Linear Array Detectors

Description: North Star Imaging partners with nearly all of the manufacturers of Industrial Digital X-ray Detectors to offer you the most effective solution for your X-ray application. Linear Diode Array Detectors (LDA) are avaiable up to 36" in size.

• Features: Digital Imaging / Tomography System
• Instrument Type: Flaw Detection
• Instrument Technology: Radiographic / X-ray

Description: The 1024L1 is a 1024x1 state of the art InGaAs linear array imager on 12.5 µm pitch that was built for both spectroscopy and machine vision in the short wave infrared band. The 1024L1-12.5-T is an advanced digital array with the lowest read noise available <110e- for a 250 μm

• Horizontal Pixels: 1,024
• Vertical Pixels: 1
• Pixel Size: 12.5 µm
• Maximum Frame Rate: 0.000032 to 0.000048 MHz

Description: The Dual Linear Array™ probe for corrosion inspection provides many advantages over conventional ultrasonic dual element transducers. This phased array solution improves productivity through features such as larger beam coverage, faster scan speed, and C-scan imaging with

• Probe Frequency: 7,500 kHz
• Measurement Range: 1 mm
• Features & Format: Array
• Probe Style: Dual Element

Description: directly to an amorphous silicon read-out structure, and devices where a phosphor is coupled to a CMOS (Complementary metal-oxide-semiconductor) array, a Linear Detector Array (LDA) or a CCD (charge coupled device) crystalline silicon read-out structure. 1.4 The DDA shall

Description: The high resolution Xlin-1.7-3000 InGaAs detector is specifically designed for earth observation. The detector is based on mechanical butting of three InGaAs photodiode arrays with each 1024 pixels on a 25 µm pixel pitch, forming a nearly continuous line of 2900 pixels. The

• Spectral Range: 0.9 to 1.7 µm
• Output Channels: 3
• Operating Temperature Range: -40 to 85 C
• Array Type: Linear Array

Description: talk and super high uniformity between adjacent elements allowing very high precision measurements. Arrays offer a low cost alternative when a large number of detectors are required. The detectors are optimized for either UV, visible or near IR range. Then can be either operated

• Sensitivity: 0.5 A/W
• Spectral Response Range: 200 to 1,100 nm
• Active Area Diameter or Length: 6.449999999999999 mm
• Active Area Height: 0.28 mm

Description: OmniScan® X3 phased array flaw detector with TFM Confidence You Can See The OmniScan X3 flaw detector is a complete phased array toolbox. Powerful tools, like total focusing method (TFM) images and advanced visualization capabilities, enable you to complete your

• Instrument Type: Corrosion, Flaw Detection
• Features: Digital Imaging System, General Corrosion Detection, Inclusions, Material Condition, Other, Pore / Void, Portable / Handheld / Mobile, Pressure Vessel Flaws / Cracks, Programmable / Digital Control Unit, Subsurface Crack Detection, Surface Cracks / Abrasion, Tube / Pipeline Defects, Weld / Joint
• Instrument Technology: Ultrasonic

Description: EOC-SI-8200 MID-IR spectrometer developed by EOC, and it employs Pyroelectric linear array sensor, linear variable filter (LVF), custom-made ultra-low noise CCD signal processing circuit, results in reducing sensor noise, improving SNR (2 times higher SNR than competitors).

• Spectral / Wavelength Range: 2,500 to 11,000 nm
• Resolution: 72 nm
• Operating Temperature: 14 to 113 F
• Operating Humidity: 0 to 90 %

Description: the 1.0 um to 2.6um range, using InP material as the base substrate. Marktech is currently producing these high reliability wafers in 2", 3" and 4" diameters. Among the applications for these wafers are photo detectors, linear arrays and image sensors. Photo detectors

• Active Area Diameter or Length: 1.5 mm
• Photodiode Material: Indium Gallium Arsenide
• Features: Other
• Photodiode Type: PIN Photodiode

Description: Knight Optical's Redshift NIR I high performance mini spectrometer is designed to cover the NIR wavelength range from 0.9-1.7μm. Boasting an InGaAs (indium gallium arsenide) detector with a high quality “Sensors Unlimited” linear photo diode array comprised of 512 pixels, 25μm

• Wavelength Range: 900 to 1,600 nm
• Spectral Resolution: 3.1 nm

Description: Knight Optical's Redshift NIR I high performance mini spectrometer is designed to cover the NIR wavelength range from 0.9-1.7μm. Boasting an InGaAs (indium gallium arsenide) detector with a high quality “Sensors Unlimited” linear photo diode array comprised of 512 pixels, 25μm

• Wavelength Range: 1,250 to 1,575 nm
• Spectral Resolution: 3.1 nm

Description: Knight Optical's Redshift NIR I high performance mini spectrometer is designed to cover the NIR wavelength range from 0.9-1.7μm. Boasting an InGaAs (indium gallium arsenide) detector with a high quality “Sensors Unlimited” linear photo diode array comprised of 512 pixels, 25μm

• Wavelength Range: 900 to 1,700 nm
• Spectral Resolution: 3.1 nm

Description: Knight Optical's Redshift NIR I high performance mini spectrometer is designed to cover the NIR wavelength range from 0.9-1.7μm. Boasting an InGaAs (indium gallium arsenide) detector with a high quality “Sensors Unlimited” linear photo diode array comprised of 512 pixels, 25μm

• Wavelength Range: 1,150 to 1,475 nm
• Spectral Resolution: 3.1 nm

Description: The HEDS-9200 series is a high performance, low cost, optical incremental encoder module. When operated in conjunction with a codestrip, this module detects linear position. The module consists of a lensed LED source and a detector IC enclosed in a small C-shaped plastic package. Due

• Operating Temperature: -40 to 212 F
• Output: Current, Voltage
• Features: Incremental, Optical, Pulse & Direction, Signal Quadrature
• Sensor Technology: Linear Encoder

Description: IEC 62976:2017 gives the rules of naming, technical requirements, test methods, inspection, marking, packaging, transportation, storage and accompanying documents for electron linear accelerator equipment for Non-Destructive Testing (NDT). This document applies to NDT electron linear

Description: IEC 62976:2017 gives the rules of naming, technical requirements, test methods, inspection, marking, packaging, transportation, storage and accompanying documents for electron linear accelerator equipment for Non-Destructive Testing (NDT). This document applies to NDT electron linear

Description: 16 user defined tables to enable flexibility for the given environment. This lattice matched InGaAs array is backside illuminated enabling detection from 0.4 to 1.7 μm with no bond pads or wires in the way of your signal and minimize stray reflections found in front side illuminated

• Horizontal Pixels: 1,024
• Vertical Pixels: 1
• Pixel Size: 12 µm
• Maximum Frame Rate: 0.000037 to 0.000048 MHz

Description: range. Refer to the part number generator tool on page two. The utilization of the MP-2350RX, in conjunction with the appropriate MP-2350TX RF/Fiber Optic Transmitter, forms a broadband link capable of supporting the transmission of RF signals over singlemode optical fiber for use in a wide

• Responsivity: 0.85 to 0.9 A/W
• Operating Temperature: -40 to 185 F
• Connector Type: FC, SC
• Features: Other

Description: single photodiode. It has not been demonstrated if this method is effective for photo-array instruments such as those using a CCD or a diode array detector. 1.4 This test method is applicable to 10-mm pathlength cuvette formats and instruments covering a wavelength range within

Description: The HEDS-9700 series is a high performance, low cost, optical incremental encoder module. When operated in conjunction with either a codewheel or codestrip, this module detects rotary or linear position. The module consists of a lensed LED source and a detector IC enclosed in a small

• Operating Temperature: -40 to 185 F
• Features: Digital, Incremental, Optical, Signal Quadrature
• Sensor Technology: Linear Encoder

Description: imagers--multiple different imaging areas on one chip "Push-broom" linear and TDI sensors with X resolution to 12000+ pixels and unlimited Y resolution Back side illuminated (BSI) options for maximum sensitivity and QE Antireflective coatings to optimize QE Radiation tolerance/hardness

• Horizontal Pixels: 12,000
• Image Sensor Type: Color
• Array Type: Linear Array

Description: detection capabilities with ACQUITY UPLC Fluorescence (FLR), Tunable UV (TUV), Photodiode Array (PDA), Evaporative Light Scattering (ELS), and Refractive Index (RI) detectors to single, tandem, and time-of-flight mass spectrometers Easily compatible with third-party MS solutions

• Analysis Method: Analytical Analysis
• Remote Interface: Computer Interface
• Instrument Type: Fixtured or Permanent
• Detector Type: Fluorescence Detector, Light Scattering Detector, Mass Spectroscopy Detector, Refractive Index Detector, Ultraviolet / Visible Light Detector

Description: very high sensitivity. In strong field environments an attenuator can be activated to reduce distortion. An integrated RF detector with a threshold circuit reports overload of the antenna. Interchangeable rod extensions for 100 cm final length (CISPR 25) and 104 cm (MIL-STD-461) are supplied.

• Primary Frequency Range: 0.0083 to 30 MHz
• Form Factor / Mounting: External
• Polarization: Linear, Vertical Linear
• Features: Other Antennas & Arrays

Description: solid debris contaminants. The enclosed linear encoder features an extruded enclosure with longitudinally attached interlocking lip seals and sealed end caps. The readhead body is joined to a sealed optical unit by a blade, which travels through the lip seals along the length of the encoder.

• Sensor Technology: Linear Encoder
• Features: Optical

Description: Current output, high UV sensitivity, excellent linearity, low power consumption NMOS linear image sensors are self-scanning photodiode arrays designed specifically as detectors for multichannel spectroscopy. The scanning circuit is made up of N-channel MOS transistors, operates

• Applications: Industrial

Description: high-density parts and generate scatter-free CT volumes with micron accuracy. The system is available with a flat panel detector and a proprietary Curved Linear Array (CLA) detector that optimizes the collection of the X-rays without capturing the undesired scattered

• X-ray Operating Voltage: 225 to 450 kilovolts
• Features: Computed Tomographic System, Other, Programmable / Digital Control Unit
• Instrument Technology: Radiographic / X-ray

Description: and generate scatter-free CT volumes with micron accuracy. The system is available with a flat panel detector and a proprietary Curved Linear Diode Array (CLDA) detector that optimizes the collection of the X-rays without capturing the undesired scattered X-rays. The

• X-ray Operating Voltage: 225 to 450 kilovolts
• Features: Computed Tomographic System, Other, Programmable / Digital Control Unit
• Instrument Technology: Radiographic / X-ray

Description: receiver. The edges of the shadow cast by an object in the beam's path are accurately measured by the detector array inside the receiver unit.

• Range: 0.3149608 to 1.968505 inch
• Features: Laser Class I, Optical - LED
• Measurement Scale / Units: Metric
• Gage / Instrument Type: Micrometer, Optical - Laser

Description: VJ Inspection Systems 4000 wheel inspection system images cast aluminum wheels in a single rotation. Operators receive a concise, accurate wheel discontinuity picture allowing optimized process adjustment. The wheel inspection system incorporates next generation linear diode array

• X-ray Operating Voltage: 225 kilovolts
• Focal Spot Size: 1,000 to 3,000 µm
• Instrument Type: Flaw Detection
• Form Factor: Monitoring System

Description: proprietary Curved Linear Array (CLA) detector that optimizes the collection of the X-rays without capturing the undesired scattered X-rays. This linear detector realizes stunning image sharpness and contrast by avoiding image pollution and associated contrast

• X-ray Operating Voltage: 450 kilovolts
• Focal Spot Size: 80 µm
• Features: Computed Tomographic System
• Form Factor: Monitoring System

Description: and systems. An integrated logarithmic power detector is included to provide closed-loop power control within the system. The device is housed in a 24-pin 3 x 5 mm Land Grid Array (LGA) package.

• Amplifier Type: Power Amplifier

Description: and systems. An integrated logarithmic power detector is included to provide closed-loop power control within the system. The device is housed in a 24-pin 3 x 5 mm Land Grid Array (LGA) package.

• Amplifier Type: Power Amplifier

Description: Unlimited linear photo diode array with 512 pixels (1024 optional) 25µm by 500µm tall to provide maximum sensitivity. The detector has an integrated thermo electric cooler (TEC) maintained at -10 °C, stabilized within +/-0.1 °C. The RED-Wave NIR InGaAs spectrometers use single

• Wavelength Range: 900 to 1,700 nm
• Mounting / Environment: In-situ / Field, Lab / Benchtop, Portable
• Display Type: Video