Products & Services
See also: Categories | Featured Products | Technical Articles | More Information-
Supplier: Accuris
Description: Measurement of thermal conductivity of thin films on silicon substrates
-
Description: TTA 4:2002 proposes a standard procedure for the three-omega method for measuring the thermal conductivity of a thin, electrically insulating film, on a substrate having a thermal conductivity significantly greater than the thermal conductivity of the
-
Supplier: Accuris
Description: Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies balanced-type circular disk resonator method
-
-
Supplier: Hot Disk AB
Description: and very high-conducting samples. Kapton sensors for thin film measurements, operating temperature from -196 °C up to 300 °C (400 °C in vacuum): Sensor design: Radius (mm): 7854 10.72 7280 14.97 7281 30.00 Also available: Specific heat capacity sensor equipped with gold cell
-
Supplier: OMEGA Engineering, Inc.
Description: measured by a thin ceramic substrate of high thermal conductivity.
- Operating Temperature: -95 to 930 F
- Response Time: 0.25 to 1.1 seconds
- Length: 0.39 inch
- Width / Diameter: 0.078 inch
-
Supplier: MTI Instruments Inc.
Description: The Proforma 300SA is a benchtop/desktop, semi-automated wafer measurement system for semi-conducting and semi-insulating materials. Based on MTII’s exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning for thickness, thickness variation, bow,
- Maximum Wafer / Part Size: 300.00000000000006 mm
- Measurements: Area Mapping, Roughness / Waviness, Shape / Flatness, Thickness - Wafer / Disc (TTV)
- Technology: Capacitance / EM Gage
- Mounting / Loading: Manual Loading
-
Supplier: SAE International
Description: The purpose of this paper is to construct the thermal analysis model by measuring and estimating the temperature at the traction contact area. For measurement of temperature, we have used a thin-film temperature sensor. For estimation of temperature, we have composed the thermal
-
Supplier: CSA Group
Description: ISO 22007-3:2008 specifies a temperature wave analysis method for the determination of the thermal diffusivity of thin films and plates of plastics in the through-thickness direction. The method can be used on plastics in either the solid or molten state, and having either an isotropic
-
Description: ISO 22007-3:2008 specifies a temperature wave analysis method for the determination of the thermal diffusivity of thin films and plates of plastics in the through-thickness direction. The method can be used on plastics in either the solid or molten state, and having either an isotropic
-
Supplier: Fischer Technology, Inc.
Description: very wide range of quantitative properties such as coating thickness, electrical conductivity and ferrite content on a variety of sample geometries. Features: Robust and very versatile desktop instrument serving as a multifunctional measurement system with archiving and processing of
- Graduation / Resolution: 0 to 0.0787402 inch
- Resolution: 0 to 0.0787402 inch
- Mounting / Loading Options: Benchtop / Floor
- Features: Coating Thickness, Eddy Current / Electromagnetic, Wet Film Thickness
-
Supplier: AENOR
Description: Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method (Endorsed by Asociación Española de Normalización in March of 2026.)
-
Supplier: InspectorTools
Description: resistance of a thin film/coating is directly proportional to the resistivity and is an important QUALITY CONTROL component of a coating. Therefore, resistivity may be the largest single item to determine the repeatability and function of a coating. Sheet resistance has the units of
- Measurement Capability: Conductivity / Resistivity Instruments
-
Supplier: InspectorTools
Description: source. The resistance of a thin film/coating is directly proportional to the resistivity and is an important QUALITY CONTROL component of a coating. Therefore, resistivity may be the largest single item to determine the repeatability and function of a coating. Sheet resistance has the
- Measurement Capability: Conductivity / Resistivity Instruments
-
Supplier: ASTM International
Description: Thermally conductive electrical insulating materials are usually heterogeneous since they typically include fillers, binders, reinforcements such as glass fiber mesh, or a layer of polymeric film. To avoid confusion, this test method uses "apparent thermal conductivity" for
-
Supplier: ASTM International
Description: Thermally conductive electrical insulating materials are usually heterogeneous since they typically include fillers, binders, reinforcements such as glass fiber mesh, or a layer of polymeric film. To avoid confusion, this test method uses "apparent thermal conductivity" for
-
Supplier: Allied Electronics, Inc.
Description: The resistive element comprises a thin film of carbon, deposited onto a high thermal conductivity ceramic core. Metal end caps are force fitted to the element prior to spiraling value. Tinned copper lead wires are welded to the end caps and the components are then coated. One
-
Supplier: Allied Electronics, Inc.
Description: The resistive element comprises a thin film of carbon, deposited onto a high thermal conductivity ceramic core. Metal end caps are force fitted to the element prior to spiraling value. Tinned copper lead wires are welded to the end caps and the components are then coated. One
-
Supplier: Allied Electronics, Inc.
Description: The resistive element comprises a thin film of carbon, deposited onto a high thermal conductivity ceramic core. Metal end caps are force fitted to the element prior to spiraling value. Tinned copper lead wires are welded to the end caps and the components are then coated. One
-
Supplier: Allied Electronics, Inc.
Description: The resistive element comprises a thin film of carbon, deposited onto a high thermal conductivity ceramic core. Metal end caps are force fitted to the element prior to spiraling value. Tinned copper lead wires are welded to the end caps and the components are then coated. One
-
Description: Thin-film platinum, 1000 Ohm RTD component with metallized backside and inversed contacts This high‑precision temperature measurement with tight tolerance according to IEC 60751 is ideal for probes in medical applications, process instrumentation and precision monitoring. Its
- Operating Temperature: -58 to 392 F
- Nominal Resistance: 1,000 R0 @ 0° C
- Length: 0.0787402 inch
- Width / Diameter: 0.09055123 inch
-
Supplier: Linseis Inc.
Description: accurate thermal management predictions. Based on the well established Laser Flash technique, the Linseis Laserflash for thin films (TF-LFA) now offers a whole range of new possibilities to analyze thermophysical properties of thin films from 80nm up to 20 μm thickness.
- Temperature Range: -100 to 500 C
- Remote Interface: Application Software Included, Computer Interface, Other Computer Interface
- Features: Temperature Control
- Thermal Analyzer Type: Thermal Conductivity Analyzer
-
Supplier: Hot Disk AB
Description: materials (Isotropic module) to measurements of rod-shaped specimens (One-dimensional module); thin films, coatings or adhesive layers (Thin Film module); high-conducting sheets or slabs (Slab module); extremely light and low-conducting materials
- Temperature Range: -252.99999999999997 to 1,000 C
- Accuracy: 5 (%)
- User Interface: Digital Front Panel
- Display: Digital Readout
-
Supplier: ASTM International
Description: see also 9.3. 1.2.2 The thin films of silicon or gallium-arsenide may be fabricated by diffusion, epitaxial or ion implant processes. The sheet resistance of the layer should be in the nominal range from 2 to 3000 [omega] per square. The substrate on which the thin film
-
Supplier: ASTM International
Description: the thin film is fabricated should have a minimum edge to edge dimension of 25 mm, measured through the centerpoint and an effective sheet resistance at least 1000 X that of the thin film. The effective sheet resistance of a bulk substrate is its bulk resistivity (in
Find Suppliers by Category Top
Featured Products Top
-
flow rate and moisture content in various gases and liquids. This webinar will present the anemometric and calorimetric thermal mass flow measurement principles employed by IST AG's thin-film flow sensors. Viewers will also learn about the importance of selecting the right materials for (read more)
Browse Flow Meters Datasheets for Innovative Sensor Technology IST USA Division -
of thin films range in thickness from 0.15mm to 0.85mm. Depending on the material selected and application thickness, these products will provide a thermal conductivity between 0.9 and 3 (read more)
Browse Thermal Compounds and Thermal Interface Materials Datasheets for Fujipoly® America Corp. -
's cell constant and the benefits of 2-electrode and 4-electrode measurement for different applications. We'll then take a trip to the cleanroom and see how they are made, step-by-step, using thin- and thick-film processes. Lastly, we'll discuss sensor customization for unique applications Register for OnDemand Webinar (read more)
Browse Biosensors and Microarrays Datasheets for Innovative Sensor Technology IST USA Division -
five types of thin film measurement technology: RTD temperature sensors, capacitive relative humidity sensors, mass flow sensors and conductivity. Manufactured at the component level, these elements are available with a diverse range of standard and custom features (read more)
Browse Flow Meters Datasheets for Innovative Sensor Technology IST USA Division -
substrates are commonly used in thick-film and thin-film resistor manufacturing: Aluminum Oxide (Al2O3): Widely used due to its good thermal conductivity, electrical insulation, and cost-effectiveness. Aluminum Nitride (AlN): Preferred (read more)
Browse Industrial Ceramic Materials Datasheets for 3X Ceramic Parts Company Limited -
-independent measurement, where a nanometer-accurate thickness value is achieved even with moving objects. The large thickness measuring range allows the measurement of thin layers, flat glass and films. Since the white light interferometer works with an SLED in the near infrared range, thickness measurement of anti (read more)
Browse Interferometers Datasheets for Micro-Epsilon Group -
System accurately measures the highest-performance optical filters. The HELIX Spectral Analysis System has redefined measurement capabilities of high performance thin-film optical filters. HELIX is an instrument designed and developed by Alluxa Engineering staff to address the limitations (read more)
Browse Optical Filters Datasheets for Alluxa, Inc. -
Conductivity sensor Innovative Sensor Technology IST AG has combined thin- and thick-film technologies to develop ceramic-based conductivity sensors that include a resistive temperature sensor (Pt1000 IEC 60751 F0.3), thus allowing for accurate compensation at the (read more)
Browse Datasheets for Innovative Sensor Technology IST USA Division -
Provide customized processing services, including size adjustment, surface polishing, laser cutting, etc. according to needs; Widely used in ceramic metallization, such as DPC (direct copper plating method), thin film sputtering method, DBC (direct copper plating (read more)
Browse Industrial Ceramic Materials Datasheets for Shenzhen Great Precision Ceramic CO., LTD. -
operational performance. Sarcon® 30YR-c is a high-performance 0.3mm thick material that exhibits a thermal conductivity of 4.0 W/m•K and a thermal resistance of only .21° C•in2/W. This V?0 rated thin film is recommended for applications with operational (read more)
Browse Thermal Compounds and Thermal Interface Materials Datasheets for Fujipoly® America Corp.
Conduct Research Top
-
A Microfluidic System for Biological Particle Enrichment Using Contactless Dielectrophoresis
reservoirs filled with a highly. conductive solution, rather than a separate thin-film array,. the electrode structures used by cDEP can be fabricated in. the same step as that of the rest of the device; hence, the. process is conducive to mass production.18. A cDEP device is presented
More Information Top
Indicates content that may require registration and/or purchase.
-
Chemical Solution Deposition of Functional Oxide Thin Films
… columnar grains and some even in epitaxial films, it is evident that the fraction of parallel and perpendicular grain boundaries will vary with the deposition technique and the measurement set-up chosen: is the thin film conductivity measured in film plane or …
-
Surface and Interface Analysis
Electrode array for in situ thin film conductivity measurements (according to [258] .
-
Passive wireless surface acoustic wave CO2 sensor for geological sequestration sites monitoring
… gas sources (Compressed Air gas tank and compressed CO2 gas tank), flow controllers, one quartz gas testing flow chamber with oven, one sink connected with exhaust gas pipe, one current source measurement unit for thin film conductivity measurement (can be replaced by …
-
Dielectric relaxation, ac and dc conductivities in the fullerenes C60 and C70
From thin film conductivity measurements Mort et al. estimated a band gap of 1.9 eV [30].
-
Measuring electric field dependent photodegradation and recovery of disperse orange 11 dye doped polymer thin films using photoconductivity and digital imaging...
[21] Zimmerman, K., Thin film conductivity measurements as a probe of polarization relaxation in solid polymer solutions, Master’s thesis, Washington State University (December 1992).
-
Electrical conductivity of non-homogeneous Au films on glass
Thin film conductivity measurements .
-
NPG Asia Materials - Nanoscale assembly into extended and continuous structures and hybrid materials
Thin film conductivity measurements revealed an increase in charge mobility for CCG−PDI (13.9 S cm−1) compared with CCG (3.0 S cm−1) and CCG−Py (1.9 S cm−1).
-
Thermal conductivities of thin, sputtered optical films
films, these data clearly demonstrate the importance of using measured thin film conductivity .
-
Spatial conductivity mapping of carbon nanotube composite thin films by electrical
impedance tomography for sensing applications
The approach is elegant since repeated probe measurements need not be taken to measure thin film conductivity . .
-
Subject Index
Electrical conductivity measurement thin film magnetoresist., HF meas.