Products/Services for SerDes ATE Test
-
Serdes - (24 companies)Serializer/de-serializer (SERDES) macro-cell circuits receive fast serial signals (on the order of Mbits/s or higher) and de-serialize them into slower parallel signals. Some SERDES circuits can be programmed like any other PLD. SERDES macrocell... -
Automated Test Equipment - (431 companies)Automated test equipment (ATE) is used to monitor and control test and measurement devices, keeping human interaction at a minimum. Automated test equipment (ATE) is computer-controlled test and measurement equipment that allows for testing... -
Mechanical Testing Equipment - (429 companies)Mechanical testing equipment covers devices used for adhesion, compression, drop (shock), tensile, vibration and fatigue testing. Mechanical testing equipment covers devices used for adhesion, compression, drop (shock), tensile, vibration... -
Electronics Test Fixtures - (75 companies)...packages. printed circuit boards (PCBs). radio frequency (RF) modules. hybrid boards. Electronic test fixtures are also used to test integrated circuits (ICs). Typically, automated test equipment (ATE) is attached to an interface between the IC... -
Test Tubes - (140 companies)Test tubes are handheld tubes are used for mixing or heating chemicals in a laboratory. They are open at the top and rounded at the bottom, and usually made of glass or plastic materials How to Select Test Tubes. Image Credit: Small Parts, Inc. Test...
-
Test Sieves - (86 companies)Test sieves are stainless steel or brass round frames with extremely accurate openings. Wire cloth is usually of stainless steel or brass with nonstandard wire diameters. Test sieves are woven wire or perforated metal pans that are used for sifting...
-
Environmental Test Chambers and Rooms - (378 companies)Definition. Environmental test chambers and rooms are used to ensure the reliability of industrial products, especially electronic items, through prolonged exposure to one or more environmental parameters. They provide heating and/or cooling...
-
Test Points - (54 companies)Test points are electrical terminals that are used for testing electrical and electronic equipment. Test points are electrical terminals used for testing electrical and electronic components. They facilitate the connection of test probes and test...
-
Package Testing Services - (22 companies)Package testing services evaluate the performance of packages and packaging materials using drop, transportation, thermal control, leak and other specialized packaging tests. Impact Handling. Image Credit: Compadre Medical Device Package Testing...
-
Transformer Test Equipment - (61 companies)Transformer Test Equipment consists of specialized test modules or systems used to test and/or monitor electrical and mechanical parameters of transformers and other related devices. Transformers can provide reliable service for extended periods...
Product News
-
Cosmic Equipment SpA
High-Efficiency ATE for Semiconductor Testing Reducing the Cost of Test with Innovative, High-Efficiency ATE Solutions. Cosmic presents ATE, handler and burn-in solutions for mixed-signal and high-power applications for automotive, industrial, and power semiconductor markets. follow us on: LinkedIn. YouTube. Cosmic. Cosmic is a global player in advanced competitive semiconductor test solutions, built on a growth and integration strategy since 2022. With over 400 professionals across 15 direct locations in Europe, the US, and Asia, Cosmic... (read more)Browse Spectrum Analyzers and Signal Analyzers Datasheets for Cosmic Equipment SpA -
LadyBug Technologies LLC
ATE RF Testing of 802.15.1 Utility Metering Bluetooth Device Testing in Manufacturing and Product Development. Bluetooth is a globally adopted wireless communication standard that enables secure connectivity through various security mechanisms (e.g., pairing, encryption). Bluetooth Low Energy (BLE) was added to the Bluetooth specification in 2010, with the original specifications now referred to as Bluetooth Classic to distinguish them. The Bluetooth standard defines several power classes based on maximum peak transmit power, which... (read more)Browse RF Power Meters Datasheets for LadyBug Technologies LLC -
Summit Interconnect
Semiconductor ATE Automated Test Equipment (ATE) boards are used for testing highly complex semiconductor chips. ATE board designs are typically highly complexity with an emphasis on high performance, The boards have an extremely high-layer count (40 to 60 ). Specialized testing. Summit is a leading supplier of PCBs to the semiconductor ATE market. These board provide customers with the ability to efficiently test portions of their design in less time with improved reliability. At Summit, we have the extensive... (read more) -
ToneCooling Technology Co., Ltd
Compact ATE Liquid Cooling Solutions ATE testing faces extreme thermal challenges as 5G/AI chips generate >500W/cm ^2 power density, leading to local hotspots and performance loss. Space constraints demand cooling solutions <15mm thick, while temperature fluctuations affect yield and MIL-STD-810G compliance. Our compact liquid cooling plates feature optimized microchannels (0.2mm, 3D-printed) and high-thermal-conductivity materials like AlN ceramic (170W/m .K) combined with titanium alloy. PID-controlled smart management maintains... (read more)Browse Heat Pipes Datasheets for ToneCooling Technology Co., Ltd -
LadyBug Technologies LLC
Small Form Measurements for ATE System that of thermal power sensors, and the LBSF09 is thermally stable. Furthermore, it offers superior dynamic range and sensitivity. The compact power sensor is designed for easy integration into ATE systems. With its 0.8-inch thickness, 1.6-inch width, and 2.9-inch length (including its standard connector), the sensor is ideal for integration into test systems. Multiple sensors fit seamlessly into a 1RU rack space. The sensor's USB standard interface utilizes either USBTMC or USB HID standards. Optional... (read more) -
NWS
Keysight High-Power ATE System Power Solution Keysight High-Power ATE System Power Solution. Upgrade your validation with Keysight 's High-Power ATE Test Solutions --engineered to conquer modern power challenges. The DP5700 Series Power Supplies deliver up to 12 kW in a compact 2U form, while the RP5900 Series Regenerative Supplies cut energy waste. For advanced load testing, the EL4900 Series Electronic Loads offer precision with sustainability. Tackle complexity, space, and energy goals with Keysight. Follow us on: Facebook. YouTube... (read more) -
LadyBug Technologies LLC
New Power Sensor designed for ATE Integration and the LBSF09L is thermally stable. Furthermore, it offers superior dynamic range and sensitivity. The compact power sensor is designed for easy integration into ATE systems. With its width of 0.8 inches and height of 1.6 inches, multiple sensors can comfortably fit into a 1RU rack space. The sensor utilizes a composite USB interface with both USBTMC and USB HID interfaces. Optional LAN, and SPI/I2C interfaces are available. Programmatic measurements are made with standard SCPI power meter... (read more) -
SiTime Corporation
Time to Rethink Jitter in SerDes Clocks! Why It 's Time to Rethink Jitter Analysis of SerDes Reference Clocks in Optical Modules. As optical fiber technology continues to push the limits of data transport speed and efficiency, the challenge falls on silicon SerDes vendors to keep up. One major obstacle? Managing tighter jitter budgets as data rates increase. A challenge in designing faster SerDes chips is meeting increasingly tighter jitter budgets with each new silicon generation. A portion of this jitter budget is allocated... (read more)Browse IC Clocks Datasheets for SiTime Corporation -
Cosmic Equipment SpA
The importance of semiconductor testing The importance of semiconductor testing. What is the purpose of semiconductor testing?. Semiconductor testing aims to identify and eliminate defective devices, with a particular focus on outliers (erratic deviations) from expected values. This process ensures the reliability and quality of microchips by detecting and removing components that exhibit anomalies. Semiconductor testing is performed using dedicated semiconductor test systems, commonly known as ATE (Automated Test Equipment... (read more) -
New York Blower Company (The)
Testing Capabilities In 2014, our laboratory in La Porte, Indiana was completely renovated to allow for expanded testing capabilities. It allows us to test any manufacturer 's fan assembly for a variety of needs and requirements. Tests following AMCA guidelines are routinely done on new designs or specific jobs for performance sound and vibration verification. In addition to the six airflow test chambers and two reverberant sound rooms, some other features include: Flows to 130,000 CFM. Pressures to 100 " SP... (read more)Browse Fans and Blowers (industrial) Datasheets for New York Blower Company (The)
More Information
Indicates content that may require registration and/or purchase.
-
DFX of a 3rd Generation, 16-core/32-thread UltraSPARC- CMT Microprocessor
Testing large scale serdes implementation on ATE is another challenge that has been addressed.
-
An Active Test Fixture Approach for 40 Gbps and Above At-Speed Testing Using a Standard ATE System
[6] M. Lin, “Capture 25-Gps Serdes Eye Diagram in ATE Production Enviorment,”IEEE International Test Conference, 2012.
-
Stretching the limits of FPGA SerDes for enhanced ATE performance
Keywords-Automated Test Equipment( ATE ); built-in self test (BIST); Serializer/Deserializer( SerDes ); Field Programmable Gate Array(FPGA); high-speed testing; mult-gigahertz testing; loopback testing; test modules; test enhancement.
-
Massively Parallel Validation of High-Speed Serial Interfaces using Compact Instrument Modules
With such significant improvement in serdes parameter validation time, new uses emerge, such as SVT tests on units prior to ATE bring-up or debug testing, SVT tests on more production units, SVT tests on units prior to system board insertion, and …
-
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
… of IEEE In- ternational Test Conference, 1999 [96] S. Sunter, A. Roy, and J. Cote, “An Automated, Complete, Structural Test Solution for SERDES ,” Proceedings of IEEE International Test Conference, 2004 [97] A … … GBit Device Pins with ATE Assisted Loopback Instrument,” …
-
Gizopoulos / Advances in ElectronicTesting
A simple pass or fail notification can then be delivered to the ATE . This type of test architecture [31] has been popularized by communications chips containing Serializers/Deserializers ( SERDES ) that have data-rates well into the Gigahertz range.
-
Developing an ATE strategy for PCI Express
All of these features are freely available on standard digital ATE pins, but are not normally available in instruments designed to test the timing and jitter content of SERDES pins. To support the non- SERDES pins on the device, you must also ensure that the test capability …
-
The leading edge of production wafer probe test technology
SerailizeriDeserialier devices, known as SERDES ,are now being probed at 4GHz with specially laid out epoxy ring, cantilever needle cards and ATE . … the device speeds, so there are the balanced driversand receiverson the device under test load board or …
-
PCI Express requires ATE strategy
As well as the serdes -oriented tests , all PCI Express I and O pins will require such tests as dc parametrics, receiving and driving of scan vectors and parallel digital vectors. Ideally, all capabilities can be switched within the ATE itself.
-
Testing SerDes beyond 4 Gbps - changing priorities
PRESENT EXTERNAL TESTING OF SERDES Automatic test equipment ( ATE ) typically measures jitter by undersampling the transmitted signal with a high- bandwidth, low …
