Advanced Production Testing of RF, SoC and SiP Devices

References

[1] Pozar, D. M., Microwave Engineering, Reading, MA: Addison-Wesley, 1993, pp. 582 594.

[2] Witte, R. A., Spectrum & Network Measurements, Upper Saddle River, NJ: Prentice Hall, 1993.

[3] Johnson, J. B., "Thermal Agitation of Electricity in Conductors," Physical Review, Vol. 32, 1928, p. 97.

[4] Nyquist, H., "Thermal Agitation of Electricity in Conductors," Physical Review, Vol. 32, 1928, p. 110.

[5] Schottky, W., "Small-Shot Effect and Flicker Effect," Physical Review, Vol. 28, 1926, p. 74.

[6] "Fundamentals of RF and Microwave Noise Figure Measurements," Hewlett Packard Application Note 57-1, 1983.

[7] Friis, H. T., "Noise Figures of Radio Receivers," Proc. IRE, July 1944, pp. 419 422.

[8] "Noise Figure Measurement Accuracy: The Y-Factor Method," Hewlett Packard, Application Note 57-2, 1992.

[9] Lance, A. L., W. D. Seal, and F. J. Bayuk, "Noise Measurement Uncertainty," J. Appl. Measurements, Vol. 2, 1974, pp. 70 75.

[10] Boyd, D., "Calculate the Uncertainty of NF Measurements," Microwaves & RF, October 1999, pp. 93 102.

[11] "10 Hints for Making Successful Noise Figure Measurements," Hewlett Packard Application Note 1341.

[12] IEEE Standard 1139, 1988.

[13] Ferre-Pikal, E. S., et al., "Draft Revision of IEEE Std 1139-1988: Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology Random Instabilities," 1997 Int. Frequency Control Symp. Proc., 1997.

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