Scanning Probe / Atomic Force (SPM / AFM) Microscopes Datasheets

inVia Raman Microscope
from Renishaw

Since being launched, the Renishaw inVia Raman microscope has become the world's best selling research Raman system. The inVia Raman microscope combines simplicity of operation with the high performance and unparalleled flexibility for which Renishaw Raman systems are renowned. inVia Raman... [See More]

  • Microscope Type: Acoustic / Ultrasonic (optional feature); Microwave (optional feature); Compound (optional feature); Fluorescent (optional feature); Inverted (optional feature); Laser / Confocal; Polarizing (optional feature); Portable Field (optional feature); Scanning Electron Microscope (optional feature); Scanning Probe / Atomic Force (optional feature); Stereomicroscope (optional feature); Transmission Electron Microscope (optional feature); Raman
  • Grade: Student (optional feature); Benchtop (optional feature); Research
  • Application: Measuring / Toolmaker / Inspection (optional feature); Biological / Life Sciences; Gemological; Medical / Forensic; Metallurgical (optional feature); Semiconductor
  • Optical Technique: Diffraction Grating
Atomic Force Microscopes
from Bruker Corporation

As atomic force microscopy enters its fourth decade as a primary technique for enabling research of all levels, its high-resolution data has helped researchers across a nearly countless array of disciplines and applications. Bruker has been leading the expansion of atomic force microscope (AFM)... [See More]

  • Microscope Type: Scanning Probe / Atomic Force
  • Remote Interface: Computer Interface
  • Application: Biological / Life Sciences (optional feature); Medical / Forensic (optional feature); Metallurgical (optional feature)
B.O.S.S. SYSTEM -- OS-100
from Newage Testing Instruments, Inc.

Brinell optical scanning system [See More]

  • Microscope Type: Scanning Probe / Atomic Force
  • Grade: Benchtop
  • Application: Metallurgical
  • Features: Digital Display; Monocular
from Park Systems, Inc.

The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology. It is a mid-priced system for materials science, polymers, electrochemistry and other applications in nanoscience and... [See More]

  • Microscope Type: Scanning Probe / Atomic Force
  • Grade: Benchtop; Research
  • Application: Biological / Life Sciences
  • Magnification: 160 to 1500
Microscope Scanning Vibrometer -- MSV-400
from Polytec, Inc.

The MSV-400 Microscope Scanning Vibrometer is the successor to the award-winning MSV-300 for full-field vibration analysis of very small objects such as MEMS optical switches. Based on the laser Doppler principle, a HeNe laser maps the vibrational response of the structure with a lateral resolution... [See More]

  • Microscope Type: Scanning Probe / Atomic Force
  • Grade: Benchtop; Research
  • Application: Measuring / Toolmaker / Inspection; Semiconductor; Microscope Scanning Vibrometer
  • Resolution: 1000