Benchtop Specialty Microscopes
from Evident Scientific
Get reliable data quickly. Sub-micron 3D observation/measurement. Observe steps in the nanometer range and measure height differences at the sub-micron level. ISO25178-compliant surface roughness measurement. Measure surface roughness from linear to planar. Non-contact, nondestructive, and fast. No... [See More]
- Grade: Benchtop
- Optical Technique: Color-DIC, Color, Reflection-type Confocal Laser Scanning Laser-DIC Microscope
- Microscope Type: Laser / Confocal
- Eyepiece Style: Binocular
from Evident Scientific
Better Images and Results. DSX1000 digital microscopes enable faster failure analysis with guaranteed accuracy and repeatability. Large selection of lenses that are easy to change. Switch between 6 different observation methods by pushing a button. Fast macro to micro viewing. Accurate measurements... [See More]
- Grade: Benchtop
- Microscope Type: Telecentric Optical System
- Application: Measuring / Toolmaker / Inspection; Metallurgical; Semiconductor; Wiring Boards, Fractured Infrastructure Metal, Automotive Part Inspection Applications
- Optical Technique: Brightfield, Darkfield, MIX [BF + DF], Differential Interference Contrast, Polarized Light
from Evident Scientific
Built for failure analysis and material engineering research, the OLS5100 laser microscope combines exceptional measurement accuracy and optical performance with smart tools that make the microscope easy to use. Precisely measure shape and surface roughness at the submicron level quickly and... [See More]
- Grade: Benchtop
- Microscope Type: Laser / Confocal
- Application: Measuring / Toolmaker / Inspection
- Optical Technique: Reflection-type confocal laser scanning laser microscope, Reflection-type confocal laser scanning laser-DIC microscope Color Color-DIC
from KEYENCE
Features. Non-contact 3D metrology system performs nanometer level profile, roughness and thickness measurements on nearly any material. This software module complies with ISO 25178 and allows users to complete measurements of several surface parameters. Up to 28,800x magnification. 0.5 nanometer... [See More]
- Grade: Benchtop
- Microscope Type: Laser / Confocal
- Application: Measuring / Toolmaker / Inspection
- Magnification: 19200 to 28000
from Foundrax Engineering Products, Ltd.
The BRINtronic series of stand alone automatic Brinell microscopes includes: -BRINtronic –LT fully automatic portable Brinell microscope includes laptop PC supplied in a tough industrial quality case, (available without laptop computer as the BRINtronic-LTx). -BRINtronic-PC fully automatic... [See More]
- Grade: Benchtop
- Microscope Type: Authentic Optical
- Application: Measuring / Toolmaker / Inspection
- Optical Technique: Authentic
from Mad City Labs, Inc.
MadAFM ™ is a new sample scanning atomic force microscope (AFM) designed for ease-of-use and simple installation. The MadAFM ™ includes our industry leading closed loop nanopositioners for precision movement of the sample and probe. Mad City Labs has designed and manufactured piezo... [See More]
- Grade: Benchtop
- Objective Lenses: One
- Application: Biological / Life Sciences
- Features: Mechanical Stage
from Qioptiq
esigned for streamlined operation and compact integration onto a. multitude of probing stations, the A-Zoom µ Micro offers a high-value. solution for circuit board, semiconductor and flat-panel display probing. without sacrificing features, function or performance. 7:1 parfocal Optical zoom. [See More]
- Grade: Benchtop
- Microscope Type: Laser / Confocal (optional feature)
- Application: Semiconductor
- Optical Technique: Brightfield
from LECO Corporation
New from LECO, the DSX Series of opto-digital microscopes combines advanced optics and the latest digital technology in one user-friendly system. Instead of looking through eyepieces, everything is controlled by touch screen, which takes the operator through the process from inspection to... [See More]
- Grade: Benchtop
- Microscope Type: Free Angle
- Application: Metallurgical
- Magnification: 0 to 2
from Unitron Ltd.
Compact and feather weight, for morphological purposes [See More]
- Grade: Benchtop
- Magnification: 100 to 2300
- Application: Metallurgical; Bond, IC Analysis
- Resolution: 700000
from Polytec, Inc.
The MSA-500 Micro System Analyzer is the premier measurement technology for the analysis and visualization of structural vibrations and surface topography in micro structures such as MEMS (Micro-Electro-Mechanical Systems) devices. By fully integrating a microscope with Scanning Laser-Doppler... [See More]
- Grade: Benchtop; Research
- Microscope Type: Interferometric; Laser / Confocal; Laser-Doppler Vibrometry, Stroboscopy
- Application: Measuring / Toolmaker / Inspection; Semiconductor; Micro System Analyzer
- Features: Digital Display
from Nikon Metrology
Nikon ’s proprietary scanning-type optical interference measurement technology achieves 1 picometer (pm) height resolution. Nikon offers a variety of optical microscopes as measurement systems to suit a wide range of measurement applications. Key benefits. Superior measurement performance. [See More]
- Grade: Benchtop
- Microscope Type: Interferometric
- Application: Measuring / Toolmaker / Inspection
- Features: Digital Display
from Oxford Instruments
The Asylum Research Cypher ES builds on the exceptional performance of the Cypher S and adds full environmental control features. The same high resolution, speed and stability are maintained while easily operating in controlled gas or liquid environments, at temperatures from 0-250 °C, and in... [See More]
- Grade: Benchtop
- Optical Technique: Contact mode, DART PFM, Dual AC, Dual AC Resonance Tracking (DART), More
- Application: Biological / Life Sciences
from Park Systems, Inc.
The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology. It is a mid-priced system for materials science, polymers, electrochemistry and other applications in nanoscience and... [See More]
- Grade: Benchtop; Research
- Magnification: 160 to 1500
- Application: Biological / Life Sciences
- Resolution: 1000
from KEYENCE
3D Measurement of a Large Area in 4 Seconds. The VR is able to measure across 30 mm in just 4 seconds, with a maximum measurement range of 100 mm x 200 mm. Instead of use a physical probe, the VR utilizes structured lighting to obtain the entire 3D shape of an object. By using telecentric lenses... [See More]
- Grade: Benchtop
- Microscope Type: LED Ring Light, White LED
- Application: Semiconductor
- Magnification: 12 to 50
from Foundrax Engineering Products, Ltd.
The BRINtronic series of stand alone automatic Brinell microscopes includes: -BRINtronic –LT fully automatic portable Brinell microscope includes laptop PC supplied in a tough industrial quality case, (available without laptop computer as the BRINtronic-LTx). -BRINtronic-PC fully automatic... [See More]
- Grade: Benchtop
- Microscope Type: Authentic Optical
- Application: Measuring / Toolmaker / Inspection
- Optical Technique: Authentic
from Qioptiq
The A-Zoom2 10x single-objective zoom optical brightfield microscope delivers continuous 10:1 variable power magnification for microelectronics inspection, R &D imaging, testing and analysis. Originally designed for electronic probing applications, A-Zoom2 features superior optics to locate and... [See More]
- Grade: Benchtop
- Microscope Type: Laser / Confocal (optional feature)
- Application: Semiconductor
- Optical Technique: Brightfield
from Polytec, Inc.
Polytec's MSV-050 and MSV-100 Microscope Adapters are the bridge that connects Laser-Doppler Vibrometry (LDV) to the micro world. Designed to couple a fiber-optic vibrometer head to a microscope, the adapters permit precise single-point and differential vibration analysis on MEMS and other... [See More]
- Grade: Benchtop; Research
- Microscope Type: Interferometric; Laser / Confocal; Laser Doppler Vibrometry
- Application: Measuring / Toolmaker / Inspection; Semiconductor; Microscope Adapter
- Eyepiece Style: Binocular
from Nikon Metrology
The ShuttlePix P-400R Digital Microscope from Nikon Metrology is a portable digital microscope that has a sleek, compact design well suited for onsite use. This new concept in digital microscopy allows for much simpler remote inspection of large samples that previously had been too challenging. [See More]
- Grade: Benchtop
- Microscope Type: Digital
- Application: Metallurgical
- Features: Digital Display
from Oxford Instruments
The Cypher ES Polymer Edition is a special configuration of the Cypher ES AFM tailored to excel in polymer science research. It shares the same extraordinary performance and versatility as the Cypher ES, but comes standard with blueDrive photo thermal excitation, three powerful techniques from our... [See More]
- Grade: Benchtop
- Optical Technique: Contact mode, DART PFM, Dual AC, Dual AC Resonance Tracking (DART), More
- Application: Biological / Life Sciences
from Park Systems, Inc.
Take the award-winning XE-100, shrink it such that it can be placed on top of the many popular inverted optical microscopes, and you have the versatile XE-120, an exceptional AFM with expanded sample and interactivity flexibility. The XE-120 is the research grade AFM with industry ’s only True... [See More]
- Grade: Benchtop; Research
- Eyepiece Style: Binocular
- Application: Biological / Life Sciences
- Field of View: 0.1000
from Foundrax Engineering Products, Ltd.
The BRINtronic series of stand alone automatic Brinell microscopes includes: -BRINtronic –LT fully automatic portable Brinell microscope includes laptop PC supplied in a tough industrial quality case, (available without laptop computer as the BRINtronic-LTx). -BRINtronic-PC fully automatic... [See More]
- Grade: Benchtop
- Microscope Type: Authentic Optical
- Application: Measuring / Toolmaker / Inspection
- Optical Technique: Authentic
from Polytec, Inc.
The MSV-400 Microscope Scanning Vibrometer is the successor to the award-winning MSV-300 for full-field vibration analysis of very small objects such as MEMS optical switches. Based on the laser Doppler principle, a HeNe laser maps the vibrational response of the structure with a lateral resolution... [See More]
- Grade: Benchtop; Research
- Microscope Type: Interferometric
- Application: Measuring / Toolmaker / Inspection; Semiconductor; Microscope Scanning Vibrometer
- Resolution: 1000
from Oxford Instruments
The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain the only full-featured fast-scanning AFMs that are compatible with a complete range of modes and accessories. [See More]
- Grade: Benchtop
- Optical Technique: Contact mode, DART PFM, Dual AC, Dual AC Resonance Tracking (DART), More
- Application: Biological / Life Sciences
from Park Systems, Inc.
XE-Bio is a powerful 3-in-1 nanoscience research tool that uniquely combines industry ’s only True Non-Contact AFM with Ion Conductance Microscopy (ICM) and inverted optical microscope on the same platform. The modular design of the XE-Bio allows easy exchange between non-contact AFM and ICM. [See More]
- Grade: Benchtop
- Optical Technique: Inverted Optical Microscope
- Application: Biological / Life Sciences
- Eyepiece Style: Binocular
from Oxford Instruments
The MFP-3D Origin ™ features Asylum Research performance and quality at a price competitive with most low-cost AFMs. Origin marks the intersection of performance and affordability and offers high-resolution imaging, supports large samples, most imaging modes, and many accessories. It's simply... [See More]
- Grade: Benchtop
- Optical Technique: Contact mode, DART PFM, Dual AC, Dual AC Resonance Tracking (DART), More
- Application: Biological / Life Sciences
from Park Systems, Inc.
XE-HDM is an automatic defect review AFM which revolutionizes the way defects in HDD substrates and media are searched, scanned, and analyzed. The new XE-HDM significantly increases throughput for the defect review process; test runs with real defects demonstrate over 500 - 800% gain in throughput... [See More]
- Grade: Benchtop
- Resolution: 1.5
- Application: Semiconductor
- Field of View: 0.1000