-
Supplier: Bruker Corporation
Description: Bruker's Dektak® stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and
- Measurement Capability: 2D / Line Profile, 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
- Mounting / Loading Options: Benchtop, Floor / Free Standing
- Display & Special Features: Computer Interface / Networkable
- Technology: Contact / Stylus Based
-
Supplier: Accuris
Description: Instruments for the Measurement of Surface Roughness by the Profile Method - Contact (Stylus) Instruments of Progressive Profile Transformation - Profile Recording Instruments
-
Description: Geometrical Product Specifications (GPS) -- Surface texture: Profile method -- Calibration of contact (stylus) instruments
-
-
Supplier: Accuris
Description: Surface Roughness and Profile of Metallic Foils (Contacting Stylus Technique)
-
Supplier: Accuris
Description: Geometrical Product Specifications (GPS) - Suface texture: Profile method - Calibration of contact (stylus) instruments
-
Supplier: Accuris
Description: Electrical contact (stylus) instruments for the measurement of surface roughness by the profile method
-
Description: Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
-
Supplier: CSA Group
Description: Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
-
Supplier: CSA Group
Description: Report is applicable only to a laterally homogeneous bulk or single-layered material where the ion-sputtering rate is determined from the sputtered depth, as measured by a mechanical stylus profilometer, and sputtering time. The Technical Report provides a method to convert the ion-sputtering
-
Description: Report is applicable only to a laterally homogeneous bulk or single-layered material where the ion-sputtering rate is determined from the sputtered depth, as measured by a mechanical stylus profilometer, and sputtering time. The Technical Report provides a method to convert the ion-sputtering
-
Supplier: Zygo Corporation
Description: included zoom lenses lets users optimize the field of view and maximize instrument flexibility The Only Profiler You Need You no longer have to select a profiler based on the type of surface you want to measure. The Nexview™ NX2 profiler measures topography of virtually any
- Features: 2-D Scanning / Profiling, 3-D Scanning / Profiling, Digitizing / Imaging, Profile Measurement
- Mounting Options: Free Standing
- Control: PC
-
Supplier: Zygo Corporation
Description: Cost-effective price-to-performance ratio compares favorably to alternative systems, including mechanical contact stylus profilers. Compact, vibration-tolerant SureScan™ technology for easy integration anywhere in your facility. Non-contact method means no consumable replacement costs
- Features: 3-D Scanning / Profiling, Digitizing / Imaging, Profile Measurement
- Mounting Options: Benchtop
-
Supplier: Gagemaker L.P.
Description: Thread form accuracy is important if two connections are to make-up properly. Using a Thread Profile Gage is a quick way to check your threads for proper form and pitch. Thread form is defined as its profile in an axial plane for a length of one pitch. Simply place the correct form into the threads
- Technology: Contact / Stylus Based
- Features: Form Measurement, Other, Specialty / Custom, Wear / Tribology
- Mounting / Loading Options: Handheld / Portable
- Applications: Mechanical Parts (Bearings, Shafting)
-
Supplier: Gagemaker L.P.
Description: hread form accuracy is important if two connections are to make-up properly. Using a Thread Profile Gage is a quick way to check your threads for proper form and pitch. Thread form is defined as its profile in an axial plane for a length of one pitch. Simply place the correct form into the threads
- Technology: Contact / Stylus Based
- Features: Form Measurement, Other, Specialty / Custom, Wear / Tribology
- Mounting / Loading Options: Handheld / Portable
- Applications: Mechanical Parts (Bearings, Shafting)
-
Supplier: Fischer Technology, Inc.
Description: To ensure that protective layers adhere permanently, the surface roughness of the base material must comply with strict recommended standards. The FPR1 profile probe is the ideal solution in this case: When combined with the FMP10/40 series, the FPR1 profile probe is the ideal solution for testing
- Technology: Contact / Stylus Based
- Features: Other
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
-
Supplier: ASTM International
Description: 1.1 This test method describes a shop or field procedure for determination of roughness characteristics of surfaces prepared for painting by abrasive blasting. The procedure uses a portable skidded or non-skidded stylus profile tracing instrument. The measured characteristics are: Rt and Rpc.
-
Supplier: ASTM International
Description: 1.1 This test method describes a shop or field procedure for determination of roughness characteristics of surfaces prepared for painting by abrasive blasting. The procedure uses a portable skidded or non-skidded stylus profile tracing instrument. The measured characteristics are: Rt and Rpc.
-
Description: Specifies the rules for comparison of the measured values with the tolerance limits for surface texture parameters defined in ISO 4287, ISO 12085, ISO 13565-2 and ISO 13565-3. It also gives rules for measuring roughness profile parameters by using stylus instruments according to ISO 3274.
-
Supplier: CSA Group
Description: ISO 17560:2014 specifies a secondary-ion mass spectrometric method using magnetic-sector or quadrupole mass spectrometers for depth profiling of boron in silicon, and using stylus profilometry or optical interferometry for depth scale calibration. This method is applicable to single-crystal,
-
Supplier: CSA Group
Description: Specifies the rules for comparison of the measured values with the tolerance limits for surface texture parameters defined in ISO 4287, ISO 12085, ISO 13565-2 and ISO 13565-3. It also gives rules for measuring roughness profile parameters by using stylus instruments according to ISO 3274.
-
Supplier: AENOR
Description: INSTRUMENTS FOR THE MEASUREMENT OF SURFACE ROUGHNESS BY THE PROFILE METHOD. CONTACT (STYLUS) INSTRUMENTS OF PROGRESSIVE PROFILE TRANSFORMATION PROFILE RECORDING INSTRUMENTS.
-
Supplier: AENOR
Description: INSTRUMENTS FOR THE MEASUREMENT OF SURFACE ROUGHNESS BY THE PROFILE METHOD. CONTACT (STYLUS) INSTRUMENTS OF CONSECUTIVE PROFILE TRANSFORMATION. CONTACT PROFILE METERS, SYSTEM M.
-
Supplier: AENOR
Description: Geometrical product specifications (GPS) - Surface texture: Profile - Calibration of contact (stylus) instruments (ISO 12179:2026)
-
Supplier: AENOR
Description: Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)
-
Supplier: Fischer Technology, Inc.
Description: Developed by anti-corrosion experts, the three devices impress with robustness, usability and performance. All required measurement tasks in heavy corrosion protection are solved quickly and reliably. The DFT is the handheld device for the simple layer thickness measurement on steel and non-ferrous
- Technology: Contact / Stylus Based
-
Supplier: Carl Zeiss Industrial Metrology, LLC
Description: technology Temperature sensors for linear temperature compensation Options Rotary table to measure rotationally symmetric parts Stylus rack for stylus and probe systems Dynalog control panel with 12” TFT display Accuracy Length measuring error [μm]: from 3.5 + L/230 COMPACT Options
- Number of Sensors / Cameras: 1
- x-axis Measuring Length: 2,500 inch
- y-axis Measuring Length: 6,000 inch
- z-axis Measuring Length: 1,800 inch
-
Supplier: Carl Zeiss Industrial Metrology, LLC
Description: CALYPSO measuring software Fast startup No special installation or power requirements Sensor systems VAST XXT scanning sensor from the technology leader Probe for single-point measuring and scanning Stylus receptacle for CNC-guided stylus change Adapter plate with 25 mm diameter for
- x-axis Measuring Length: 500 inch
- y-axis Measuring Length: 500 inch
- z-axis Measuring Length: 500 inch
- Features: 3-D Scanning / Profiling, Coordinate Measuring Machine (CMM), Crash Protection, Offline Programming, Other, Reverse Engineering, SPC Software, Shop Floor Suitable, Temperature Compensation
-
Supplier: Carl Zeiss Industrial Metrology, LLC
Description: from the technology leader Probe for single-point measuring and scanning Stylus receptacle for CNC-guided stylus change Adapter plate with 25 mm diameter for optimal reproducibility
- Number of Sensors / Cameras: 1
- x-axis Measuring Length: 98 inch
- y-axis Measuring Length: 236 inch
- z-axis Measuring Length: 79 inch
-
Supplier: Carl Zeiss Industrial Metrology, LLC
Description: positioning accuracy below 100 nanometers. For example, the stylus deflection remains more constant, which results in higher accuracy. Another benefit is evident when measuring curved surfaces: the more reliably and accurately a stylus follows the specified path, the more precisely
- Number of Sensors / Cameras: 1
- x-axis Measuring Length: 900 inch
- y-axis Measuring Length: 1,500 inch
- z-axis Measuring Length: 700 inch
-
Supplier: PTB Sales, Inc.
Description: Ask for pricing. The Dektak IIA is used for making accurate measurements on small vertical features ranging in height from 100 to 655,000 angstroms. Dektak IIA acquires data by moving the sample beneath the diamond tipped stylus. Vertical movements of the stylus are sensed by an LVDT,
- Applications: CVD / PVD Films
- Form Factor: Monitor / Instrument
-
Supplier: PCE Instruments / PCE Americas Inc.
Description: the main unit of the roughness gauge. The diamond stylus is installed in the motorized sensor. This presses with a maximum force of 4 mN on the surface from which the roughness is to be measured. The roughness tester measures according to the valid ISO, ANSI and JIS standards for roughness
- Operating Temperature: -4 to 104 F
- Technology: Contact / Stylus Based
- Display & Special Features: Digital Readout
- Mounting / Loading Options: Handheld / Portable
-
Supplier: Ametek Solartron Metrology
Description: Spring and Pneumatic versions 0.5, 1, and 2 mm ranges Width as thin as 4 mm (0.5 mm range) Accuracy better than 1 µm Repeatability to 0.05 µm Pneumatic or spring actuation (pneumatic 1 and 2 mm only) Removable leaves for ease of repair IP65 Protection Parallel Flexures with high resolution and
- Operating Temperature: 41 to 176 F
- Technology: Contact / Stylus Based
- Mounting / Loading Options: Machine Mounted
- Applications: Mechanical Parts (Bearings, Shafting)
-
Supplier: Mahr Inc.
Description: Product features Bright, illuminated color display Automatic selection of filter and traversing length conforming to standards Integrated thermal graphics printer of high print quality Print the r-profile via the thermal graphics printer Printed log either by pressing a button or automatically Data
- Vertical (Z) Range: 0.003543309 to 0.013779535 inch
- Vertical (Z) Resolution: 0.0000003149608 inch
- Traverse Length: 0.0393701 to 0.6299216 inch
- Scan Rate: 0.0196850393700788 in/sec
-
Supplier: Mahr Inc.
Description: MarSurf XR 1. The ideal instrument for a low-cost introduction to user-friendly surface metrology. The PC-based instrument delivers all common surface parameters and profiles in accordance with international standards, both in the measuring room and in production. MarSurf XR 1 from Mahr stands for
- Vertical (Z) Range: 0.009842525 to 0.029527575 inch
- Traverse Length: 0.022047256 to 2.2047256 inch
- Applications: Aerospace / Defense, Automotive, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
- Mounting / Loading Options: Benchtop
-
Supplier: Cole-Parmer
Description: • Bright 5.7" (14.5 cm) touch-screen display is glove and stylus friendly • Multiple communication choices for remote operation including USB, Bluetooth® wireless connectivity, RS-232, and RS-485 • Ingenious VersaLid cover can be set up as a left- or right-handed hinge, or even removed—all
- Frequency Range: 50 to 60 Hz
- Volume: 7 liters
- Operating Temperature: -4 to 302 F
- Configuration: Controlled Bath
Find Suppliers by Category Top
Featured Products Top
-
Lever Probes are generally used for precision gauging of components, such as shafts, for profiling but the Orbit®3 compatible Lever Probe is not restricted to such small applications. The narrow body (compared to devices based (read more)
Browse Dimensional Gages and Instruments Datasheets for Ametek Solartron Metrology -
ML3G is a non-contact tool measurement system designed to control any type of tool directly on machine. The main feature of a “non-contact” tool setter is that the measurement is performed by interrupting a laser beam instead of mechanical contact with a stylus. This (read more)
Browse Optical Micrometers and Laser Micrometers Datasheets for Marposs Corp
More Information Top
Indicates content that may require registration and/or purchase.
-
Optical Shop Testing 3rd Edition Complete Document
Stylus Profilers 670 .
-
Principles and Applications of Tribology 2nd Edition Complete Document
Roughness Measurements by Stylus Profiler , AFM and Non-Contact Optical Profiler,” Wear 190, 76–88.
-
Feature characterization of microfabricated microfluidic chips by PDMS replication and CCD imaging
Depth and width measurements obtained using the method agreed well with those gained using a stylus profiler and universal measuring microscope, with a deviation of below 0.9 lm, while profile distortions of deeper structures using stylus profilers were avoided.
-
Methods divergence between measurements of micrometer and sub-micrometer surface features
Measurements of micrometer and sub-micrometersurfacefeatures have been made using a stylus profiler ,an STM, an AFM and a phase-measuring interferometricmicroscope.
-
Surface Profiling - Dektak Surface Profilers in Three-Dimensional Surface Profiling Analysis
Benefits of Dektak Stylus Profilers .
-
Form Error Characterisation by an Optical Profiler
The form measurements obtained by the optical profiler are compared with the stylus profiler and the results are presented.
-
Polymer Sub-Wavelength Optics for
Lab-on-a-Chip
Table 3.3: Table showing the results of the thickness measurements, after the UV exposure and development, on three different wafers performed using a Dektak8 stylus profiler .
-
Calibration of high-aspect ratio quality control optical scanning system
Traceable calibration of TS by stylus profiler (SP) and scanning electron microscope (SEM), performed in laboratory- controlled configuration.
-
Reference metrology in a research fab: the NIST clean calibrations thrust
Initially, we have focused on calibration, monitoring, and uncertainty analysis for a three-tool set consisting of a stylus profiler , an SEM, and an AFM.
-
Dimensional measurement of 3D microstruture based on white light interferometer
The 4 common contact types of equipment are: Contact Stylus Profiler , Coordinate Measurement Machine (CMM), and Scanning Probe Microscopes (SPM). .