Electronic Failure Analysis Handbook: Techniques and Applications for Electronic and Electrical Packages, Components, and Assemblies

GLOSSARY

A-C

Accelerated Stress Test (AST)
A screen conducted at a higher level of stress and for a shorter time than a conventional screen. Usually not called a screen, because the acronym would then be unacceptable.
Ambient
The surrounding environment that contacts the system, assembly, or component of interest.
Anode
An electrode or terminal through which current enters a metallic conductor or electrical device. Usually the positive terminal.
AOI
Automated optical inspection.
Arc
An electrical discharge through a gas. Normally characterized by a voltage drop in the immediate vicinity of the cathode approximately equal to the ionization potential of the gas.
Arc Tracking
A mechanism that occurs on insulating materials in which electrical discharges break down the chemical structure of the material and leave behind more conductive materials, which tend to degrade the material s insulating properties.
ATE
Automated test equipment.
Azeotrope
A mixture of two or more liquids that have a constant boiling point different from that of any of the component liquids.
Backscattered Electrons (BSEs)
Electrons arising from the elastic collision between the electrons produced by the electron gun of the scanning electron microscope and the nuclei of the specimen. BSE yield is strongly dependent on atomic number.
Bed-of-Nails
A fixture featuring spring-loaded contact pins that engage points on the board to perform in-circuit tests. These fixtures are usually dedicated to one PCB design.
Bimetallic Element
An actuating element consisting of two strips of metal with different coefficients of thermal expansion bound together in such a way that the internal...

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