Thickness Testing X-Ray Fluorescence Spectrometers
from Rigaku Corporation
Rigaku's WaferX 300 represents the culmination of 25 years of experience in the X-ray fluorescence analysis of thin films on silicon wafers. Specifically developed as an in-process metrology tool, the system incorporates "bridge tool" technology — servicing 6", 8", as well as the latest 12"... [See More]
- Module Type: Wavelength Dispersive
- Detector Type: Scintillation; Proportional Counter
- ICP Measurement Mode: Simultaneous
- Excitation Source: X-Ray Tubes
from Hitachi High-Tech America
Microspot XRF coating thickness and materials analyzers for rapid quality control and validation testing, making it easy to get the right results in seconds. Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique,... [See More]
- Special Features: Thickness Testing
from Fischer Technology, Inc.
The FISCHERSCOPE X-RAY XDV- μ SEMI is an automated measurement system optimized for the quality control of micro-structures in complex 2.5D/3D packaging applications in the semiconductor industry. Fully automated analysis prevents damage to valuable wafer material. And consistent test conditions... [See More]
- Special Features: Microscope; Cooled Detector; Thickness Testing
from Rigaku Corporation
The WDA-3650 X-ray fluorescence spectrometer for thin film evaluation continues Rigaku's 30-year history of XRF wafer analyzers that has mirrored the history of thin film device development. This latest XRF metrology tool contributes significantly to the process control of metal film thickness, film... [See More]
- Module Type: Wavelength Dispersive
- Detector Type: Scintillation; Proportional Counter
- ICP Measurement Mode: Simultaneous
- Excitation Source: X-Ray Tubes
from Hitachi High-Tech America
The FT230 benchtop XRF analyzer has been designed to significantly reduce the time taken to make a measurement. Recognizing that the most time is taken with sample setup and measurement recipe selection, engineers at Hitachi have created a ground-breaking analyzer that effectively ‘sets up... [See More]
- Module Type: Energy Dispersive
- Excitation Source: X-Ray Tubes
- Detector Type: Silicon Drift Detector
- Sample Type: Solids
from Fischer Technology, Inc.
The vacuum measurement chamber of devices in the XUV ® range enables the verification of light materials from sodium onwards by means of X-ray fluorescence analysis (RFA). Because of the radiation-absorbing properties of room air, it is normally not possible to use this method. For this reason... [See More]
- Module Type: Energy Dispersive
- Number of Compounds Measured:: 24
- Excitation Source: X-Ray Tubes
- Special Features: Microscope; Cooled Detector; Thickness Testing
from Fischer Technology, Inc.
Handheld, desktop, inline: the XAN ®500 X-ray fluorescence instrument is Fischer ’s most versatile yet. It can be used as a handheld device, as a fully enclosed desktop unit or integrated directly into production lines. Equipped with a tablet computer, the XAN500 also utilizes the... [See More]
- Module Type: Energy Dispersive
- Detector Window: Window
- Excitation Source: X-Ray Tubes
- Special Features: Microscope; Cooled Detector; Thickness Testing
from Fischer Technology, Inc.
The main application of the instruments from the XAN ® range is coating thickness measurement and analysis of gold and other precious-metal alloys. Products in this range stand out through their ease of use and advantageous price-performance ratio. In addition, detectors, apertures and filters... [See More]
- Module Type: Energy Dispersive
- Excitation Source: X-Ray Tubes
- ICP Measurement Mode: Simultaneous
- Number of Compounds Measured:: 24
from Fischer Technology, Inc.
Measurement instruments from the XUL ® series are the solution of choice wherever the need is to determine coating thicknesses quickly and very precisely in electroplating or electronics manufacturing. The X-ray fluorescence instruments measure from bottom to top, enabling easy positioning of... [See More]
- Module Type: Energy Dispersive
- Excitation Source: X-Ray Tubes
- ICP Measurement Mode: Simultaneous
- Number of Compounds Measured:: 24