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Supplier: Hypersen Technologies Co., Ltd.
Description: achieve high-precision 2D and 3D shape inline measurement within 1 second, suitable for various 3D inspection applications in the fields of 3C, semiconductor, PCB, and precision workpieces.
- x-axis Linear Accuracy: 7.87E-4 inch
- x-axis Measuring Length: 0.2559 inch
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Supplier: KEYENCE
Description: mixture of various colors and material finishes. Revolutionary Speed and Stability World's fastest sampling speed among all 2D laser measuring instruments. This makes it possible to measure the various shapes of products on a moving conveyor or through a piece of equipment at
- Application: Profile Measurement
- Control: PC
- Machine Type and Specifications: 2-D Scanning / Profiling
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Description: ,0 mm2. The Technical Report is applicable only to a laterally homogeneous bulk or single-layered material where the ion-sputtering rate is determined from the sputtered depth, as measured by a mechanical stylus profilometer, and sputtering time. The Technical Report provides a method
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Supplier: North Star Imaging, Inc.
Description: The ImagiX is North Star Imaging’s most compact system. The generous scanning envelope can handle products up to 5 in (12 cm) in size making it a great choice for laboratories, small electronics and R&D applications. SYSTEM CAPABILITIES Advanced 2D X
- Display & Special Features: SPC / Software Capability
- Industrial Applications: Aerospace / Defense, Automotive, Coatings (Thin Films, Plating, etc.), Electronics, Mechanical Parts (Bearings, Shafting), Medical, Precision Machining / Grinding, Wear / Tribology
- Mounting / Loading: Floor / Free Standing
- Part Diameter / Width: 5 inch
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Supplier: North Star Imaging, Inc.
Description: The X5500 is the standalone manipulator from North Star Imaging’s most versatile system, the X5000. The system boasts a large scanning envelope and excellent ergonomics for loading sizable objects while still maintaining the sensitivity to inspect even the smallest of items. SYSTEM CAPABILITIES
- Display & Special Features: SPC / Software Capability
- Industrial Applications: Aerospace / Defense, Automotive, Coatings (Thin Films, Plating, etc.), Electronics, Mechanical Parts (Bearings, Shafting), Medical, Precision Machining / Grinding, Wear / Tribology
- Mounting / Loading: Floor / Free Standing
- Part Diameter / Width: 32 inch
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Supplier: North Star Imaging, Inc.
Description: The X7000 is North Star Imaging’s largest standard system. The large scanning envelope and generous focal distance allow for unparalleled inspection capabilities of very large objects. The system is great for composites, castings, pipes, tubes, welds and similar parts. SYSTEM CAPABILITIES X-ray
- Display & Special Features: SPC / Software Capability
- Industrial Applications: Aerospace / Defense, Automotive, Coatings (Thin Films, Plating, etc.), Electronics, Mechanical Parts (Bearings, Shafting), Medical, Precision Machining / Grinding, Wear / Tribology
- Mounting / Loading: Floor / Free Standing
- Part Diameter / Width: 60 inch
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Supplier: North Star Imaging, Inc.
Description: The X50 is one of NSI’s most popular models for electronics, aerospace components and medical devices. It offers an excellent balance of power and space sensitivity. The system can handle products up to 12 in (30 cm) in size while seated nicely in your failure analysis lab or busy production line.
- Display & Special Features: SPC / Software Capability
- Industrial Applications: Aerospace / Defense, Automotive, Coatings (Thin Films, Plating, etc.), Electronics, Mechanical Parts (Bearings, Shafting), Medical, Precision Machining / Grinding, Wear / Tribology
- Mounting / Loading: Floor / Free Standing
- Part Diameter / Width: 12 inch
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Supplier: LMI Technologies
Description: MikroCAD delivers sub-micron accuracy and repeatability on a variety of challenging scan surfaces such as shiny, reflective and steep edges, in contrast to confocal solutions that are unable to handle steeply angled geometries. With MikroCAD 3D Surface Metrology you can: Measure roughness and
- Display & Special Features: Computer Interface / Networkable
- Mounting / Loading: Benchtop
- Surface Metrology: 3D / Areal Topography
- Technology: Non-contact - Optical / Laser
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Supplier: Micro-Epsilon Group
Description: scanCONTROL 30x2 laser scanners are powerful profile sensors in terms of size, accuracy and measuring rate. These laser scanners provide calibrated 2D profile data with up to 5.12 million points per second. With a maximum profile frequency of 5 kHz, the scanners are designed for
- Factory / Production Use: Yes
- Industrial Applications: Aerospace / Defense, Automotive, Coatings (Thin Films, Plating, etc.), Displays / FPD, Electronics, Mechanical Parts (Bearings, Shafting), Medical, MEMS, Precision Machining / Grinding, Semiconductor Manufacturing
- Measurement Capability: Defects / ADC, Flatness, Step Height, Thickness, Warp / Bow
- Mounting / Loading: Other
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Supplier: Bruker Corporation
Description: Bruker's Dektak® stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D
- Display & Special Features: Computer Interface / Networkable
- Industrial Applications: Electronics, Semiconductor Manufacturing, Other
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
- Mounting / Loading: Benchtop, Floor / Free Standing
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Supplier: Micro-Epsilon Group
Description: scanCONTROL 30x2 laser scanners are powerful profile sensors in terms of size, accuracy and measuring rate. These laser scanners provide calibrated 2D profile data with up to 5.12 million points per second. With a maximum profile frequency of 5 kHz, the scanners are designed for
- Factory / Production Use: Yes
- Industrial Applications: Aerospace / Defense, Automotive, Coatings (Thin Films, Plating, etc.), Displays / FPD, Electronics, Mechanical Parts (Bearings, Shafting), Medical, MEMS, Precision Machining / Grinding, Semiconductor Manufacturing
- Measurement Capability: Defects / ADC, Flatness, Step Height, Thickness, Warp / Bow
- Mounting / Loading: Other
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Supplier: Micro-Epsilon Group
Description: scanCONTROL 30x0 laser scanners are among the highest performing profile sensors in terms of their size, accuracy and measuring rate. They provide calibrated 2D profile data with up to 7.37 million points per second. Their profile frequency of max. 10 kHz enables precise profile
- Factory / Production Use: Yes
- Industrial Applications: Aerospace / Defense, Automotive, Coatings (Thin Films, Plating, etc.), Displays / FPD, Electronics, Mechanical Parts (Bearings, Shafting), Medical, MEMS, Precision Machining / Grinding, Semiconductor Manufacturing
- Measurement Capability: Defects / ADC, Flatness, Step Height, Thickness, Warp / Bow
- Mounting / Loading: Other
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Supplier: Micro-Epsilon Group
Description: scanCONTROL 30x0 laser scanners are among the highest performing profile sensors in terms of their size, accuracy and measuring rate. They provide calibrated 2D profile data with up to 7.37 million points per second. Their profile frequency of max. 10 kHz enables precise profile
- Factory / Production Use: Yes
- Industrial Applications: Aerospace / Defense, Automotive, Coatings (Thin Films, Plating, etc.), Displays / FPD, Electronics, Mechanical Parts (Bearings, Shafting), Medical, MEMS, Precision Machining / Grinding, Semiconductor Manufacturing
- Measurement Capability: Defects / ADC, Flatness, Step Height, Thickness, Warp / Bow
- Mounting / Loading: Other
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Supplier: Mahr Inc.
Description: for all optical and reflective surfaces, fine technical surfaces and surfaces of circuit boards, semiconductor products and biological tissue 2D surface analysis and measurement evaluations Topographical 3D surface analysis and measurement evaluations Fast measurements #96
- Industrial Applications: Electronics, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
- Mounting / Loading: Benchtop
- Surface Metrology: 2D / Line Profile, 3D / Areal Topography
- Technology: Non-contact - Optical / Laser
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Supplier: MTI Instruments Inc.
Description: The latest 1D laser displacement sensor from MTI provides excellent speed and accuracy for even the most difficult applications and provides data output and power through a single USB cable. The Microtrak™ 4 is the ultimate 2d laser measurement sensor for measuring height,
- Display & Special Features: Computer Interface / Networkable, SPC / Software Capability
- Industrial Applications: Aerospace / Defense, Automotive, Electronics, Mechanical Parts (Bearings, Shafting)
- Measurement Capability: Step Height, Thickness, Specialty / Custom
- Mounting / Loading: Machine Mounted
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Supplier: CSA Group
Description: ,0 mm2. The Technical Report is applicable only to a laterally homogeneous bulk or single-layered material where the ion-sputtering rate is determined from the sputtered depth, as measured by a mechanical stylus profilometer, and sputtering time. The Technical Report provides a method
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Supplier: Fischer Technology, Inc.
Description: reports, statistical evaluations and the storage of measurement values Measurement according ASTM D4417, Method B, SSPC PA17, AS 3894.5-C, U.S. NAVY NSI 009-32, SANS 5772 and other standards Applications: Measurement of the surface profile of sand-blasted parts
- Industrial Applications: Other
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
- Standards Compliance: Other
- Technology: Contact / Stylus Based
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Supplier: MTI Instruments Inc.
Description: , Vista, Windows® 7 and Windows® 8 8 different stand-off models – From 25mm to 300mm. Measuring ranges from 2mm to 200 mm. Resolution down to 0.04µm
- Display & Special Features: Computer Interface / Networkable, SPC / Software Capability
- Factory / Production Use: Yes
- Industrial Applications: Aerospace / Defense, Automotive, Electronics, Mechanical Parts (Bearings, Shafting), Medical, MEMS, Nanomaterials, Optics / Photonics, Precision Machining / Grinding, Semiconductor Manufacturing
- Measurement Capability: Flatness, Step Height, Thickness, Warp / Bow
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Supplier: Fischer Technology, Inc.
Description: every situation (DFT) Preconfigured batches for SSPC-PA 2, IMO PSPC, ISO 19840, Australian AS 3894.3 B, Swedish IS 18 41 60 etc. (DFT) Probe pol (DFT) and temperature sensors (DPM) very resistent Big memory space for 250,000 readings in 2500 batches (DFT, DPM and SPG
- Technology: Contact / Stylus Based
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Supplier: Zygo Corporation
Description: ZYGO's Compass™ metrology systems set the benchmark for automated, non-contact 3D surface metrology and process control for discrete micro lenses and molds critical to compact imaging systems such as automotive vision systems and cameras for smart phones and tablets. There
- Mounting / Loading: Benchtop
- Surface Metrology: 3D / Areal Topography
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Supplier: KEYENCE
Description: Features Non-contact 3D metrology system performs nanometer level profile, roughness and thickness measurements on nearly any material. This software module complies with ISO 25178 and allows users to complete measurements of several surface parameters. Up to 28
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Supplier: Mahr Inc.
Description: Product features Includes laptop computer and printer for automated surface plate profiling Surface plate profiling software provides automated collection of data and plotting of profile results Profiling software allows user to select surface plate size, number of runs to make and provided
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Supplier: Mahr Inc.
Description: Product features The precision, computer-controlled optical measuring instrument MarSurf CWM 100 with sub-nanometer resolution. A combined 3D measuring system comprising a confocal microscope and white light interferometer Features Advantages
- Industrial Applications: Electronics, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
- Mounting / Loading: Benchtop
- Surface Metrology: 3D / Areal Topography
- Technology: Non-contact - Optical / Laser
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Supplier: Renishaw
Description: Multi-sensor 5-axis measurement system The REVO system uses synchronised motion and 5-axis measurement technology to minimise the dynamic effects of CMM motion at ultra high measurement speeds. This is achieved by letting the REVO-2 head do the fast demanding motion while the CMM
- Industrial Applications: Precision Machining / Grinding
- Technology: Non-contact - Optical / Laser
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Supplier: Bruker Corporation
Description: , WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically
- Applications: Semiconductor Wafers, Other
- Measurement Capability: Defects / ADC, Roughness / Waviness
- Technology: Profilometer / AFM, X-ray Diffractometer
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Supplier: Park Systems, Inc.
Description: • Out of plane motion of less than 2 nm over entire scan range • Accurate feature measurements with industry leading gauge sigma • Superior tool to tool matching Longer Tip Life by True Non-Contact Mode • 10 times larger Z-scan bandwidth than a piezotube
- Applications: Semiconductor Wafers
- Form Factor: Monitor / Instrument
- Measurement Capability: Defects / ADC
- Mounting / Loading: Floor Mounted / Stand-alone
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Supplier: Park Systems, Inc.
Description: 100 µm x 100 µm with low residual bow • Out of plane motion of less than 2 nm over entire scan range • Accurate height and angle measurements with PTR Gauge Sigma less than 0.1 nm. • Superior tool to tool matching. Longer Tip Life by True Non
- Applications: Semiconductor Wafers
- Form Factor: Monitor / Instrument
- Measurement Capability: Defects / ADC
- Mounting / Loading: Floor Mounted / Stand-alone
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Supplier: Park Systems, Inc.
Description: -resolution imaging • Minimized sample damage or modification • Soft photoresist structures can be imaged non-destructively • Immunity from parameter-dependent results observed in tapping imaging Complete 3D Metrology of Sidewall • Sidewall
- Applications: Semiconductor Wafers
- Form Factor: Monitor / Instrument
- Measurement Capability: Critical Dimension / Trench Geometry, Defects / ADC, Roughness / Waviness
- Mounting / Loading: Floor Mounted / Stand-alone
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Supplier: Park Systems, Inc.
Description: . Artifact Free Metrology by Crosstalk Elimination • Two independent, closed-loop XY and Z flexure scanners for sample and tip • Flat and linear XY scan of 100 µm x 100 µm with low residual bow • Out of plane motion of less than 2 nm over entire scan
- Applications: Semiconductor Wafers
- Form Factor: Monitor / Instrument
- Measurement Capability: Critical Dimension / Trench Geometry, Defects / ADC, Roughness / Waviness
- Mounting / Loading: Floor Mounted / Stand-alone
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Supplier: Edmund Optics Inc.
Description: aspheric lenses. Featuring improved aspheric surface figure, surface quality, and centering specification over our TECHSPEC® Precision Aspheric lenses, these optical components are ideal for integration into R&D; and OEM applications alike. With high numerical apertures, the lenses are ideal
- Diameter / Length: 25 mm
- Focal Length: 25 mm
- Lens Type: Aspheric Lens
- Materials: Other
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Supplier: Edmund Optics Inc.
Description: aspheric lenses. Featuring improved aspheric surface figure, surface quality, and centering specification over our TECHSPEC® Precision Aspheric lenses, these optical components are ideal for integration into R&D; and OEM applications alike. With high numerical apertures, the lenses are ideal
- Diameter / Length: 50 mm
- Focal Length: 37.5 mm
- Lens Type: Aspheric Lens
- Materials: Other
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Supplier: Edmund Optics Inc.
Description: aspheric lenses. Featuring improved aspheric surface figure, surface quality, and centering specification over our TECHSPEC® Precision Aspheric lenses, these optical components are ideal for integration into R&D; and OEM applications alike. With high numerical apertures, the lenses are ideal
- Diameter / Length: 50 mm
- Focal Length: 31.25 mm
- Lens Type: Aspheric Lens
- Materials: Other
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Supplier: Edmund Optics Inc.
Description: aspheric lenses. Featuring improved aspheric surface figure, surface quality, and centering specification over our TECHSPEC® Precision Aspheric lenses, these optical components are ideal for integration into R&D; and OEM applications alike. With high numerical apertures, the lenses are ideal
- Diameter / Length: 25 mm
- Focal Length: 18.75 mm
- Lens Type: Aspheric Lens
- Materials: Other
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Supplier: ASTM International
Description: 1.1 This guide covers the preferred procedure for acquiring and post-processing of sputter crater depth measurements. This guide is limited to stylus-type surface profilometers equipped with a stage, stylus, associated scan and sensing electronics, video system for sample and scan alignment,
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Supplier: ASTM International
Description: 1.1 This guide covers the preferred procedure for acquiring and post-processing of sputter crater depth measurements. This guide is limited to stylus-type surface profilometers equipped with a stage, stylus, associated scan and sensing electronics, video system for sample and scan alignment,
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Supplier: ASTM International
Description: 1.1 This guide covers the preferred procedure for acquiring and post-processing of sputter crater depth measurements. This guide is limited to stylus-type surface profilometers equipped with a stage, stylus, associated scan and sensing electronics, video system for sample and scan alignment,
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Supplier: SAE International
Description: hand, slips associated with the maxima predicted by the model compare poorly with test data indicating that a better shear stress-shear displacement sub-model is needed. The range of tire sinkage from the model compares well with the range of sinkage of test data obtained using a 3-D
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Supplier: ASTM International
Description: -nm thick. Interface regions 20 nm and thicker rarely occur, but are evidenced by a roughness in the originally smooth substrate which can be detected by a profilometer after the thickness measurement is completed and the layer has been etched away. 1.2 This test method is applicable
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Supplier: Suzhou Jiujon Optics Co., Ltd
Description: for high-precision imaging and measurement applications. Common applications of cylindrical lenses include: 1.Optical Metrology: Cylindrical lenses are used in metrology applications to measure the shape and form of objects with high accuracy. They are employed in profilometers
- Materials: Other
- Surface Quality: 40-20 Scratch / Dig
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transmission, HPS-DBL series sensors can achievehigh-precision 2D and 3D shape inline measurement within 1 second,suitable for various 3D inspection applications in the fields of3C, semiconductor,PCB, and precision workpieces. (read more)
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that includes all 3 components. But, in reality, this is somewhat misleading. To get a really good look at surface roughness, first form has to be removed and then the waviness. How Do You Measure Just the Roughness? Non-contact, 3D (read more)
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Geometric Tolerances
In this work they are referred to as 2D profilometers to distinguish them from more complex solutions illustrated later.
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Two‐ and three‐dimensional profilometer assessments to determine titanium roughness
Greater Ra values were obtained by the 2D profilometer , although the samples had received the same surface treatment as with the 3D evaluated samples.
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Development of soft and hard x-ray optics for astronomy
… 2 it is shown the shell during the characterization of the longitudinal profiles performed at Zeiss, while in Fig. 3 it is possible to see the shell during the microrougbness measurement performed at OAB by means of a WYKO TOPO- 2D profilometer .
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Development of mirrors made of chemically tempered glass foils for future X-ray telescopes
They were characterized in shape with 1D and 2D profilometers , both before and after chemical tempering.
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Optical Measurement of Surface Topography
Chromatic confocal probes can be used on 2D profilometers to measure surface texture or step height.
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Thermal fatigue properties of laser treated steels
The thermal fatigue properties were examined through customized fatigue testing while characterisation was made using 2D profilometer and metallographic study.
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Scratch Cell Test: A Simple, Cost Effective Screening Tool to Evaluate Self-Healing in Anti-Corrosion Coatings
The coating thickness was measured using a 2D profilometer , while the coating hardness on the coupons was determined using Elcometer 501, Pencil Hardness Tester (ASTM D3363-92a).
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Determining cutting efficiency of nickel‐titanium coronal flaring instruments used in lateral action
In the present experimental model, a 2D profilometer was employed to assess maximum cutting depth and 3D microcomputed tomography allowed the evaluation of volume of extracted dentine, both as validation for the third method, direct measurement of notch area, which may be …
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Study of surface integrity of ground bearing steel using Barkhausen noise technique
The surface profile of ground surface, thus produced, was traced by a 2D profilometer (cutoff, 0.8 mm; model Surtronic 3+, Taylor Hobson) in the trans- verse direction and the data treated by Taly profile version 3.1.9 software for surface …
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Multi-body Vehicle Dynamics Simulation Based on Measured 3-D Terrain Data
This is similar to errors seen in 2D profilometer studies where advanced filtering techniques are used to remove similar measurement artifacts.