysis. Originally designed for electronic probing applications, A-Zoom2 features superior optics to
- Application: Semiconductor Inspection
- Eyepiece Style: Binocular
- Grade: Benchtop
- Microscope Type: Compound, Laser / Confocal
-
Supplier: Hamamatsu Photonics
Description: Failure analysis from both sides is possible with one unit The iPHEMOS-MPX is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
- Application: Semiconductor Inspection
-
Supplier: Hamamatsu Photonics
Description: Handles from visible light to near-infrared light with one unit by equipping with a multi-wavelength laser The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by
- Application: Semiconductor Inspection
-
Supplier: Phenom-World BV
Description: The Phenom Pure desktop SEM (scanning electron microscope) is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom Pure is equipped with the basic fundamentals for meeting imaging needs. The Phenom Pure
- Applications / Capabilities: Electronics or Semiconductor Inspection, Flaw Detection, Materials Analysis
- Image Source: Electron Microscope
- Imaging & Analysis Software: Yes
- System Type: Modular / PC-Based
-
Supplier: Phenom-World BV
Description: The Phenom ProX desktop scanning electron microscope is the ultimate all-in-one imaging and X-ray analysis system. With the Phenom ProX desktop SEM, sample structures can be physically examined and their elemental composition determined. Viewing three-dimensional images of microscopic
- Applications / Capabilities: Electronics or Semiconductor Inspection, Flaw Detection, Materials Analysis
- Image Source: Electron Microscope
- Imaging & Analysis Software: Yes
- System Type: Modular / PC-Based
-
Supplier: Phenom-World BV
Description: The Phenom Pro desktop SEM is one of the most advanced imaging models in the Phenom series. With its long-life high-brightness CeB6 electron source, the Phenom Pro creates state-of-the-art images with a minimum of user maintenance intervention. The backscattered-electr on detector (BSED) and
- Applications / Capabilities: Electronics or Semiconductor Inspection, Flaw Detection, Materials Analysis
- Image Source: Electron Microscope
- Imaging & Analysis Software: Yes
- System Type: Modular / PC-Based
-
Supplier: WDI Wise Device Inc.
Description: This is the only commercially available microscope guaranteeing transmission of more then 80% for all four YAG laser harmonics: 266, 355, 532, and 1064nm - without compromising the review channel fidelity. The MIC4 microscope is instrumental in laser repair of TFT arrays over the
- Applications / Capabilities: Alignment / Guidance, Biotechnology or Medical, Electronics or Semiconductor Inspection, Flaw Detection, Gauging, Scanning & Dimensioning, Non-contact Profilometry, Production & Quality Control, Other
- Cameras or Imagers: Yes
- Image Source: Thermal or Infrared, Optical Microscope, Line Scan Camera, Confocal Laser
- Imaging Illuminators: Yes
-
Supplier: WDI Wise Device Inc.
Description: WDI's AOI Microscope is designed for fast scanning and defect review applications of a variety of specimen including bare glass, TFT array and colour filter. It provides exceptional image quality, and is limited only by the selection of the microscope objective lens. The
- Applications / Capabilities: Alignment / Guidance, Biotechnology or Medical, Electronics or Semiconductor Inspection, Flaw Detection, Gauging, Scanning & Dimensioning, Non-contact Profilometry, Production & Quality Control, Other
- Cameras or Imagers: Yes
- Image Source: Optical Microscope, Line Scan Camera, Confocal Laser
- Imaging Illuminators: Yes
-
Supplier: SemiProbe
Description: SemiProbe IRIS inspection systems inspect, locate and identify defects created during wafer manufacturing, probing, bumping, dicing or general handling, providing microelectronic device manufacturers with accurate, timely quality assurance and process information. The IRIS inspection
- Applications / Capabilities: Electronics or Semiconductor Inspection
- Image Source: Electron Microscope, Other Image Source
- Imaging & Analysis Software: Yes
- Stage / Positioner: X-Y-Z Stage
-
Supplier: Accuris
Description: Harmonized system of quality assessment for electronic components: Basic specification: Scanning electron microscope inspection of semiconductor dice
-
Supplier: KEYENCE
Description: 3D Measurement of a Large Area in 4 Seconds The VR is able to measure across 30 mm in just 4 seconds, with a maximum measurement range of 100 mm x 200 mm. Instead of use a physical probe, the VR utilizes structured lighting to obtain the entire 3D shape of an object. By using telecentric lenses with
- Application: Semiconductor Inspection
- Computer Interface: Yes
- Digital Display: Yes
- Grade: Benchtop
-
Supplier: Optris Infrared Sensing, LLC
Description: The PI 640i microscope lenses offer resolutions down to 28 µm, ideal for electronic board inspection and small component analysis. They allow hands-free operation for simultaneous testing and radiometric measurement, with an adjustable distance from 80 to 100 mm. The optris PI 640i
- Applications / Capabilities: Electronics or Semiconductor Inspection
- Image Source: Thermal or Infrared
-
Supplier: Optris Infrared Sensing, LLC
Description: The microscope optics for the optris Xi 400 infrared camera allow reliable temperature measurement on tiny objects from 240 µm. Combined with a suitable stand, this setup enables professional measurement of printed circuit boards and components in the electronics industry. The measuring
- Applications / Capabilities: Electronics or Semiconductor Inspection
- Image Source: Thermal or Infrared
-
Supplier: Nanotronics Imaging
Description: The Nanotronics Imaging nSpec® is an inspection device designed for high resolution microscopy and detection of wafer defects. With particular application in silicon carbide and Galium Nitride epi wafers, the nSpec® offers fast quantification and qualification of defects
- Applications / Capabilities: Electronics or Semiconductor Inspection
- Cameras or Imagers: Yes
- Clean Room Compatible: Yes
- Image Source: Optical Microscope
-
Supplier: Polytec, Inc.
Description: The MSA-500 Micro System Analyzer is the premier measurement technology for the analysis and visualization of structural vibrations and surface topography in micro structures such as MEMS (Micro-Electro-Mecha nical Systems) devices. By fully integrating a microscope with Scanning Laser
- Application: Measuring / Toolmaker, Semiconductor Inspection, Other
- Computer Interface: Yes
- Digital Display: Yes
- Grade: Benchtop, Research
-
Supplier: Optris Infrared Sensing, LLC
Description: Precision High-Resolution VGA Infrared Microscope Camera with 2X Magnification
- Applications / Capabilities: Electronics or Semiconductor Inspection
- Image Source: Thermal or Infrared
-
Supplier: Piezosystem Jena, Inc.
Description: scanning and analysis semiconductor analysis equipment scanning interferometry & biotechnology (e.g. cell inspection) ray focusing for print processes The MIPOS N100/2 series offers positioning and a scan-range up to 100 µm. These systems
- Minimum Step Size (Resolution): 2.00E-4 µm
- Type: Z-Axis Stage
-
Supplier: Park Systems, Inc.
Description: market today. Providing the highest resolution and the lowest gauge sigma value for repeatability and reproducibility, the XE-WAFER is the perfect solution for the semiconductor and hard disk drive industries which, until now, had very limited choices for industrial grade in-line
- Application: Semiconductor Inspection
- Digital Display: Yes
- Grade: Benchtop
- Image Analysis Processing Software: Yes
-
Supplier: Park Systems, Inc.
Description: , sidewall slope, and line width characterization. The completely automated XE-LCD is designed for characterization of flat panel displays as either an in-line or off-line inspection tool. • Automatic Non-Contact AFM measurement • Automatic navigation and focusing
- Application: Semiconductor Inspection
- Digital Display: Yes
- Grade: Benchtop
- Image Analysis Processing Software: Yes
-
Supplier: Park Systems, Inc.
Description: -nano scale accuracy, repeatability, and throughput are the keys to slider inspection for improving the overall yield. Matching the highest resolution AFM in the world with the lowest one gauge sigma value for repeatability and reproduction, the XE-PTR is the perfect solution for slider
- Application: Semiconductor Inspection
- Digital Display: Yes
- Grade: Benchtop
- Image Analysis Processing Software: Yes
-
Supplier: PI (Physik Instrumente) L.P.
Description: Biotechnology Semiconductor inspection PIFOC scanner system of the entry-level class System consisting of P-725.xCDE1 PIFOC scanner and E-709.1C1L controller. Outstanding lifetime thanks to PICMA®piezo actuators PICMA® piezo actuators are
- Type: Z-Axis Stage
-
Supplier: Park Systems, Inc.
Description: Park Systems has revolutionized the AFM with the introduction of the XE-3DM, the fully automated AFM system designed for overhang and trench profiles, sidewall roughness and imaging, and critical angle measurements. The unique design of the XE-3DM, made possible by the XE-series’ decoupled XY and Z
- Application: Semiconductor Inspection
- Digital Display: Yes
- Grade: Benchtop
- Image Analysis Processing Software: Yes
Find Suppliers by Category Top
Featured Products Top
-
Specially-designed lens option for high-resolution imaging of small light source and display features The Radiant Vision Systems Microscope Lens enables high-resolution imaging of extremely small components and features, such as individual LEDs, display pixels, and (read more)
Browse Datasheets for Radiant Vision Systems -
Science Applications Semiconductor defect inspection Flat panel display inspection Industrial inspection Cell imaging Multi-well imaging Microfluidic device imaging Biomedical 3D measurements Fluorescence microscopy Pixelink Camera Recommendations PL-X9520 - Sony IMX531 (20 MP 1.1") PL-X9524 - Sony IMX530 (24 MP 1.2") (read more)
Browse Camera Lenses and Video Lenses Datasheets for Navitar, Inc. -
A new publication in Ultramicroscopy details a breakthrough in magnetic field-free TEM/STEM imaging—featuring the first wide-gap pole piece developed for the JEOL MARS.
(read more)
Authored by Tatsuhiro Maekawa of JEOL Ltd. and Prof. Arakawa of Shimane University, this study introduces an innovative image-forming system that enables conventional TEM imaging (bright/dark field) without mag...
Browse Electron Microscopes Datasheets for JEOL USA, Inc. -
EOL is a world leader in the development and manufacture of leading edge, high performance, high stability Transmission Electron Microscopes (TEM). JEOL introduced its first TEM over 70 years ago and has been developing and producing TEMs (read more)
Browse Electron Microscopes Datasheets for JEOL USA, Inc. -
Transmission Electron Microscopes (TEM) of 120kV accelerating voltage are widely used in soft material fields such as biology and polymer. We developed the JEM-120i with the concept of "Compact", "Easy To Use", and "Expandable". With the new external appearance, this instrument has evolved into (read more)
Browse Electron Microscopes Datasheets for JEOL USA, Inc. -
manufactured by Linkam Scientific Instruments* and an optical microscope manufactured by Nikon Corporation*. The stage coordinates of each instrument can be linked, so the orientation and position of the specimen can always be identified during specimen transfer between instruments. (read more)
Browse Electron Microscopes Datasheets for JEOL USA, Inc. -
our services, design support, inspection process, and long history of success, you can see more about what it means for Protomatic to be a medical device contract manufacturing company and how we set the standard for quality components. To learn more from our team of professionals or to contact us (read more)
Browse Datasheets for Protomatic, Inc. -
There is a given when it comes to telescope lenses for use on earth or in space. The bigger the better! A bigger diameter implies greater optical resolution and light gathering power.
But making bigger and bigger mirrors and windows comes with some considerations for those wishing to deploy them, and for the companies charged with their fabrication.
First, bigger mirror and...
(read more)
Browse Optical and Light Microscopes Datasheets for Zygo Corporation -
capability for inspection of critical dimensions on their most challenging surfaces. With diverse measurands including radii, diameters, distances, and angles the Advanced Contour Analysis simplifies their workflows by incorporating this industry leading feature from MountainsMap directly into (read more)
Browse Optical and Light Microscopes Datasheets for Zygo Corporation -
and crack. Providing the Aerospace, Medical, Nuclear Power, and Semiconductor markets with custom fabricated parts, we specialize in complex and precision machining of these exotic materials. (read more)
Browse Ultra-hard Materials Machining Datasheets for Top Seiko Co., Ltd.
More Information Top
Indicates content that may require registration and/or purchase.
-
Semiconductor / Microscopes
MX61A - Automatic Semiconductor Inspection Microscope .
-
Stability of resistive-type humidity sensor based on cross-linked polyelectrolytes in chemical environments
Surface morphology of the sensors was measured on a semiconductor inspection microscope (LEICA DM2500, Germany).
-
Materials Forum
The new MX50 semiconductor inspection microscope from Olympus, combined with the ALlOO wafer handling system, has been designed after an extensive study of user requirements worldwide.
-
Olympus Corp. MX61A - Automatic Semiconductor Inspection Microscope
Olympus MX61A - Automatic Semiconductor Inspection Microscope .
-
Application of a dielectric discontinuity microscope to process development at the Fairchild Research Center of National Semiconductor
applied the Zernicke Phase Contrast (ZPC)- technology to a reflective semiconductor inspection microscope .
-
ZEDFA0201P10
There are a nwnbcr of basic optical considerations in designing a mulliplc spectml bandwidth VISflJVIDUV microscope for semiconductor inspection thaI is easy 10 usc.
-
SEM Evaluation of Metallization on Semiconductors
GSFC-S-311-P12A, "Scanning Electron Micro- scope Inspection of Semiconductor Device Metal- lization, Specification For," NASA/Goddard Space Flight Center, Greenbelt, Md.