The aim of this book is to discuss production test, including related problems, their modeling, and the design and optimization of System-on-Chip (SOC) test solutions. The emphasis is on test scheduling, how to organize the testing, which is becoming important since the amount of test data is increasing due to more complex systems to test, and the presence of new fault types because of device size miniaturization. The focus of the discussion in the book is on the system perspective since the increasing complexity of SOC designs makes it harder for test designers to grasp the impact of each design decisions on the system s test solution, and also because locally optimized test solution for each testable unit do rarely lead to globally optimized solutions.

An important aspect when taking the system perspective is the computational cost versus modeling and optimization granularity. A fine grain model taking a high number of details into account is obviously to be preferred compared to a model that is considering only a few details. However, a fine grain model leads to high computational cost, and the computational cost is important to keep under control since the SOC designs are increasing in size, and also since the nature of the design process of test solutions is an iterative process. Furthermore, as the number of design parameters increases, which makes the design space large, it is of most import...