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Supplier: Hypersen Technologies Co., Ltd.
Description: high-precision 2D and 3D shape inline measurement within 1 second, suitable for various 3D inspection applications in the fields of 3C, semiconductor, PCB, and precision workpieces.
- x-axis Measuring Length: 0.25590565 inch
- x-axis Linear Accuracy: 0.000787402 inch
- Features: 3-D Scanning / Profiling
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Supplier: KEYENCE
Description: various colors and material finishes. Revolutionary Speed and Stability World's fastest sampling speed among all 2D laser measuring instruments. This makes it possible to measure the various shapes of products on a moving conveyor or through a piece of equipment at high speeds without missing
- Machine Type: 2-D Scanning / Profiling
- Control: PC
- Application: Profile Measurement
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Supplier: CSA Group
Description: Report is applicable only to a laterally homogeneous bulk or single-layered material where the ion-sputtering rate is determined from the sputtered depth, as measured by a mechanical stylus profilometer, and sputtering time. The Technical Report provides a method to convert the ion-sputtering
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Description: Report is applicable only to a laterally homogeneous bulk or single-layered material where the ion-sputtering rate is determined from the sputtered depth, as measured by a mechanical stylus profilometer, and sputtering time. The Technical Report provides a method to convert the ion-sputtering
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Supplier: North Star Imaging, Inc.
Description: The ImagiX is North Star Imaging’s most compact system. The generous scanning envelope can handle products up to 5 in (12 cm) in size making it a great choice for laboratories, small electronics and R&D applications. SYSTEM CAPABILITIES Advanced 2D X-ray inspection 2D CT Slice
- Part Diameter / Width: 5 inch
- Measurement Capability: 2D / Line Profile, 3D / Areal Topography
- Applications: Aerospace / Defense, Automotive, Coatings (Thin Films, Plating, etc.), Electronics, Mechanical Parts (Bearings, Shafting), Medical, Precision Machining / Grinding, Wear / Tribology
- Mounting / Loading Options: Floor / Free Standing
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Supplier: Micro-Epsilon Group
Description: The scanCONTROL 30x2 laser profile scanners provide calibrated profile data with up to 7.9 million points per second. Thanks to their high accuracy, high profile frequency and versatility, these powerful scanners are particularly suitable for demanding measurement tasks. They measure and evaluate,
- Vertical (Z) Range: 7.87402 to 13.385834 inch
- Operating Temperature: 32 to 113 F
- Profile Vertical Range: 7.87402 to 13.385834 inch
- Measurement Capability: 2D / Line Profile, 3D / Areal Topography, Defects / ADC, Flatness, Step Height, Thickness, Warp / Bow
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Supplier: Micro-Epsilon Group
Description: The scanCONTROL 30x2 laser profile scanners provide calibrated profile data with up to 7.9 million points per second. Thanks to their high accuracy, high profile frequency and versatility, these powerful scanners are particularly suitable for demanding measurement tasks. They measure and evaluate,
- Vertical (Z) Range: 4.1338605 to 5.7086645 inch
- Operating Temperature: 32 to 113 F
- Profile Vertical Range: 4.1338605 to 5.7086645 inch
- Measurement Capability: 2D / Line Profile, 3D / Areal Topography, Defects / ADC, Flatness, Step Height, Thickness, Warp / Bow
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Supplier: Micro-Epsilon Group
Description: The scanCONTROL 30x0 laser profile scanners provide calibrated profile data with up to 9.6 million points per second. Thanks to their high accuracy, high profile frequency and versatility, these powerful scanners are suitable for demanding measurement tasks. They measure and evaluate, for example,
- Vertical (Z) Range: 7.87402 to 16.535442 inch
- Operating Temperature: 32 to 113 F
- Profile Vertical Range: 7.87402 to 16.535442 inch
- Measurement Capability: 2D / Line Profile, 3D / Areal Topography, Defects / ADC, Flatness, Step Height, Thickness, Warp / Bow
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Supplier: Mahr Inc.
Description: technical surfaces and surfaces of circuit boards, semiconductor products and biological tissue 2D surface analysis and measurement evaluations Topographical 3D surface analysis and measurement evaluations Fast measurements #96 short measuring times Manual table and object positioning in up
- Vertical (Z) Range: 7.87402 inch
- Measurement Capability: 2D / Line Profile, 3D / Areal Topography
- Mounting / Loading Options: Benchtop
- Applications: Electronics, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
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Supplier: Micro-Epsilon Group
Description: The scanCONTROL 30x0 laser profile scanners provide calibrated profile data with up to 9.6 million points per second. Thanks to their high accuracy, high profile frequency and versatility, these powerful scanners are suitable for demanding measurement tasks. They measure and evaluate, for example,
- Vertical (Z) Range: 7.87402 to 13.385834 inch
- Operating Temperature: 32 to 113 F
- Profile Vertical Range: 7.87402 to 13.385834 inch
- Measurement Capability: 2D / Line Profile, 3D / Areal Topography, Defects / ADC, Flatness, Step Height, Thickness, Warp / Bow
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Supplier: Mahr Inc.
Description: Product features Includes laptop computer and printer for automated surface plate profiling Surface plate profiling software provides automated collection of data and plotting of profile results Profiling software allows user to select surface plate size, number of runs to make and provided
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Supplier: KEYENCE
Description: Features Non-contact 3D metrology system performs nanometer level profile, roughness and thickness measurements on nearly any material. This software module complies with ISO 25178 and allows users to complete measurements of several surface parameters. Up to 28,800x magnification 0.5 nanometer
- Features: Surface Profilometry
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Supplier: Fischer Technology, Inc.
Description: To ensure that protective layers adhere permanently, the surface roughness of the base material must comply with strict recommended standards. The FPR1 profile probe is the ideal solution in this case: When combined with the FMP10/40 series, the FPR1 profile probe is the ideal solution for testing
- Technology: Contact / Stylus Based
- Features: Other
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
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Supplier: Marposs Corp
Description: DESCRIPTION Optocloud S is an advanced optical measurement system that combines multiple laser profilometers, a high-precision rotary axis and an optimized optical architecture to perform complete 360° inspection of parts without repositioning. In a single measuring cycle, the system acquires
- Number of Sensors / Cameras: 3
- Features: 3-D Scanning / Profiling
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Supplier: Fischer Technology, Inc.
Description: Developed by anti-corrosion experts, the three devices impress with robustness, usability and performance. All required measurement tasks in heavy corrosion protection are solved quickly and reliably. The DFT is the handheld device for the simple layer thickness measurement on steel and non-ferrous
- Technology: Contact / Stylus Based
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Supplier: Bruker Corporation
Description: Bruker's Dektak® stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film
- Measurement Capability: 2D / Line Profile, 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
- Mounting / Loading Options: Benchtop, Floor / Free Standing
- Display & Special Features: Computer Interface / Networkable
- Technology: Contact / Stylus Based
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Supplier: LMI Technologies
Description: MikroCAD delivers sub-micron accuracy and repeatability on a variety of challenging scan surfaces such as shiny, reflective and steep edges, in contrast to confocal solutions that are unable to handle steeply angled geometries. With MikroCAD 3D Surface Metrology you can: Measure roughness and
- Traverse Length: 0.03149608 inch
- Measuring Path / Scan Length: 0.03149608 inch
- Measurement Capability: 3D / Areal Topography
- Mounting / Loading Options: Benchtop
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Supplier: Zygo Corporation
Description: ZYGO's Compass™ 2 metrology systems set the benchmark for automated, non-contact 3D surface metrology and process control for discrete micro lenses and molds critical to compact camera modules found in smart phones, tablets, and automotive vision systems. At their core is ZYGO’s Coherence Scanning
- Measurement Capability: 3D / Areal Topography
- Mounting / Loading Options: Floor / Free Standing
- Features: Form Measurement, Surface Profilometry
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Supplier: Mahr Inc.
Description: Product features The precision, computer-controlled optical measuring instrument MarSurf CWM 100 with sub-nanometer resolution. A combined 3D measuring system comprising a confocal microscope and white light interferometer Features Advantages Special microscope technology dedicated to the
- Vertical (Z) Range: 3.93701 inch
- Measurement Capability: 3D / Areal Topography
- Mounting / Loading Options: Benchtop
- Applications: Electronics, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
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Supplier: Renishaw
Description: Multi-sensor 5-axis measurement system The REVO system uses synchronised motion and 5-axis measurement technology to minimise the dynamic effects of CMM motion at ultra high measurement speeds. This is achieved by letting the REVO-2 head do the fast demanding motion while the CMM moves in a linear
- Technology: Non-contact - Optical / Laser
- Applications: Precision Machining / Grinding
- Features: Surface Profilometry
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Supplier: Bruker Corporation
Description: Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker™s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide
- Measurements: Defects / ADC, Roughness / Waviness
- Features: Other
- Technology: Profilometer / AFM, X-ray Diffractometer
- Applications: Semiconductor Wafers
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Supplier: Zygo Corporation
Description: ZYGO's Compass™ metrology systems set the benchmark for automated, non-contact 3D surface metrology and process control for discrete micro lenses and molds critical to compact imaging systems such as automotive vision systems and cameras for smart phones and tablets. There are two models of
- Measurement Capability: 3D / Areal Topography
- Mounting / Loading Options: Benchtop
- Features: Form Measurement, Surface Profilometry
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Supplier: MTI Instruments Inc.
Description: The latest 1D laser displacement sensor from MTI provides excellent speed and accuracy for even the most difficult applications and provides data output and power through a single USB cable. The Microtrak™ 4 is the ultimate 2d laser measurement sensor for measuring height, thickness,
- Vertical (Z) Range: 0.0787402 inch
- Vertical (Z) Resolution: 0.0000014960638 inch
- Operating Temperature: 32 to 104 F
- Profile Vertical Range: 0.0787402 inch
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Supplier: Park Systems, Inc.
Description: XE-HDM is an automatic defect review AFM which revolutionizes the way defects in HDD substrates and media are searched, scanned, and analyzed. The new XE-HDM significantly increases throughput for the defect review process; test runs with real defects demonstrate over 500 - 800% gain in throughput
- Applications: Data Storage / Memory, Semiconductor Wafers
- Measurements: Defects / ADC
- Mounting / Loading: Floor Mounted / Stand-alone
- Form Factor: Monitor / Instrument
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Supplier: Park Systems, Inc.
Description: Park Systems has revolutionized the AFM with the introduction of the XE-3DM, the fully automated AFM system designed for overhang and trench profiles, sidewall roughness and imaging, and critical angle measurements. The unique design of the XE-3DM, made possible by the XE-series’ decoupled XY and Z
- Measurements: Critical Dimension / Trench Geometry, Defects / ADC, Roughness / Waviness
- Mounting / Loading: Floor Mounted / Stand-alone
- Form Factor: Monitor / Instrument
- Features: Non-contact, Non-destructive
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Supplier: ASTM International
Description: 1.1 This guide covers the preferred procedure for acquiring and post-processing of sputter crater depth measurements. This guide is limited to stylus-type surface profilometers equipped with a stage, stylus, associated scan and sensing electronics, video system for sample and scan alignment,
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Supplier: MTI Instruments Inc.
Description: High resolution, high speed laser displacement sensor (non-contact linear displacement sensor) utilizes the latest CMOS sensor technology that challenges even the most difficult measurement applications. The Microtrak™ 3 is undoubtedly an essential measurement tool for process automation, quality
- Vertical (Z) Range: 0.9842525 inch
- Vertical (Z) Resolution: 0.00000150000081 inch
- Operating Temperature: 32 to 104 F
- Profile Vertical Range: 0.9842525 inch
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Supplier: Edmund Optics Inc.
Description: systems, or for applications requiring a compact optical path.Each aspheric lens is serialized and provided with a complete metrology data package. The test data package includes a surface profile performed on our Taylor Hobson Talysurf Profilometer, an interferogram of the spherical surface,
- Focal Length: 37.50000000000001 mm
- Diameter / Length: 50 mm
- Center Thickness: 19.400000000000002 mm
- Edge Thickness: 7.8500000000000005 mm
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Supplier: Edmund Optics Inc.
Description: systems, or for applications requiring a compact optical path.Each aspheric lens is serialized and provided with a complete metrology data package. The test data package includes a surface profile performed on our Taylor Hobson Talysurf Profilometer, an interferogram of the spherical surface,
- Focal Length: 31.250000000000004 mm
- Diameter / Length: 50 mm
- Center Thickness: 19.400000000000002 mm
- Edge Thickness: 2.6900000000000004 mm
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Supplier: ASTM International
Description: to characterization of stainless steel surfaces that are smoother than Ra = 0.25 μm, as determined by a contact-stylus profilometer and defined by ANSI B46.1. The magnifications and height scales used in this test method were chosen with this smoothness in mind. 1.2.2 Intentional etching or
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Supplier: SAE International
Description: laser-based profilometer.
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Supplier: Suzhou Jiujon Optics Co., Ltd
Description: crucial for high-precision imaging and measurement applications. Common applications of cylindrical lenses include: 1.Optical Metrology: Cylindrical lenses are used in metrology applications to measure the shape and form of objects with high accuracy. They are employed in profilometers,
- Surface Quality: 40-20 Scratch / Dig
- Lens Type: Cylindrical Lens
- Features: Other
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Optocloud S is an advanced optical measurement system that integrates multiple laser profilometers, a high-precision rotary axis, and an optimized optical architecture to perform complete 360° inspection of parts without repositioning (read more)
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endeavor. At Avantier, we design optical solutions systems and manufacture high-performance optics, elevating the standards of metrology equipment used in research, industry, aerospace, and defense. Our comprehensive range of metrology systems includes: 1. Optical Profilometers (read more)
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Grinding is used for shaping, sizing, and finishing ceramic pins, which are often used in high-precision applications such as aerospace, automotive, and medical devices. 2. Grinding Tools and Equipment The selection of grinding tools and (read more)
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equipment for a wide variety of applications. We work at the forefront of research and developments, and produce metrology systems for research, industry, aerospace, and defense. Examples include: Optical profilometers, which can be used to measure surface topographies at high resolution (read more)
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Geometric Tolerances
In this work they are referred to as 2D profilometers to distinguish them from more complex solutions illustrated later.
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Two‐ and three‐dimensional profilometer assessments to determine titanium roughness
Greater Ra values were obtained by the 2D profilometer , although the samples had received the same surface treatment as with the 3D evaluated samples.
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Development of soft and hard x-ray optics for astronomy
… 2 it is shown the shell during the characterization of the longitudinal profiles performed at Zeiss, while in Fig. 3 it is possible to see the shell during the microrougbness measurement performed at OAB by means of a WYKO TOPO- 2D profilometer .
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Development of mirrors made of chemically tempered glass foils for future X-ray telescopes
They were characterized in shape with 1D and 2D profilometers , both before and after chemical tempering.
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Optical Measurement of Surface Topography
Chromatic confocal probes can be used on 2D profilometers to measure surface texture or step height.
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Thermal fatigue properties of laser treated steels
The thermal fatigue properties were examined through customized fatigue testing while characterisation was made using 2D profilometer and metallographic study.
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Scratch Cell Test: A Simple, Cost Effective Screening Tool to Evaluate Self-Healing in Anti-Corrosion Coatings
The coating thickness was measured using a 2D profilometer , while the coating hardness on the coupons was determined using Elcometer 501, Pencil Hardness Tester (ASTM D3363-92a).
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Determining cutting efficiency of nickel‐titanium coronal flaring instruments used in lateral action
In the present experimental model, a 2D profilometer was employed to assess maximum cutting depth and 3D microcomputed tomography allowed the evaluation of volume of extracted dentine, both as validation for the third method, direct measurement of notch area, which may be …
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Study of surface integrity of ground bearing steel using Barkhausen noise technique
The surface profile of ground surface, thus produced, was traced by a 2D profilometer (cutoff, 0.8 mm; model Surtronic 3+, Taylor Hobson) in the trans- verse direction and the data treated by Taly profile version 3.1.9 software for surface …
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Multi-body Vehicle Dynamics Simulation Based on Measured 3-D Terrain Data
This is similar to errors seen in 2D profilometer studies where advanced filtering techniques are used to remove similar measurement artifacts.