6.1 Introduction

As shown in Chapter 5, for plane rectilinear near-field scanning, probe pattern characterisation errors contribute to the overall facility error budget as a singular mapping. Essentially then, this means that an error in the probe pattern at a particular direction in space will correspond to a similar error at that angle being introduced into any antenna pattern that has been corrected with this data. Furthermore, this can potentially constitute one of the largest and most repeatable, measurement uncertainties. Thus it is clear that in order to obtain reliable measurements, the electromagnetic (EM) properties of the near-field probe must be known very accurately indeed. Throughout this work, it has been assumed that relative measurements are taken, that is, without reference to absolute gain. If an absolute gain is required, then it is assumed that a substitution method is used employing a calibrated gain standard in order that the measurements can be correctly normalized. The importance of this for the characterisation of the near-field probe is that if the same probe and probe pattern used to correct the measurement of the antennas under test (AUTs) and the standard gain horn (SGH) then the gain of the probe will be unimportant. Thus, within this chapter, characterisation of the gain of the probe is not discussed and the gain of the probe will be normalized to unity for convenience. This chapter briefly describes the properties that are desirable in a near-field probe before proceeding to describe methods for obtaining and then using...