Advanced Production Testing of RF, SoC and SiP Devices

[1] Pozar, D. M., Microwave Engineering, Reading, MA: Addison-Wesley, 1993, pp. 582 594.
[2] Witte, R. A., Spectrum & Network Measurements, Upper Saddle River, NJ: Prentice Hall, 1993.
[3] Johnson, J. B., "Thermal Agitation of Electricity in Conductors," Physical Review, Vol. 32, 1928, p. 97.
[4] Nyquist, H., "Thermal Agitation of Electricity in Conductors," Physical Review, Vol. 32, 1928, p. 110.
[5] Schottky, W., "Small-Shot Effect and Flicker Effect," Physical Review, Vol. 28, 1926, p. 74.
[6] "Fundamentals of RF and Microwave Noise Figure Measurements," Hewlett Packard Application Note 57-1, 1983.
[7] Friis, H. T., "Noise Figures of Radio Receivers," Proc. IRE, July 1944, pp. 419 422.
[8] "Noise Figure Measurement Accuracy: The Y-Factor Method," Hewlett Packard, Application Note 57-2, 1992.
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[10] Boyd, D., "Calculate the Uncertainty of NF Measurements," Microwaves & RF, October 1999, pp. 93 102.
[11] "10 Hints for Making Successful Noise Figure Measurements," Hewlett Packard Application Note 1341.
[12] IEEE Standard 1139, 1988.
[13] Ferre-Pikal, E. S., et al., "Draft Revision of IEEE Std 1139-1988: Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology Random Instabilities," 1997 Int. Frequency Control Symp. Proc., 1997.