Research Microscopes Datasheets

Microscope -- Etaluma LumaScope
from Baker

A dramatically new concept in simple, inexpensive, and accessible fluorescence microscopy. The Etaluma LumaScope provides provides fluorescence and brightfield capability in a small, portable, and easy to use microscope. Small enough to fit into a cabinet or workstation, the Lumascope is available... [See More]

  • Grade: Research
  • Features: Digital Display
  • Application: Biological / Life Sciences
Fixed Stage Microscope -- BX61WI / BX51WI
from Olympus America, Inc.

The BX51WI is ideal for all physiological experiments such as patch clamping and intravital microscopy. The fixed stage concept and vibration-free frame design ensure excellent stability throughout the experiment. Use of infrared light protects living cells and offers high penetration depths of... [See More]

  • Grade: Research
  • Magnification: 1 to 100
  • Optical Technique: Fluorescence, Differential/IR-Differential Interference Contrast, Simple Polarized Light, Brightfield, Darkfield
  • Eyepiece Style: Binocular
FT-IR/Raman Microscope System
from Renishaw

Combined Raman and FT-IR provides users with exceptional analytical power for identifying unknown materials by combining both vibrational spectroscopic techniques. This combined IR/Raman analysis simplifies a wide range of analytical problems (such as forensic fibre analysis). Smiths Detection... [See More]

  • Grade: Benchtop; Research
  • Microscope Type: Laser / Confocal; Raman
  • Application: Medical / Forensic
  • Eyepiece Style: Binocular
Stereo Microscope
from Titan Tool Supply, Inc.

The RX - 2 Stereo Microscope is an EXTRA WIDE FIELD STEREO MICROSCOPE WITH UNUSUALLY LONG FOCAL LENGTHS AND GREAT DEPTH OF FIELD. The image. is crisp and sharp with unexcelled natural light gathering capabilities. The eight way adjustable pillar stand allows for many combinations of vertical and... [See More]

  • Grade: Benchtop; Research
  • Microscope Type: Stereomicroscope
  • Application: Measuring / Toolmaker / Inspection; Metallurgical; Semiconductor
  • Magnification: 5 to 40
from Hirox-USA, Inc.

This BGA lens allows ball joints to be observed non-destructively. Also, a 3D optical rotary ring enables 3D observation. This lens incorporates special hardware, such as a prism tip with lighting and a cushion mechanism, to ensure comfortable observation. [See More]

  • Grade: Research
  • Microscope Type: Stands & Stage Units Available
  • Application: Measuring / Toolmaker / Inspection; Biological / Life Sciences; Medical / Forensic; Metallurgical; Semiconductor
  • Magnification: 50 to 200
Focused Ion & Electron Beam Microscope -- nanoDUE'T NB5000
from Hitachi High Technologies America, Inc.

The dual-beam FIB-SEM integrates a high-performance 40 kV FIB column and an ultra-high-resolution Schottky field-emission SEM column. By using dedicated fabrication template patterns for automatic lift-out, fabrication processes from fiducial marking to specimen lift-out can be automated. For... [See More]

  • Grade: Research
  • Microscope Type: Scanning Electron Microscope
  • Application: Biological / Life Sciences; Medical / Forensic
Fiber Microscope
from HORIBA Scientific

The remote fiber coupled Raman microscope from HORIBA Scientific provides a unique facility for microscopic Raman, photoluminescence (PL) and fluorescence analysis. Ideal for complementing existing instrumentation or for analysis in restricted environments such as fume cupboards and clean rooms, the... [See More]

  • Grade: Research
  • Microscope Type: Fiber Microscope
  • Application: Biological / Life Sciences; Medical / Forensic; Semiconductor
  • Remote Interface: Computer Interface
Automated Semiconductor Process Tools -- JFS-9855S / 9955S
from JEOL USA, Inc.

Has a focused ion beam (FIB) milling system, automated wafer metrology [See More]

  • Grade: Research
  • Microscope Type: Scanning Electron Microscope
  • Application: Semiconductor
  • Resolution: 5
from KLA-Tencor Corporation

KLA-Tencor ’s eDR-52xx wafer defect review systems capture high resolution images of wafer defects detected by inspection tools. These images enable defect classification, helping chipmakers to identify systematic defect sources and resolve yield issues. The latest addition to the eDR-52xx... [See More]

  • Grade: Research
  • Microscope Type: Scanning Electron Microscope
  • Application: Semiconductor
  • Features: Digital Display
from Park Systems, Inc.

The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology. It is a mid-priced system for materials science, polymers, electrochemistry and other applications in nanoscience and... [See More]

  • Grade: Benchtop; Research
  • Microscope Type: Scanning Probe / Atomic Force
  • Application: Biological / Life Sciences
  • Magnification: 160 to 1500
Micro System Analyzer -- MSA-500
from Polytec, Inc.

The MSA-500 Micro System Analyzer is the premier measurement technology for the analysis and visualization of structural vibrations and surface topography in micro structures such as MEMS (Micro-Electro-Mechanical Systems) devices. By fully integrating a microscope with Scanning Laser-Doppler... [See More]

  • Grade: Benchtop; Research
  • Microscope Type: Laser / Confocal; Laser-Doppler Vibrometry, Stroboscopy
  • Application: Measuring / Toolmaker / Inspection; Semiconductor; Micro System Analyzer
  • Features: Digital Display
Versamet-3 -- 15292
from Unitron Ltd.

For brightfield, darkfield, interference contrast and polarization [See More]

  • Grade: Benchtop; Research
  • Microscope Type: Compound; Inverted; Polarizing
  • Application: Metallurgical
  • Optical Technique: Multi