Computer Interface X-Ray Fluorescence Spectrometers
from Evident Scientific
The DELTA Classic Plus with a 40kV tube and Si-PIN detector is ideal for simple applications. The DELTA Classic Plus provides quick ID, screening, sorting, and elemental and metals analysis. The DELTA Classic Plus is a proven, ruggedized analyzer, that is cost-effective, easy to use, and reliable. [See More]
- Detector Type: Si-PIN Diode
- User Interface: Digital Front Panel
- Excitation Source: X-Ray Tubes
- Remote Interface: Computer Interface; Serial; Application Software Included.
from Evident Scientific
The DELTA Element is the most affordable unit in the Olympus line-up of handheld X-ray fluorescence (XRF) analyzers designed for fast, accurate results. Fast, simple and reliable, the DELTA Element incorporates the features and rugged design of the DELTA family. With fast elemental ID for screening,... [See More]
- Detector Type: Si-PIN Diode
- User Interface: Digital Front Panel
- Excitation Source: X-Ray Tubes
- Remote Interface: Computer Interface; Serial; Application Software Included.
from Evident Scientific
The DELTA Premium, with advanced 40kV tube and large area SDD detector, works best for ultra-quick, analytically demanding applications, such as detection of low levels of trace elements and light element analysis in low alloy steel, soil, mining, and metallurgical samples. The DELTA Premium... [See More]
- Detector Type: Silicon Drift
- User Interface: Digital Front Panel
- Excitation Source: X-Ray Tubes
- Remote Interface: Computer Interface; Serial; Application Software Included.
from Evident Scientific
The DELTA Professional provides excellent performance in speed, LODs, and elemental range. It is housed in an industrial designed body ruggedized to demanding environments. It provides the best mix of durability and analytical performance with lower cost of ownership. The DELTA Professional... [See More]
- Detector Type: Silicon Drift
- User Interface: Digital Front Panel
- Excitation Source: X-Ray Tubes
- Remote Interface: Computer Interface; Serial; Application Software Included.
from Evident Scientific
The Vanta Series: Rugged. Revolutionary. Productive. The Vanta analyzer is our most advanced handheld X-ray fluorescence (XRF) device and provides rapid, accurate element analysis and alloy identification to customers who demand laboratory-quality results in the field. Vanta handheld XRF analyzers... [See More]
- Detector Type: Silicon Drift
- User Interface: Digital Front Panel
- Excitation Source: X-Ray Tubes
- Remote Interface: Computer Interface; Serial; Application Software Included.
from Shimadzu Scientific Instruments, Inc.
Utilizing state-of-the-art technology, including enhanced local analysis technology, originally pioneered by Shimadzu in 1994, in conjunction with superb basic functions, the Lab Center XRF-1800 delivers exceptional reliability, stability, and sensitivity. With complete control, analysis and... [See More]
- ICP Measurement Mode: Simultaneous
- Excitation Source: X-Ray Tubes
- Detector Type: Scintillation
- Remote Interface: Computer Interface; Application Software Included.
from Bruker Corporation
Elemental Analysis, Process and Quality Control. X-ray fluorescence analysis (XRF) one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed. XRF combines highest accuracy and precision with simple and... [See More]
- Excitation Source: X-Ray Tubes (optional feature)
- Remote Interface: Computer Interface; Application Software Included.
- Special Features: Chemical Mapping or Imaging
- General Features: Portable (optional feature)
from Rigaku Corporation
Rigaku's Primini Biofuel is suitable for phosphorus analysis in biodiesel for EN14214 and ASTM D6751. It is optimized for sub-ppm detection limits of P, S and Cl and features easy operation without chemical treatment of the samples. Easy sample preparation and operation reduces the need for a highly... [See More]
- Module Type: Wavelength Dispersive
- Detector Type: Sealed Type Proportional Counter
- ICP Measurement Mode: Sequential
- Optical System: Crystal
from Hitachi High-Tech America
Microspot XRF coating thickness and materials analyzers for rapid quality control and validation testing, making it easy to get the right results in seconds. Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique,... [See More]
- Detector Type: Xe-Filled Proportional Counter
- Analyzer Type: Single Channel
- Excitation Source: X-Ray Tubes
- Sample Type: Solids
from Fischer Technology, Inc.
The vacuum measurement chamber of devices in the XUV ® range enables the verification of light materials from sodium onwards by means of X-ray fluorescence analysis (RFA). Because of the radiation-absorbing properties of room air, it is normally not possible to use this method. For this reason... [See More]
- Module Type: Energy Dispersive
- Number of Compounds Measured:: 24
- Excitation Source: X-Ray Tubes
- Special Features: Microscope; Cooled Detector; Thickness Testing
from Xenemetrix Ltd.
EX-6600 SDD. Secondary Target EDXRF. Xenemetrix ’s EX-6600 SDD Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer offers the ultimate in sensitivity and selectivity. The Silicon Drift Detector (SDD) simultaneously delivers lower electronic noise and higher count rates which translates... [See More]
- Module Type: Energy Dispersive
- Analyzer Type: Multichannel
- Excitation Source: X-Ray Tubes
- Sample Type: Solids; Liquids
from Shimadzu Scientific Instruments, Inc.
EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated... [See More]
- Module Type: Energy Dispersive
- Remote Interface: Computer Interface; Application Software Included.
- Excitation Source: X-Ray Tubes
- Display: None
from Rigaku Corporation
Rigaku NEX CG delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — with minimal standards. Unlike conventional EDXRF analyzers, the NEX CG was engineered with a unique close-coupled Cartesian Geometry (CG) optical... [See More]
- Module Type: Energy Dispersive
- Excitation Source: X-Ray Tubes
- Detector Type: High Performance SDD
- Sample Type: Solids; Liquids
from Hitachi High-Tech America
The FT230 benchtop XRF analyzer has been designed to significantly reduce the time taken to make a measurement. Recognizing that the most time is taken with sample setup and measurement recipe selection, engineers at Hitachi have created a ground-breaking analyzer that effectively ‘sets up... [See More]
- Module Type: Energy Dispersive
- Excitation Source: X-Ray Tubes
- Detector Type: Silicon Drift Detector
- Sample Type: Solids
from Fischer Technology, Inc.
Handheld, desktop, inline: the XAN ®500 X-ray fluorescence instrument is Fischer ’s most versatile yet. It can be used as a handheld device, as a fully enclosed desktop unit or integrated directly into production lines. Equipped with a tablet computer, the XAN500 also utilizes the... [See More]
- Module Type: Energy Dispersive
- Detector Window: Window
- Excitation Source: X-Ray Tubes
- Special Features: Microscope; Cooled Detector; Thickness Testing
from Xenemetrix Ltd.
RoHS Vision. The Fast and Easy Method for Ensuring Compliance. with Regulations for Hazardous Substances. The Restriction of Hazardous Substances Directive (RoHS) restricts toxic metals in electrical and electronic equipment. Xenemetrix ’s new RoHS Vision uses a high resolution detector, a... [See More]
- Module Type: Energy Dispersive
- Analyzer Type: Multichannel
- Excitation Source: X-Ray Tubes
- Sample Type: Solids; Liquids
from Rigaku Corporation
As the world's only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of fluorine (F) through uranium (U) of almost any material, the Rigaku Supermini uniquely delivers low cost-of-ownership (COA) with high resolution and lower... [See More]
- Module Type: Wavelength Dispersive
- Detector Type: Scintillation; Flow Proportional Counter
- ICP Measurement Mode: Sequential
- Optical System: Crystal
from Hitachi High-Tech America
XRF analysis with the X-Supreme8000 for quality assurance and process control requirements. Analysis can be performed on a wide range of sample types including solids, liquids, powders, pastes, films, etc., from ppm to high %, covering elements Na11 to U92 in the periodic table. Minimal or no sample... [See More]
- Excitation Source: X-Ray Tubes
- Sample Type: Solids; Liquids
- Analyzer Type: Single Channel
- User Interface: Digital Front Panel
from Fischer Technology, Inc.
The main application of the instruments from the XAN ® range is coating thickness measurement and analysis of gold and other precious-metal alloys. Products in this range stand out through their ease of use and advantageous price-performance ratio. In addition, detectors, apertures and filters... [See More]
- Module Type: Energy Dispersive
- Excitation Source: X-Ray Tubes
- ICP Measurement Mode: Simultaneous
- Number of Compounds Measured:: 24
from Xenemetrix Ltd.
X-Calibur SDD. Bench Top EDXRF Spectrometer. versatile, high energy resolution. Our X-Calibur SDD EDXRF spectrometer features similar configuration like X-Calibur but with Silicon Drift Detector. Thanks to SDD high count rates the instrument improves its response time thus minimizing down time. The... [See More]
- Module Type: Energy Dispersive
- Analyzer Type: Multichannel
- Excitation Source: X-Ray Tubes
- Sample Type: Solids; Liquids
from Rigaku Corporation
Rigaku's WaferX 300 represents the culmination of 25 years of experience in the X-ray fluorescence analysis of thin films on silicon wafers. Specifically developed as an in-process metrology tool, the system incorporates "bridge tool" technology — servicing 6", 8", as well as the latest 12"... [See More]
- Module Type: Wavelength Dispersive
- Detector Type: Scintillation; Proportional Counter
- ICP Measurement Mode: Simultaneous
- Excitation Source: X-Ray Tubes
from Fischer Technology, Inc.
Measurement instruments from the XUL ® series are the solution of choice wherever the need is to determine coating thicknesses quickly and very precisely in electroplating or electronics manufacturing. The X-ray fluorescence instruments measure from bottom to top, enabling easy positioning of... [See More]
- Module Type: Energy Dispersive
- Excitation Source: X-Ray Tubes
- ICP Measurement Mode: Simultaneous
- Number of Compounds Measured:: 24
from Xenemetrix Ltd.
X-Cite. Bench Top EDXRF Spectrometer. economical, accurate, easy to use. Xenemetrix ’s powerful X-Cite benchtop Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer enables system operators to identify the elemental composition of samples. The analyzer performs non-destructive qualitative... [See More]
- Module Type: Energy Dispersive
- Sample Type: Solids; Liquids
- Excitation Source: X-Ray Tubes
- Special Features: Cooled Detector; Vacuum
from Rigaku Corporation
The WDA-3650 X-ray fluorescence spectrometer for thin film evaluation continues Rigaku's 30-year history of XRF wafer analyzers that has mirrored the history of thin film device development. This latest XRF metrology tool contributes significantly to the process control of metal film thickness, film... [See More]
- Module Type: Wavelength Dispersive
- Detector Type: Scintillation; Proportional Counter
- ICP Measurement Mode: Simultaneous
- Excitation Source: X-Ray Tubes
from Fischer Technology, Inc.
With motor-driven axes (optional) and measurement direction from top to bottom, the measurement instruments from the XDL ® range enable automated serial tests. A variety of versions – differing in their X-ray source, filter, Aperture and detector – make it possible to select the... [See More]
- Module Type: Energy Dispersive
- Excitation Source: X-Ray Tubes
- ICP Measurement Mode: Simultaneous
- Number of Compounds Measured:: 24
from Xenemetrix Ltd.
X-PMA. Precious Metals EDXRF Spectrometer. fast, accurate, easy to use. XRF is a non-destructive analytical technique that can rapidly and easily identify and determine the presence of various elements such as gold, platinum, silver and other precious metals present in solid, powdered and liquid... [See More]
- Module Type: Energy Dispersive
- Analyzer Type: Multichannel
- Excitation Source: X-Ray Tubes
- Sample Type: Solids; Liquids