Advanced Metrology Systems

Description: The APM650™ packaging metrology system is a new inspection tool for automated measurement of panel-based PCBs and other advanced packaging applications. It provides 2D & 3D measurements of a variety of surface features with sub-nanometer vertical precision and sub

• Applications: Semiconductor Wafers
• Area Mapping: Yes
• Depth Profiling: Yes
• Form Factor: Monitor / Instrument

Description: are two models of Compass™ systems available, depending on your metrology needs... Compass – ZYGO's advanced solution for precision metrology of micro lens surface form and deviation, topography, and relational/dimension al parameters. This is the ideal choice for

• Measurement Capability: 3D / Areal Topography
• Mounting / Loading: Benchtop
• Surface Metrology: Form Measurement, Surface Profilometry

Description: Measure and analyze spindle and motor performance with the SpinCheck spindle metrology system and non-contact capacitive displacement sensors. The SpinCheck system includes a desktop PC, data acquisition and timing boards, comprehensive SpinCheck measurement and analysis

• Applications: Mechanical Test, Other
• Computer Platform: PC

Description: A field-proven solution for any dual-magnetron sputtering application with additional capabilities facilitating advanced process innovation. Achieve higher deposition rates with a more stable process through advanced ARC management Tune your process with variable frequency

• Applications: Semiconductor Wafers, Other
• Mounting / Loading: Floor Mounted / Stand-alone

Description: Mahr Inc., a member of the Mahr Group, has over 150 years of experience providing dimensional measurement solutions to fit customer application needs. We manufacture and market a wide variety of dimensional metrology equipment, from simple and easy-to-use handheld gages to technically

• Capabilities: Commissioning, Consulting / Training, Engineering Verification Testing, Evaluation and Analysis
• Forms Tested: Products (Machines / Devices)
• Industry Applications: Aerospace / Avionics, Automotive, Industrial, Specialty / Other
• Services Offered: Dimensional Gaging

Description: of the apparatus (not on 17702W). An ordinary garden hose may be used for water supply and waste connections. Use without cooling is not recommended above 700°C. 4. An advanced proportional electronic control system controls the furnace temperature. The control may be self-calibrated

• Atmosphere: Air / Oxidizing
• Configuration: Top Loading
• Controller Type: Programmable
• Process Temperature: 125 to 1090 C

Description: hours. 1. The furnace core, into which the freeze-point cell is inserted, is of aluminum alloy, which provides a very low thermal gradient along the core length. The main furnace heater is of the parallel-tube design as used at NIST. A pre-warming tube is provided. 2. An advanced

• Atmosphere: Air / Oxidizing
• Configuration: Top Loading
• Controller Type: Single Set Point
• Height: 960 mm

Description: Lower cost of ownership than competitive solutions The Litmas® Remote Plasma Source (RPS) system delivers high concentrations of reactive gas species to enable advanced fluorinated gas abatement. Its small-footprint, high-performance, ease-of-use, and low

• Applications: Semiconductor Wafers, Etching - Plasma / Wet, Photolithography / Patterning
• Mounting / Loading: Floor Mounted / Stand-alone

Description: The ImagiX is North Star Imaging’s most compact system. The generous scanning envelope can handle products up to 5 in (12 cm) in size making it a great choice for laboratories, small electronics and R&D applications. SYSTEM CAPABILITIES Advanced 2D X

• Display & Special Features: SPC / Software Capability
• Industrial Applications: Aerospace / Defense, Automotive, Coatings (Thin Films, Plating, etc.), Electronics, Mechanical Parts (Bearings, Shafting), Medical, Precision Machining / Grinding, Wear / Tribology
• Measurement Capability: 2D / Line Profiles, 3D / Areal Topography
• Mounting / Loading: Floor / Free Standing

Description: Advanced composite materials have been used successfully in optomechanical systems since the 1970s. They are being used increasingly in numerous commercial and military applications including: optical benches, telescopes, binoculars, mirrors, metrology and photolithography

• Modality: On-site / In Plant
• Technology / Subject: Design / Engineering Methods (ESDU, DFx, etc.), Photonics / Optics
• Type: Course

Description: laser scanners independently. Non-contact gear inspection Advanced gear inspection can be done with the HN-C3030, a non-contact 3D metrology system equipped with a high-speed, high-precision laser scanner. Five-axis automatic control allows scanning of parts with complex shapes

• Forms Tested / Certified: Components / Parts, Products
• Industry: Aerospace / Avionics, Automotive, Health Care / Medical, Microelectronics / Electronics
• Services Offered: CMM Inspection, Dimensional Gaging / Metrology, Form / Geometry (Straightness, Roundness, etc.), Surface Profilometry

Description: total control moved to a local joystick. This powerful DLL-based software allows users to quickly and easily communicate with the probe system and test instrumentation. Full driver libraries are available for LabView, C++, and Visual Basic with specific instrument drivers to support the most

• Applications: Semiconductor Wafers
• Form Factor: Wafer Probing System
• Maximum Wafer / Part Size: 300 mm
• Measurement Capability: Electrical Test - Parametric / In-line

Description: advanced instrumentation available, including the Agilent B1500 Semiconductor Device Analyzer and Keithley 4200 Parametric Analyzer series. Communications may be made using RS-232, GPIB or TCP/IP enabling the system to be either a controller or a slave in an integrated solution. A

• Applications: Semiconductor Wafers
• Form Factor: Wafer Probing System
• Maximum Wafer / Part Size: 100 mm
• Measurement Capability: Electrical Test - Parametric / In-line

Description: control moved to a local joystick. This powerful DLL-based software allows users to quickly and easily communicate with the probe system and test instrumentation. Full driver libraries are available for LabView, C++, and Visual Basic with specific instrument drivers to support the most

• Applications: Semiconductor Wafers
• Form Factor: Wafer Probing System
• Maximum Wafer / Part Size: 200 mm
• Measurement Capability: Electrical Test - Parametric / In-line

Description: advanced instrumentation available, including the Agilent B1500 Semiconductor Device Analyzer and Keithley 4200 Parametric Analyzer series. Communications may be made using RS-232, GPIB or TCP/IP enabling the system to be either a controller or a slave in an integrated solution. A

• Applications: Semiconductor Wafers
• Form Factor: Wafer Probing System
• Maximum Wafer / Part Size: 150 mm
• Measurement Capability: Electrical Test - Parametric / In-line

Description: processes across a range of industries worldwide, including paper, aluminum, copper, steel, plastics, and nonwovens. REDUCES VIDEO SEARCH TIME With SmartAdvisor® Process Inspection, operators can see a reduction in video search time of over 50%. Advanced camera

• Display & Special Features: Computer Interface / Networkable
• Factory / Production Use: Yes
• Industrial Applications: Other
• Measurement Capability: Defects / ADC

Description: The most advanced surface inspection platform available to the market, SmartView® combines powerful software, linescan camera technology, high-intensity lighting and industry-leading engineering to deliver a trusted automatic solution. Flexible and customizable

• Display & Special Features: Computer Interface / Networkable
• Factory / Production Use: Yes
• Industrial Applications: Other
• Measurement Capability: Defects / ADC

Description: . SupaScan is ideal for setting simple parts quickly and easily. The system has the capability to monitor workpiece surface condition and capture basic form measurements. Simple macro code is used to program SupaScan cycles. Productivity™ Scanning Suite is perfect for advanced

• Industrial Applications: Precision Machining / Grinding
• Measurement Capability: 3D / Areal Topography
• Technology: Contact / Stylus Based

Description: An advanced edge cross-section monitoring system, Edge Monitoring enables both trimmed material edges in a processing line to be monitored for anomalies. Detecting edge defects such as cut-to-break ratios and burrs is critical for quality control purposes and to avoid any issues in

• Display & Special Features: Computer Interface / Networkable
• Factory / Production Use: Yes
• Industrial Applications: Other
• Measurement Capability: Defects / ADC

Description: SmartAdvisor’s synchronized system along with the flexibility and proven quality of SmartView’s industry-leading surface inspection solution. SmartView’s advanced classification can be configured to trigger an event capture across multiple SmartAdvisor data points on the production

• Display & Special Features: Computer Interface / Networkable
• Factory / Production Use: Yes
• Industrial Applications: Other
• Measurement Capability: Defects / ADC

Description: The Nikon Confocal NEXIV VMZ-K6555 was developed on the strength of Nikon's leading opto-mechatronics (optical, mechanical and electronic) technologies. It incorporates a variety of confocal optics for fast and accurate evaluation of fine three-dimensional surface metrology, image processing

• Applications / Capabilities: Electronics or Semiconductor Inspection
• Image Source: Optical Microscope
• System Type: Turnkey / Complete System

Description: The C2 platform is a high-precision, extra large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 7-axis manipulator. Supporting dual sources up to 450 kV offers the necessary power to penetrate

• Form Factor: Other
• Instrument / System Type: Computed Tomographic System
• Programmable / Digital Control Unit: Yes
• X-ray Operating Voltage: 225 to 450 kilovolts

Description: Mahr Inc., a member of the Mahr Group, has over 150 years of experience providing dimensional measurement solutions to fit customer application needs. We manufacture and market a wide variety of dimensional metrology equipment, from simple and easy-to-use handheld gages to technically

• Forms Tested / Certified: Components / Parts, Products
• Industry: Aerospace / Avionics, Automotive, Health Care / Medical
• Services Offered: Dimensional Gaging / Metrology, Form / Geometry (Straightness, Roundness, etc.), Surface Profilometry

Description: The M2 system is a high-precision large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 8 axis manipulator. Supporting dual sources up to 450 kV offers the necessary power to penetrate through

• Form Factor: Other
• Instrument / System Type: Computed Tomographic System
• Programmable / Digital Control Unit: Yes
• X-ray Operating Voltage: 225 to 450 kilovolts

Description: Bruker's Dektak® stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film

• Display & Special Features: Computer Interface / Networkable
• Industrial Applications: Electronics, Semiconductor Manufacturing, Other
• Measurement Capability: 2D / Line Profiles, 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
• Mounting / Loading: Benchtop, Floor / Free Standing

Description: The Phenom Pro desktop SEM is one of the most advanced imaging models in the Phenom series. With its long-life high-brightness CeB6 electron source, the Phenom Pro creates state-of-the-art images with a minimum of user maintenance intervention. The backscattered-electr on detector (BSED

• Applications: Semiconductor Wafers, CVD / PVD Films, Packaged ICs / Ceramic Substrates
• Area Mapping: Yes
• FIB / Ion Mill: Yes
• Form Factor: Monitor / Instrument

Description: testing: Microroughness of precision surfaces Air bearing surface geometry of magnetic heads Optical components and systems: Flats, Spheres, Parabolas, Prisms Surface Angles Reflective and antireflective coatings Specular surfaces of all kinds

• Capabilities: Certification, Component / Product Comparison, Consulting / Training, Testing / Simulation
• Forms Tested / Certified: Components / Parts, Samples or Materials, Other
• Industry: Aerospace / Avionics, Health Care / Medical, Semiconductor / IC Packages, Specialty / Other
• Services Offered: Dimensional Gaging / Metrology, Form / Geometry (Straightness, Roundness, etc.), Surface Profilometry

Description: The RTA is an automated, on-line, real-time, and in-tank system for monitoring and controlling the levels of chemical constituents of plating baths. The RTA technology is a unique modern approach to metrology combining the advanced, purpose-selected electroanalytical techniques

• Applications: Semiconductor Wafers, Electroplated Films
• Form Factor: Monitor / Instrument

Description: Advanced Screw Design: bell shaped construction, patented self-balancing screws Compact Design: integrated control panel Efficient: low cost of ownership, minimal maintenance, high uptime Reliable: operationally

• Applications: General Purpose / Industrial, Analytical / Scientific, Manufacturing Processing, Semiconductor Manufacturing
• Configuration: Individual Vacuum Pump
• Lubrication: Dry / Oil-less
• Motor Power: 2.41 HP

Description: -scanning stages operating concurrently and independently. The innovative magnetic levitation technology allows significant acceleration and precision gain enabling the TWINSCAN NXT:1950i to achieve unprecedented productivity and overlay performance. Advanced in-situ metrology per

Description: Advanced Screw Design: bell shaped construction, patented self-balancing screws Efficient: low operating costs, energy-efficient, minimal maintenance, high uptime Reliable: operationally reliable Flexible:

• Applications: General Purpose / Industrial, Analytical / Scientific, Manufacturing Processing, Semiconductor Manufacturing
• Configuration: Individual Vacuum Pump
• Lubrication: Dry / Oil-less
• Motor Power: 3.89 HP

Description: technologies, Material, process and device modeling, TFT and organic electronics, MEMS, imagers and sensors, Advanced manufacturing technology, metrology and yield, Reliability physics, characterization and test, Advanced packaging and 2.5D/3D Integration, Photonics and Beyond

• Industry: Electronics and Semiconductor, Networking and Computing
• Type: Conference

Description: components – like flats, lenses, and prisms – and even precision machined metal and ceramic surfaces. A true laser Fizeau design, the Verifire™ system expands upon ZYGO's unmatched experience in surface form metrology. The on-axis configuration combined with ZYGO's patented

• Aperture Size: 102 to 152 mm
• Display & Special Features: Continuous Zoom
• Laser Wavelength: 633 nm
• Light Source / Laser Type: HeNe

Description: A concise, comprehensive reference text covering electro-optical systems, optical system design, optical physics, holography, Fourier optics, and optical metrology. It emphasizes physical insight aimed at engineering applications. This book is suitable as an advanced

Description: advanced software solutions and superior performance, the XL-80 can significantly improve your business performance. Renishaw has been designing, manufacturing and supplying laser systems for over 25 years. The XL-80 builds on that experience to deliver a real advance in system

Description: requires a strategic partner that can offer creative thinking, unrivaled engineering and manufacturing, and complete systems integration. ASML Optics enables end-to-end advanced optical systems across a broad range of commercial, industrial, and scientific applications. ASML

• Additional Services: Optical Modeling, Prototyping, Low Volume Manufacture, Testing and Metrology
• Design Services: Optical Component Design, Optical System Design, Optomechanical Design, Optoelectronic Design
• Industry Served: General Industrial, Other
• Location: North America, United States Only, Northeast US Only, Southern US Only, Southwest US Only, Northwest US Only, Midwest US Only, Europe Only, East Asia / Pacific Only

Description: Inspector Automated and Accurate System Solutions Product reliability and quality assurance is the focus for 21st century manufacturing and the acquisition of accurate and reproducible metrology data a top priority. Olympus expertise in imaging and metrology systems

Description: If you require Metrology done right, please include JIT Global on your vendor list. With over 60 years of combined experience in inspecting for quality issues (including Gage R&R, PPAP ,and 1ST Article inspection) you can trust our results. As an ISO 9001:2008 certified company, JIT Global

• Capabilities: Auditing / Assessment, Consulting / Training, Evaluation, Failure Analysis / Troubleshooting, First Article / Contract QA, Fixtures / Equipment, In-process / In-line Testing, Research and Development
• Forms Inspected: Components / Parts, Products
• Industry Applications: Appliances, Aerospace / Avionics, Automotive, Electrical Distribution, Health Care / Medical, HVAC, Plumbing and Lighting, Industrial / Machinery, Instrument & Sensors / Laboratory, Marine, RF & Wireless / IT & Telecom, Semiconductor / IC Packages, Welding & Fabrication
• Services Offered: Dimensional Gaging / Metrology, NDT / Inspection, Visual / Video Inspection

Description: Mahr Inc., a member of the Mahr Group, has over 150 years of experience providing dimensional measurement solutions to fit customer application needs. We manufacture and market a wide variety of dimensional metrology equipment, from simple and easy-to-use handheld gages to technically

• Capabilities: Consulting / Training, Evaluation, Failure Analysis / Troubleshooting, Field Evaluation / On-site Inspection
• Forms Inspected: Products
• Industry Applications: Aerospace / Avionics, Automotive, Health Care / Medical, Industrial / Machinery, Specialty / Other
• Services Offered: Dimensional Gaging / Metrology

Description: a wide range of substrates to be deposited including 150 mm, 200 mm, and 300 mm wafers, supporting of all of your wafer metrology applications and improving product yield. The Model 2300G3M Particle Deposition System offers best-in-class performance for deposition of particle size

• Other Predefined: Yes

Description: a wide range of substrates to be deposited including 150 mm, 200 mm, and 300 mm wafers, supporting of all of your wafer metrology applications and improving product yield. The Model 2300G3M Particle Deposition System offers best-in-class performance for deposition of particle size

• Other Predefined: Yes

Description: such as Critical Dimension and Thin Film Metrology, Wafer Scribing, and Wafer Laser Thermal Annealing. It is also suitable for Back End Of Line Lithography machines (mask aligners) and some wafer dicing applications. METIS delivers reliable performance, making it an essential tool for

• Axis Configuration: X-Y-Z Axes
• Features: Multi-position
• Rated Speed: 47.24 in/sec
• Stroke or X-Axis Travel: 12.6 inch

Description: motors enable extreme duty cycles. Coupled with ETEL’s advanced AccurET controllers, TELICA benefits from features like zero settling time, advanced feedforward and trajectory filters, full synchronization of all axes with nanosecond jitter, and comprehensive software diagnostic and

• Axis Configuration: X-Y-Z Axes
• Drive Specifications: Direct Drive, Other
• Features: Multi-position
• Motor Specifications: Other

Description: Design Features Travel ranges from 100 µm to 600 µm available Long device lifetime High-precision, frictionless flexure guidance system Superior positioning resolution and linearity to 0.007% with direct-metrology capacitive sensor options

• Axis Configuration: X-Y Axes
• Carriage Load: 2.21 lbs
• Drive Specifications: Other
• Features: Closed Loop Control

Description: lasers using both piezo-electric transducers and current modulation inputs. The Model LB1005-S is ideal for demanding applications including atom/ion trapping, Bose-Einstein condensation, frequency metrology, quantum optics, and the high-speed stabilization, synchronization, and control of

Description: The PlanarDLA is available in three positioning performance options. Relying on decades of experience in system-level design including not only positioning mechanics, but also software and electronics, Aerotech has developed advanced technologies to push the envelope of precision

• Axis Configuration: X-Y Axes
• Bearing Type: Ball/Roller Bearing
• Carriage Load: 44.1 to 110 lbs
• Drive Specifications: Direct Drive

Description: Raytheon ELCAN Optical Technologies works with the world's best optical designers to design and build custom precision optical assemblies & sub-assemblies. Fully integrated contract manufacturing and precision assembly, driven by advanced engineering and high-precision technical computing

• Additional Services: Consulting Services, Design Software, Optical Modeling, Prototyping, Low Volume Manufacture, Alignment Services, Testing and Metrology
• Design Services: Optical Component Design, Optical System Design, Optomechanical Design, Optoelectronic Design
• Industry Served: Aerospace, Biotechnology, Electronics, Energy, Food and Beverage, General Industrial, Government, Marine, Medical, Military, Telecommunications, Other
• Location: North America, Southern US Only, Canada Only, Other

Description: , TT-HUD can be used to evaluate all visual aspects of the HUD system as well as test to the specific parameters documented in automotive standards: SAE J1757-1 "Standard Metrology for Vehicular Displays" SAE J1757-2 "Optical System HUD for Automotive" ISO/TC 22/SC 35/WG

Description: The Q1 Laser Radar by Ommatidia offers high-precision measurements and advanced contactless vibrometry. With its 128 parallel channels, it delivers metrology-grade results for distances of up to 50 meters. Additionally, the Q1 features imaging vibrometry, allowing users to analyze

Description: different gas calibrations User-accessible service port simplifies installation, troubleshooting and diagnostic tasks Excellent accuracy backed by superior metrology systems and calibration based on global standards Multi-protocol communication interface simplifies

• Mass Flow Rate: 8.26E-6 to 6.88 lbs/min
• Electrical Output: Analog Current, Analog Voltage
• Flow Meter Type: Mass Flow Meter
• Interface Options: Serial / Digital, Network / Fieldbus

Description: different gas calibrations User-accessible service port simplifies installation, troubleshooting and diagnostic tasks Excellent accuracy backed by superior metrology systems and calibration based on global standards Multi-protocol communication interface simplifies

• Accuracy: 0.1800 ±% FS
• Control Signal Output: Analog Voltage, Current Loop, Serial / Digital, Network / Fieldbus Output
• Media: Liquid, Gas / Air
• Number of Control Outputs: 1 outputs

Description: “hosedown” applications Long-term stability reduces maintenance and periodic recalibration requirements User-accessible service port simplifies installation, troubleshooting and diagnostic tasks Excellent accuracy backed by superior metrology systems and calibration based on

• Accuracy: 0.1200 ±% FS
• Control Signal Output: Analog Voltage, Current Loop, Serial / Digital, Network / Fieldbus Output, Other
• Number of Control Outputs: 1 outputs
• Number of Inputs: 1 inputs

Description: precision metrology. Shanghai Optics utilizes advanced manufacturing techniques (including CNC machine tools and single point diamond turning) to create high quality freeform optics and state-of-art metrology (including surface profilers, interferometers, and computer-generated

• Lens Type: Other

Description: prevents damage during installation Multi-protocol communication interface simplifies integration into existing systems Superior metrology and primary calibration systems based on global standards ensure accuracy Applications Chemical and petrochemical catalyst research and

• Mass Flow Rate: 8.26E-6 to 6.88 lbs/min
• Electrical Output: Analog Current, Analog Voltage
• Flow Meter Type: Mass Flow Meter
• Interface Options: Serial / Digital, Network / Fieldbus

Description: Mahr Inc., a member of the Mahr Group, has over 150 years of experience providing dimensional measurement solutions to fit customer application needs. We manufacture and market a wide variety of dimensional metrology equipment, from simple and easy-to-use handheld gages to technically

• Equipment Expertise: Coordinate Measuring Machines (CMM), Dimensional Gages / Instruments
• Location: North America, United States Only, Northeast US Only, Europe Only, East Asia / Pacific Only, Other
• Services Offered: Bench (Off-site), Calibration Service, Calibration Documentation, Preventative Maintenance / Service Contracts, Rapid Turnaround, Replacement / Exchange Program, Product Sales - New, Spare Parts Inventory, Troubleshooting

Description: , interferometers, and other advanced metrology tools. 2.Laser systems: Cylindrical lenses are used in laser systems to focus and shape laser beams. They can be used to collimate or converge the laser beam in one direction while leaving the other direction unaffected.

• Materials: Other
• Surface Quality: 40-20 Scratch / Dig

Description: The Nano-P Series are piezo actuated, closed loop, linear nanopositioners that incorporate a unique flexure hinge design. The flexure hinge is machined entirely from a single block of high strength titanium using an advanced electrical discharge machining process. This hinge, available for

• Actuation Type: Electrical
• Carriage Load: 0.4410 lbs
• Drive Specifications: Other
• Motor Specifications: Other

Description: The TBS linear axis by ETEL offers unparalleled precision and performance, making it the ideal solution for high accuracy applications across diverse industries. The TBS is a high-precision linear axis with 1 Degree Of Freedom, utilizing a mechanical bearing-based indirect drive system

• Actuation Type: Electrical
• Motor Continuous Power: 83.2 HP
• Motor Specifications: DC Servo
• Motor Voltage: 400 volts

Description: The M5180 is a 2-port, 18 GHz Vector Network Analyzer that delivers metrology-grade performance in a more economical package that excludes a number of advanced features: Vector Mixer Calibration TRL Calibration Frequency Offset Time Domain

• Frequency Range: 300 to 1.80E7 kHz
• Frequency Resolution: 1 Hz
• Instrument Type: Portable / Benchtop Instrument, PC-Based Instrument / Module
• Nominal Input Impedance: 50 Ohms

Description: frequency enabling high process throughput and fast closed-loop response. Using a patent-pending drive design, yaw errors are minimized while still maintaining an Abbe-compliant metrology system. This design results in unmatched positioning performance over the entire XY travel space.

• Maximum X-Distance: 0.1200 mm
• Maximum Y-Distance: 0.1200 mm
• Minimum Step Size (Resolution): 0.1500 µm
• Type: Other

Description: , advanced control algorithms to improve dynamic performance and error compensation, and a wide suite of software development tools. The A-322 series is a starting point for further adaptations. Critical core components such as linear motors, measuring systems, and air bearing

• Design Units: Metric
• Load Capacity: 55.08 lbs
• Shape: Flat, Rectangular / Square

Description: and high reliability which comes from our sustaining tightly quality control. We set up a complete ISO 9001:2000 certified quality system and invested in advanced metrology instruments including Zygo Interferometers, Perkin-Elmer Lambda 950 spectrometer, Nikon Microscope,

• Capabilities: Coatings, Grinding and Polishing, High Volume Production
• Location: East Asia / Pacific Only
• Optic Type: Beamsplitters, Crystals, Lenses, Mirrors, Polarizing Optics, Prisms, Waveplates, Windows
• Substrate: Glass, Other

Description: The Lumentum 1100 Series red helium-neon laser products offer low noise, high power stability, and long life for the most demanding applications.With more than 1.5 million units sold, Lumentum lasers are the industry standard for many advanced system designs. Lumentum manufactures

• Beam Area: 0.4800 to 0.8100 mm²
• CDRH Classification: Class IIIa, Class IIIb
• Laser Power: 0.5000 to 22.5 milliwatts
• Laser Type: Helium Neon Lasers