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Supplier: Flexbar Machine Corporation
Description: FLEXBAR DIGI-ZOOM VIDEO MICROSCOPE SYSTEM Featuring Auto-Focus, Image Capture, Documentation and Manual Measurement In One Easy-to-Use Package. MAIN SYSTEM FEATURES: Continuous 1:14 Ratio Optical Zoom Auto-Focus System 0.5X Standard Objective
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Supplier: Accuris
Description: Surface chemical analysis - Scanningprobe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
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Supplier: Accuris
Description: Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement
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Supplier: Foundrax Engineering Products, Ltd.
Description: connectors, free standard software upgrades. The microscope unit features internal logic to ensure that the correct calibration data is used for every test regardless of the microscope unit used (where more than one is available) Results provided in HBW and mm, and
- Application: Measuring / Toolmaker
- Computer Interface: Yes
- Digital Display: Yes
- Eyepiece Style: Monocular
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Supplier: Foundrax Engineering Products, Ltd.
Description: connectors, free standard software upgrades. The microscope unit features internal logic to ensure that the correct calibration data is used for every test regardless of the microscope unit used (where more than one is available) Results provided in HBW and mm, and
- Application: Measuring / Toolmaker
- Computer Interface: Yes
- Digital Display: Yes
- Eyepiece Style: Monocular
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Supplier: Foundrax Engineering Products, Ltd.
Description: connectors, free standard software upgrades. The microscope unit features internal logic to ensure that the correct calibration data is used for every test regardless of the microscope unit used (where more than one is available) Results provided in HBW and mm, and
- Application: Measuring / Toolmaker
- Computer Interface: Yes
- Digital Display: Yes
- Eyepiece Style: Monocular
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Description: ISO 27911:2011 describes a method for determining the spatial (lateral) resolution of an apertured near-field scanning optical microscope (NSOM) by imaging an object with a size much smaller than the expected resolution. It is applicable to aperture-type NSOMs operated in the
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Supplier: Accuris
Description: Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
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Supplier: CSA Group
Description: ISO 27911:2011 describes a method for determining the spatial (lateral) resolution of an apertured near-field scanning optical microscope (NSOM) by imaging an object with a size much smaller than the expected resolution. It is applicable to aperture-type NSOMs operated in the
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Supplier: Suzhou Jiujon Optics Co., Ltd
Description: Stage micrometers, calibration rulers, and grids are commonly used in microscopy and other imaging applications to provide standard reference scales for measurement and calibration. These devices are typically placed directly on the microscope stage and are used to
- Materials: Specialty / Other
- Parallelism or Wedge Angle: 0.0833 arcmin
- Surface Quality: 40-20 Scratch / Dig
- Wedged or Parallel?: Parallel
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Supplier: ASTM International
Description: practice is applicable for a microscope equipped with a micrometer attachment, such as an optical filar, video filar, optical image-shearing with optical or video display, optical image-scanning, or video image-scanning micrometer. Adjustment and calibration
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Supplier: ASTM International
Description: This standard was transferred to SEMI (www.semi.org) May 2003 1.1 This practice covers the preparation of an optical microscope for dimensional measurements. It is intended for preparing an optical microscope to measure the width of lines, in the range from 0.5 to
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Supplier: KEYENCE
Description: obtained and are traceable according to international standards. An XYZ calibration scale is included with each system so that users can quickly calibrate on-site as needed.
- Application: Semiconductor Inspection
- Computer Interface: Yes
- Digital Display: Yes
- Field of View: 1.4 to 24 mm
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Description: ISO 8503-3:2012 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503-1. It is also applicable to the determination of the surface profile, within the range of 20 µm to 200 µm, of
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Supplier: Nikon Metrology
Description: , with a minimum readout down to 0.01 µm. It features a 300 x 300 x 150mm stage, TTL Laser height/profile scanning, intelligent pattern recognition and low contrast edge measuring. Perfect when exceptional accuracy is critical, such as calibration of standards and gages, master dies
- Applications / Capabilities: Electronics or Semiconductor Inspection
- Image Source: Optical Microscope
- System Type: Turnkey / Complete System
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Supplier: CSA Group
Description: ISO 8503-3:2012 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503-1. It is also applicable to the determination of the surface profile, within the range of 20 µm to 200
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Description: Describes the sampling procedures and methods for the determination of particle concentration and size distribution. Three methods are specified. One uses an automatic particle size analyser, working on the light interruption principle. The other two use an optical microscope, in
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Description: intended for measuring the grain size and distribution by the linear-intercept technique. ISO 4499-2:2008 essentially covers four main topics: calibration of microscopes, to underpin the accuracy of measurements; linear analysis techniques, to acquire sufficient statistically
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Supplier: CSA Group
Description: Describes the sampling procedures and methods for the determination of particle concentration and size distribution. Three methods are specified. One uses an automatic particle size analyser, working on the light interruption principle. The other two use an optical microscope, in
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Supplier: Titan Tool Supply, Inc.
Description: made. These micrometers can also be used for calibration of a master in borescope measurements. These stages can be used for checking the accuracy of stage movements with digital or standard micrometers. Their usage is only limited by the imagination of the user in optical
- Display: Digital Display
- Range: 1.00E-3 to 0.0050 inch
- Type: Micrometer
- Units: English, Metric
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Supplier: JEOL USA, Inc.
Description: selected from the Stage Navigation image. Analysis Auto functions enabling anyone to obtain high quality SEM images Easy EPMA for fast elemental analysis with simplified instrument setting In combination of the Auto Focus function of an optical microscope and Auto
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Supplier: CSA Group
Description: intended for measuring the grain size and distribution by the linear-intercept technique. ISO 4499-2:2008 essentially covers four main topics: calibration of microscopes, to underpin the accuracy of measurements; linear analysis techniques, to acquire sufficient statistically
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Supplier: Foundrax Engineering Products, Ltd.
Description: The Foundrax BRINscan MKIII is a high-speed heavy duty fully-automatic Brinell hardness tester fitted with a BRINtronic automatic Brinell microscope, suitable for off-line and in-line use. The Foundrax BRINscan MkIII has been proven in operational use over many years to be capable of
- Hardness Testers: Brinell
- Mounting: Fixtured or Permanent
- Test Method: Macro
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Supplier: JEOL USA, Inc.
Description: of the Auto Focus function of an optical microscope and Auto functions of SEM incorporating a new system with higher accuracy and faster degree of capabilities, any user can acquire high quality SEM images. “Live Analysis” enables elemental screening during observation. “Easy
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Scaling issues in ferroelectric barium strontium titanate tunable planar capacitors
Using this method, gap widths could be controlled only to within ±0.5 μm. subsequent to this variability, regardless of the mask used, all gap dimensions were verified by measurement with an optical microscope and calibration standard to ensure consistency of comparison …
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Techniques for qualitative and quantitative measurement of aspects of laser-induced damage important for laser beam propagation
In cases where quantitative results are desired, luminosity data can be calibrated using a standard optical microscope equipped with a precision stage. . Acknowledgments .
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Study of Pinning Effects for Vortices in Bi2 Sr2 CaCu2 O8+δ Single Crystals Using a Bitter Decoration Technique
The height of the step is 2 um, which was measured by the optical microscope , calibrated with a standard scale.
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Accurate and traceable calibration of one-dimensional gratings
Keywords: 1D grating, scanning probe microscope , calibration , standard , optical diffractometer, nanometrology (Some figures in this article are in colour only in the electronic version) .
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An NBS Physical Standard For The Calibration Of Photomask Linewidth Measuring Systems
In different sections of this paper will be discussed the pattern on the standard, the means by which NBS calibrates linewidths on the standard, how one uses the standard for the calibration of optical microscopes , some kinds of errors it can reveal …
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Polyimide Fibers Obtained by Spinning Lyotropic Solutions of Rigid‐Rod Aromatic Poly(amic ethyl ester)s
Prior to testing, the fiber diameters were determined with an Olympus BX60 optical microscope calibrated with a Leitz dimensional standard at a magnifica- tion of Â500, for the as-spun fibers and Â1000 for the drawn fibers.
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Application of an electrodynamic balance to the study of particle-fluid interactions
The diameters of selected PSL spheres were measured with an optical microscope and a standard reticle for calibration of the pixel count.
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Technical note: A toy as tool: A low‐cost image analysis system for the evaluation of tumor size in experimental small animal models
The size of the lesion or tumor can be evaluated using a standard light- optical microscope with a calibrated ocular grid, or even more simple, a ruler (Xu et al., 2003).
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Visual kerogen and vitrinite reflectance analyses of the Pleasant Bayou No. 1 Well, Brazoria Co. , Texas
After being f i n e l y polished, a high resolution micro- scope , calibrated with a known optical standard , is used t o measure the r e f l e c t i v i t y of the vitrinite particles.