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Supplier: Bruker Corporation
Description: Bruker's Dektak® stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and
- Display & Special Features: Computer Interface / Networkable
- Industrial Applications: Electronics, Semiconductor Manufacturing, Other
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
- Mounting / Loading: Benchtop, Floor / Free Standing
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Description: Geometrical Product Specifications (GPS) -- Surface texture: Profile method -- Calibration of contact (stylus) instruments
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Description: Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
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Supplier: Accuris
Description: Surface Roughness and Profile of Metallic Foils (Contacting Stylus Technique)
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Supplier: Accuris
Description: Electrical contact (stylus) instruments for the measurement of surface roughness by the profile method
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Supplier: Accuris
Description: Geometrical Product Specifications (GPS) - Suface texture: Profile method - Calibration of contact (stylus) instruments
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Supplier: Zygo Corporation
Description: . Heavy duty T-slot compatible part positioning staging enables simple, repeatable fixturing and measurement. Productivity and Value Cost-effective price-to-performance ratio compares favorably to alternative systems, including mechanical contact stylus profilers
- Application: Profile Measurement, Digitizing / Imaging
- Machine Type and Specifications: 3-D Scanning / Profiling
- Mounting Options: Benchtop
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Supplier: Zygo Corporation
Description: , and provides the best qualities of other profiling technologies (stylus, confocal, focus scanning) without their shortcomings. Additional application modules for specific needs, such as measurement in the presence of transparent films, and 2D vision analysis, are available for
- Application: Profile Measurement, Digitizing / Imaging
- Control: PC
- Machine Type and Specifications: 2-D Scanning / Profiling, 3-D Scanning / Profiling
- Mounting Options: Free Standing
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Supplier: Accuris
Description: Instruments for the Measurement of Surface Roughness by the Profile Method - Contact (Stylus) Instruments of Progressive Profile Transformation - Profile Recording Instruments
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Description: ISO/TR 22335:2007 describes a method for determining ion-sputtering rates for depth profiling measurements with Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) where the specimen is ion-sputtered over a region with an area between 0,4 mm2 and 3
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Supplier: CSA Group
Description: Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
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Supplier: Gagemaker L.P.
Description: Thread form accuracy is important if two connections are to make-up properly. Using a Thread Profile Gage is a quick way to check your threads for proper form and pitch. Thread form is defined as its profile in an axial plane for a length of one pitch. Simply place the correct form
- Form Parameters: Other
- Industrial Applications: Mechanical Parts (Bearings, Shafting)
- Mounting / Loading: Handheld / Portable
- Technology: Contact / Stylus Based
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Supplier: Gagemaker L.P.
Description: hread form accuracy is important if two connections are to make-up properly. Using a Thread Profile Gage is a quick way to check your threads for proper form and pitch. Thread form is defined as its profile in an axial plane for a length of one pitch. Simply place the correct form into
- Form Parameters: Other
- Industrial Applications: Mechanical Parts (Bearings, Shafting)
- Mounting / Loading: Handheld / Portable
- Technology: Contact / Stylus Based
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Supplier: Fischer Technology, Inc.
Description: To ensure that protective layers adhere permanently, the surface roughness of the base material must comply with strict recommended standards. The FPR1 profile probe is the ideal solution in this case: When combined with the FMP10/40 series, the FPR1 profile probe is the ideal solution
- Industrial Applications: Other
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
- Standards Compliance: Other
- Technology: Contact / Stylus Based
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Supplier: CSA Group
Description: ISO/TR 22335:2007 describes a method for determining ion-sputtering rates for depth profiling measurements with Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) where the specimen is ion-sputtered over a region with an area between 0,4 mm2 and 3
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: Standard components VAST Navigator “mass” multisensor technology Temperature sensors for linear temperature compensation Options Rotary table to measure rotationally symmetric parts Stylus rack for stylus and
- Application: Dimensional Measurement, Profile Measurement, Digitizing / Imaging
- Control: Manual, CNC, PC, Other
- Features: Crash Protection, Offline Programming, Reverse Engineering, Shop Floor Suitable, SPC Software, Temperature Compensation
- Machine Type and Specifications: Coordinate Measuring Machine (CMM), 3-D Scanning / Profiling
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: Configured with scanning Made to measure Easy to use; can be loaded from three sides Practical stylus rack Low space requirements; more room to work Machine technology Reliable drive technology Completely covered
- Application: Dimensional Measurement, Profile Measurement, Digitizing / Imaging
- Control: Manual, CNC, PC, Other
- Features: Crash Protection, Offline Programming, Reverse Engineering, Shop Floor Suitable, SPC Software, Temperature Compensation
- Machine Type and Specifications: Coordinate Measuring Machine (CMM), 3-D Scanning / Profiling
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: Practical stylus rack Low space requirements; more room to work Machine technology Reliable drive technology Completely covered guideways Integrated damping system Compensation of guideway errors (CAA corrected) Technology
- Application: Dimensional Measurement, Profile Measurement, Digitizing / Imaging
- Control: Manual, CNC, PC, Other
- Features: Crash Protection, Offline Programming, Reverse Engineering, Shop Floor Suitable, SPC Software, Temperature Compensation
- Machine Type and Specifications: Coordinate Measuring Machine (CMM), 2-D Scanning / Profiling, 3-D Scanning / Profiling
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: -aided correction system, RDS is a real calibration wonder. RDS-CAA calibrates automatically by mathematical calculation. It calibrates 8-12 angular positions and uses the stylus in all 20,736 positions. You simply cannot measure any more flexibly. RDS-CAA makes it possible to change a
- Application: Dimensional Measurement, Profile Measurement, Digitizing / Imaging
- Control: Manual, CNC, PC
- Features: Crash Protection, Offline Programming, Reverse Engineering, Shop Floor Suitable, SPC Software, Temperature Compensation
- Machine Type and Specifications: Coordinate Measuring Machine (CMM), 3-D Scanning / Profiling
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Supplier: Fischer Technology, Inc.
Description: -ferrous metals. The DPM with integrated measuring probe is used to measure and record all climate parameters relevant for coating processes. The SPG checks the surface profile in the blink of an eye. All devices are available in a corrosion kit. Optionally: the Bresle Salt Kit for quick,
- Technology: Contact / Stylus Based
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Supplier: ASTM International
Description: 1.1 This test method describes a shop or field procedure for determination of four roughness characteristics of surfaces prepared for painting by abrasive blasting. The procedure uses a portable skidded or non-skidded stylus profile tracing instrument. The three measured
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Supplier: ASTM International
Description: 1.1 This test method describes a shop or field procedure for determination of roughness characteristics of surfaces prepared for painting by abrasive blasting. The procedure uses a portable skidded or non-skidded stylus profile tracing instrument. The measured characteristics are: Rt
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Supplier: ASTM International
Description: 1.1 This test method describes a shop or field procedure for determination of roughness characteristics of surfaces prepared for painting by abrasive blasting. The procedure uses a portable skidded or non-skidded stylus profile tracing instrument. The measured characteristics are: Rt
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Description: Specifies the rules for comparison of the measured values with the tolerance limits for surface texture parameters defined in ISO 4287, ISO 12085, ISO 13565-2 and ISO 13565-3. It also gives rules for measuring roughness profile parameters by using stylus instruments according to ISO
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Supplier: PCE Instruments / PCE Americas Inc.
Description: The roughness tester PCE-RT 2300 is used to measure the roughness of surfaces. The PCE-RT 2300 roughness meter has a removable motorized sensor. This property makes it possible to determine the surface roughness with the roughness tester even on small or narrow profiles. The measured values
- Display & Special Features: Digital Readout
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Mounting / Loading: Handheld / Portable
- Operating Temperature: -4 to 104 F
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Supplier: CSA Group
Description: Specifies the rules for comparison of the measured values with the tolerance limits for surface texture parameters defined in ISO 4287, ISO 12085, ISO 13565-2 and ISO 13565-3. It also gives rules for measuring roughness profile parameters by using stylus instruments according to ISO
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Supplier: CSA Group
Description: ISO 17560:2014 specifies a secondary-ion mass spectrometric method using magnetic-sector or quadrupole mass spectrometers for depth profiling of boron in silicon, and using stylus profilometry or optical interferometry for depth scale calibration. This method is applicable to single
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Supplier: Ametek Solartron Metrology
Description: cycles and are virtually free from hysteresis. Flexures can be mounted such that there is little or no stress through the gauge line enabling precision profiling of moving materials such as rotating shafts, brake discs etc. With resolution better than 0.05 µm at speeds up to 3906 readings per
- Form Parameters: Roundness
- Industrial Applications: Mechanical Parts (Bearings, Shafting), Other
- Mounting / Loading: Machine Mounted
- Operating Temperature: 41 to 176 F
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Supplier: PCE Instruments / PCE Americas Inc.
Description: display. In addition to the numerical measured value display, the measuring profile can be graphically visualized. The roughness tester PCE-RT 2000 is powered by a rechargeable battery. The charger of the surface tester is included in delivery. The roughness tester has an automatic shut-off
- Display & Special Features: Digital Readout
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Mounting / Loading: Handheld / Portable
- Technology: Contact / Stylus Based
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Supplier: Mahr Inc.
Description: -style user guidance Integrated standard in drive unit Large measuring range, 350 µm Automatic profile detection and corresponding selection of filter and traversing length conforming to standards Integrated memory for the results of up to 40,000 measurements
- Display & Special Features: Digital Readout
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Mounting / Loading: Handheld / Portable
- Operating Temperature: 23 to 104 F
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Supplier: Mahr Inc.
Description: Product features Bright, illuminated color display Automatic selection of filter and traversing length conforming to standards Integrated thermal graphics printer of high print quality Print the r-profile via the thermal graphics printer
- Display & Special Features: Digital Readout
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Mounting / Loading: Handheld / Portable
- Operating Temperature: 23 to 104 F
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Supplier: AENOR
Description: Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2000)
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Supplier: AENOR
Description: Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)
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Supplier: AENOR
Description: Geometrical product specifications (GPS) - Surface texture: Profile - Calibration of contact (stylus) instruments (ISO/DIS 12179:2025)
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Supplier: Mahr Inc.
Description: MarSurf XR 1. The ideal instrument for a low-cost introduction to user-friendly surface metrology. The PC-based instrument delivers all common surface parameters and profiles in accordance with international standards, both in the measuring room and in production. MarSurf XR 1 from
- Display & Special Features: Computer Interface / Networkable
- Industrial Applications: Aerospace / Defense, Automotive, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Mounting / Loading: Benchtop
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Supplier: AENOR
Description: INSTRUMENTS FOR THE MEASUREMENT OF SURFACE ROUGHNESS BY THE PROFILE METHOD. CONTACT (STYLUS) INSTRUMENTS OF PROGRESSIVE PROFILE TRANSFORMATION PROFILE RECORDING INSTRUMENTS.
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favorably to alternative systems, including mechanical contact stylus profilers. Compact, vibration-tolerant SureScan™ technology for easy integration anywhere in your facility. Non-contact method means no consumable replacement costs to worry about. Simplified (read more)
Browse Surface Metrology Equipment Datasheets for Zygo Corporation -
other profiling technologies (stylus, confocal, focus scanning) without their shortcomings. Analysis & Control Software The Nexview NX2 profiler uses ZYGO's Mx™ software that powers (read more)
Browse Dimensional and Profile Scanners Datasheets for Zygo Corporation -
Lever Probes are generally used for precision gauging of components, such as shafts, for profiling but the Orbit®3 compatible Lever Probe is not restricted to such small applications. The narrow body (compared to devices based (read more)
Browse Dimensional Gages and Instruments Datasheets for Ametek Solartron Metrology -
ML3G is a non-contact tool measurement system designed to control any type of tool directly on machine. The main feature of a “non-contact” tool setter is that the measurement is performed by interrupting a laser beam instead of mechanical contact with a stylus. This (read more)
Browse Optical Micrometers and Laser Micrometers Datasheets for Marposs Corp -
optical profilers with powerful data gathering and data analysis software make this type of measurement easier and faster compared to other roughness inspection methods. A profiler based on Coherence Scanning Interferometry (CSI) makes it possible to collect enough data on most samples while (read more)
Browse Surface Profilometers Datasheets for Zygo Corporation
More Information Top
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Optical Shop Testing 3rd Edition Complete Document
Stylus Profilers 670 .
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Principles and Applications of Tribology 2nd Edition Complete Document
Roughness Measurements by Stylus Profiler , AFM and Non-Contact Optical Profiler,” Wear 190, 76–88.
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Feature characterization of microfabricated microfluidic chips by PDMS replication and CCD imaging
Depth and width measurements obtained using the method agreed well with those gained using a stylus profiler and universal measuring microscope, with a deviation of below 0.9 lm, while profile distortions of deeper structures using stylus profilers were avoided.
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Methods divergence between measurements of micrometer and sub-micrometer surface features
Measurements of micrometer and sub-micrometersurfacefeatures have been made using a stylus profiler ,an STM, an AFM and a phase-measuring interferometricmicroscope.
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Surface Profiling - Dektak Surface Profilers in Three-Dimensional Surface Profiling Analysis
Benefits of Dektak Stylus Profilers .
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Form Error Characterisation by an Optical Profiler
The form measurements obtained by the optical profiler are compared with the stylus profiler and the results are presented.
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Polymer Sub-Wavelength Optics for
Lab-on-a-Chip
Table 3.3: Table showing the results of the thickness measurements, after the UV exposure and development, on three different wafers performed using a Dektak8 stylus profiler .
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Calibration of high-aspect ratio quality control optical scanning system
Traceable calibration of TS by stylus profiler (SP) and scanning electron microscope (SEM), performed in laboratory- controlled configuration.
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Reference metrology in a research fab: the NIST clean calibrations thrust
Initially, we have focused on calibration, monitoring, and uncertainty analysis for a three-tool set consisting of a stylus profiler , an SEM, and an AFM.
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Dimensional measurement of 3D microstruture based on white light interferometer
The 4 common contact types of equipment are: Contact Stylus Profiler , Coordinate Measurement Machine (CMM), and Scanning Probe Microscopes (SPM). .
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