Microscope X-Ray Fluorescence Spectrometers

8 Results
RoHS X-ray Fluorescence Machine
from Haida International Equipment Co., Ltd.

Unique Rohs Machine is currently the world's smallest volume, identify the fastest, most functional, most accurate, RoHS and harmful elements of the reliability of identification (PMI) and validation of the multi-purpose X-ray fluorescence Analyzer. The Rohs X-ray Fluorescence analyzer not only... [See More]

  • Excitation Source: X-Ray Tubes
  • Detection Limit: 1
  • Response Time:: 120
  • Sample Type: Solids; Liquids
EDXRF Instrument for Non-destructive Microstructure Wafer Metrology -- FISCHERSCOPE® X-RAY XDV®-µ SEMI
from Fischer Technology, Inc.

The FISCHERSCOPE X-RAY XDV- μ SEMI is an automated measurement system optimized for the quality control of micro-structures in complex 2.5D/3D packaging applications in the semiconductor industry. Fully automated analysis prevents damage to valuable wafer material. And consistent test conditions... [See More]

  • Special Features: Microscope; Cooled Detector; Thickness Testing
X-ray RoHS Analyzer
from Haida International Equipment Co., Ltd.

The X-ray fluorescence spectrometer is a high-end product in the X-ray Rohs Analyzer series. Rohs Analyzer can meet the EU RoHS standards, electronic products pollution management measures, halogen-free testing and other related instructions testing requirements and precious metals, coating testing. [See More]

  • Excitation Source: X-Ray Tubes
  • Detection Limit: 1
  • Response Time:: 120
  • Sample Type: Solids; Liquids
High Performance X-Ray Fluorescence Measuring Instrument with Vacuum Chamber for non-destructive Coating Thickness Measurement and Material Analysis -- FISCHERSCOPE® X-RAY XUV® 773
from Fischer Technology, Inc.

The vacuum measurement chamber of devices in the XUV ® range enables the verification of light materials from sodium onwards by means of X-ray fluorescence analysis (RFA). Because of the radiation-absorbing properties of room air, it is normally not possible to use this method. For this reason... [See More]

  • Module Type: Energy Dispersive
  • Number of Compounds Measured:: 24
  • Excitation Source: X-Ray Tubes
  • Special Features: Microscope; Cooled Detector; Thickness Testing
X-ray Fluorescence Instrument -- FISCHERSCOPE® X-RAY XAN® 500
from Fischer Technology, Inc.

Handheld, desktop, inline: the XAN ®500 X-ray fluorescence instrument is Fischer ’s most versatile yet. It can be used as a handheld device, as a fully enclosed desktop unit or integrated directly into production lines. Equipped with a tablet computer, the XAN500 also utilizes the... [See More]

  • Module Type: Energy Dispersive
  • Detector Window: Window
  • Excitation Source: X-Ray Tubes
  • Special Features: Microscope; Cooled Detector; Thickness Testing
X-Ray Fluorescence Measuring Instrument for Fast and Non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys -- FISCHERSCOPE® X-RAY XAN® 220 / 222
from Fischer Technology, Inc.

The main application of the instruments from the XAN ® range is coating thickness measurement and analysis of gold and other precious-metal alloys. Products in this range stand out through their ease of use and advantageous price-performance ratio. In addition, detectors, apertures and filters... [See More]

  • Module Type: Energy Dispersive
  • Excitation Source: X-Ray Tubes
  • ICP Measurement Mode: Simultaneous
  • Number of Compounds Measured:: 24
X-Ray Fluorescence Measuring Instrument for Fast and Non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys -- FISCHERSCOPE® X-RAY XUL® Series
from Fischer Technology, Inc.

Measurement instruments from the XUL ® series are the solution of choice wherever the need is to determine coating thicknesses quickly and very precisely in electroplating or electronics manufacturing. The X-ray fluorescence instruments measure from bottom to top, enabling easy positioning of... [See More]

  • Module Type: Energy Dispersive
  • Excitation Source: X-Ray Tubes
  • ICP Measurement Mode: Simultaneous
  • Number of Compounds Measured:: 24
X-Ray Fluorescence Measuring Instrument for Manual or Automated Coating Thickness Measurements and Analysis -- FISCHERSCOPE® X-RAY XDL® Series
from Fischer Technology, Inc.

With motor-driven axes (optional) and measurement direction from top to bottom, the measurement instruments from the XDL ® range enable automated serial tests. A variety of versions – differing in their X-ray source, filter, Aperture and detector – make it possible to select the... [See More]

  • Module Type: Energy Dispersive
  • Excitation Source: X-Ray Tubes
  • ICP Measurement Mode: Simultaneous
  • Number of Compounds Measured:: 24