Displays / FPD Surface Profilometers Datasheets

reflectCONTROL Compact -- RCC100-105
from Micro-Epsilon Group

reflectCONTROL Compact has been specifically developed for the inspection of lustrous surfaces. The system projects a striped pattern onto the measurement object. Defects on the surface cause deviations from the striped pattern which are recorded by cameras and evaluated by software. [See More]

  • Applications: Automotive; Flat Panel Display; Optics / Photonics; Precision Machining / Grinding; Semiconductors; Production or Factory Use
  • Measurement Capability: 2D / Line Profile; Defects, dimples or film residues