Wavelength Dispersive X-Ray Fluorescence Spectrometers
from Rigaku Corporation
Rigaku's Primini Biofuel is suitable for phosphorus analysis in biodiesel for EN14214 and ASTM D6751. It is optimized for sub-ppm detection limits of P, S and Cl and features easy operation without chemical treatment of the samples. Easy sample preparation and operation reduces the need for a highly... [See More]
- Module Type: Wavelength Dispersive
- Detector Type: Sealed Type Proportional Counter
- ICP Measurement Mode: Sequential
- Optical System: Crystal
from Rigaku Corporation
As the world's only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of fluorine (F) through uranium (U) of almost any material, the Rigaku Supermini uniquely delivers low cost-of-ownership (COA) with high resolution and lower... [See More]
- Module Type: Wavelength Dispersive
- Detector Type: Scintillation; Flow Proportional Counter
- ICP Measurement Mode: Sequential
- Optical System: Crystal
from Rigaku Corporation
Rigaku's WaferX 300 represents the culmination of 25 years of experience in the X-ray fluorescence analysis of thin films on silicon wafers. Specifically developed as an in-process metrology tool, the system incorporates "bridge tool" technology — servicing 6", 8", as well as the latest 12"... [See More]
- Module Type: Wavelength Dispersive
- Detector Type: Scintillation; Proportional Counter
- ICP Measurement Mode: Simultaneous
- Excitation Source: X-Ray Tubes
from Rigaku Corporation
As a premium low cost benchtop Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer, the Rigaku NEX QC delivers wide elemental coverage with an easy-to-learn software interface in a robust package designed for industrial at-line quality control elemental analysis applications. Specifically... [See More]
- Module Type: Wavelength Dispersive
- Excitation Source: X-Ray Tubes
- Detector Type: Semiconductor
- Sample Type: Solids; Liquids
from Rigaku Corporation
The WDA-3650 X-ray fluorescence spectrometer for thin film evaluation continues Rigaku's 30-year history of XRF wafer analyzers that has mirrored the history of thin film device development. This latest XRF metrology tool contributes significantly to the process control of metal film thickness, film... [See More]
- Module Type: Wavelength Dispersive
- Detector Type: Scintillation; Proportional Counter
- ICP Measurement Mode: Simultaneous
- Excitation Source: X-Ray Tubes
from Rigaku Corporation
Winner of the 2007 R &D 100 award, a mark of excellence known to industry, government, and academia as proof that the winner is one of the most innovative products of the year, the Rigaku NANOHUNTER benchtop total reflection X-ray fluorescence (TXRF) spectrometer was specifically designed to... [See More]
- Module Type: Wavelength Dispersive
- Optical System: Monochromator
- Detector Type: Silicon Drift Detector (SSD)
- Excitation Source: X-Ray Tubes
from Rigaku Corporation
Rigaku ZSX Primus II delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Primus II features an innovative optics-above configuration. Never again worry about a... [See More]
- Module Type: Wavelength Dispersive
- Detector Type: Scintillation; Flow Proportional Counter
- ICP Measurement Mode: Sequential
- Optical System: Crystal
from Rigaku Corporation
The newest version of our popular multi-channel simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system is the Simultix 14. Based on over 30 years of accumulated experience, the Simultix 14 stands out as the most advanced, fully automated system available — designed... [See More]
- Module Type: Wavelength Dispersive
- Optical System: Crystal
- ICP Measurement Mode: Simultaneous
- Excitation Source: X-Ray Tubes
from Rigaku Corporation
Rigaku's unique ZSX 400 sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer was specifically designed to handle very large and/or heavy samples. Accepting samples up to 400 mm diameter, 50 mm thick and 30 kg weight, this system is ideal for analyzing sputtering targets, magnetic... [See More]
- Module Type: Wavelength Dispersive
- Optical System: Crystal
- ICP Measurement Mode: Sequential
- Excitation Source: X-Ray Tubes
from Rigaku Corporation
Rigaku ZSX Primus delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. The latest instrument in Rigaku's ZSX series, the ZSX Primus continues the tradition of... [See More]
- Module Type: Wavelength Dispersive
- Detector Type: Scintillation; Flow Proportional Counter
- ICP Measurement Mode: Sequential
- Optical System: Crystal