Programmable X-Ray Fluorescence Spectrometers
from Pratt & Whitney Measurement Systems, Inc.
The MasterXRF ® instruments are X-ray fluorescence spectrometers for the inline analysis of plating solutions in the electroplating industry. It is the ideal instrument for industrial process control, improving product quality, and saving money. The instrument allows for the continuous, fully... [See More]
- ICP Measurement Mode: Simultaneous
- Excitation Source: X-Ray Tubes
- Detector Type: Silicon-drift-detector (SDD)
- Resolution: 9.54
from Hitachi High-Tech America
Microspot XRF coating thickness and materials analyzers for rapid quality control and validation testing, making it easy to get the right results in seconds. Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique,... [See More]
- Detector Type: Xe-Filled Proportional Counter
- Analyzer Type: Single Channel
- Excitation Source: X-Ray Tubes
- Sample Type: Solids
from Shimadzu Scientific Instruments, Inc.
Utilizing state-of-the-art technology, including enhanced local analysis technology, originally pioneered by Shimadzu in 1994, in conjunction with superb basic functions, the Lab Center XRF-1800 delivers exceptional reliability, stability, and sensitivity. With complete control, analysis and... [See More]
- ICP Measurement Mode: Simultaneous
- Excitation Source: X-Ray Tubes
- Detector Type: Scintillation
- Remote Interface: Computer Interface; Application Software Included.
from Hitachi High-Tech America
The FT230 benchtop XRF analyzer has been designed to significantly reduce the time taken to make a measurement. Recognizing that the most time is taken with sample setup and measurement recipe selection, engineers at Hitachi have created a ground-breaking analyzer that effectively ‘sets up... [See More]
- Module Type: Energy Dispersive
- Excitation Source: X-Ray Tubes
- Detector Type: Silicon Drift Detector
- Sample Type: Solids
from Shimadzu Scientific Instruments, Inc.
EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated... [See More]
- Module Type: Energy Dispersive
- Remote Interface: Computer Interface; Application Software Included.
- Excitation Source: X-Ray Tubes
- Display: None