Mosfet Modeling For VLSI Simulation: Theory And Practice

The drain current Eq. (6.14) includes both the drift and diffusion components of the current.
Let us assume that the diffusion current is negligible so that all the current flow is due to drift only. This is a fairly good assumption provided the device is in strong inversion, that is, the gate voltage is greater than the threshold voltage ( V g s > V th). If the diffusion current is neglected then, from Eq. (6.2), it is easy to see that
| (6.38) | |
Comparing this equation with Eq. (6.7) we find that for a device in strong inversion, we can write
and therefore, from Eq (6.9) it follows that
| (6.39) | |
where ? s(0) is the surface potential at y = 0 (source end). For the sake of algebraic manipulation, it is more convenient to write
where V( y) now varies from 0 at the source end to V ds at the drain end. With this assumption, Eq. (6.39) can be rewritten as
| (6.40) | |
where we have replaced ? s(0) by 2 ? f, the classical criterion for strong inversion, while Eq. (6.14) reduces to
| (6.41) | |
Thus, to calculate I ds we need to calculate Q i. We will now derive a simple and more useful expression for Q i using a charge balance equation given by Eq. (6.28). It is interesting to note that Eq. (6.41) can...