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Supplier: Accuris
Description: Calibration of Stylus Instruments
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Supplier: Accuris
Description: Calibration Specimens - Stylus Instruments - Types, Calibration and Use of Specimens
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Supplier: Accuris
Description: Measurement of coating thickness by differential measurement using a stylus instrument
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Supplier: Accuris
Description: Instruments for the Measurement of Surface Roughness by the Profile Method - Contact (Stylus) Instruments of Progressive Profile Transformation - Profile Recording Instruments
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Description: Geometrical Product Specifications (GPS) -- Surface texture: Profile method -- Calibration of contact (stylus) instruments
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Description: Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
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Supplier: CSA Group
Description: Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
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Description: ISO 25178-601:2010 defines the metrological characteristics of contact (stylus) areal surface texture measuring instruments.
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Supplier: CSA Group
Description: ISO 25178-601:2010 defines the metrological characteristics of contact (stylus) areal surface texture measuring instruments.
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Supplier: Swiss Jewel Company
Description: A sapphire stylus is a small pin-point components where the end radius is controlled to as small as .001". Sapphire's hardness and ability to accept a good polish provide for a very hard and smooth tip which provide and excellent point of contact, perfect for a stylus. Typical Sapphire
- Length: 0.05 to 0.08 inch
- Diameter: 0.0195 to 0.027 inch
- Density: 3.9699974944255785 g/cc
- Max Use / Curie Temperature: 2,000 C
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Description: ISO 25178-701:2010 specifies the characteristics of material measures used as measurement standards, the estimation methods of the residual errors, and the calibration methods and tests for acceptance and periodical re-verification for areal surface texture contact (stylus) measurement
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Supplier: CSA Group
Description: ISO 25178-701:2010 specifies the characteristics of material measures used as measurement standards, the estimation methods of the residual errors, and the calibration methods and tests for acceptance and periodical re-verification for areal surface texture contact (stylus) measurement
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Supplier: ASTM International
Description: 1.1 This test method describes a shop or field procedure for determination of four roughness characteristics of surfaces prepared for painting by abrasive blasting. The procedure uses a portable skidded or non-skidded stylus profile tracing instrument. The three measured
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Supplier: ASTM International
Description: 1.1 This test method describes a shop or field procedure for determination of roughness characteristics of surfaces prepared for painting by abrasive blasting. The procedure uses a portable skidded or non-skidded stylus profile tracing instrument. The measured characteristics are: Rt
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Supplier: Fischer Technology, Inc.
Description: Developed by anti-corrosion experts, the three devices impress with robustness, usability and performance. All required measurement tasks in heavy corrosion protection are solved quickly and reliably. The DFT is the handheld device for the simple layer thickness measurement on steel and non-ferrous
- Technology: Contact / Stylus Based
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: SURFCOM 130 is designed for mobile use in production. The separate control and analysis unit features a touchscreen display and a printer. An interface enables external data storage and professional analysis with ACCTee PRO on a computer. Compact tracing driver Highly accurate free
- Measurement Capability: 2D / Line Profiles, 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt )
- Standards Compliance: ASME, DIN, ISO / EN, JIS
- Mounting / Loading Options: Benchtop, Handheld / Portable
- Display & Special Features: Computer Interface / Networkable, SPC / Software Capability, Video / Graphic Display
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Supplier: Mahr Inc.
Description: instrument An all in one solution. Small and lightweight (approx. 500 g) Instrument flexibility: Removable drive unit All the measuring positions you need: horizontal, vertical, upside down 31 surface parameters offer the same range of functions as a laboratory instrument. Error
- Vertical (Z) Range: 0.003543309 to 0.013779535 inch
- Vertical (Z) Resolution: 0.0000003149608 inch
- Traverse Length: 0.0393701 to 0.6299216 inch
- Technology: Contact / Stylus Based
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Supplier: Mahr Inc.
Description: Within the "mobile surface metrology" range, MarSurf M 400 provides the necessary range of functions, while at the same time being quick and easy to use. Features Mobile and stationary measuring instrument Roughness and waviness measurements Traversing lengths up to 26 mm Over 50 R , W and P
- Vertical (Z) Range: 0.009842525 to 0.029527575 inch
- Vertical (Z) Resolution: 0.00000003149608 inch
- Traverse Length: 1.0236226 inch
- Scan Rate: 0.0078740157480315 to 0.0393700787401575 in/sec
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Supplier: AENOR
Description: CALIBRATION SPECIMENS. STYLUS INSTRUMENTS. TYPES, CALIBRATION AND USE OF SPECIMENS.
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Supplier: AENOR
Description: RULES AND PROCEDURES FOR THE MEASUREMENT OF SURFACE ROUGHNESS USING STYLUS INSTRUMENTS.
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Supplier: AENOR
Description: INSTRUMENTS FOR THE MEASUREMENT OF SURFACE ROUGHNESS BY THE PROFILE METHOD. CONTACT (STYLUS) INSTRUMENTS OF PROGRESSIVE PROFILE TRANSFORMATION PROFILE RECORDING INSTRUMENTS.
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Supplier: AENOR
Description: Geometrical product specifications (GPS) - Surface texture: Profile - Calibration of contact (stylus) instruments (ISO 12179:2026)
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Supplier: PTB Sales, Inc.
Description: Ask for pricing. The Dektak IIA is used for making accurate measurements on small vertical features ranging in height from 100 to 655,000 angstroms. Dektak IIA acquires data by moving the sample beneath the diamond tipped stylus. Vertical movements of the stylus are sensed by an LVDT,
- Applications: CVD / PVD Films
- Form Factor: Monitor / Instrument
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Supplier: CSA Group
Description: Specifies the rules for comparison of the measured values with the tolerance limits for surface texture parameters defined in ISO 4287, ISO 12085, ISO 13565-2 and ISO 13565-3. It also gives rules for measuring roughness profile parameters by using stylus instruments according to ISO
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Supplier: PCE Instruments / PCE Americas Inc.
Description: the main unit of the roughness gauge. The diamond stylus is installed in the motorized sensor. This presses with a maximum force of 4 mN on the surface from which the roughness is to be measured. The roughness tester measures according to the valid ISO, ANSI and JIS standards for roughness
- Operating Temperature: -4 to 104 F
- Technology: Contact / Stylus Based
- Display & Special Features: Digital Readout
- Mounting / Loading Options: Handheld / Portable
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Supplier: Mahr Inc.
Description: Product features Large, high contrast dial face Can be controlled independently of a machine tool Large working range in all axis (X, Y, Z) prevents damage to the stylus by contacting errors Compact metal housing and long probe arm High accuracy and linearity Shock and water proof, ideal for
- Resolution: 0.000393701 inch
- Graduation / Resolution: 0.000393701 inch
- Display: Dial / Analog / Direct Reading Scale
- Features: Indicator
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Supplier: Fischer Technology, Inc.
Description: for consumables Measurement performed with the proven FMP handheld devices from Fischer: both coating thickness and profile measurements carried out with the same instrument FMP's comprehensive set of functions available: automatic test reports, statistical evaluations and the storage of
- Technology: Contact / Stylus Based
- Features: Other
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
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Supplier: Mahr Inc.
Description: Product features Easy to read display due to the combination of: - a progressive analog display (bar graph) for dynamic path information - a digital display for accurate reading Can be controlled independently of a machine tool Large working range in all axis (X, Y, Z) prevents damage to the
- Range: 0.0787402 to 0.1574804 inch
- Range / Travel: 0.0787402 to 0.1574804 inch
- Display: Digital Display
- Features: Indicator
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Supplier: SAE International
Description: roughest surface, with Sa values of 0.60-1.00 \u03bcm, and the highest COF values. The DF sample falls between the MF and EDT with Sa = 0.60 \u03bcm. Also, the EDT and DF samples have a more isotropic surface, as indicated by Stylus X Ra/Stylus Y Ra = 0.97-1.01, and the COF values are
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Supplier: Cole-Parmer
Description: • Modular Calibration and HART Communication System uses three basic components to perform duties formerly requiring a wide range of different instruments • Hand held HART communicator and combined multifunction calibrator • Powerful device configuration, commissioning and maintenance
- Calibrator Style: Battery Powered
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Supplier: Cole-Parmer
Description: • Modular Calibration and HART Communication System uses three basic components to perform duties formerly requiring a wide range of different instruments • Hand held HART communicator and combined multifunction calibrator • Powerful device configuration, commissioning and maintenance
- Calibrator Style: Battery Powered
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Supplier: Gagemaker L.P.
Description: A small, lightweight, and extremely easy to use surface roughness measurement instrument that lets you view surface roughness waveforms right on a color LCD screen. The popular Surftest SJ-210 is a user-friendly surface roughness measurement instrument designed as a handheld tool that
- Profile Vertical Range: 0.7 to 1 inch
- Display & Special Features: Computer Interface / Networkable, Digital Readout, Video / Graphic Display
- Technology: Contact / Stylus Based
- Features: Form Measurement, Waviness Parameters (Wa,Wt )
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: 3-in-1 form, contour and surface measurement in one setting For large, precision parts for the wind, power and bearing industries Precision rotary table on air bearings with 80 nanometer rotation accuracy Form tester, contour measuring instrument and roughness measuring system in one Clear
- Display & Special Features: Computer Interface / Networkable, SPC / Software Capability
- Technology: Contact / Stylus Based
- Mounting / Loading Options: Floor / Free Standing
- Features: Other, Specialty / Custom
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: range up to 15 mm SURFCOM 1900 CNC measuring station with two stylus-and-arm systems for contour and surface measurements and fast stylus-and-arm exchange Sensors Surface sensor Contour sensor SURFCOM 2900 Like the SURFCOM 1900, but with additional bending scale in the Z deflection for
- Measurement Capability: 2D / Line Profiles, 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt )
- Standards Compliance: ASME, DIN, ISO / EN, JIS
- Mounting / Loading Options: Benchtop
- Display & Special Features: Computer Interface / Networkable, SPC / Software Capability
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Supplier: RS Components, Ltd.
Description: ideas. Makequick calculations. Play games. Ultra light. Case and LCD made from durable, shatter-proof, non-toxic plastic. Pressure-sensitive LCD writing surface is easy to clean and maintain. Write or draw with the included stainless steel telescoping stylus or almost any other
- Display Size: 10.5 inch
- Features: Handheld / Portable, Tablet
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on dial test indicators) coupled with a gentle touch down to 0.05N enables access to difficult to reach details, even on fragile components. Due to it’s cylindrical housing geometry, the Lever Probe can be mounted in any attitude relative to the intended target, although the stylus (read more)
Browse Dimensional Gages and Instruments Datasheets for Ametek Solartron Metrology -
screens Series FT Resistive Touch Screens key features: Benefits of 4-wire touch screens include: Quicker response time Options in multiple sizes; choices of input by finger, gloved finger or stylus (read more)
Browse Touch Screen Displays Datasheets for NKK Switches -
Versatile Industrial Applications Adaptable with multiple stylus and extension rods for varied inspection needs (read more)
Browse 3D Scanners Datasheets for SCANOLOGY -
ML3G is a non-contact tool measurement system designed to control any type of tool directly on machine. The main feature of a “non-contact” tool setter is that the measurement is performed by interrupting a laser beam instead of mechanical contact with a stylus. This (read more)
Browse Optical Micrometers and Laser Micrometers Datasheets for Marposs Corp -
environments, NimProbe withstands vibration, temperature shifts, humidity, and variable lighting. Its dynamic compensation algorithms ensure accuracy and stability in any setting. With a wide range of stylus and corner extension rods, NimProbe adapts to intricate curved surfaces, deep cavities, and (read more)
Browse 3D Scanners Datasheets for SCANOLOGY -
of parts and design changes, and the system's automatic stylus changing rack enables the inspection of multiple parts in quick succession. It is a proven example of how manufacturers are future-proofing their business activities with an efficient and cost-effective solution to part gauging (read more)
Browse Dimensional Gages and Instruments Datasheets for Renishaw -
. The volume accuracy is 0.089 mm for 49.0 m³, 0.067 mm for 28.6 m³, and 0.049 mm for 10.4m³. Excellent for Deep Hidden Points Thanks to its 500-mm length (excluding the stylus), and sophisticated algorithm, the i-Probe can measure (read more)
Browse 3D Scanners Datasheets for SCANOLOGY -
fingers or a stylus on the screens of smart phones, tablets, computer screens, music players, and computer touch pads. XFdtd computes the capacitance of complex sensor designs, allowing designers to choose the best geometry for their needs without prototyping. (read more)
Browse Modeling and Simulation Software Datasheets for Remcom (USA)
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Coming Age of Surface Metrology with Optical Instruments
creating a surface, there will be a target range, an instrument for seeing that range, and a required method. The method for examining this quality is measurement, and the contact-type instrument (contact stylus) is the tool most typically used to perform this measurement. Contact-type measurement
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Touch Screen Selection Guide
A touch screen is an assembly that is mounted in front of a video display. It is activated by touching, with a stylus or finger, the selected area on the display that indicates the desired function. The touch screen or frame has an independent X-Y coordinate system that is calibrated to the display
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Active vs Passive Scanning for Multi-Point Measurement
with a fluid and continuous movement that can quickly and accurately measure hundreds or thousands of points along a path as the stylus moves across a surface. But while all scanning technologies offer advantages over single-point measurement, all scanning probe heads are not the same.
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Optical Measurement of Surface Topography
… 2 1.4 Surface Texture Standards and GPS.........................................................3 1.4.1 Profile Standards ...........................................................................3 1.4.2 Areal Specification Standards........................................................4 1.5 Instrument Types in the ISO 25178 Series...............................................5 1.5.1 The Stylus Instrument ....................................................................7 1.5.2 …
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Nanoscale Calibration Standards and Methods
and Stylus Instruments Using Gaussian Filter 88 .
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ROUGH SURFACES, 2ND EDITION
STYLUS INSTRUMENTS .
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
Stylus Instruments . . . . . . . . . . . . . . . . . . . . . . . . . .
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Springer Handbook of Metrology and Testing
While stylus instruments are inherently contacting methods and optical instruments noncontacting methods, scan- ning probe microscopes can be both contacting and noncontacting.
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Springer Handbook of Materials Measurement Methods
While stylus instruments are inherently contacting methods and opti- cal instruments noncontacting methods, scanning probe microscopes can be both contacting and noncontacting.
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Development of an optical stylus displacement sensor for surface profiling instruments
Abstract The main cause of irrational results from measurements made with optical stylus instruments is speckle noise in the reflected light.