Advanced Production Testing of RF, SoC and SiP Devices

Selected Bibliography

Adam, S., Microwave Theory and Applications, Upper Saddle River, NJ: Prentice Hall, 1969, pp. 490 502.

Chambers, D. R., "A Noise Source for Noise Figure Measurements," Hewlett Packard J., April 1983, pp. 26 27.

Hewlett Packard, "Understanding and Measuring Phase Noise in the Frequency Domain," Application Note 207, 1976.

IRE Standards on Methods of Measuring Noise in Linear Two-Ports, 1959. Proc. IRE, January 1960.

Noren, B., "Production Test Places New Requirements on Noise Figure Measurement Techniques," Agilent Technologies, 1999.

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