Simultaneous X-Ray Fluorescence Spectrometers
from Pratt & Whitney Measurement Systems, Inc.
The MasterXRF ® instruments are X-ray fluorescence spectrometers for the inline analysis of plating solutions in the electroplating industry. It is the ideal instrument for industrial process control, improving product quality, and saving money. The instrument allows for the continuous, fully... [See More]
- ICP Measurement Mode: Simultaneous
- Excitation Source: X-Ray Tubes
- Detector Type: Silicon-drift-detector (SDD)
- Resolution: 9.54
from Rigaku Corporation
Rigaku's WaferX 300 represents the culmination of 25 years of experience in the X-ray fluorescence analysis of thin films on silicon wafers. Specifically developed as an in-process metrology tool, the system incorporates "bridge tool" technology — servicing 6", 8", as well as the latest 12"... [See More]
- ICP Measurement Mode: Simultaneous
- Detector Type: Scintillation; Proportional Counter
- Module Type: Wavelength Dispersive
- Excitation Source: X-Ray Tubes
from Fischer Technology, Inc.
The main application of the instruments from the XAN ® range is coating thickness measurement and analysis of gold and other precious-metal alloys. Products in this range stand out through their ease of use and advantageous price-performance ratio. In addition, detectors, apertures and filters... [See More]
- ICP Measurement Mode: Simultaneous
- Excitation Source: X-Ray Tubes
- Module Type: Energy Dispersive
- Number of Compounds Measured:: 24
from Shimadzu Scientific Instruments, Inc.
Utilizing state-of-the-art technology, including enhanced local analysis technology, originally pioneered by Shimadzu in 1994, in conjunction with superb basic functions, the Lab Center XRF-1800 delivers exceptional reliability, stability, and sensitivity. With complete control, analysis and... [See More]
- ICP Measurement Mode: Simultaneous
- Excitation Source: X-Ray Tubes
- Detector Type: Scintillation
- Remote Interface: Computer Interface; Application Software Included.
from Rigaku Corporation
The WDA-3650 X-ray fluorescence spectrometer for thin film evaluation continues Rigaku's 30-year history of XRF wafer analyzers that has mirrored the history of thin film device development. This latest XRF metrology tool contributes significantly to the process control of metal film thickness, film... [See More]
- ICP Measurement Mode: Simultaneous
- Detector Type: Scintillation; Proportional Counter
- Module Type: Wavelength Dispersive
- Excitation Source: X-Ray Tubes
from Fischer Technology, Inc.
Measurement instruments from the XUL ® series are the solution of choice wherever the need is to determine coating thicknesses quickly and very precisely in electroplating or electronics manufacturing. The X-ray fluorescence instruments measure from bottom to top, enabling easy positioning of... [See More]
- ICP Measurement Mode: Simultaneous
- Excitation Source: X-Ray Tubes
- Module Type: Energy Dispersive
- Number of Compounds Measured:: 24
from Rigaku Corporation
The newest version of our popular multi-channel simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system is the Simultix 14. Based on over 30 years of accumulated experience, the Simultix 14 stands out as the most advanced, fully automated system available — designed... [See More]
- ICP Measurement Mode: Simultaneous
- Optical System: Crystal
- Module Type: Wavelength Dispersive
- Excitation Source: X-Ray Tubes
from Fischer Technology, Inc.
With motor-driven axes (optional) and measurement direction from top to bottom, the measurement instruments from the XDL ® range enable automated serial tests. A variety of versions – differing in their X-ray source, filter, Aperture and detector – make it possible to select the... [See More]
- ICP Measurement Mode: Simultaneous
- Excitation Source: X-Ray Tubes
- Module Type: Energy Dispersive
- Number of Compounds Measured:: 24